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in xps

in xps, Total:5 items.

In the international standard classification, in xps involves: Analytical chemistry.

Association Francaise de Normalisation, in xps

• NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)

International Organization for Standardization (ISO), in xps

• ISO 16531:2020 Surface chemical analysis — Depth profiling — Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

British Standards Institution (BSI), in xps

• BS ISO 16531:2020 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
• 19/30399949 DC BS ISO 16531. Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

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