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Beamer

Beamer, Total:236 items.

In the international standard classification, Beamer involves: Fibre optic communications, Medical equipment, Optics and optical measurements, Optical equipment, Testing of metals, Non-destructive testing, Analytical chemistry, Optoelectronics. Laser equipment, Audio, video and audiovisual engineering, Special measuring equipment for use in telecommunications, Electrical accessories, Shipbuilding and marine structures in general, Industrial furnaces, Radiocommunications, Vocabularies, Metrology and measurement in general, Radiation measurements.


British Standards Institution (BSI), Beamer

  • BS EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments. Michelson interferometer single wavelength meters
  • BS EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
  • BS EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments. Optical spectrum analyzers
  • 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BS ISO 11938:2013 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS EN ISO 15367-2:2006 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Shack-Hartmann sensors
  • BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • BS EN 61290-4-1:2011 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
  • BS EN 61290-4-1:2016 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
  • BS EN ISO 15367-2:2005 Lasers and laser-related equipment. Test methods for determination of the shape of a laser beam wavefront - Shack-Hartmann sensors
  • BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • BS PD IEC/TS 62129-3:2014 Calibration of wavelength/optical frequency measurement instruments. Optical frequency meters using optical frequency combs
  • BS EN 60875-1:2010 Fibre optic interconnecting devices and passive components. Non-wavelength-selective fibre optic branching devices. Generic specification
  • BS EN 60875-1:2015 Fibre optic interconnecting devices and passive components. Non-wavelength-selective fibre optic branching devices. Generic specification
  • BS IEC 62801:2020 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulator in wireless communication and broadcasting systems
  • BS DD IEC/PAS 62593:2009 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulators in wireless communication and broadcasting systems
  • DD IEC/PAS 62593:2008 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulators in wireless communication and broadcasting systems
  • BS EN 181101:1995 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: fibre optic branching devices - Type: non wavelength selective transmissive star
  • BS EN 61753-031-6:2014 Fibre optic interconnecting devices and passive components. Performance standard. Non-connectorized single-mode 1xN and 2xN non-wavelength-selective branching devices for Category O. Uncontrolled environment
  • BS EN 61753-031-2:2014 Fibre optic interconnecting devices and passive components. Performance standard. Non-connectorized single-mode 1xN and 2xN non-wavelength-selective branching devices for Category C. Controlled environment
  • 13/30266303 DC BS EN 62801. Measurement Method of a Half-Wavelength Voltage for Mach-Zehnder Optical Modulator in Wireless Communication and Broadcasting Systems
  • BS EN 62802:2017 Measurement methods of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulators in high-frequency radio on fibre (RoF) systems
  • BS EN 181102:1995 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: fibre optic branching devices - Type: wavelength selective transmission star

International Telecommunication Union (ITU), Beamer

Association Francaise de Normalisation, Beamer

  • NF S10-020*NF EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
  • NF EN ISO 7944:1998 Optique et instruments d'optique - Longueurs d'onde de référence
  • NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
  • NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
  • NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
  • NF ISO 11938:2012 Analyse par microfaisceaux - Analyse par microsonde électronique (microsonde de Castaing) - Méthodes d'analyse par cartographie élémentaire en utilisant la spectrométrie à dispersion de longueur d'onde
  • NF C93-846-1*NF EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1 : optical spectrum analyzers
  • NF C93-832:1995 Blank detail specification. Fibre optic branching devices. Type : wavelength selective transmissive star.
  • NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
  • NF EN ISO 15367-2:2005 Lasers et équipements associés aux lasers - Méthodes d'essai pour la détermination de la forme du front d'onde du faisceau laser - Partie 2 : senseurs Shack-Hartmann
  • NF C93-805-4-1:2011 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method.
  • NF C93-805-4-1*NF EN 61290-4-1:2017 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method
  • NF EN 61290-4-1:2017 Amplificateurs optiques - Méthodes d'essai - Partie 4-1 : paramètres de gain transitoire - Méthode à deux longueurs d'onde
  • NF EN 181101:1995 Spécification particulière cadre - Coupleurs à fibres optiques type : non sélectif en longueur d'onde, transmission en étoile.
  • NF C93-831*NF EN 181101:1995 Blank detail specification. Fibre optic branching devices. Type : non wavelength selective transmissive star.
  • NF EN 54-12:2015 Systèmes de détection et d'alarme incendie - Partie 12 : détecteurs de fumée - Détecteurs linéaires fonctionnant suivant le principe de la transmission d'un faisceau d'ondes optiques rayonnées
  • NF C93-846-13*NF EN IEC 62129-3:2019 Calibration of wavelength/optical frequency measurement instruments - Part 3 : optical frequency meters internally referenced to a frequency comb
  • NF EN ISO 15367-1:2004 Lasers et équipements associés aux lasers - Méthodes d'essai pour la détermination de la forme du front d'onde du faisceau laser - Partie 1 : terminologie et aspects fondamentaux
  • NF S10-127-2*NF EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2 : Shack-Hartmann sensors.
  • NF EN 61280-2-10:2006 Procédures d'essai des sous-systèmes de télécommunication à fibres optiques - Partie 2-10 : systèmes numériques - Mesure de la fluctuation de la longueur d'onde résolue dans le temps et du facteur alpha des émetteurs laser

