ZH
RU
ES

UV-absorbing semiconducting materials

UV-absorbing semiconducting materials, Total:19 items.

In the international standard classification, UV-absorbing semiconducting materials involves: Semiconducting materials, Analytical chemistry, Optics and optical measurements, Ceramics, Materials and articles in contact with foodstuffs, Nuclear energy engineering, Electrical wires and cables.

Professional Standard - Electron, UV-absorbing semiconducting materials

SJ 20744-1999 General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials

Korean Agency for Technology and Standards (KATS), UV-absorbing semiconducting materials

KS D 2717-2008(2018) Evaluation of metallic/semiconducting ratio of single-walled carbon nanotube soots using UV-VIS－NIR absorption spectroscopy

Association Francaise de Normalisation, UV-absorbing semiconducting materials

NF ISO 10677:2011 Céramiques techniques - Sources lumineuses UV destinée aux essais des matériaux photocatalytiques semi-conducteurs
NF B44-103*NF ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics) - Ultraviolet light source for testing semiconducting photocatalytic materials

German Institute for Standardization, UV-absorbing semiconducting materials

DIN 50449-2:1998 Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide
DIN 50449-1:1997 Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 1: Carbon in gallium arsenide
DIN 50438-2:1982 Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon
DIN 50437:1979 Testing of semi-conductive inorganic materials; measuring the thickness of silicon epitaxial layer thickness by infrared interference method
DIN 50443-1:1988 Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography
DIN 50451-1:2003 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
DIN 50451-1:2003-04 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS

国家市场监督管理总局、中国国家标准化管理委员会, UV-absorbing semiconducting materials

GB/T 37131-2018 Nanotechnologies—Test method of semiconductor nanopowder using UV-Vis diffuse reflectance spectroscopy
GB/T 40561-2021 Photovoltaic silicon material—Determination of oxygen—Pulse heating inert gas fusion infrared absorption method

KR-KS, UV-absorbing semiconducting materials

KS L ISO 10677-2023 Fine ceramics (advanced ceramics, advanced technical ceramics) — Ultraviolet light source for testing semiconducting photocatalytic materials

British Standards Institution (BSI), UV-absorbing semiconducting materials

BS ISO 10677:2011 Fine ceramics (advanced ceramics, advanced technical ceramics). Ultraviolet light source for testing semiconducting photocatalytic materials

Group Standards of the People's Republic of China, UV-absorbing semiconducting materials

T/CITS 0006-2021 Determination of ultraviolet absorbents in plastic materials and products contacted with food-Ultra performance convergence chromatography

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, UV-absorbing semiconducting materials

GB 15146.10-2001 Nuclear criticality safety for fissile materials outside reactors Safety requirements for the use of fixed neutron absorbers

Standard Association of Australia （SAA）, UV-absorbing semiconducting materials

AS/NZS 1660.2.3:1998 Test methods for electric cables, cords and conductors - Insulation, extruded semi-conductive screens and non-metallic sheaths - Methods specific to PVC and halogen free thermoplastic materials
AS/NZS 1660.2.2:1998 Test methods for electric cables, cords and conductors - Insulation, extruded semi-conductive screens and non-metallic sheaths - Methods specific to elastomeric, XLPE and XLPVC materials