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quartz crystal

quartz crystal, Total:499 items.

In the international standard classification, quartz crystal involves: Electronic components in general, Piezoelectric and dielectric devices, Optics and optical measurements, Non-metalliferous minerals, Electric filters, Adhesives, Insulating fluids, Aerospace engines and propulsion systems, Horology, Measurement of force, weight and pressure, Vocabularies, Products of the chemical industry, Mechanical structures for electronic equipment, Corrosion of metals, Gas and steam turbines. Steam engines, Fuels.


Korean Agency for Technology and Standards (KATS), quartz crystal

  • KS C 6506-1983 Synthetic Quartz Crysta1
  • KS C 6506-1983(2008) Synthetic Quartz Crysta1
  • KS C 6503-1999 Quartz crystal units for oscillators
  • KS C 6503-1984 Quartz crystal units for oscillators
  • KS C 6504-1987(2017) Ovens for Quartz Crystal Units
  • KS C IEC 60679-2:2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2023 Quartz Crystal Oscillator Part 2: A Guide to Using a Quartz Crystal Oscillator
  • KS C 6509-1991 General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6508-2013 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C 6509-1991(2011) General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6504-1987(2022) Ovens for Quartz Crystal Units
  • KS C IEC 60444-8:2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
  • KS C 6504-1987 Ovens for Quartz Crystal Units
  • KS C 6508-1990 Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C IEC 60444-8-2016(2021) Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
  • KS C IEC 60444-7-2016(2021) Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
  • KS C 6503-1999(2009) QUARTZ CRYSTAL UNITS FOR OSCILLATORS
  • KS C IEC 60122-2-2003(2018)
  • KS C IEC 60444-7:2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
  • KS C IEC 61080:2018 Guide to the measurement of equivalent electrical parameters of quartz crystal units
  • KS C IEC 60758:2018 Synthetic quartz crystal – Specifications and guidelines for use
  • KS C IEC 61080-2023 Quartz Crystal Equivalent Electrical Parameter Measurement Guide
  • KS C IEC 60758-2023 Synthetic Quartz Crystal Specifications and Usage Guide
  • KS C IEC 60122-2-1-2011(2021) Quartz crystal units for frequency control and selection-Part 2:Guide to the use of quartz crystal units for frequency control and selection-Section one:Quartz crystal units for microprocessor clock s
  • KS C IEC 60122-2-1-2011(2016) Quartz crystal units for frequency control and selection-Part 2:Guide to the use of quartz crystal units for frequency control and selection-Section one:Quartz crystal units for microprocessor clock s
  • KS C 6509-2013 General Rules of Quartz Crystal Controlled Oscillators
  • KS C 6508-1990(2010) Quartz Crystal Units for Oscillators (for 200∼1000kHz)
  • KS C IEC 60444-2-2002(2017) Measurement of quartz crystal unit parameters by zero phase technique in a p-network-Part 2:Phase offset method for measurement of motional capacitance of quartz crystal units
  • KS C IEC 60444-2-2002(2022) Measurement of quartz crystal unit parameters by zero phase technique in a p-network-Part 2:Phase offset method for measurement of motional capacitance of quartz crystal units
  • KS C IEC 60679-6:2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2023 Qualified Quartz Crystal Oscillators Part 6: Application Guidelines for Phase Jitter Measurement Methods for Quartz Crystal Oscillators and Surface Acoustic Wave Oscillators
  • KS C IEC 60122-1:2022 Quartz crystal units of assessed quality — Part 1: Generic specification
  • KS C IEC 60122-1:2018 Quartz crystal units of assessed quality — Part 1: Generic specification
  • KS C IEC 60122-4:2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, quartz crystal