International Organization for Standardization (ISO), Beamer

  • ISO 7944:1984 Optics and optical instruments; Reference wavelengths
  • ISO/CD 7944 Optics and optical instruments — Reference wavelengths
  • ISO 7944:1998 Optics and optical instruments - Reference wavelengths
  • ISO/DIS 7944:2023 Optics and optical instruments — Reference wavelengths
  • ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
  • ISO 7944:1998/Cor 1:2009 Optics and optical instruments - Reference wavelengths; Technical Corrigendum 1
  • ISO 14594:2003 Analyse par microfaisceaux - Analyse par microsonde électronique (Microsonde de Castaing) - Lignes directrices pour la détermination des paramètres expérimentaux pour la spectrométrie à dispersion de longueur d'onde
  • ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
  • ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Beamer

  • GB/T 10050-1988 Optics and optical instruments--Reference wavelengths
  • GB/T 10050-2009 Optics and optical insturments.Reference wavelengths
  • GB/T 29230.1-2012 Opto-electronic-opto bidirectional wavelength converter for plastic optical fiber transmission system.Part 1: Wavelength converter between 650nm and 1550nm (or 1310nm or 850nm) of 100Mbit/s ethernet
  • GB/T 32212-2015 Standard practice for testing fixed-wavelength photometric detectors used in liquid chromatography
  • GB/T 13714-1992 Fiber optic branching devices--Part 3:Sectional specification--One-to-n wavelength multiplexer/demultiplexer
  • GB/T 18311.5-2003 Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-5:Examinations and measurements-Wavelength dependence of attenuation

Danish Standards Foundation, Beamer

  • DS/EN ISO 7944:1999 Optics and optical instruments - Reference wavelengths
  • DS/EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
  • DS/EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • DS/IEC 875-3:1989 Fibre optic branching devices. Part 3: Sectional specification. One-to-n wavelength multiplexer/demultiplexer
  • DS/EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors
  • DS/EN ISO 15367-1:2004 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects
  • DS/EN IEC 61300-3-7:2021 Fibre optic interconnecting devices and passive components – Basic test and measurement procedures – Part 3-7: Examinations and measurements – Wavelength dependence of attenuation and return loss of single mode components

Korean Agency for Technology and Standards (KATS), Beamer

  • KS B ISO 7944:2011 Optics and optical instruments-Reference wavelengths
  • KS B ISO 7944-2011(2021) Optics and optical instruments-Reference wavelengths
  • KS B ISO 7944-2011(2016) Optics and optical instruments-Reference wavelengths
  • KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS C IEC 60875-2:2012 Fibre optic branching devices-Part 2: Sectional specification-Non-wavelength selective branching devices
  • KS C IEC 60875-3:2012 Fibre optic branching devices-Part 3:Sectional specification-Wavelength selective branching devices
  • KS C IEC 60875-3-2002(2007) Fibre optic branching devices-Part 3:Sectional specification-Wavelength selective branching devices
  • KS D ISO 22489:2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
  • KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS C IEC 60875-2-2002(2007) Fibre optic branching devices-Part 2: Sectional specification-Non-wavelength selective branching devices
  • KS B ISO 15367-2:2015 Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront — Part 2: Shark-Hartmann sensors
  • KS B ISO 15367-2:2006 Lasers and laser-related equipment-Test methods fordetermination of the shape of a laser beam wavefront-Part 2:Shark-Hartmann sensors
  • KS B ISO 15367-2:2020 Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront —Part 2: Shark-Hartmann sensors
  • KS B ISO 11553-2:2020 Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront —Part 2: Shark-Hartmann sensors
  • KS C IEC 61300-3-7-2008(2018) Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-7:Examinations and measurements-Wavelength dependence of attenuation and return loss
  • KS C IEC 61300-3-7:2008 Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-7:Examinations and measurements-Wavelength dependence of attenuation and return loss
  • KS C IEC 61300-3-5:2008 Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-5:Examinations and measurements-Wavelength dependence of attenuation
  • KS C IEC 61300-3-5:2011 Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-5:Examinations and measurements-Wavelength dependence of attenuation

Japanese Industrial Standards Committee (JISC), Beamer

  • JIS B 7090:1999 Optics and optical instruments -- Reference wavelengths
  • JIS C 5910:2006 General rules of optical branching devices (Non-wavelength selective branching devices)
  • JIS C 5910-3:2015 Non-wavelength-selective fiber optic branching devices -- Part 3: Non-connectorized single-mode 1xN and 2xN non-wavelength-selective branching devices
  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
  • JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • JIS C 5910-1:2014 Non-wavelength-selective fiber optic branching devices -- Part 1: Generic specification
  • JIS C 5910-1:2019 Non-wavelength-selective fiber optic branching devices -- Part 1: Generic specification
  • JIS C 6122-4-1:2013 Optical amplifiers.Test methods.Part 4-1: Transient parameters.Measurement of gain parameters using two-wavelength method
  • JIS C 61300-3-7:2012 Fiber optic interconnecting devices and passive components -- Basic test and measurement procedures -- Part 3-7: Examinations and measurements -- Wavelength dependence of attenuation and return loss of single mode components

RU-GOST R, Beamer

  • GOST R ISO 7944-2013 Optics and optical instruments. Reference wavelengths
  • GOST 26086-1984 Lasers. Methods for measurement of beam diameter and beam energy divergence angle
  • GOST 8.197-2005 State system for ensuring the uniformity of measurements. State verification scheme for instruments measuring of the spectral radiance in spectral range from 0,04 to 0,25 ?
  • GOST 8.197-1986 State system for ensuring the uniforming of measurements. State special standard and state verification schedule for means measuring spectral density of energy radiance of optical radiation in the wavelength range of 0,04-0,25 um
  • GOST IEC 60884-2-7-2016 Electric plugs connectors for household and similar purposes. Part 2-7. Particular requirements for cord extension sets
  • GOST R ISO 15367-2-2012 Laser and laser-related equipment. Test methods for determination of the shape of a laser beam wavefront. Part 2. Shack-Hartmann sensors
  • GOST R 55232-2012 Fixed-wavelength photometric detectors used in liquid chromatography and flow-injection analysis. General technical requirements and test methods
  • GOST R 8.841-2013 State system for ensuring the uniformity of measurement. Instruments for measurement of exposure and irradiance in the wavelength range 1 to 10 nm. Verification procedure
  • GOST 8.273-1978 State system for ensuring the uniformity of measurements. State special standard and all-union verification schedule for means measuring radiant flux 1·10 in minus 6 degree to 1·10 in minus 2 degree W in the wavelength range of 0,4 - 1,4 um
  • GOST R 8.863-2013 State system for ensuring the uniformity of measurements. Insruments for measurement power and irradiance in the wavelength range from 10 to 30 nm. Verification procedure
  • GOST R 8.864-2013 State system for ensuring the uniformity of measurements. Absolute spectral responsiviti of detectors in the wavelength range 0,120-0,400 nm. Measurement procedur

