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Electron probes are non-destructive

Electron probes are non-destructive, Total:184 items.

In the international standard classification, Electron probes are non-destructive involves: Analytical chemistry, Electrical accessories, Non-destructive testing, Optics and optical measurements, Farming and forestry, Vocabularies, Electrical and electronic testing, Protection against fire, Optical equipment, Radiation measurements, Insulating fluids, Semiconducting materials, Aerospace electric equipment and systems, Electricity. Magnetism. Electrical and magnetic measurements, On-board equipment and instruments, Electromechanical components for electronic and telecommunications equipment, Test conditions and procedures in general, Welding, brazing and soldering, Testing of metals, Environmental protection, Fruits. Vegetables, Nuclear energy engineering, Thermodynamics and temperature measurements, Pipeline components and pipelines, Electrical engineering in general.

CZ-CSN, Electron probes are non-destructive

CSN ON 81 3790-1966 Electric feeler
CSN ON 81 3791-1966 Holder of electric íeeler
CSN ISO 9764:1994 Nondestructive testing. Electric resistance and induction welded steel tubes for pressure purposes. Ultrasonic testing of weld seam for the detection of longitudinal imperfections

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron probes are non-destructive

GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
GB/T 15075-1994 Method for testing EPMA instrument
GB/T 15074-2008 General guide of quantitative analysis by EPMA
GB/T 15074-1994 General guide for EPMA quantitative analysis
GB/T 15244-2002 Quantitative analysis of glass by electron probe microanalysis
GB/T 21636-2008 Microbeam analysis.Electron probe microanalysis (EPMA).Vocabulary
GB/T 17363-1998 Method of quantitative electron probe microanalysis on gold products
GB/T 15617-2002 Quantitative analysis of silicate minerals by electron probe microanalysis
GB/T 15245-2002 Quantitative analysis of rare earth element(REE) oxides by electron probe microanalysis(EPMA)
GB/T 15246-2002 Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 4930-1993 General specification of electron probe microanalysis standard specimen
GB/T 15616-1995 Qantitative method for electron probe microanalysis of metals and alloys
GB/T 15616-2008 Quantitative method for electron probe microanalysis of metals and alloys
GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
GB/T 17366-1998 Methods of mineral and rock specimen preparation for EPMA
GB/T 17360-1998 Method of quantitative electron probe microanalysis on low contents of Si and Mn in steels
GB/T 17506-1998 The method of electron probe micro analysis as corrosive layer on ferrous metals of ship
GB/T 17360-2008 Quantitative analysis method of low content Si and Mn in steel with electron probe microanalysis
GB/T 17506-2008 The analysis method of corrosive layer on ferrous metals of ship with EPMA
GB/T 20725-2006 Electron probe microanalysis guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
GB/T 26830-2011 Non-destructive testing instruments.High frequency constant potential X-ray equipment
GB/T 20129-2006 Electron linac for non-destructive testing
GB/T 20129-2015 Electron linear accelerator for non-destructive testing
GB/T 17365-1998 Method of preparation for samples of metal and alloy in electron probe microanalysis
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 32055-2015 Microbeam analysis.Electron probe microanalysis.Methods for elemental-mapping analysis using wavelengthdispersive spectroscopy
GB/T 4930-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for the specification of certified reference materials(CRMs)
GB/T 30705-2014 Microbeam analysis.Electron probe microanalysis.Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 14141-2009 Test method for sheet resistance of silicon epitaxial,diffused and ion-implanted layers using a collinear four-probe array
GB/T 30371-2013 Standard of electron linear accelerator engineering for non-destructive testing
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis

American National Standards Institute （ANSI), Electron probes are non-destructive

ANSI/EIA 364-25C:1998 Electric Connectors – Probe Damage Test Procedure
ANSI/EIA 364-25D:2010 Probe Damage Test Procedure for Electrical Connectors

Professional Standard - Military and Civilian Products, Electron probes are non-destructive

WJ 2297-1995 Electronic Probe Verification Regulations

Society of Automotive Engineers (SAE), Electron probes are non-destructive

SAE TS351-1-1985 TS351 Test for Electrical Connectors Test Probe Damage
SAE ARP1333-1991 NONDESTRUCTIVE TESTING OF ELECTRON BEAM WELDED JOINTS IN TITANIUM-BASE ALLOYS

National Metrological Verification Regulations of the People's Republic of China, Electron probes are non-destructive

JJG(地质) 1017-1990 Verification Regulations for Electronic Probe Instrument
JJG 901-1995 Verification Regulation of Electron Probe Microanalyzer

