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Spectral silicon

Spectral silicon, Total:96 items.

In the international standard classification, Spectral silicon involves: Powder metallurgy, Semiconducting materials, Non-metalliferous minerals, Analytical chemistry, Non-ferrous metals, Ferrous metals, Leather technology, Metalliferous minerals, Conducting materials, Ceramics, Glass, Natural gas, Fibre optic communications, Inorganic chemicals, Testing of metals, Refractories, Products of the chemical industry, Fuels.


RO-ASRO, Spectral silicon

  • STAS 11359/8-1980 NATIVE SULPHUR ORES AND CONCENTRATES Aluminium, calcium, magnesium, iron and silicon spectral analysis

RU-GOST R, Spectral silicon

  • GOST 16412.9-1991 Iron powder. Method of photoelectric spectral analysis of silicon, manganese and phosphorus
  • GOST 23687.2-1979 Alloy of copper-beryllium. Spectral method of the determination of magnesium, iron, aluminium, silicon, lead
  • GOST 9853.6-1979 Sponge titanium. Spectral method for the determination of silicon, iron and nickel
  • GOST 18385.2-1979 Niobium. Spectral method for the determination of silicon, titanium and iron
  • GOST R ISO 7530-8-2017 Nickel alloys. Flame atomic absorption spectrometric method. Part 8. Determination of silicon content
  • GOST R 50233.4-1992 Niobium pentoxide. Atomic-emission method for determination of titanium, silicon, iron, nickel, aluminium, magnesium, manganse, cobalt, chromium, lead and zirconium
  • GOST 23201.1-1978 Alumina. Methods of spectral analysis. Determination of silicon dioxide, iron oxide, sodium oxide and magnium oxide
  • GOST 23862.4-1979 Rare-earth metals and their oxides. Spectral method of determination of vanadium, iron, cobalt, silicon, manganese, copper, nickel, lead, titanium, chromium

Professional Standard - Electron, Spectral silicon

  • SJ/T 11491-2015 Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry
  • SJ/T 11552-2015 Test methods for measurement of interstitial oxygen content of silicon wafers by infrared absorption with P-polarized radiation incident at the Brewster angle
  • SJ 3198-1989 Method for determination of Silicon,Iron,Magnesium and Copper in vacuum Silicon-Aluminium alloy by emission spectrum

Japanese Industrial Standards Committee (JISC), Spectral silicon

  • JIS H 0615:2021 Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
  • JIS H 0615:1996 Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
  • JIS K 0164:2010 Surface chemical analysis -- Secondary-ion mass spectrometry -- Method for depth profiling of boron in silicon

GOSTR, Spectral silicon

  • GOST 9853.23-1996 Sponge titanium. Spectral method for determination of silicon, iron, nickel

British Standards Institution (BSI), Spectral silicon

  • BS ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • BS ISO 17560:2014 Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
  • BS ISO 14706:2000 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS ISO 14706:2014 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • BS ISO 14706:2001 Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • 23/30433267 DC BS EN ISO 2613-2. Analysis of natural gas. Biomethane - Part 2. Determination of siloxane content by gas chromatography ion mobility spectrometry
  • BS 7455-8:1992 Analysis of nickel alloys by flame atomic absorption spectrometry. Method for determination of silicon
  • BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS 7709-1:1993 Analysis of extract solutions of glass. Method for determination of silicon dioxide by molecular absorption spectrometry
  • BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
  • BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • DD ENV 14226:2002 Advanced technical ceramics. Test methods for ceramic powders. Determination of calcium, magnesium, iron and aluminium in silicon nitride by using flame atomic absorption spectroscopy (FAAS) or inductively coupled plasma atomic emission spectroscopy (I...

International Organization for Standardization (ISO), Spectral silicon

  • ISO 17560:2002 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • ISO 5400:1984 Leather; Determination of total silicon content; Reduced molybdosilicate spectrometric method
  • ISO 9502:1993 Metallurgical-grade fluorspar; determination of silica content; reduced-molybdosilicate spectrometric method
  • ISO 7530-8:1992 Nickel alloys; flame atomic absorption spectrometric analysis; part 8: determination of silicon content
  • ISO 5438:1993 Acid-grade and ceramic-grade fluorspar; determination of silica content; reduced-molybdosilicate spectrometric method
  • ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
  • ISO 9502:1989 Metallurgical-grade fluorspar — Determination of silica content — Reduced-molybdosilicate spectrometric method
  • ISO 2613-1 Analysis of natural gas — Silicon content of biomethane — Part 1: Determination of total silicon by atomic emission spectroscopy (AES)
  • ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
  • ISO 2613-1:2023 Analysis of natural gas — Silicon content of biomethane — Part 1: Determination of total silicon by atomic emission spectroscopy (AES)
  • ISO 5438:1985 Acid-grade and ceramic-grade fluorspar — Determination of silica content — Reduced molybdosilicate spectrometric method
  • ISO 5935:1980 Crude sodium borates for industrial use; Determination of total and alkali-soluble silica contents; Molybdosilicate spectrometric method
  • ISO 5935:1984 Crude sodium borates for industrial use; Determination of total and alkali-soluble silica contents; Molybdosilicate spectrometric method
  • ISO 10136-1:1993 Glas and glassware; analysis of extract solutions; part 1: determination of silicon dioxide by molecular absorption spectrometry

Association Francaise de Normalisation, Spectral silicon

  • NF X21-051*NF ISO 17560:2006 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon
  • NF A07-520:1971 Analysis of aluminium silicon and aluminium-silicon-copper alloys by emission spectrography.
  • FD A06-326*FD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al in ferro-silicon by X-ray fluorescence spectrometry
  • NF T90-053*NF EN ISO 16264:2004 Water quality - Determination of soluble silicates by flow analysis (FIA and CFA) and photometric detection
  • NF EN ISO 2613-1:2023 Analyse du gaz naturel - Teneur en silicium du biométhane - Partie 1 : détermination de la teneur totale en silicium par spectrométrie d'émission atomique (SEA)
  • NF ISO 7530-8:2007 Alliages de nickel - Analyse par spectrométrie d'absorption atomique dans la flamme - Partie 8 : dosage du silicium
  • NF A08-908*NF ISO 7530-8:2007 Nickel alloys - Flame atomic absorption spectrometric analysis - Part 8 : determination of silicon content.

Korean Agency for Technology and Standards (KATS), Spectral silicon

  • KS D ISO 17560:2003 Surface chemical analysis-Secondary-on mass spectrometry- Method for depth profiling of boron in silicon
  • KS M ISO 5400-2012(2022) Leather-Determination of total silicon content-Reduced molybdosilicate spectrometric method
  • KS M ISO 5400:2012 Leather-Determination of total silicon content-Reduced molybdosilicate spectrometric method
  • KS D ISO 14706:2003 Surface chemical analysis-Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence(TXRF) spectroscopy
  • KS E 3076-2017 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
  • KS E 3076-2022 Methods for X-ray fluorescence spectrometric analysis of silica stone and silica sand
  • KS D ISO 7530-8:2012 Nickel alloys-Flame atomic absorption spectrometric analysis-Part 8:Determination of silicon content
  • KS D ISO 7530-8-2012(2017) Nickel alloys-Flame atomic absorption spectrometric analysis-Part 8:Determination of silicon content
  • KS D ISO 7530-8-2012(2022) Nickel alloys-Flame atomic absorption spectrometric analysis-Part 8:Determination of silicon content

European Committee for Standardization (CEN), Spectral silicon

  • CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
  • PD CEN/TR 10354:2011 Chemical analysis of ferrous materials - Analysis of ferro-silicon - Determination of Si and Al by X-ray fluorescence spectrometry
  • prEN ISO 2613-2 Analysis of natural gas - Biomethane - Part 2: Determination of siloxane content by gas chromatography ion mobility spectrometry (ISO/DIS 2613-2:2023)
  • FprEN ISO 2613-1 Analysis of natural gas - Silicon content of biomethane - Part 1: Determination of total silicon by atomic emission spectroscopy (AES) (ISO/FDIS 2613-1:2023)

AENOR, Spectral silicon

  • UNE 59027:1988 LEATHER. DETERMINATION OF TOTAL SILICON CONTENT. REDUCED MOLYBDOSILICATE SPECTROMETRIC METHOD

ES-UNE, Spectral silicon

  • UNE 59027:1988 ERRATUM LEATHER. DETERMINATION OF TOTAL SILICON CONTENT. REDUCED MOLYBDOSILICATE SPECTROMETRIC METHOD

American National Standards Institute (ANSI), Spectral silicon

  • BS EN ISO 2613-1:2023 Analysis of natural gas. Silicon content of biomethane Determination of total silicon by atomic emission spectroscopy (AES) (British Standard)