German Institute for Standardization, Beamer

  • DIN EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
  • DIN EN 62129-2:2012-03 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters (IEC 62129-2:2011); German version EN 62129-2:2011
  • DIN EN ISO 7944:1998-07 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
  • DIN EN 61290-4-1:2017-06 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016 / Note: DIN EN 61290-4-1 (2012-04) remains valid alongside this standard until 2019-10-31.
  • DIN EN ISO 15367-2:2005-06 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors (ISO 15367-2:2005); German version EN ISO 15367-2:2005
  • DIN EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors (ISO 15367-2:2005); German version EN ISO 15367-2:2005
  • DIN EN 181102:1995 Blank detail specification: Fibre optic branching devices - Type: Wavelength selective transmissive star; German version EN 181102:1994
  • DIN EN 181101:1995 Blank detail specification: Fibre optic branching devices - Type: Non wavelength selective transmissive star; German version EN 181101:1994
  • DIN EN 181103:1998 Blank detail specification - Fibre optic branching devices - Type: Non wavelength selective transmission star for telecommunication application; German version EN 181103:1997
  • DIN EN 181104:1998 Blank detail specification - Fibre optic branching devices - Type: Wavelength selective transmissive star for telecommunication application; German version EN 181104:1997
  • DIN EN ISO 15367-1:2004-02 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003); German version EN ISO 15367-1:2003
  • DIN EN 61753-2-3:2002-08 Fibre optic interconnecting devices and passive components performance standard - Part 2-3: Non-connectorised single-mode 1×N and 2×N non-wavelength-selective branching devices for category U; Uncontrolled environment (IEC 61753-2-3:2001); German ver...
  • DIN EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (IEC 62129-1:2016); German version EN 62129-1:2016
  • DIN EN 62801:2014 Measurement Method of a Half-Wavelength Voltage for Mach-Zehnder Optical Modulator in Wireless Communication and Broadcasting Systems (IEC 103/120/CDV:2013); English version FprEN 62801:2013
  • DIN EN 61290-4-1:2012 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2011); German version EN 61290-4-1:2011
  • DIN EN 61290-4-1:2017 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016

未注明发布机构, Beamer

  • BS EN ISO 7944:1998(1999) Optics and optical instruments — Reference wavelengths
  • BS EN IEC 62129-3:2019 Calibration of wavelength / optical frequency measurement instruments Part 3 : Optical frequency meters internally referenced to a frequency comb

International Electrotechnical Commission (IEC), Beamer

  • IEC 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
  • IEC 60875-3:1987 Fibre optic branching devices; part 3: sectional specification; wavelength selective branching devices
  • IEC 60875-3:1992 Fibre optic branching devices; part 3: sectional specification; wavelength selective branching devices
  • IEC 60875-2:1992 Fibre optic branching devices; part 2: sectional specification; non-wavelength selective branching devices
  • IEC 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • IEC 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • IEC 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • IEC 62150-5:2017 Fibre optic active components and devices - Test and measurement procedures - Part 5: Wavelength channel tuning time of tuneable transmitters
  • IEC PAS 62593:2008 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulators in wireless communication and broadcasting systems
  • IEC 62801:2020 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulator in wireless communication and broadcasting systems
  • IEC 61300-3-7:2000 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-7: Examinations and measurements; Wavelength dependence of attenuation and return loss
  • IEC 61300-3-7:2004 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-7: Examinations and measurements - Wavelength dependence of attenuation and return loss
  • IEC 86/461/DTS:2013 IEC/TS 62129-3, Ed. 1: Calibration of wavelength/optical frequency measurement instruments - Part 3: Optical frequency meters using optical frequency combs
  • IEC 62129-3:2019 Calibration of wavelength/optical frequency measurement instruments - Part 3:Optical frequency meters internally referenced to a frequency comb
  • IEC 103/74/PAS:2008 IEC/PAS 62593: Measurement method of a half-wavelength voltage for mach-zehnder optical modulator in wireless communication and broadcasting systems
  • IEC 62802:2017 Measurement method of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulator in high-frequency radio on fibre (RoF) systems
  • IEC 61753-031-2:2014 Fibre optic interconnecting devices and passive components - Performance standard - Part 031-2: Non-connectorized single-mode 1×N and 2×N non-wavelengthselective branching devices for Category C - Controlled environment
  • IEC 61300-3-7:2021 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-7: Examinations and measurements - Wavelength dependence of attenuation and return loss of single mode components
  • IEC 61300-3-7:2009 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-7: Examinations and measurements - Wavelength dependence of attenuation and return loss of single mode components
  • IEC TS 62129-3:2014 IEC/TS 62129-3, Ed. 1: Calibration of wavelength/optical frequency measurement instruments - Part 3: Optical frequency meters using optical frequency combs
  • IEC 61753-2-3:2001 Fibre optic interconnecting devices and passive components performance standard - Part 2-3: Non-connectorised single-mode 1×N and 2×N non-wavelength-selective branching devices for category U; Uncontrolled environment
  • IEC 61300-3-5:2000 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-5: Examinations and measurements; Wavelength dependence of attenuation
  • IEC 61300-3-5:2004 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-5: Examinations and measurements - Wavelength dependence of attenuation
  • IEC 61753-031-6:2014 Fibre optic interconnecting devices and passive components - Performance standard - Part 031-6: Non-connectorized single-mode 1xN and 2xN non-wavelength-selective branching devices for Category O - Uncontrolled environment

