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spectral double peak
spectral double peak, Total:75 items.
In the international standard classification, spectral double peak involves: Electronic tubes, Optoelectronics. Laser equipment, Acoustics and acoustic measurements, Optics and optical measurements, Analytical chemistry, Special measuring equipment for use in telecommunications, Fibre optic communications, Photography, Semiconductor devices, Applications of information technology, Alarm and warning systems, Metrology and measurement in general, Television and radio broadcasting.
Professional Standard - Electron, spectral double peak
- SJ/Z 731-1973 Preferred series and types photomultiplier tubes
- SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices
- SJ 2658.12-1986 Methods of measurement for semiconductor infrared diodes Methods of measurement for peak emission wavelength and spectral half width
- SJ/T 2658.12-2015 Measuring method for semiconductor infrared-emitting diode.Part 12: Peak-emission wavelength and spectral radiant bandwidth
RU-GOST R, spectral double peak
- GOST 11612.17-1981 Phetomultiplirs. Methods of measuring spectral anode sensitivity
- GOST 11612.7-1983 Photomultipliers. Measuring methods of light and spectral equivalent of anode current noise produced by luminous flux
- GOST 8.197-2013 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance, spectral radiant power, spectral irradiance, spectral radiant intensity, power and radiant intensity in spectral range
Military Standard of the People's Republic of China-General Armament Department, spectral double peak
- GJB 759-1989 Potassium titanium phosphate (KTP) crystal for laser frequency doubler
- GJB 1677-1993 Specification for frequency doubling antireflection coating of potassium titanyl phosphate (KTP) for nonlinear optical crystals
U.S. Air Force, spectral double peak
International Organization for Standardization (ISO), spectral double peak
- ISO/DIS 13473-4 Characterization of pavement texture by use of surface profiles — Part 4: One third octave band spectral analysis of surface profiles
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 20903:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
- ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
Korean Agency for Technology and Standards (KATS), spectral double peak
American Society for Testing and Materials (ASTM), spectral double peak
- ASTM E520-08(2023) Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
- ASTM E520-08(2015)e1 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
- ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
- ASTM E520-98 Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
- ASTM E520-98(2003) Standard Practice for Describing Photomultiplier Detectors in Emission and Absorption Spectrometry
- ASTM E827-95 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
- ASTM E827-02 Standard Practice for Indentifying Elements by the Peaks in Auger Electron Spectroscopy
国家市场监督管理总局、中国国家标准化管理委员会, spectral double peak
- GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 37984-2019 Nanotechnologies—Raman shift correction value for spectrometer calibration
British Standards Institution (BSI), spectral double peak
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
- BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
- PD IEC/TR 63100:2017 Transmitting equipment for radiocommunication. Radio-over-fibre technologies for spectrum measurement. 100-GHz spectrum measurement equipment
- BS EN 61290-10-2:2003 Optical amplifiers - Test methods - Multichannel parameters - Pulse method using a gated optical spectrum analyzer
- BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
- BS EN 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- BS EN 61290-1-1:2015 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
- BS EN 61290-1-1:2007 Optical amplifiers. Test methods. Power and gain parameters. Optical spectrum analyzer method
ZA-SANS, spectral double peak
German Institute for Standardization, spectral double peak
- DIN 45672-3:2023-02 Vibration measurement on railway traffic systems - Part 3: Prediction method based on third-octave spectra / Note: Date of issue 2023-01-06
International Telecommunication Union (ITU), spectral double peak
- ITU-T G.694.1-2002 Spectral grids for WDM applications: DWDM frequency grid Series G: Transmission Systems and Media, Digital Systems and Networks Transmission media characteristics - Characteristics of optical components and subsystems Study Group 15
- ITU-T G.694.2-2003 Spectral grids for WDM applications: CWDM wavelength grid Series G: Transmission Systems and Media Digital Systems and Networks Transmission media characteristics - Characteristics of optical components and subsystems Study Group 15
- ITU-R SM.667 SPANISH-1990 NATIONAL SPECTRUM MANAGEMENT DATA