  • GB/T 3352-1994 Synthetic quartz crystal
  • GB/T 3351~353-1982 artificial quartz crystal
  • GB/T 6628-1996 Lumbered synthetic quartz crystal
  • GB/T 7895-1987 Optical grade synthetic quartz crystal
  • GB/T 7895-2008 Optical grade synthetic quartz crystal
  • GB 12274-1990 Quartz crystal controlled oscillators Generic specificatoin for
  • GB/T 3353-1995 Guide to the use of synthetic quartz crystal
  • GB/T 22319.7-2015 Measurement of quartz crystal unit parameters.Part 7:Measurement of activity dips of quartz crystal units
  • GB/T 3351-1982 Designations for synthetic quartz crystals
  • GB/T 22319.8-2008 Measurement of quartz crystal unit parameters.Part 8:Test fixture for surface mounted quartz crystal units
  • GB/T 7896-1987 Testing method for optical--Grade synthetic quartz crystal
  • GB/T 7896-2008 Test method for optical grade synthetic quartz crystal
  • GB/T 15020-1994 Quartz crystal units for use in electronic equipment.Bland detail specification for.Resistance welded quartz crystal units.Assessment level E
  • GB/T 12275-1990 The rule of type designation for quarz crystal oscillators
  • GB 12275-1990 Quartz Crystal Oscillator Model Nomenclature
  • GB/T 3352-2012 Synthetic quartz crystal.Specifications and guide to the use
  • GB/T 6627-1986 Designation for lumbered synthetic quartz crystal
  • GB/T 11113-1989 Analytical method for impurities in the synthetic quartz crystal
  • GB 6627-1986 Artificial Quartz Crystal Rod Model Nomenclature
  • GB 6627-1986 Artificial Quartz Crystal Rod Model Nomenclature
  • GB 6627-1986 Artificial Quartz Crystal Rod Model Nomenclature
  • GB/T 12274-1990 Quartz crystal controlled oscillators--Generic specification for
  • GB/T 11114-1989 Method for detecting dislocations of synthetic quartz using X-ray topographic technique
  • GB/T 12274.1-2012 Quartz crystal controlled oscillators of assessed quality.Part 1:Generic specification

Japanese Industrial Standards Committee (JISC), quartz crystal

TR-TSE, quartz crystal

  • TS 2319-1976 Quartz Crystal Units For Oscilators
  • TS 2268-1976 Quartz Crystal Unit Holders For Oscillators And Pin Connectiors

Professional Standard - Electron, quartz crystal

  • SJ/T 11199-1999 Piezoelectric quartz crystal blanks
  • SJ/Z 9155.2-1987 Quartz crystal oscillator Part 2: Guide to the use of quartz crystal oscillator
  • SJ/T 10639-1995 Quartz crystal unit terms
  • SJ/T 10638-1995 Measurement methods for quartz crystal oscillators
  • SJ 2592-1985 Quartz crystal monolithic filters for Type LSP10.7MA(~E)
  • SJ 52138.1-1995 Crystal unit,quartz,type JA 538,detail specification for
  • SJ/Z 9570.1-1995 Quartz crystal component quality grading standard
  • SJ/T 9570.1-1995 Quality grading standard for quartz crystal units
  • SJ 20110-1992 Filters,quartz crystal,Type LST60MA,detail specification for
  • SJ/Z 9158-1987 Temperature control unit for quartz crystal elements
  • SJ/T 9570.3-1995 Quality grading standard for quartz crystal oscillators
  • SJ 51508/1-1994 Filter,quartz crystal,Type LST60.02M,detail specification for
  • SJ 51508/2-1994 Filter,quartz crystal,Type LST42.02M,detail specification for
  • SJ 51508/6-1996 Filters,quartz crystal,type LST21.4M,detail specification for
  • SJ 51508/7-1996 Filters,quartz crystal,type LST25.0425M,detail specification for
  • SJ/Z 9152.2-1987 Quartz crystal elements for frequency control and selection Part 2: Guide to the use of quartz crystal elements for frequency control and selection
  • SJ/T 9570.2-1995 Quality grading standard for quartz crystal monolithic filters
  • SJ 51508.4-1995 Filter,quartz crystal,sideband,type LSB1.4M,detail specification for
  • SJ 51508.5-1995 Filter,quartz crystal,monolithic,type LSP21.4M,detail specification for
  • SJ 51508/8-1999 Filter,quartz crystal,monolithic,type LP12,detail specification for
  • SJ/T 10015-1991 32kHz tuning fork quartz crystal units for clocks and watches type JU38 and JU26
  • SJ/Z 9154.2-1987 Use the zero phase technique in π-network to measure the quartz crystal unit parameters Part 2: Phase offset method for measurement of dynamic capacity of quartz crystal elements
  • SJ 51508/3-1994 Filter,quartz crystal,Type LSP10.7M(1~3),detail specification for
  • SJ/Z 9154.1-1987 Use the zero phase technique in π-network to measure the quartz crystal unit parameters Part 1: Basic method for measurement of resonance frequency and resonance resistance of quartz crystal elements
  • SJ/T 10015-2013 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
  • SJ/T 11256-2001 Quartz crystal ctratal controlled oscillators of assessed quality Part 1:Generic specification
  • SJ/Z 9162-1987 Measuring methods, test methods and standard values of 32KHz quartz crystal elements for wrist watches
  • SJ/T 31490-1995 Comparable unit output energy consumption quota for piezoelectric quartz crystal manufacturing products
  • SJ/T 11210-1999 Measurement of quartz crystal unit parameters.Part4:Method for the measurement of the load resonance frequency fL,load resonance resistance RL and the calculation of other derived values of quartz crystal units,up to 30MHz

