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How to use the scanning electron microscope

How to use the scanning electron microscope, Total:19 items.

In the international standard classification, How to use the scanning electron microscope involves: Linear and angular measurements, Mechanical testing, Analytical chemistry, Physics. Chemistry, Optics and optical measurements, Paints and varnishes, Air quality.

Association of German Mechanical Engineers, How to use the scanning electron microscope

• VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems

International Organization for Standardization (ISO), How to use the scanning electron microscope

• ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
• ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
• ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

British Standards Institution (BSI), How to use the scanning electron microscope

• BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
• DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

BE-NBN, How to use the scanning electron microscope

• NBN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning électron microscope method (ISO 9220:1988)

American Society for Testing and Materials (ASTM), How to use the scanning electron microscope

• ASTM E2809-13 Standard Guide for Using Scanning Electron Microscopy/X-Ray Spectrometry in Forensic Paint Examinations
• ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
• ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
• ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
• ASTM E2090-06 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
• ASTM E2090-12(2020) Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
• ASTM E3284-23 Standard Practice for Training in the Forensic Examination of Primer Gunshot Residue (pGSR) Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry (SEM/EDS)

German Institute for Standardization, How to use the scanning electron microscope

• DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)

Danish Standards Foundation, How to use the scanning electron microscope

• DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

Association Francaise de Normalisation, How to use the scanning electron microscope

• FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

BELST, How to use the scanning electron microscope

• STB 2210-2011 Nano-sized carbon and non-carbon materials and composites based on them. Method for determining parameters using scan electron microscopy measurements
• STB 2209-2011 Nano-sized carbon and non-carbon materials and composites based on them. The technique for determining elemental composition using scan electron microscopy measurements

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