National Aeronautics and Space Administration (NASA), spectral double peak
Electronic Components, Assemblies and Materials Association, spectral double peak
- ECA TEP 150-1964 Relative Spectral Response Data for Photosensitive Devices ("S" Curves)
工业和信息化部, spectral double peak
- JC/T 2418-2017 General technical conditions and testing methods for neodymium-doped calcium oxyborate gadolinium-yttrium laser self-doubling crystals
International Electrotechnical Commission (IEC), spectral double peak
- IEC TR 63100:2017 Transmitting equipment for radiocommunication - Radio-over-fibre technologies for spectrum measurement - 100-GHz spectrum measurement equipment
- IEC 61290-2-1:1998 Optical fibre amplifiers - Basic specification - Part 2-1: Test methods for optical power parameters - Optical spectrum analyzer
- IEC 61290-1-1:2015 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-1-1:2006 Optical amplifiers - Test methods - Part 1-1: Power and gain parameters - Optical spectrum analyzer method
- IEC 61290-10-2:2003 Optical amplifiers - Test methods - Part 10-2: Multichannel parameters; Pulse method using a gated optical spectrum analyzer
Association Francaise de Normalisation, spectral double peak
- NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
- NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
- NF ISO 23166:2019 Alliages de nickel - Détermination du tantale - Méthode par spectrométrie d'émission optique avec source à plasma induit par haute fréquence
- NF EN 62129-1:2016 Étalonnage des appareils de mesure de longueur d'onde/appareil de mesure de la fréquence optique - Partie 1 : analyseurs de spectre optique
- NF EN 15605:2010 Cuivre et alliages de cuivre - Analyse par spectrométrie d'émission optique avec source à plasma induit par haute fréquence
- NF Z84-567:2012 Broadband Radio Access Networks (BRAN) - 60 GHz Multiple-Gigabit WAS/RLAN Systems - Harmonized EN covering the essential requirements of article 3.2 of the R&TTE Directive (V1.2.1).
- NF C93-805-1-1:2007 Optical amplifiers - Test methods - Part 1-1 : power and gain parameters - Optical spectrum analyzer method.
- NF C93-805-5-1:2001 Optical fibre amplifiers - Basic specification - Part 5-1 : test methods for reflectance parameters - Optical spectrum analyser.
- NF C93-805-2-2*NF EN 61290-2-2:1998 Optical fibre amplifiers. Basic specification. Part 2-2 : test methods for optical power parameters. Electrical spectrum analyzer.
- NF EN 15111:2007 Produits alimentaires - Dosage des éléments traces - Dosage de l'iode par spectrométrie d'émission avec plasma induit par haute fréquence et spectromètre de masse (ICP-SM)
Society of Motion Picture and Television Engineers (SMPTE), spectral double peak
- SMPTE 117M-2001 Motion-Picture Film - Photographic Audio Record - Spectral Diffuse Density
Institute of Electrical and Electronics Engineers (IEEE), spectral double peak
European Committee for Electrotechnical Standardization（CENELEC）, spectral double peak
- EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
- EN 62129:2006 Calibration of optical spectrum analyzers (Incorporating corrigendum December 2006)
ES-UNE, spectral double peak
- UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, spectral double peak
- GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
- GB/T 36063-2018 Nanotechnologies—Raman shift standard curve for spectrometer calibration
- GB/T 10725-1989 Chemical reagent--General rules for industively coupled plasma atomic emission spectrometry
American National Standards Institute （ANSI), spectral double peak
- ANSI/IEEE 1214:1993 MCA Histogram Data Interchange Format for Nuclear Spectroscopy
- ANSI/TIA/EIA 455-209-2000 FOTP209 - IEC 61290-2-1 - Optical Fibre Amplifiers - Basic Specification Part 2-1: Test Methods for Optical Power Parameters - Optical Spectrum Analyzer
Group Standards of the People's Republic of China, spectral double peak
- T/CCSAS 009-2021 Technical specification for hazardous gas spectrum video monitoring and early warning system
CENELEC - European Committee for Electrotechnical Standardization, spectral double peak
- EN 61290-5-1:2000 Optical Fibre Amplifiers - Basic Specification - Part 5-1: Test Methods for Reflectance Parameters - Optical Spectrum Analyser
- EN 61290-2-2:1998 Optical Fibre Amplifiers - Basic Specification Part 2-2: Test Methods for Optical Power Parameters Electrical SPectrum Analyzer
Japanese Industrial Standards Committee (JISC), spectral double peak
- JIS C 6122-1-1:2011 Optical amplifiers -- Test methods -- Part 1-1: Power and gain parameters -- Optical spectrum analyzer method
- JIS C 6122-3-1:2011 Optical amplifiers -- Test methods -- Part 3-1: Noise figure parameters -- Optical spectrum analyzer method
Professional Standard - Agriculture, spectral double peak
- GB 10725-1989 General rules for chemical reagent inductively coupled high frequency plasma atomic emission spectrometry