Professional Standard - Aviation, Spectral silicon

  • HB 7716.12-2002 Spectrometric analysis of titanium alloys Part 12:Determination of silicon content-Flame atomic absorption spectrometric method
  • HB 6731.12-2005 Mtehods for spectromertic analysis of aluminium alloys--Part 10:Determination of silicon content by inductivel coupled plasma atomic spectrometric method

American Society for Testing and Materials (ASTM), Spectral silicon

  • ASTM E463-98 Standard Test Method for Silica in Fluorspar by the Silico-Molybdate Visible Spectrometry
  • ASTM E463-08 Standard Test Method for Silica in Fluorspar by the Silico-Molybdate Visible Spectrometry
  • ASTM E463-14 Standard Test Method for Determination of Silica in Fluorspar by Silico-Molybdate Visible Spectrometry
  • ASTM E1614-94(1999) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy and Broadband Systems
  • ASTM E1614-94(2021) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in Remote Fiber-Optic Spectroscopy and Broadband Systems
  • ASTM E1614-94(2013) Standard Guide for Procedure for Measuring Ionizing Radiation-Induced Attenuation in Silica-Based Optical Fibers and Cables for Use in???Remote???Fiber-Optic Spectroscopy???and Broadband???Systems
  • ASTM F1723-96 Standard Practice for Evaluation of Polycrystalline Silicon Rods by Float-Zone Crystal Growth and Spectroscopy
  • ASTM F1724-96 Standard Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy
  • ASTM F1619-95(2000) Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle
  • ASTM F1708-96 Standard Practice for Evaluation of Granular Polysilicon by Meter-Zoner Spectroscopies

PL-PKN, Spectral silicon

  • PN C04348-1970 Solid fuels. Determinatiom of silicon, aluminium, iron, calcium and mag- nesium in ashes by the spectrogra- phic method

Professional Standard - Non-ferrous Metal, Spectral silicon

  • YS/T 426.5-2000 Method for chemical analysis of antimony-beryllium pellets.Determination of silicon content.ICP-AES method

YU-JUS, Spectral silicon

  • JUS B.G8.305-1988 Ores and concentrates. Chromium ores and concentrates. Determination of silicon content. Spectrometric and gravimetric mcthods
  • JUS H.B8.091-1980 Cryolite, natural and artificial. Determination oj' si licem content. RcduceJ molybdosilicute speetrophotometric method

Professional Standard - Ferrous Metallurgy, Spectral silicon

  • YB/T 5159-2007 Determination of trace boron in graphite products of High purty by spectroscopical method The powder method
  • YB/T 5159-1993 Powder method for spectroscopic determination of silicon and iron in high-purity graphite products

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Spectral silicon

  • GB/T 24579-2009 Test methods for measuring surface metal contamination of polycrystalline silicon by acid extraction-atomic absorption spectroscopy
  • GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities
  • GB/T 29057-2023 Practice for evaluating polycrystalline silicon rods by zone fusion pulling and spectroscopic analysis
  • GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy

国家市场监督管理总局、中国国家标准化管理委员会, Spectral silicon

  • GB/T 40110-2021 Surface chemical analysis—Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
  • GB/T 40915-2021 Determination of SiO2,Al2O3,Fe2O3,K2O,Na2O,CaO,MgO content of soda-lime-silica glass by X-ray fluorescence spectrometric method

Professional Standard - Commodity Inspection, Spectral silicon

  • SN/T 2489-2010 Determination of Cr、Mn、P、Si contents in pig-irons-Photoelectric emission spectroscopic method

BE-NBN, Spectral silicon

  • NBN T 03-367-1988 Crude sodium borates for industrial use - Determination of total and alkali-soluble silica contents - Molybdosilicate spectrometric method

German Institute for Standardization, Spectral silicon

  • DIN EN ISO 2613-1:2023-11 Analysis of natural gas - Silicon content of biomethane - Part 1: Determination of total silicon by atomic emission spectroscopy (AES) (ISO 2613-1:2023); German version EN ISO 2613-1:2023
  • DIN 38405-21:1990-10 German standard methods for the examination of water, waste water and sludge; anions (group D); determination of dissolved silicate by spectrometry (D 21)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Spectral silicon

  • GB/T 33465-2016 Determination of chlorine and silicon in gasoline by inductively coupled plasma optical emission spectrometry(ICP-OES)
  • GB/T 35309-2017 Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies

VN-TCVN, Spectral silicon

  • TCVN 7207-1-2002 Glass and glassware.Analysis of extract solutions.Part 1: Determination of silicon dioxide by molecular absorption spectrometry




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