ES-UNE, quartz crystal

  • UNE-EN 168100:1993 SS: QUARTZ CRYSTAL UNITS. (Endorsed by AENOR in November of 1996.)
  • UNE-EN 168200/A1:1993 SS: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 168200:1993 SS: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in September of 1996.)
  • UNE-EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units (Endorsed by Asociación Española de Normalización in May of 2017.)
  • UNE-EN 60444-7:2004 Measurement of queartz crystal unit parameters -- Part 7: Measurement of activity and frequency dips of quartz crystal units (Endorsed by AENOR in September of 2004.)
  • UNE-EN 60758:2016 Synthetic Quartz Crystal - Specifications and guidelines for use (Endorsed by AENOR in November of 2016.)
  • UNE-EN 168201:1992 BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (QUALIFICATION APPROVAL). (Endorsed by AENOR in November of 1997.)
  • UNE-EN 168101:1992 BLANK DETAIL SPECIFICATION: QUARTZ CRYSTAL UNITS (CAPATIBILITY APPROVAL). (Endorsed by AENOR in November of 1997.)
  • UNE-EN 60444-2:1997 MEASUREMENT OF QUARTZ CRYSTAL UNIT PARAMETERS BY ZERO PHASE IN A PI-NETWORK. PART 2: PHASE OFFSET METHOD FOR MEASUREMENT OF MOTIONAL CAPACITANCE OF QUARTZ CRYSTAL UNITS (Endorsed by AENOR in October of 1997.)
  • UNE-EN 60122-1:2002/A1:2018 Quartz crystal units of assessed quality - Part 1: Generic specification (Endorsed by Asociación Española de Normalización in May of 2018.)
  • UNE-EN 60122-1:2002 Quartz crystal units of assessed quality -- Part 1: Generic specification (Endorsed by AENOR in March of 2003.)
  • UNE-EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (Endorsed by Asociación Española de Normalización in May of 2019.)
  • UNE-EN 60689:2009 Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values (Endorsed by AENOR in June of 2009.)

工业和信息化部, quartz crystal

International Electrotechnical Commission (IEC), quartz crystal

  • IEC 60679-2:1981 Quartz crystal controlled oscillators. Part 2 : Guide to the use of quartz crystal controlled oscillators
  • IEC 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
  • IEC 60444-8:2016 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
  • IEC 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
  • IEC 60758:1993 Synthetic quartz crystal; specifications and guide to the use
  • IEC 60758:2008 Synthetic quartz crystal - Specifications and guidelines for use
  • IEC 60758:2004 Synthetic quartz crystal - Specifications and guide to the use
  • IEC 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
  • IEC 60122-2-1:1991 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; section 1: quartz crystal units for microprocessor clock supply
  • IEC 60314:1970 Temperature control devices for quartz crystal units
  • IEC 60122-2-1:1991/AMD1:1993 Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for mi
  • IEC 60122-2:1983 Quartz crystal units for frequency control and selection. Part 2 : Guide to the use of quartz crystal units for frequency control and selection
  • IEC 61080:1991 Guide to the measurement of equivalent electrical parameters of quartz crystal units
  • IEC 60758/AMD2:2001 Synthetic quartz crystal - Specifications and guide to the use; Amendment 2
  • IEC PAS 60679-6:2008 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60444-2:1980 Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2 : phase offset method for measurement of motional capacitance of quartz crystal units
  • IEC 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide
  • IEC 60314/AMD1:1979 Temperature control devices for quartz crystal units
  • IEC 60122-1:2002+AMD1:2017 CSV Quartz crystal units of assessed quality - Part 1: Generic specification
  • IEC 60679-1:1997 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • IEC 60122-1:2002 Quartz crystal units of assessed quality - Part 1: Generic specification
  • IEC 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • IEC 60679-3:1989 Quartz crystal controlled oscillators; part 3: standard outlines and lead connections
  • IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
  • IEC 60679-1/AMD1:2002 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification; Amendment 1
  • IEC 60689:1980 Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values
  • IEC 60122-1:2002/AMD1:2017 Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
  • IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