British Standards Institution (BSI), Electron probes are non-destructive

BS EN ISO 15548-2:2008 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
BS EN ISO 15548-2:2013 Non-destructive testing. Equipment for eddy current examination. Probe characteristics and verification
BS EN 13860-2:2003 Non destructive testing - Eddy current examination - Equipment characteristics and verification - Probe characteristics and verification
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
BS EN 2591-415:2001 Elements of electrical and optical connection - Test methods - Test probe damage (female contacts)
BS EN 2591-6415:2002 Elements of electrical and optical connection. Test methods - Optical elements. Test probe damage
BS EN 2591:6415:2002 Elements of electrical and optical connection - Test methods - Optical elements - Test probe damage
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS IEC 62976:2017 Industrial non-destructive testing equipment. Electron linear accelerator
BS EN IEC 62976:2019+A1:2022 Industrial non-destructive testing equipment. Electron linear accelerator
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS EN 10246-10:2000 Non-destructive testing of steel tubes - Radiographic testing of the weld seam of automatic fusion arc welded steel tubes for the detection of imperfections
21/30430903 DC BS IEC 62976 AMD1. Industrial non-destructive testing equipment. Electron linear accelerator
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
17/30345380 DC BS ISO 2100-415. Aerospace elements of electrical and optical connection. Test methods - Part 415. Test probe damage (female contact)
BS EN 10246-8:2000 Non-destructive testing of steel tubes - Automatic ultrasonic testing of the weld seam of electric welded steel tubes for the detection of longitudinal imperfections
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
17/30345560 DC BS ISO 2100-6415. Aerospace elements of electrical and optical connection. Test methods. Part 6415. Optical elements. Test probe damage
BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations — Test 16a: Probe damage

ECIA - Electronic Components Industry Association, Electron probes are non-destructive

RS-364-25A-1983 TP-25A Probe Damage Test Procedure for Electrical Connectors
EIA-364-25C-1998 TP-25C Probe Damage Test Procedure for Electrical Connectors (FSC 5935; Should Be Used Instead of MIL-STD-1344@ Method 2006.1)

Japanese Industrial Standards Committee (JISC), Electron probes are non-destructive

JIS Z 2316-3:2014 Non-destructive testing -- Eddy current testing -- Part 3: Probe characteristics and verification
JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy

International Organization for Standardization (ISO), Electron probes are non-destructive

ISO 15548-2:2008 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
ISO 18563-2:2017 Non-destructive testing - Characterization and verification of ultrasonic phased array equipment - Part 2: Probes
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product

European Committee for Standardization (CEN), Electron probes are non-destructive

EN ISO 15548-2:2013 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification
EN ISO 18563-2:2017 Non-destructive testing - Characterization and verification of ultrasonic phased array equipment - Part 2: Probes
EN ISO 15548-2:2008 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification [Superseded: CEN EN 13860-2]
EN 12668-2:2001 Non-destructive testing - Characterization and verification of ultrasonic examination equipment - Part 2: Probes Includes amendment A1:2004
EN 2591-415:2001 Aerospace series - Elements of electrical and optical connection; Test methods - Part 415: Test probe damage (female contacts)
EN 2591-6415:2001 Aerospace series - Elements of electrical and optical connection; Test methods - Part 6415: Optical elements; Test probe damage

German Institute for Standardization, Electron probes are non-destructive

DIN EN ISO 15548-2:2009 Non-destructive testing - Equipment for eddy current examination - Part 2: Probe characteristics and verification (ISO 15548-2:2008); English version of DIN EN ISO 15548-2:2009-01
DIN EN ISO 9934-2:2003 Non-destructive testing - Magnetic particle testing - Part 2: Detection media (ISO 9934-2:2002); German version EN ISO 9934-2:2002
DIN 6800-1:2016 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6801-1:2019-09 Procedures of dosimetry with probe-type detectors for proton and ion radiation - Part 1: Ionization chambers
DIN EN 60512-16-1:2009-03 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008); German version EN 60512-16-1:2008 / Note: DIN IEC 60512-8 (1994-05) remains valid al...
DIN 6800-1:1980 Procedures in dosimetry; principles of photon and electron dosimetry with probe-type detectors
DIN 6800-2:2020-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
DIN 6800-1:2016-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 1: General
DIN 6800-4:2000-12 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-4:2000 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 4: Film dosimetry
DIN 6800-5:2005 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 5: Thermoluminescence dosimetry
DIN 54191:2009 Non-destructive testing - Thermographic testing of electric installations
DIN IEC 62976:2017 Industrial non-destructive testing equipment - Electron linear accelerator (IEC 62976:2017)
DIN EN ISO 9934-2:2015 Non-destructive testing - Magnetic particle testing - Part 2: Detection media (ISO 9934-2:2015); German version EN ISO 9934-2:2015

Jiangsu Provincial Standard of the People's Republic of China, Electron probes are non-destructive

DB32/T 4378-2022 Four-probe method for non-destructive testing of sheet resistance of nanometer and submicron scale thin films on substrate surface

Korean Agency for Technology and Standards (KATS), Electron probes are non-destructive

KS D ISO 23833:2012 Microbeam analysis-Electron probe microanalysis(EPMA)-Vocabulary
KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 23833:2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method

Professional Standard - Petroleum, Electron probes are non-destructive

SY/T 6027-2012 Quantitative analysis method of rock and mineral by electron probe microanalysis
SY/T 6027-1994 Electron Probe Quantitative Analysis Method for Oxygenated Minerals

国家能源局, Electron probes are non-destructive

SY/T 6027-2019 Electron probe quantitative analysis method of rock minerals

Taiwan Provincial Standard of the People's Republic of China, Electron probes are non-destructive

CNS 7664-1987 Method of Test for Low Frequency (Below 3 MHz)Electrical Connectors (TP - 25 Probe Damage Test)

KR-KS, Electron probes are non-destructive

KS D ISO 23833-2022 Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary
KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy

Yunnan Provincial Standard of the People's Republic of China, Electron probes are non-destructive

DB53/T 443-2012 Fire technical appraisal method Electron probe analysis method

国家市场监督管理总局、中国国家标准化管理委员会, Electron probes are non-destructive

GB/T 21636-2021 Microbeam analysis—Electron probe microanalysis (EPMA)—Vocabulary
GB/T 4930-2021 Microbeam analysis—Electron probe microanalysis—Guidelines for the specification of certified reference materials (CRMs)
GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer

ES-UNE, Electron probes are non-destructive

UNE-EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements -- Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (Endorsed by AENOR in November of 2008.)
UNE-EN IEC 62976:2019/A1:2022 Industrial non-destructive testing equipment - Electron linear accelerator (Endorsed by Asociación Española de Normalización in January of 2023.)
UNE-EN IEC 62976:2019 Industrial non-destructive testing equipment - Electron linear accelerator (Endorsed by Asociación Española de Normalización in July of 2019.)
UNE-EN 2591-415:2001 Aerospace series. Elements of electrical and optical connection. Test methods. Part 415: Test probe damage (female contacts) (Endorsed by AENOR in April of 2002.)
UNE-EN 2591-6415:2001 Aerospace series. Elements of electrical and optical connection. Test methods. Part 6415: Optical elements. Test probe damage (Endorsed by AENOR in February of 2002.)

Professional Standard - Machinery, Electron probes are non-destructive

JB/T 12074-2014 Quantitative analysis of composition metal.Electron probe microanalysis
JB/T 7411-2012 Non-destructive testing instruments.Specification of electricity magnetic yoke magnetic particle flaw detector
JB/T 6221-2012 Non-destructive testing instruments - The electric general specification for industrial X-ray apparatus

Association Francaise de Normalisation, Electron probes are non-destructive

NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF C93-400-16-1*NF EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1 : mechanical tests on contacts and terminations - Test 16a : probe damage
NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
NF A09-326:1987 Non-destructive testing - Ultrasonic testing - Method of evaluation under working of ultrasonic beam characteristics of contact probe
NF A89-520:2011 Non-destructive testing of welds - Ultrasonic testing - Techniques, testing levels and assessment.
NF EN 60512-16-1:2008 Connecteurs pour équipements électroniques - Essais et mesures - Partie 16-1 : essais mécaniques des contacts et des sorties - Essai 16a : endommagement par sonde d'essai
NF C19-600*NF EN IEC 62976:2019 Industrial non-destructive testing equipment - Electron linear accelerator
NF EN IEC 62976/A1:2022 Appareils destinés aux essais non destructifs pour le secteur industriel - Accélérateur électronique linéaire
NF EN IEC 62976:2019 Appareils destinés aux essais non destructifs pour le secteur industriel - Accélérateur électronique linéaire
NF L54-002-132*NF EN 2591-6415:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415 : optical elements - Test probe damage
NF L54-002-058*NF EN 2591-415:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 415 : test probe damage (female contacts)
NF EN 2591-415:2002 Série aérospatiale - Organes de connexion électrique et optique - Méthodes d'essais - Partie 415 : endommagement par sonde d'essai (contacts femelles)
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF EN 2591-6415:2002 Série aérospatiale - Organes de connexion électrique et optique - Méthodes d'essais - Partie 6415 : organes optiques - Endommagement par sonde d'essai

