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atomic concentration

atomic concentration, Total:11 items.

In the international standard classification, atomic concentration involves: Analytical chemistry.

International Organization for Standardization (ISO), atomic concentration

• ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
• ISO 14237:2000 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Association Francaise de Normalisation, atomic concentration

• NF X21-070*NF ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, atomic concentration

• GB/T 20176-2006 Surface chemical analysis.Secondary-ion mass spectrometry.Determination of boron atomic concentration in silicon using uniformly doped materials

British Standards Institution (BSI), atomic concentration

• BS ISO 14237:2010 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

Japanese Industrial Standards Committee (JISC), atomic concentration

• JIS K 0143:2023 Surface chemical analysis -- Secondary-ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials
• JIS K 0143:2000 Surface chemical analysis -- Secondary ion mass spectrometry -- Determination of boron atomic concentration in silicon using uniformly doped materials

KR-KS, atomic concentration

• KS D ISO 14237-2003(2023)

Korean Agency for Technology and Standards (KATS), atomic concentration

• KS D ISO 14237-2003(2018)
• KS D ISO 14237:2003 Surface chemical analysis－Secondary-ion mass spectrometry－Determination of boron atomic concentration in silicon using uniformly doped materials

Standard Association of Australia （SAA）, atomic concentration

• AS ISO 14237:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials

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