National Metrological Verification Regulations of the People's Republic of China, quartz crystal

  • JJG 181-2005 Quartz Crystal Frequency Standards
  • JJG 809-1993 Verification Regulation of Digital Temperature Indicators with Quartz Crystal Sensors
  • JJG 180-2002 Verification Regulation of Crystal Oscillators inside the Electrical Measuring Instruments
  • JJG(轻工) 76-1991 SCI 327 Quartz Crystal Impedance Meter SPM 327PPM Counter Verification Regulations

Military Standard of the People's Republic of China-General Armament Department, quartz crystal

  • GJB 1787-1993 Specifications for Artificial Quartz Crystals
  • GJB 1942-1994 Specification for fused quartz for artificial quartz crystals
  • GJB 2138-1994 General specification for quartz crystal components
  • GJB 2138A-2015 General specification for quartz crystal components
  • GJB 1508-1992 General specification for quartz crystal filters
  • GJB 2138/4-2011 Detail specification for type JA500 quartz crystal unit
  • GJB 960-1990 Artificial quartz crystal substrate for surface acoustic wave devices
  • GJB/Z 45.1-1993 Military piezoelectric device series spectrum quartz crystal components
  • GJB/Z 45.1A-2021 Military Piezoelectric Device Series Type Spectrum Part 1: Quartz Crystal Components
  • GJB 960A-2020 Specification for artificial quartz crystal substrates for long-delay surface acoustic wave devices

KR-KS, quartz crystal

  • KS C IEC 60679-2-2018 Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60679-2-2018(2023) Quartz crystal controlled oscillators — Part 2: Guide to the use of quartz crystal controlled oscillators
  • KS C IEC 60444-8-2016 Measurement of quartz crystal unit parameters ― Part 8: Test fixture for surface mounted quartz crystal units
  • KS C IEC 61080-2018 Guide to the measurement of equivalent electrical parameters of quartz crystal units
  • KS C IEC 60758-2018 Synthetic quartz crystal – Specifications and guidelines for use
  • KS C IEC 60758-2018(2023) Synthetic quartz crystal – Specifications and guidelines for use
  • KS C IEC 60444-7-2016 Measurement of quartz crystal unit parameters ― Part 7: Measurement of activity and frequency dips of quartz crystal units
  • KS C IEC 61080-2018(2023) Guide to the measurement of equivalent electrical parameters of quartz crystal units
  • KS C IEC 60679-6-2018(2023) Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60679-6-2018 Quartz crystal controlled oscillators of assessed quality — Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guidelines
  • KS C IEC 60122-1-2022 Quartz crystal units of assessed quality — Part 1: Generic specification
  • KS C IEC 60122-1-2018 Quartz crystal units of assessed quality — Part 1: Generic specification
  • KS C IEC 60122-4-2022 Quartz crystal units of assessed quality —Part 4: Crystal units with thermistors

Group Standards of the People's Republic of China, quartz crystal

German Institute for Standardization, quartz crystal

  • DIN IEC 60679-2:1997 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN 60444-8:2017-11 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017 / Note: DIN EN 60444-8 (2004-03) remains valid alongside this standard until 2020-01-19.
  • DIN IEC 60679-2:1997-09 Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
  • DIN EN 60444-8:2004 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003); German version EN 60444-8:2003
  • DIN EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
  • DIN EN 60444-7:2004-11 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
  • DIN EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2008); German version EN 60758:2009
  • DIN EN 168100:1993 Sectional specification: quartz crystal units (capability approval) (includes amendments A1 and A2:1993); German version EN 168100:1993
  • DIN EN 168200:1993 Sectional specification; quartz crystal units (qualification approval); German version EN 168200:1993
  • DIN EN 60758:2017-04 Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016 / Note: DIN EN 60758 (2009-05) remains valid alongside this standard until 2019-10-07.
  • DIN IEC 60122-2-1:1992 Quartz crystal units for frequency control and selection; part 2: guide to use of quartz crystal units for frequency control and selection; Section one: quartz crystal units for microprocessor clock supply; identical with IEC 60122-2-1:1991
  • DIN IEC 60122-2:1993 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
  • DIN EN 168200:1993-10 Sectional specification; quartz crystal units (qualification approval); German version EN 168200:1993
  • DIN EN 168101:1992-09 Blank detail specification; quartz crystal units (capability approval); german version EN 168101:1992
  • DIN EN 169200:1996-05 Sectional specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169200:1995
  • DIN EN 168201:1992-09 Blank detail specification; quartz crystal units (qualification approval); german version EN 168201:1992
  • DIN EN 60444-2:1997 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
  • DIN IEC 60122-2:1993-09 Quartz crystal units for frequency control and selection; part 2: guide to the use of quartz crystal units for frequency control and selection; identical with IEC 60122-2:1983
  • DIN EN 60122-1:2003 Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002); German version EN 60122-1:2002
  • DIN EN 169201:1996-05 Blank detail specification: Quartz crystal controlled oscillators (Qualification approval); German version EN 169201:1995
  • DIN EN 60122-1:2018-08 Quartz crystal units of assessed quality - Part 1: Generic specification (IEC 60122-1:2002 + A1:2017); German version EN 60122-1:2002 + A1:2018 / Note: DIN EN 60122-1 (2003-06) remains valid alongside this standard until 2021-01-12.
  • DIN EN 60679-1:2008 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007
  • DIN EN 60679-5:1999-05 Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification; qualification approval (IEC 60679-5:1998); German version EN 60679-5:1998
  • DIN EN 168100:1993-06 Sectional specification: quartz crystal units (capability approval) (includes amendments A1 and A2:1993); German version EN 168100:1993
  • DIN IEC 61080:1993-02 Guide to the measurement of equivalent electrical parameters of quartz crystal units; identical with IEC 61080:1991
  • DIN EN 60444-2:1997-10 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
  • DIN EN IEC 60122-4:2019-10 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors (IEC 60122-4:2019); German version EN IEC 60122-4:2019
  • DIN EN 60758:2017 Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2016); German version EN 60758:2016
  • DIN EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
  • DIN EN 60444-1:2000 Measurement of quartz crystal unit parameters by zero phase technique in a -network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network (IEC 60444

British Standards Institution (BSI), quartz crystal

  • BS EN 60444-8:2003 Measurement of quartz crystal unit parameters - Test fixture for surface mounted quartz crystal units
  • BS EN 60444-8:2017 Measurement of quartz crystal unit parameters. Test fixture for surface mounted quartz crystal units
  • BS EN 60444-7:2004 Measurement of quartz crystal unit parameters - Measurement of activity and frequency dips of quartz crystal units
  • BS EN 60444-2:1997 Measurement of quartz crystal unit parameters. Phase offset method for measurement of motional capacitance of quartz crystal units
  • BS EN 60758:2005 Synthetic quartz crystal - Specifications and guide to the use
  • BS EN 60758:2009 Synthetic quartz crystal — Specifications and guidelines for use
  • BS EN 60444-2:1993 Measurement of quartz crystal unit parameters - Phase offset method for measurement of motional capacitance of quartz crystal units
  • BS EN 60122-1:2002+A1:2018 Quartz crystal units of assessed quality - Generic specification
  • BS EN 60444-4:1993 Measurement of quartz crystal unit parameters - Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
  • BS EN 60122-1:2003 Quartz crystal units of assessed quality. Generic specification
  • BS EN 60122-1:2002 Quartz crystal units of assessed quality. Generic specification
  • BS EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality. Phase jitter measurement method for quartz crystal oscillators and SAW oscillators. Application guidelines
  • BS EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality. Generic specification
  • BS EN 60444-1:1997 Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a π-network
  • BS EN 60758:2016 Tracked Changes. Synthetic quartz crystal. Specifications and guidelines for use
  • BS EN 60444-1:1993 Measurement of quartz crystal unit parameters. Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a $Gp-network
  • BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
  • BS EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Crystal units with thermistors
  • BS EN 60122-3:2011 Quartz crystal units of assessed quality. Standard outlines and lead connections
  • BS EN 60122-3:2010 Quartz crystal units of assessed quality. Standard outlines and lead connections
  • BS 9620:1975 Specification for quartz crystal oscillators of assessed quality: generic data and methods of test
  • BS EN 60444-6:2013 Measurement of quartz crystal unit parameters. Measurement of drive level dependence (DLD)
  • BS EN 60679-3:2013 Quartz crystal controlled oscillators of assessed quality. Standard outlines and lead connections

未注明发布机构, quartz crystal

  • DIN IEC 679-2:1997 Quartz crystal controlled oscillators; Part 2; Guide to the use of quartz crystal controlled oscillators
  • BS EN 168000:1996(1999) Harmonized system ofquality assessment for electronic components Generic specification : Quartz crystal units

Defense Logistics Agency, quartz crystal

SE-SIS, quartz crystal

U.S. Military Regulations and Norms, quartz crystal

IN-BIS, quartz crystal

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, quartz crystal

  • GB/T 22319.9-2018 Measurement of quartz crystal unit parameters—Part 9:Measurement of spurious resonances of piezoelectric crystal units
  • GB/T 12273.1-2017 Quartz crystal units of assessed quality—Part 1:Generic specification

PL-PKN, quartz crystal

Danish Standards Foundation, quartz crystal

  • DS/EN 60444-8:2003 Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
  • DS/EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
  • DS/EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use
  • DS/IEC 122-2-1:1993 Quartz crystal units for frequency control and selection. Part 2: Guide to the use of quartz crystal units for frequency control and selection. Section one: Quartz crystal units for microprocessor clock supply
  • DS/EN 169200:1998 Sectional Specification: Quartz crystal controlled oscillators (Qualification approval)
  • DS/EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • DS/EN 60444-2:1998 Measurement of quartz crystal unit parameters by zero phase technique in a PI-Network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
  • DS/EN 60122-1:2003 Quartz crystal units of assessed quality - Part 1: Generic specification
  • DS/EN 169201:1998 Blank Detail Specification: Quartz crystal controlled oscillators (Qualification approval)
  • DS/EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • DS/EN 60444-1/A1:2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
  • DS/EN 60444-1:1998 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

Association Francaise de Normalisation, quartz crystal

  • NF C93-621-8*NF EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
  • NF C93-621-8:2005 Measurement of quartz crystal unit parameters - Part 8 : test fixture for surface mounted quartz crystal units.
  • NF C93-621-7*NF EN 60444-7:2004 Measurement of quartz crystal unit parameters - Part 7 : measurement of activity and frequency dips of quartz crystal units
  • NF C93-632:2005 Synthetic quartz crystal - Specifications and guide to the use
  • NF C93-632:2013 Synthetic quartz crystal - Specifications and guidelines for use
  • NF C93-640-100*NF EN 168100:2013 Sectional specification : quartz crystal units (Capability Approval)
  • NF C93-632*NF EN 60758:2018 Synthetic quartz crystal - Specifications and guidelines for use
  • NF EN 60758:2018 Cristal de quartz synthétique - Spécifications et lignes directrices d'utilisation
  • NF C93-640-200*NF EN 168200:2013 Sectionnal specification : quartz crystal units (Qualification approval)
  • NF C93-640-101*NF EN 168101:2014 Blank detail specification : quartz crystal units (Capacity approval)
  • NF C93-640-201*NF EN 168201:2014 Blank detail specification: quartz crystal units (Qualification approval)
  • NF C93-620-6*NF EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6 : phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • NF C93-622*NF EN 60444-2:2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2 : phase offset method for measurement of motional capacitance of quartz crystal units.
  • NF C93-618-1/A1*NF EN 60122-1/A1:2018 Quartz crystal units of assessed quality - Part 1 : generic specification
  • NF C93-624*NF EN 60444-4:2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 4 : method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal unit
  • NF C93-618-1*NF EN 60122-1:2003 Quartz crystal units of assessed quality - Part 1 : generic specification
  • NF C93-611:1975 Components for electronic equipment. Piezoelectric devices. Quartz crystal units for oscillators.
  • NF C93-620-1:2013 Quartz crystal controlled oscillators of assessed quality - Part 1: generic specification
  • UTE C93-611U*UTE C93-611:1975 Components for electric equipment. Piezoelectric devices. Quartz crystal units for oscillators.
  • NF EN 60444-3:2001 Mesure des paramètres des quartz piézoélectriques par la technique de phase nulle dans le circuit en pi - Partie 3 : méthode fondamentale pour la mesure des paramètres à deux pôles des résonateurs à quartz à la fréquence jusqu'à 200 MHz pa...
  • NF C93-626:2001 Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependance (DLD).
  • NF C93-621*NF EN 60444-1 + A1:2000 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1 : basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

European Standard for Electrical and Electronic Components, quartz crystal

  • EN 169000:1992 Generic specification: quartz crystal controlled oscillatores
  • EN 168101:1992 Blank detail specification: quartz crystal units (capability approval)
  • EN 168201:1992 Blank detail specification: quartz crystal units (qualification approval)

Electronic Industrial Alliance (U.S.), quartz crystal

  • EIA CB6-A-1987 Guide for the Use of Quartz Crystal Units for Frequency Control
  • EIA RS-192-A-1967 Holdes Qutlines and Pin Connections for Quartz Crystal Units
  • EIA-699-1997 Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks
  • EIA-512-1985 STANDARD METH0DS FOR MEASUREMENT OF THE EQUIVALENT ELECTRICAL PARAMETERS OF QUARTZ CRYSTAL UNITS, 1 kHz to 1 GHz

ECIA - Electronic Components Industry Association, quartz crystal

  • CB6-A-1987 Guide for the Use of Quartz Crystal Units for Freqency Control
  • RS-192-A-1967 Holder Outlines and Pin Connections for Quartz Crystal Units
  • 699-1997 Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks
  • 512-1-1990 Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units@ 1 kHz to 1 GHz
  • 512-1983 Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units@ 1 kHz to 1 GHz

Professional Standard - Aerospace, quartz crystal

  • QJ 2979-1997 Detail specification for XJ33 type quartz crystal components
  • QJ 2980-1997 Detailed specifications for XJ36 quartz crystal elements
  • QJ 2981-1997 Detailed specifications for XJ39 quartz crystal elements
  • QJ 2978-1997 Detailed specifications for XJ17 quartz crystal elements
  • QJ 2929-1997 Detail specification for XJ42 type quartz crystal element
  • QJ 2931-1997 Detailed specifications for XB07 high-precision quartz crystal elements
  • QJ 2930-1997 Detailed specifications for XB87 high-precision quartz crystal elements

European Committee for Electrotechnical Standardization(CENELEC), quartz crystal

  • EN 60444-8:2017 Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
  • EN 60758:2009 Synthetic quartz crystal - Specifications and guidelines for use
  • EN 60758:2016 Synthetic quartz crystal - Specifications and guidelines for use
  • EN 60444-8:2003 Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
  • EN 60444-7:2004 Measurement of quartz crystal unit parameters Part 7: Measurement of activity and frequency dips of quartz crystal units
  • EN 169101:1993 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Capability Approval) (Remains Current)
  • EN 60679-1:2007 Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification
  • EN 60679-1:2017 Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
  • EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

CENELEC - European Committee for Electrotechnical Standardization, quartz crystal

  • EN 60758:2005 Synthetic quartz crystal Specifications and guide to the use
  • EN 169200:1995 Sectional Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
  • EN 60679-6:2011 Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines
  • EN 169201:1995 Blank Detail Specification: Quartz Crystal Controlled Oscillators (Qualification Approval)
  • EN 60679-1:1998 Quartz crystal controlled oscillators of assessed quality Part 1: Generic specification (Incorporates Amendment A1: 2002)
  • EN 168000:1993 Generic Specification: Quartz Crystal Units (Incorporates Amendments A1: 1993 and A2: 1998)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, quartz crystal

  • GJB 2138/1-2007 Detail specincation for JA533 quartz crystal resonators
  • GJB 2138/2-2007 Detail specincation for JA547 quartz crystal resonators
  • GJB 2138/3-2007 Detail specincation for JA557 quartz crystal resonators
  • GJB 2138.1-2007 Detailed specification of JA533 quartz crystal resonator
  • GJB 2138.2-2007 Detailed specification of JA547 quartz crystal resonator
  • GJB 2138.3-2007 Detailed specification of JA557 quartz crystal resonator
  • GJB 5971-2007 Specifcation for 1OMHz~100MHz band-pass monolithic quartz crystal filters