Taiwan Provincial Standard of the People's Republic of China, Beamer

  • CNS 11399-1985 Method of Straight-Beam Ultrasonic Test for Steel Plate for Pressure Vessel Use

CENELEC - European Committee for Electrotechnical Standardization, Beamer

  • EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters
  • EN 60875-1:2001 Non-Wavelength-Selective Fibre Optic Branching Devices Part 1: Generic Specification
  • EN 61300-3-7:2001 Fibre Optic Interconnecting Devices and Passive Components - Basic Test and Measurement Procedures Part 3-7: Examinations and Measurements - Wavelength Dependance of Attenuation and Return Loss

ES-UNE, Beamer

  • UNE-EN 62129-2:2011 Calibration of wavelength/optical frequency measurement instruments - Part 2: Michelson interferometer single wavelength meters (Endorsed by AENOR in October of 2011.)
  • UNE-EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers (Endorsed by AENOR in July of 2016.)
  • UNE-EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (Endorsed by Asociación Española de Normalización in February of 2017.)
  • UNE-EN IEC 62129-3:2019 Calibration of wavelength/optical frequency measurement instruments - Part 3:Optical frequency meters internally referenced to a frequency comb (Endorsed by Asociación Española de Normalización in September of 2019.)

PL-PKN, Beamer

  • PN T06561-1971 Microwave measuring instruments Cavity wavemeter General requirements and tests

KR-KS, Beamer

  • KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
  • KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS B ISO 11553-2-2020 Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront —Part 2: Shark-Hartmann sensors
  • KS B ISO 15367-2-2020 Lasers and laser-related equipment — Test methods for determination of the shape of a laser beam wavefront —Part 2: Shark-Hartmann sensors
  • KS C IEC 61300-3-5-2008 Fibre optic interconnecting devices and passive components-Basic test and measurement procedures-Part 3-5:Examinations and measurements-Wavelength dependence of attenuation

Lithuanian Standards Office , Beamer

  • LST EN ISO 7944:2000 Optics and optical instruments - Reference wavelengths (ISO 7944:1998)
  • LST EN 62129-2-2011 Calibration of wavelength/optical frequency measurement instruments -- Part 2: Michelson interferometer single wavelength meters (IEC 62129-2:2011)
  • LST EN ISO 7944:2000/AC:2009 Optics and optical instruments - Reference wavelengths (ISO 7944:1998/Cor 1:2009)
  • LST EN 61290-4-1-2011 Optical amplifiers - Test methods -- Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2011)
  • LST EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors (ISO 15367-2:2005)
  • LST EN 60875-1-2010 Fibre optic interconnecting devices and passive components - Non-wavelength-selective fibre optic branching devices -- Part 1: Generic specification (IEC 61558-2-5:2010)
  • LST EN ISO 15367-1:2004 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003)

AENOR, Beamer

  • UNE-EN ISO 7944:1999 OPTICS AND OPTICAL INSTRUMENTS. REFERENCE WAVELENGTHS (ISO 7944:1998)
  • UNE-EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors (ISO 15367-2:2005)
  • UNE-EN ISO 15367-1:2004 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 1: Terminology and fundamental aspects (ISO 15367-1:2003)