工业和信息化部, Electron probes are non-destructive

JB/T 14223-2021 Non-destructive testing instrument Rechargeable AC yoke flaw detector

National Metrological Technical Specifications of the People's Republic of China, Electron probes are non-destructive

JJF 1029-1991 The Technical Norm for Development of Certified Reference Materied Used in Quantitative Analysis of Electron Microprobe

Professional Standard - Aviation, Electron probes are non-destructive

HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys

Electronic Components, Assemblies and Materials Association, Electron probes are non-destructive

ECA EIA-364-25C-1998 TP-25C Probe Damage Test Procedure for Electrical Connectors

US-FCR, Electron probes are non-destructive

FCR NE-F-11-4T-1972 DETERMINATION OF A FIGURE OF MERIT FOR PUO2-UO2 FUEL PELLET HOMOGENEITY BY USE OF AN ELECTRON MICROPROBE (INACTIVE FOR NEW DESIGN)

Group Standards of the People's Republic of China, Electron probes are non-destructive

T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method
T/SPSTS 018-2021 Environmentally friendly lithium-ion battery factory specifications
T/CSEE 0116-2019 Technical specification for detection of surface charge of pot insulators for GIS by passive static capacitance probe method

Danish Standards Foundation, Electron probes are non-destructive

DS/EN 60512-16-1:2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage
DS/EN 2591-415:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contacts)
DS/EN 2591-6415:2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage

Lithuanian Standards Office , Electron probes are non-destructive

LST EN 60512-16-1-2008 Connectors for electronic equipment - Tests and measurements - Part 16-1: Mechanical tests on contacts and terminations - Test 16a: Probe damage (IEC 60512-16-1:2008)
LST EN 2591-415-2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 415: Test probe damage (female contacts)
LST EN 2591-6415-2002 Aerospace series - Elements of electrical and optical connection - Test methods - Part 6415: Optical elements - Test probe damage

能源部, Electron probes are non-destructive

SY/T 5449-1992 Non-destructive testing method for oil well pipes: electromagnetic induction flaw detection of drill pipe body

Fujian Provincial Standard of the People's Republic of China, Electron probes are non-destructive

DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

CO-ICONTEC, Electron probes are non-destructive

ICONTEC 1031-1981

PL-PKN, Electron probes are non-destructive

PN G03351-1991 Cable terminals, probe heads, well logging heads. Types, principal parameters, dimensions, technical requirements

European Association of Aerospace Industries, Electron probes are non-destructive

AECMA PREN 2591-D15-1992 Aerospace Series Elements of Electrical and Optical Connection Test Methods Part D15 - Test Probe Damage (Female Contact) Issue P 1

International Electrotechnical Commission (IEC), Electron probes are non-destructive

IEC 62976:2017 Industrial non-destructive testing equipment - Electron linear accelerator
IEC 62976:2017/AMD1:2021 Industrial non-destructive testing equipment - Electron linear accelerator
IEC 62976:2017+AMD1:2021 CSV Industrial non-destructive testing equipment - Electron linear accelerator
IEC 62976:2021 Industrial non-destructive testing equipment - Electron linear accelerator

CENELEC - European Committee for Electrotechnical Standardization, Electron probes are non-destructive

EN IEC 62976:2019 Industrial non-destructive testing equipment - Electron linear accelerator

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron probes are non-destructive

GB/T 33886-2017 Non-destructive testing instruments—Industrial electronic endoscopic detector

SAE - SAE International, Electron probes are non-destructive

SAE ARP1333A-2007 Nondestructive Testing of Electron Beam Welded Joints in Titanium-Base Alloys

American Society for Testing and Materials (ASTM), Electron probes are non-destructive

ASTM E2730-21 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-22 Standard Guide for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10(2015)e1 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits
ASTM E2730-10 Standard Practice for Calibration and Use of Thermocouple Reference Junction Probes in Evaluation of Electronic Reference Junction Compensation Circuits

CEN - European Committee for Standardization, Electron probes are non-destructive

EN ISO 14270:2001 Specimen Dimensions and Procedure for Mechanized Peel Testing Resistance Spot@ Seam and Embossed Projection Welds

ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, Electron probes are non-destructive

PREN 2591-D15-1992 Aerospace Series Elements of Electrical and Optical Connection Test Methods Part D15 - Test Probe Damage (Female Contact) (Issue P 1)

Aerospace, Security and Defence Industries Association of Europe (ASD), Electron probes are non-destructive

ASD-STAN PREN 2591-FD15-1993 Aerospace Series Elements of Electrical and Optical Connection Test Methods Part FD15 - Optical Elements - Test Probe Damage (Edition P 1)