Lithuanian Standards Office , quartz crystal

  • LST EN 169000+A1-2001 Generic Specification: Quartz crystal controlled oscillators
  • LST EN 60444-8-2004 Measurement of quartz crystal unit parameters. Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2003)
  • LST EN 60444-7-2004 Measurement of quartz crystal unit parameters. Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004)
  • LST EN 168200-2002/A1-2005 Sectional specification. Quartz crystal units (qualification approval)
  • LST EN 168200-2002 Sectional specification. Quartz crystal units (qualification approval)
  • LST EN 60758-2009 Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2008)
  • LST EN 169100-2003 Sectional specification: Quartz crystal controlled oscillators (Capability approval)
  • LST EN 168201-2001 Blank detail specification. Quartz crystal units (qualification approval)
  • LST EN 168101-2001 Blank detail specification. Quartz crystal units (capability approval)
  • LST EN 169101-2003 Blank detail specification: Quartz crystal controlled oscillators (Capability approval)
  • LST EN 60444-2-2001 Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980)
  • LST EN 60679-6-2011 Quartz crystal controlled oscillators of assessed quality -- Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines (IEC 60679-6:2011)
  • LST EN 168100-2001 Sectional specification. Quartz crystal units (capability approval) (includes amendments A1 and A2:1993)

IECQ - IEC: Quality Assessment System for Electronic Components, quartz crystal

Professional Standard - Building Materials, quartz crystal

  • JC/T 471-1992 Artificial Quartz Crystal Plates for Photosensitive Detectors

国家建筑材料工业局, quartz crystal

  • JC 471-1992 Artificial quartz crystal sheet for photosensitive detectors

Electronic Components, Assemblies and Materials Association, quartz crystal

Taiwan Provincial Standard of the People's Republic of China, quartz crystal

American National Standards Institute (ANSI), quartz crystal

  • ANSI/EIA 192-A:1967 Holder Outlines and Pin Connections for Quartz Crystal Units
  • ANSI/EIA 699:1997 Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks
  • ANSI/EIA 512:1985 Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to 1 GHz, Standard Methods for Measurement of
  • ANSI/ASTM D7739:2011 Practice for Thermal Oxidative Stability Measurement via Quartz Crystal Microbalance

Electronic Components, Assemblies and Materials Association, quartz crystal

  • ECA 699-1997 Test Method for the Visual Inspection of Quartz Crystal Resonator Blanks
  • ECA CB6-A-1987 Guide for the Use of Quartz Crystal Units for Freqency Control
  • ECA 512-1-1990 Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to 1 GHz
  • ECA 512-1983 Standard Methods for Measurement of the Equivalent Electrical Parameters of Quartz Crystal Units, 1 kHz to 1 GHz

IEC - International Electrotechnical Commission, quartz crystal

  • PAS 62277-2001 Test-Fixture of Surface Mounting Quartz Crystal Units (Edition 1.0;)
  • PAS 60679-6-2008 Quartz crystal controlled oscillators of assessed quality – Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators – Application guide (Edition 1.0)

YU-JUS, quartz crystal

  • JUS N.R9.005-1977 Piezoelectric vibrators. Quartz crystal units for frequency control and selection
  • JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
  • JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
  • JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
  • JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
  • JUS N.R9.074-1986 Piezoelectric vibrators. Ouartz crystal units. Two wire crystal holder outline, type 19
  • JUS N.R9.072-1986 Piezoe/ectric vibrators. Ctuartz crystal units. Two wfre crystaf holder outline, type 16
  • JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20
  • JUS N.R9.076-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal hotder outllne, type08
  • JUS N.R9.075-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal holder outline, type 10
  • JUS N.R9.078-1986 Piezoelectric vibrators. Quartz crystal units. Turo wire crystal holder outline, type 21
  • JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15

National Metrological Technical Specifications of the People's Republic of China, quartz crystal

  • JJF 1984-2022 Specification for calibration of quartz crystal oscillators in electronic measuring instruments

国家市场监督管理总局、中国国家标准化管理委员会, quartz crystal

  • GB/T 21296.5-2020 Automatic instruments for weighing road vehicles in motion—Part 5:Crystal quartz type
  • GB/T 5832.4-2020 Gas analysis—Determination of moisture—Part 4: The method of quartz crystal oscillation

American Society for Testing and Materials (ASTM), quartz crystal

  • ASTM B808-10(2020) Standard Test Method for Monitoring of Atmospheric Corrosion Chambers by Quartz Crystal Microbalances
  • ASTM D7739-11(2020) Standard Practice for Thermal Oxidative Stability Measurement via Quartz Crystal Microbalance
  • ASTM B808-05 Standard Test Method for Monitoring of Atmospheric Corrosion Chambers by Quartz Crystal Microbalances

CEN - European Committee for Standardization, quartz crystal

  • EN IEC 60122-4:2019 Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors




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