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X-ray photoelectron spectrometer and energy spectrometer

X-ray photoelectron spectrometer and energy spectrometer, Total:152 items.

In the international standard classification, X-ray photoelectron spectrometer and energy spectrometer involves: Analytical chemistry, Linear and angular measurements, Non-destructive testing, Electricity. Magnetism. Electrical and magnetic measurements, Optics and optical measurements, Nuclear energy engineering, Electronic components in general, Test conditions and procedures in general, Medical sciences and health care facilities in general, Petroleum products in general, Soil quality. Pedology.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray photoelectron spectrometer and energy spectrometer

GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

German Institute for Standardization, X-ray photoelectron spectrometer and energy spectrometer

DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN EN ISO 13196:2015-11 Soil quality - Sreening soils for selected elements by energy-dipersive X-ray fluorescence spectrometry using a handheld or portable instrument (ISO 13196:2013); German version EN ISO 13196:2015

International Organization for Standardization (ISO), X-ray photoelectron spectrometer and energy spectrometer

ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
ISO 13196:2013 Soil quality - Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument
ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
ISO/CD 13196:2023 Soil quality — Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument

British Standards Institution (BSI), X-ray photoelectron spectrometer and energy spectrometer

BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 13196:2013 Soil quality. Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument
BS EN ISO 13196:2015 Soil quality. Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument
BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction

Korean Agency for Technology and Standards (KATS), X-ray photoelectron spectrometer and energy spectrometer

KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer

未注明发布机构, X-ray photoelectron spectrometer and energy spectrometer

BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution

American Society for Testing and Materials (ASTM), X-ray photoelectron spectrometer and energy spectrometer

ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E902-05 Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
ASTM E2120-10 Standard Practice for Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
ASTM E2120-00 Standard Practice for the Performance Evaluation of the Portable X-Ray Fluorescence Spectrometer for the Measurement of Lead in Paint Films
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1375-92(1999) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM F1375-92(2020) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry

Professional Standard - Electron, X-ray photoelectron spectrometer and energy spectrometer

SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray photoelectron spectrometer and energy spectrometer

GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）

KR-KS, X-ray photoelectron spectrometer and energy spectrometer

KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

National Metrological Technical Specifications of the People's Republic of China, X-ray photoelectron spectrometer and energy spectrometer

JJF 2024-2023

工业和信息化部/国家能源局, X-ray photoelectron spectrometer and energy spectrometer

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques

Association Francaise de Normalisation, X-ray photoelectron spectrometer and energy spectrometer

NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
NF X31-013:2013 Soil quality - Screening soils for selected elements by energy dispersive X-ray fluorescence spectrometry using a handheld or portable instrument
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif
NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
NF X31-013*NF EN ISO 13196:2015 Soil quality - Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument

Standard Association of Australia （SAA）, X-ray photoelectron spectrometer and energy spectrometer

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

IN-BIS, X-ray photoelectron spectrometer and energy spectrometer

IS 12737-1988

Japanese Industrial Standards Committee (JISC), X-ray photoelectron spectrometer and energy spectrometer

JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters
JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Group Standards of the People's Republic of China, X-ray photoelectron spectrometer and energy spectrometer

T/CSTM 00962-2022 Evaluation method for spectrometer performance of spark discharge atomic emission

国家市场监督管理总局、中国国家标准化管理委员会, X-ray photoelectron spectrometer and energy spectrometer

GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
GB/T 40196-2021 Method for analysing CCA and ACQ in preservative-treated wood and wood preservatives by X-ray fluorescence spectroscopy
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films

Professional Standard - Machinery, X-ray photoelectron spectrometer and energy spectrometer

JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect

European Committee for Standardization (CEN), X-ray photoelectron spectrometer and energy spectrometer

EN ISO 13196:2015 Soil quality - Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument (ISO 13196:2013)
prEN ISO 13196 rev Soil quality — Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument

Danish Standards Foundation, X-ray photoelectron spectrometer and energy spectrometer

DS/ISO 13196:2013 Soil quality - Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument

ES-UNE, X-ray photoelectron spectrometer and energy spectrometer

UNE-EN ISO 13196:2015 Soil quality - Screening soils for selected elements by energy-dispersive X-ray fluorescence spectrometry using a handheld or portable instrument (ISO 13196:2013) (Endorsed by AENOR in September of 2015.)