European Committee for Standardization (CEN), Beamer

  • EN ISO 7944:1998 Optics and Optical Instruments - Reference Wavelengths ISO 7944:1998
  • EN ISO 7944:1998/AC:2009 Optics and optical instruments - Reference wavelengths (ISO 7944:1998/Cor 1:2009)
  • EN ISO 15367-2:2005 Lasers and laser-related equipment - Test methods for determination of the shape of a laser beam wavefront - Part 2: Shack-Hartmann sensors

Group Standards of the People's Republic of China, Beamer

  • T/CVIA 86-2021 Technical specifications for wavelength conversion devices for laser display

Professional Standard - Military and Civilian Products, Beamer

  • WJ 2279-1995 Verification rules for wavelength standard device of low-pressure quartz mercury lamp

Professional Standard - Electron, Beamer

  • SJ 20642.7-2000 Semiconductor opto-electronic devices Detail specification for type GR1325J light emitting diode module
  • SJ 20683-1998 General specification of digital beam controller module of T/R module for phased array radar
  • SJ 2355.7-1983 Method of measurement for peak emission wavelength and spectral radiation bandwidth of light-emitting devices

Defense Logistics Agency, Beamer

  • DLA DSCC-DWG-10023-2013 CONNECTOR PLUG, EXPANDED BEAM, HYBRID (2 SINGLE MODE& 2 MULTIMODE CHANNELS)
  • DLA DSCC-DWG-94032 REV A-2000 CONNECTOR, ELECTRICAL, RECTANGULAR, HIGH DENSITY NANOMINIATURE, LOBE KEYED, PLUG, WIRE/HARNESS TERMINATED
  • DLA DSCC-DWG-94033-1996 CONNECTORS, ELECTRICAL, RECTANGULAR, HIGH DENSITY NANOMINIATURE, LOBE KEYED, RECEPTACLE, WIRE/ HARNESS TERMINATED
  • DLA DSCC-DWG-10024-2013 CONNECTOR RECEPTACLE, EXPANDED BEAM, MIXED MODE (2 SINGLE MODE& 2 MULTIMODE CHANNELS)
  • DLA MIL-PRF-19500/469 D-2008 SEMICONDUCTOR DEVICE, SILICON, HIGH-POWER, SINGLE PHASE, FULL WAVE BRIDGE RECTIFIER, TYPES M19500/469-01, -02, -03, -04, -05, JANTX AND JANTXV

American Society for Testing and Materials (ASTM), Beamer

  • ASTM G178-16 Standard Practice for Determining the Activation Spectrum of a Material (Wavelength Sensitivity to an Exposure Source) Using the Sharp Cut-On Filter or Spectrographic Technique
  • ASTM E2223-13(2018)e1 Standard Practice for Examination of Seamless, Gas-Filled, Steel Pressure Vessels Using Angle Beam Ultrasonics
  • ASTM E2223-13(2022) Standard Practice for Examination of Seamless, Gas-Filled, Steel Pressure Vessels Using Angle Beam Ultrasonics
  • ASTM E1657-98(2006) Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E685-93 Standard Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E685-93(2013) Standard Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E685-93(2021) Standard Practice for Testing Fixed-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E1657-98 Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E1657-98(2001) Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E1657-98(2019) Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM E1657-98(2011) Standard Practice for Testing Variable-Wavelength Photometric Detectors Used in Liquid Chromatography
  • ASTM G178-03 Standard Practice for Determining the Activation Spectrum of a Material (Wavelength Sensitivity to an Exposure Source) Using the Sharp Cut-On Filter or Spectrographic Technique
  • ASTM G178-16(2023) Standard Practice for Determining the Activation Spectrum of a Material (Wavelength Sensitivity to an Exposure Source) Using the Sharp Cut-On Filter or Spectrographic Technique
  • ASTM G178-09 Standard Practice for Determining the Activation Spectrum of a Material (Wavelength Sensitivity to an Exposure Source) Using the Sharp Cut-On Filter or Spectrographic Technique

Professional Standard - Post and Telecommunication, Beamer

  • YD/T 1527-2006 Technical requirements and test methods for optoelectronic(wavelength/mode)converter
  • YD/T 1527-2013 Photoelectric (wavelength/mode) converter technical requirements and test methods

European Committee for Electrotechnical Standardization(CENELEC), Beamer

  • EN 181102:1994 Blank Detail Specification: Fibre Optic Branching Devices Type: Wavelength Selective Transmissive Star
  • EN 181101:1994 Blank Detail Specification: Fibre Optic Branching Devices Type: Non Wavelength Selective Transmissive Star
  • EN 62129-1:2016 Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
  • EN 181104:1997 Blank Detail Specification: Fibre Optic Branching Devices Type: Wavelength Selective Transmissive Star for Telecommunication Application
  • EN 181103:1997 Blank Detail Specification: Fibre Optic Branching Devices Type: Non Wavelength Selective Transmissive Star for Telecommunication Application
  • EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
  • EN IEC 62129-3:2019 Calibration of wavelength/optical frequency measurement instruments - Part 3:Optical frequency meters internally referenced to a frequency comb
  • EN 62802:2017 Measurement methods of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulators in highfrequency radio on fibre (RoF) Systems
  • EN 61753-2-3:2001 Fibre Optic Interconnecting Devices and Passive Components Performance Standard - Part 2-3: Non-Connectorised Single Mode 1xN and 2xN Non-Wavelength-Selective Branching Devices for Category U - Uncontrolled Environment
  • EN 61300-3-7:2012 Fibre optic interconnecting devices and passive components - Basic test and measurement procedures - Part 3-7: Examinations and measurements - Wavelength dependence of attenuation and return loss of single mode components

UNKNOWN, Beamer

  • GB/T 32211-2015 Test Method for Variable Wavelength Photometric Detectors for Liquid Chromatography
  • GB/T 32211-2015 Test Method for Variable Wavelength Photometric Detectors for Liquid Chromatography

TH-TISI, Beamer

  • TIS 2058-2000 Fibre optic branching devices.part 3: sectional specification.wavelength selective branching devices
  • TIS 2057-2000 Fibre optic branching devices.part 2: sectional specification.non.wavelength selective branching devices

Professional Standard - Machinery, Beamer

  • JB/T 9358-1999 Test method for fixed wavelength (254nm) UV detector used in liquid chromatography

Military Standard of the People's Republic of China-General Armament Department, Beamer

  • GJB 960A-2020 Specification for artificial quartz crystal substrates for long-delay surface acoustic wave devices

US-FCR, Beamer

  • FCR COE EC 1130-2-205-1996 USE OF SINGLE TRANSDUCER MULTIBEAM ACOUSTIC SURVEY SYSTEMS ON NAVIGATION, FLOOD CONTROL, AND DREDGING PROJECTS

国家市场监督管理总局、中国国家标准化管理委员会, Beamer

  • GB/T 18497.2-2019 Characteristics of electric infrared emitters for industrial heating—Part 2: Mediumwave and longwave electric infrared emitters

IEC - International Electrotechnical Commission, Beamer

  • TS 62129-3-2014 Calibration of wavelength/optical frequency measurement instruments - Part 3: Optical frequency meters using optical frequency combs (Edition 1.0)
  • PAS 62593-2008 Measurement method of a half-wavelength voltage for Mach-Zehnder optical modulators in wireless communication and broadcasting systems (Edition 1.0)

工业和信息化部, Beamer

  • YD/T 3433-2018 Technical requirements and test methods for built-in wavelength selective reflectors in ONU optical modules for OTDR testing

European Standard for Electrical and Electronic Components, Beamer

  • CECC 81 101- 804 ISSUE 1-1994 Fibre Optic Branching Devices; Type: Non Wavelength Selective Transmissive Star 1 x 8 Ports Bidirectional; Style: Configuration A, Fibre Type A1.a (En)
  • CECC 81 102- 801 ISSUE 1-1994 Fibre Optic Branching Devices; Type: Wavelength Selective Multiplexer/ Demultiplexer 1 x 2 Ports Bidirectional; Style: Configuration A, Fibre Type B1.2 (En)




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