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piezoelectric crystal material
piezoelectric crystal material, Total:145 items.
In the international standard classification, piezoelectric crystal material involves: Piezoelectric and dielectric devices, Vocabularies, Test conditions and procedures in general, Components for electrical equipment, Ceramics, Magnetic materials, Semiconducting materials, Nuclear energy engineering, Radiation measurements, Materials for the reinforcement of composites, Inorganic chemicals, Glass, Physics. Chemistry, Semiconductor devices, Insulating fluids, Electrical and electronic testing, Plastics, Non-textile floor coverings, Electronic components in general, Radiocommunications, Analytical chemistry, Solar energy engineering, Applications of information technology, Electricity. Magnetism. Electrical and magnetic measurements, Insulating materials.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, piezoelectric crystal material
- GB/T 11312-1989 Test methods for SAW properties of piezoelectric ceramics and crystals
- GB/T 9532-2012 Designations for piezoelectric crystals
- GB/T 12633-1990 Terms for the measurements of the properties of the piezoelectric crystals
- GB/T 12634-1990 Test methods for electroelastic constants of piezoelectric crystals
- GB/T 2413-1980 Piezoelectric ceramic materials--Measuring methods for determination of volume density
- GB/T 2413-1981 Piezoelectric ceramic materials--Measuring methods fordetermination of volume and density
- GB 2413-1981 Measurement method of bulk density of piezoelectric ceramic materials
- GB 2413-1980 Measurement method of bulk density of piezoelectric ceramic materials
- GB/T 9532-1988 Designations for LiNbO3,LiTaO3,Bi12GeO20,Bi12SiO20 piezoelectric crystals
- GB/T 13387-1992 Test method for measuring flat length on slices of electronic materials
- GB/T 15250-1994 Test method for bulk acoustic wave attenuation of piezoelectric lithium niobate crystals
- GB/T 1411-2002/IEC 61621-1997 Dry,solid insulating materials--Resistance test to high-voltage,low-current arc discharges
- GB/T 1411-2002/IEC 61621:1997 Dry,solid insulating materials--Resistance test to high-voltage,low-current arc discharges
- GB/T 1411-2002 Dry,solid insulating materials--Resistance test to high-voltage,low-current arc discharges
British Standards Institution (BSI), piezoelectric crystal material
- BS DD IEC/TS 61994-4-1:2008 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Piezoelectric materials - Synthetic quartz crystal
- PD IEC TS 61994-4-1:2018 Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Synthetic quartz crystal
- BS EN 60444-9:2007 Measurement of quartz crystal unit parameters - Measurement of spurious resonances of piezoelectric crystal units
- PD IEC TS 61994-4-4:2018 Tracked Changes. Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary. Piezoelectric materials. Single crystal wafers for surface acoustic wave (SAW) devices
- BS IEC 62860:2013 Test methods for the characterization of organic transistors and materials
- BS EN 61621:1997 Dry, solid insulating materials. Resistance test to high-voltage, low-current arc discharges
International Electrotechnical Commission (IEC), piezoelectric crystal material
- IEC TS 61994-4-1:2001 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials; Synthetic quartz crystal
- IEC TS 61994-4-1:2007 Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
- IEC TS 61994-4-1:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
- IEC TS 61994-4-1:2018 RLV Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
- IEC 60293:1968 Supply voltages for transistorized nuclear instruments
- IEC 62860:2013 Test Methods for the Characterization of Organic Transistors and Materials
- IEC 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
- IEC TS 61994-4-4:2018 Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for s
- IEC TS 61994-4-4:2018 RLV Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for s
IEC - International Electrotechnical Commission, piezoelectric crystal material
- TS 61994-4-1-2007 Piezoelectric and dielectric devices for frequency control and selection – Glossary – Part 4-1: Piezoelectric materials – Synthetic quartz crystal (Edition 2.0)
- TS 61994-4-1 (REDLINE + STANDARD)-2018 Piezoelectric@ dielectric and electrostatic devices and associated materials for frequency control@ selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal (Edition 3.0)
- TS 61994-4-1-2018 Piezoelectric@ dielectric and electrostatic devices and associated materials for frequency control@ selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal (Edition 3.0)
- TS 61994-4-4-2018 Piezoelectric@ dielectric and electrostatic devices and associated materials for frequency control@ selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices (Edition 3.0)
- TS 61994-4-4 (REDLINE + STANDARD)-2018 Piezoelectric@ dielectric and electrostatic devices and associated materials for frequency control@ selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices (Edition 3.0)
工业和信息化部, piezoelectric crystal material
Professional Standard - Building Materials, piezoelectric crystal material
IEEE - The Institute of Electrical and Electronics Engineers@ Inc., piezoelectric crystal material
- IEEE 176-1949 STANDARDS ON PIEZOELECTRIC CRYSTALS
- IEEE 180-1962 STANDARDS ON PIEZOELECTRIC AND FERROELECTRIC CRYSTALS: DEFINITIONS OF FERROELECTRIC CRYSTAL TERMS 1962 (62 IRE 14.S1)
国家市场监督管理总局、中国国家标准化管理委员会, piezoelectric crystal material
Professional Standard - Electron, piezoelectric crystal material
- SJ/T 11199-1999 Piezoelectric quartz crystal blanks
- SJ 2268-1983 Series of gyromagnetic multi-crystal materials made of magnetic oxides
- SJ/T 11743.4.1-2019 Piezoelectric and dielectric devices for frequency control and selection – Glossary –Part 4-1: Materials – Synthetic quartz crystal（IEC/TS 61994-4-1：2007，Piezoelectric and dielectric devices for frequency control and selection –Gloss...
- SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material
- SJ 20858-2002 Measuring methods for electrical parameters of silicon carbide single crystal material
CZ-CSN, piezoelectric crystal material
Group Standards of the People's Republic of China, piezoelectric crystal material
IN-BIS, piezoelectric crystal material
Institute of Electrical and Electronics Engineers (IEEE), piezoelectric crystal material
Association Francaise de Normalisation, piezoelectric crystal material
- NF C93-601/AM1:1976 COMPONENTS FOR ELECTRONIC EQUIPMENT. PIEZOELECTRIC DEVICES. CRYSTAL HOLDERS.
- NF UTE C93-613:1979 Dispositifs piézoélectriques - Filtres piézoélectriques - Guide d'emploi des filtres à cristal piézoélectrique.
- NF T51-223:1985 Plastics. Semi-cristalline materials. Determination of the conventional melting temperature by thermal analyse.
- NF EN 61621:1998 Matériaux isolants solides secs - Essai de résistance aux décharges à l'arc haute tension, faible courant.
- NF C93-621-9*NF EN 60444-9:2014 Measurement of quartz crystal unit parameters - Part 9 : measurement of spurious resonances of piezoelectric crystal units
- UTE C93-613U*UTE C93-613:1979 Components for electric equipment. Piezoelectric devices. Piezoelectric filters. Guide to the use of crystal filters.
German Institute for Standardization, piezoelectric crystal material
- DIN 50439:1982 Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact
- DIN 51911:2020 Testing of carbonaceous materials - Determination of specific electrical resistance by the current-voltage method - Solid materials
- DIN 51911:2020-12 Testing of carbonaceous materials - Determination of specific electrical resistance by the current-voltage method - Solid materials
- DIN 51919:1999 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method; solid materials
- DIN 51919:2013 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
- DIN 51919:2013-05 Testing of carbonaceous materials - Determination of the electrical resistivity of electrodes according to the current-voltage method - Solid materials
- DIN 50431:1988 Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array
- DIN EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
- DIN 51911:1997 Testing of carbon materials - Determination of specific electrical resistance by the current-voltage method - Solid matters
- DIN EN 60444-9:2007-12 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007
YU-JUS, piezoelectric crystal material
- JUS N.R9.071-1986 Piezoelectric vibrators. Quartz crystal units. Two mre crystal holder outline, type 18
- JUS N.R9.070-1986 Piezoelectric vibrators. Ouartz crystal units. Two pin crystal holder outlfne, type09
- JUS N.R9.073-1986 Piezoelectrlc vibrators. Quartz crystal unlts. Two wire crystal holder outline, type 17
- JUS N.R9.069-1986 Piezoelectric vibrators. Quartz crystal units. Two piri crystal holder outline, type 07
- JUS N.R9.064-1986 Piezoelectric vibrators. Ctuartz crystal units. Two wire crystal holder outline. Types 11, 14 and 15
- JUS N.R9.074-1986 Piezoelectric vibrators. Ouartz crystal units. Two wire crystal holder outline, type 19
- JUS N.R9.072-1986 Piezoe/ectric vibrators. Ctuartz crystal units. Two wfre crystaf holder outline, type 16
- JUS N.R9.077-1986 Piezoelectric vibrators. Quartz crystal units. Two wire crystal holder outline, type 20
- JUS N.R9.076-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal hotder outllne, type08
- JUS N.R9.075-1986 Piezoelectric vibrators. Quartz crystal units. Two pin crystal holder outline, type 10
- JUS N.R9.078-1986 Piezoelectric vibrators. Quartz crystal units. Turo wire crystal holder outline, type 21
PL-PKN, piezoelectric crystal material
- PN T01504-04-1987 Transistors Measuring methods Breakdown voltages U(BR) CBO and U(BR) ebo
- PN T01504-02-1987 Transistors Measuring methods Collector-emitter saturation voltage ?/C?-sat and base-emitter saturation voltage UBEat
- PN E04441-1974 Solid insulating materials Testing of high-voltage, low-current arc resistance
- PN T01505 ArkusZ02-1974 Field-effect transistors Measuring me?hod Ga?e-source ?hreshold yoltage Ugs (TO)
- PN T01505 ArkusZ11-1974 Field-effect ?ransis?ors Measuring method Drain-source breakdown yol?age U
- PN T01504-01-1987 Transistors Measuring methods Static value of the forward current transfer ratio hus and base-emitter voltage Ube
RO-ASRO, piezoelectric crystal material
- STAS 10289-1982 Solid electroinsulating materials THERMOSETTING LAMINATED MATERIALS Test methods
- STAS 6415/1-1990 Solid electric insulating materials. Determination of low voltage arc resistance in direct current
- STAS 11381/10-1980 Graphical symbols for electrical diagrams PIEZOELECTRIC CRISTALS ELECTRET
Military Standard of the People's Republic of China-General Armament Department, piezoelectric crystal material
- GJB 3933-2000 Specification for ultrapure aluminum oxide powder materials for laser crystals
- GJB/Z 45.2-1993 Military piezoelectric device series spectrum crystal oscillator
- GJB/Z 45.1-1993 Military piezoelectric device series spectrum quartz crystal components
RU-GOST R, piezoelectric crystal material
- GOST 9553-1974 Silica glass and glass crystal materials. Determinationn of density
- GOST 20398.7-1974 Field-effect transistors. Threshold and cut-off voltage measurement technique
- GOST 10134.2-1982 Glass inorganic and glass-crystal materials. Method for determination of acid resistance
- GOST 11103-1985 Inorganic glass and glass crystal materials. Method for the determination of thermal stability
GOSTR, piezoelectric crystal material
- GOST 9553-2017 Glass and glass products. Density determination method
- GOST 18604.19-1988 Bipolar transistors. Method of measuring threshold voltage
- GOST 11103-2018 Inorganic glass and glass-ceramic materials. Heat resistance determination method
Korean Agency for Technology and Standards (KATS), piezoelectric crystal material
- KS C IEC 62860:2018 Test methods for the characterization of organic transistors and materials
- KS C 2105-2003 Testing methods for electric strengthof solid insulating materials
- KS C 2127-1996(2021) Testing method for proof-voltage testing of thin solid electrical insulating materials
- KS C 2105-1982 Testing methods for electric strengthof solid insulating materials
- KS C IEC 60444-9:2016 Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
- KS C IEC 60444-9-2016(2021) Measurement of quartz crystal unit parameters ― Part 9: Measurement of spurious resonance of piezoelectric crystal units
- KS C 2130-1996 Testing method for high-voltage, low-current, dry arc resistance of solid electrical insulation
- KS C IEC 61621:2014 Dry, solid insulating materials — Resistance test to high-voltage, low-current arc discharges
- KS C 2130-1996(2016) Testing method for high-voltage, low-current, dry arc resistance of solid electrical insulation
KR-KS, piezoelectric crystal material
European Committee for Standardization (CEN), piezoelectric crystal material
- prEN 220-1985 Elastomeric dental impression materials
- EN 1815:2016 Resilient and laminate floor coverings - Assessment of static electrical propensity
Professional Standard-Ships, piezoelectric crystal material
- CB/Z 166-1979 Measurement method of volume resistivity ρv of piezoelectric ceramic materials
Taiwan Provincial Standard of the People's Republic of China, piezoelectric crystal material
- CNS 8105-1981 Test Method for Transistor Collector - Emitter Saturation Voltage
ES-AENOR, piezoelectric crystal material
European Committee for Electrotechnical Standardization（CENELEC）, piezoelectric crystal material
- EN 60444-9:2007 Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
American National Standards Institute （ANSI), piezoelectric crystal material
- ANSI/IEEE 1620:2008 Standard for Test Methods for the Characterization of Organic Transistors and Materials
United States Navy, piezoelectric crystal material
WRC - Welding Research Council, piezoelectric crystal material
- BULLETIN 122-1967 A REVIEW OF SOME MICROSTRUCTURAL ASPECTS OF FRACTURE IN CRYSTALLINE MATERIALS
Shaanxi Provincial Standard of the People's Republic of China, piezoelectric crystal material
- DB61/T 514-2011 Inspection rules for raw materials for ground-use crystalline silicon photovoltaic modules
Xinjiang Provincial Standard of the People's Republic of China, piezoelectric crystal material
- DB65/T 3683-2014 Technical specifications of raw materials for ground-use crystalline silicon photovoltaic modules
American Welding Society (AWS), piezoelectric crystal material
- WRC 122:1967(1976) A Review of Some Microstructural Aspects of Fracture in Crystalline Materials
U.S. Military Regulations and Norms, piezoelectric crystal material
- ARMY MIL-PRF-55310/40 B-2013 OSCILLATOR, CRYSTAL CONTROLLED, TYPE 1 (CRYSTAL OSCILLATOR (XO)), 1 MHz THROUGH 100 MHz, HERMETIC SEAL, LOW VOLTAGE 1.8V CMOS
Danish Standards Foundation, piezoelectric crystal material
- DS/EN 60444-9:2007 Measurement of quartz crystal unit parameters -- Part 9: Measurement of spurious resonances of piezoelectric crystal units
ESD - ESD ASSOCIATION, piezoelectric crystal material
- STM97.2-1999 Floor Materials and Footwear Voltage Measurement in Combination with a Person
(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, piezoelectric crystal material
Professional Standard - Non-ferrous Metal, piezoelectric crystal material
- YS/T 557-2006 Test method for acoustic wave attenuation of piezoelectric lithium niobate single crystal