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x-ray spectrometer
x-ray spectrometer, Total:53 items.
In the international standard classification, x-ray spectrometer involves: Analytical chemistry, Radiation measurements, Optics and optical measurements, Fuels, Surface treatment and coating, Nuclear energy engineering, Metalliferous minerals, Metrology and measurement in general, Testing of metals, Non-destructive testing, Linear and angular measurements, Petroleum products in general, Electricity. Magnetism. Electrical and magnetic measurements.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-ray spectrometer
- GB/T 20726-2006 Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
- GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 31364-2015 Test methods for main performance of energy dispersive X-ray fluorescence spectrometer
- GB/Z 42358-2023 Determination of Accuracy of Wavelength Dispersive X-ray Fluorescence Spectrometer for Iron Ore
SE-SIS, x-ray spectrometer
- SIS SS IEC 759:1986 Nuclear instrumentation —Test procedures for semiconductor X-ray energy spectrometers
CZ-CSN, x-ray spectrometer
Korean Agency for Technology and Standards (KATS), x-ray spectrometer
- KS C IEC 60759:2009 Standard test procedures for semiconductor X-ray energy spectrometers
- KS C IEC 60759-2009(2019) Standard test procedures for semiconductor X-ray energy spectrometers
- KS D ISO 3497-2002(2017) Metallic coatings－Measurement of coating thickness－X-ray spectrometric methods
- KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
- KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
International Electrotechnical Commission (IEC), x-ray spectrometer
- IEC 60759:1983 Standard test procedures for semiconductor X-ray energy spectrometers
- IEC 60759:1983/AMD1:1991 Standard test procedures for semiconductor X-ray energy spectrometers; amendment 1
Institute of Electrical and Electronics Engineers (IEEE), x-ray spectrometer
Professional Standard - Machinery, x-ray spectrometer
American Society for Testing and Materials (ASTM), x-ray spectrometer
- ASTM D7220-12 Standard Test Method for Sulfur in Automotive, Heating, and Jet Fuels by Monochromatic Energy Dispersive X-ray Fluorescence Spectrometry
- ASTM E1172-22 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM E1172-16 Standard Practice for Describing and Specifying a Wavelength Dispersive X-Ray Spectrometer
- ASTM F1375-92(1999) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
- ASTM F1375-92(2020) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
Japanese Industrial Standards Committee (JISC), x-ray spectrometer
National Metrological Verification Regulations of the People's Republic of China, x-ray spectrometer
- JJG(地质) 1006-1990 Verification regulations for 3080E X-ray fluorescence spectrometer
- JJG 810-1993 Verification Regulation for Wavelength Dispersive X-Ray Fluorescence Spectrometers
Group Standards of the People's Republic of China, x-ray spectrometer
- T/CSTM 00901-2023 Calibration specification for handheld X-ray fluorescence spectrometer
German Institute for Standardization, x-ray spectrometer
- DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
International Organization for Standardization (ISO), x-ray spectrometer
- ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- ISO/TR 18231:2016 Iron ores - Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
Association Francaise de Normalisation, x-ray spectrometer
- NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
Standard Association of Australia （SAA）, x-ray spectrometer
- AS 2563:1996 Wavelength dispersive X-ray fluorescence spectrometers - Determination of precision
- AS 2563:2019 Iron ores — Wavelength dispersive X-ray fluorescence spectrometers — Determination of precision
National Metrological Technical Specifications of the People's Republic of China, x-ray spectrometer
Professional Standard - Agriculture, x-ray spectrometer
- JJG(教委) 016-1996 Verification rules for wavelength dispersive X-ray fluorescence spectrometer
IN-BIS, x-ray spectrometer
工业和信息化部/国家能源局, x-ray spectrometer
- JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
- JB/T 12962.1-2016 Energy-dispersive X-ray fluorescence spectrometers Part 1: General techniques
- JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer
RU-GOST R, x-ray spectrometer
- GOST 22091.8-1984 X-ray devices. Method of measuring spectral structure and relative spectrum contamination
British Standards Institution (BSI), x-ray spectrometer
- BS PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- PD ISO/TR 18231:2016 Iron ores. Wavelength dispersive X-ray fluorescence spectrometers. Determination of precision
- BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
- BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
KR-KS, x-ray spectrometer
- KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
Professional Standard - Electron, x-ray spectrometer
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers