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X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy, Total:138 items.
In the international standard classification, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy involves: Electronic components in general, Optics and optical measurements, Non-destructive testing, Analytical chemistry, Linear and angular measurements, Electricity. Magnetism. Electrical and magnetic measurements, Protection against crime, Optical equipment, Medical sciences and health care facilities in general, Metrology and measurement in general.
Professional Standard - Electron, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
- SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
American Society for Testing and Materials (ASTM), X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
- ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
- ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
- ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
- ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
- ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
- ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
- ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
- ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
- ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
- ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
International Organization for Standardization (ISO), X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
- ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
- ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
- ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
- ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- ISO 18118:2004 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ISO 18118:2015 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
- ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
- ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
- ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
- ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
- ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
- ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
Korean Agency for Technology and Standards (KATS), X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
- KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
- KS D ISO 19319:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
- KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
- KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
- KS D ISO 19318-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Reporting of methods used for charge control and charge correction
- KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
- GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
- GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
- GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
- GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
- GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
- GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
- GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
- GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
- GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
- GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
- GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
- GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
- GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
- GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
- GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
- GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
- GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
- GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
- GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
British Standards Institution (BSI), X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
- BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
- BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
- BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
- BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
- BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
- 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
- BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
- 23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 18118:2005 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
- BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
- BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
- BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
- BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
- 20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
- BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
- BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
未注明发布机构, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
- BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
German Institute for Standardization, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
- DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
- DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
国家市场监督管理总局、中国国家标准化管理委员会, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
- GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy
- GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
- GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
Japanese Industrial Standards Committee (JISC), X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
- JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
Association Francaise de Normalisation, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
- NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
- NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
- NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
Standard Association of Australia （SAA）, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
- AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
- AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
- AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
- GB/T 32565-2016 Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)
- GB/T 32998-2016 Surface chemical analysis—Auger electron spectroscopy—Reporting of methods used for charge control and charge correction
- GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy（XPS）
KR-KS, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Professional Standard - Judicatory, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
Professional Standard - Public Safety Standards, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
- GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
- GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
Fujian Provincial Standard of the People's Republic of China, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection
Guangdong Provincial Standard of the People's Republic of China, X-ray Photoelectron Spectroscopy and Auger Electron Spectroscopy
- DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy