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x-rays and high-energy electron beams

x-rays and high-energy electron beams, Total:394 items.

In the international standard classification, x-rays and high-energy electron beams involves: Welding, brazing and soldering, Analytical chemistry, Non-destructive testing, Radiation measurements, Processes in the food industry, Radiation protection, Optics and optical measurements, Medical equipment, Linear and angular measurements, Optical equipment, Electronic components in general, Food products in general, Protection against crime, Electricity. Magnetism. Electrical and magnetic measurements, Metrology and measurement in general, Materials for aerospace construction, Electrical accessories, Medical sciences and health care facilities in general, Paper and board, Reinforced plastics, Electromagnetic compatibility (EMC), Road vehicle systems, ENVIRONMENT. HEALTH PROTECTION. SAFETY, Physics. Chemistry, Non-ferrous metals, Applications of information technology, Wastes, Dentistry, Electronic tubes, Electronic display devices, Photography, Paints and varnishes.


AT-ON, x-rays and high-energy electron beams

  • ONORM S 5233-1987 Dosimeters for use in radiotherapy with ionization Chambers forX-rays, y -rays and electron beams
  • ONORM S 5231-1993 Radiation protection dosemeters - Individual dosemeters and portable area monitors with ionization Chambers, countertubes or scintillators for y- and X-rays - Marking of conformity

Association of German Mechanical Engineers, x-rays and high-energy electron beams

German Institute for Standardization, x-rays and high-energy electron beams

  • DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
  • DIN 6809-1:1976 Clinical dosimetry; therapeutical application of x-ray, gamma-ray and electron beams
  • DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
  • DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
  • DIN EN 60601-2-54:2010 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009); German version EN 60601-2-54:2009
  • DIN 6827-1:2020-10 Recording in medical application of ionizing radiation - Part 1: Therapy with electron accelerators as well as X-ray and gamma-ray therapy systems
  • DIN EN 60526:2006-04 High-voltage cable plug and socket connections for medical X-ray equipment (IEC 60526:1978, modified); German version EN 60526:2004
  • DIN 6800-2:2020-08 Procedures of dosimetry with probe-type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
  • DIN 6800-2 Berichtigung 1:2010 Procedures of dosimetry with probe type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation, Corrigendum to DIN 6800-2:2008-03
  • DIN 6800-2:2008 Procedures of dosimetry with probe type detectors for photon and electron radiation - Part 2: Ionization chamber dosimetry of high energy photon and electron radiation
  • DIN 44402-14:1971-10 Measurements of electrical properties of electronic tubes; methods of measurement of emission current from hot cathodes for high-vacuum electronic tubes and valves
  • DIN EN 12543-5:1999 Non-destructive testing - Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing - Part 5: Measurement of the effective focal spot size of mini and micro focus X-ray tubes; German version EN 12543-5:1999
  • DIN 6809-6:2020 Clinical dosimetry - Part 6: Application of high energy photon and electron radiation in teleradiotherapy
  • DIN 6809-6:2020-11 Clinical dosimetry - Part 6: Application of high energy photon and electron radiation in teleradiotherapy
  • DIN 6871-2:2005 Cyclotron systems for positron emission tomography - Part 2: Radiation protection labyrinths and wall entrances
  • DIN EN 60601-2-54:2016 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009 + Cor.:2010 + Cor.:2011 + A1:2015); German version EN 60601-2-54:2009 +
  • DIN IEC 60151-14:1980 Measurement of the electrical properties of electronic tubes; part 14: methods of measurement of radar and oscilloscope cathode-ray tubes
  • DIN EN 60601-2-54 Berichtigung 3:2012 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009); German version EN 60601-2-54:2009, Corrigendum to DIN EN 60601-2-54 (

Professional Standard - Hygiene , x-rays and high-energy electron beams

  • WS/T 117-1999 Specification of estimation of eye lens dose from X、γ、β rays and electron beams

International Organization for Standardization (ISO), x-rays and high-energy electron beams

  • ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • ISO/ASTM 51431:2005 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
  • ISO 10810:2019 Surface chemical analysis — X-ray photoelectron spectroscopy — Guidelines for analysis
  • ISO 10810:2010 Surface chemical analysis - X-ray photoelectron spectroscopy - Guidelines for analysis
  • ISO 19830:2015 Surface chemical analysis - Electron spectroscopies - Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • ISO 16243:2011 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • ISO/CD TR 18392:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for determining backgrounds
  • ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • ISO 18554:2016 Surface chemical analysis - Electron spectroscopies - Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • ISO 14701:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Measurement of silicon oxide thickness
  • ISO 14701:2011 Surface chemical analysis - X-ray photoelectron spectroscopy - Measurement of silicon oxide thickness
  • ISO 13424:2013 Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of results of thin-film analysis
  • ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • ISO 17109:2022 Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth p
  • ISO 17109:2015 Surface chemical analysis - Depth profiling - Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
  • ISO/TR 19319:2003 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area, and sample area viewed by the analyser
  • ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
  • ISO/ASTM 51818:2009 Practice for dosimetry in an electron beam facility for radiation processing at energies between 80 and 300 keV
  • ISO/ASTM 51818:2013 Practice for dosimetry in an electron beam facility for radiation processing at energies between 80 and 300 keV
  • ISO 19668:2017 Surface chemical analysis — X-ray photoelectron spectroscopy — Estimating and reporting detection limits for elements in homogeneous materials
  • ISO 11452-4:2011 Road vehicles - Component test methods for electrical disturbances from narrowband radiated electromagnetic energy - Part 4: Harness excitation methods
  • ISO/DIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO/FDIS 18118:2023 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
  • ISO 4037:1979/Add 1:1983 X and gamma reference radiations for calibrating dosemeters and dose ratemeters and for determining their response as a function of photon energy — Addendum 1: High rate series of filtered X-radiation
  • ISO 15573:1998 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 80 keV and 300 keV
  • ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
  • ISO 15569:1998 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 300 keV and 25 MeV
  • ISO/ASTM 51649:2002 Practice for dosimetry in an electron beam facility for radiation processing at energies between 300 keV and 25 MeV
  • ISO/ASTM 51649:2005 Practice for dosimetry in an electron beam facility for radiation processing at energies between 300 keV and 25 MeV
  • ISO/ASTM 51649:2015 Practice for dosimetry in an electron beam facility for radiation processing at energies between 300 keV and 25 MeV
  • ISO 22581:2021 Surface chemical analysis — Near real-time information from the X-ray photoelectron spectroscopy survey scan — Rules for identification of, and correction for, surface contamination by carbon-containi
  • ISO 16531:2013 Surface chemical analysis - Depth profiling - Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS

British Standards Institution (BSI), x-rays and high-energy electron beams

  • BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
  • BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
  • BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
  • BS ISO 10810:2010 Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 19830:2015 Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • BS EN 60601-2-68:2015 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam therapy equi
  • BS EN 60601-2-54:2009 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • BS EN 60601-2-54:2010 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • BS ISO 16243:2011 Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
  • BS ISO 18554:2016 Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
  • BS ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • BS ISO 10810:2019 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Guidelines for analysis
  • BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
  • 19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
  • BS EN 60526:2005 High-voltage cable plug and socket connections for medical X-ray equipment
  • BS EN 60526:2004 High-voltage cable plug and socket connections for medical X-ray equipment
  • BS ISO 14701:2011 Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS ISO 17109:2022 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter dept profiling using single and multi-layer thin…
  • 21/30433862 DC BS ISO 17109 AMD1. Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and…
  • BS ISO 17470:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • 20/30423741 DC BS ISO 19318. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
  • BS ISO 14701:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Measurement of silicon oxide thickness
  • BS ISO 17109:2015 Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • BS ISO 19668:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Estimating and reporting detection limits for elements in homogeneous materials
  • BS ISO 19318:2021 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Reporting of methods used for charge control and charge correction
  • BS EN 60601-2-54:2009+A2:2019 Medical electrical equipment. Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
  • BS ISO 20903:2019 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
  • BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
  • BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
  • DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • 23/30461294 DC BS ISO 18118. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS ISO 15573:1998 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 80 keV and 300 keV
  • BS ISO 15573:1999 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 80 keV and 300 keV
  • BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
  • BS ISO 18118:2015 Tracked Changes. Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • BS ISO 15569:1998 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 300 keV and 25 MeV
  • BS ISO 15569:1999 Practice for dosimetry in an electron-beam facility for radiation processing at energies between 300 keV and 25 MeV
  • BS ISO 24237:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • BS EN IEC 61223-3-7:2021 Evaluation and routine testing in medical imaging departments - Acceptance and constancy tests. Imaging performance of X-ray equipment for dental cone beam computed tomography
  • BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • BS EN 60601-2-63:2015 Medical electrical equipment. Particular requirements for the basic safety and essential performance of dental extra-oral X-ray equipment
  • BS EN 60601-2-63:2015+A2:2021 Medical electrical equipment - Particular requirements for the basic safety and essential performance of dental extra-oral X-ray equipment
  • BS EN 60601-1-3:2008+A1:2013 Medical electrical equipment. General requirements for basic safety and essential performance. Collateral Standard. Radiation protection in diagnostic X-ray equipment
  • IEC 62607-6-21:2022 Nanomanufacturing. Key control characteristics. - Part 6-21: Graphene-based material. Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
  • BS EN 60601-2-43:2022 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for interventional procedures
  • BS EN 60601-2-43:2010+A2:2020 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for interventional procedures
  • BS EN 60601-2-65:2013+A2:2021 Medical electrical equipment - Particular requirements for the basic safety and essential performance of dental intra-oral X-ray equipment
  • BS EN 60601-1-3:2008 Medical electrical equipment -Part 1-3: General requirements for basic safety and essential performance - Collateral Standard - Radiation protection in diagnostic X-ray equipment
  • BS EN 60601-1-3:2008+A2:2021 Medical electrical equipment - General requirements for basic safety and essential performance. Collateral Standard: Radiation protection in diagnostic X-ray equipment
  • BS ISO 4037-2:1998 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy. Dosimetry for radiation protection over the energy ranges 8 keV to 1, 3 MeV and 4 MeV to 9 MeV
  • BS EN 60601-2-65:2013 Medical electrical equipment. Particular requirements for the basic safety and essential performance of dental intra-oral X-ray equipment
  • BS EN IEC 60601-2-28:2019 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray tube assemblies for medical diagnosis
  • BS ISO 16531:2013 Surface chemical analysis. Depth profiling. Methods for ion beam alignment and the associated measurement of current or current density for depth profiling in AES and XPS
  • BS ISO 4037-1:1998 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Radiation characteristics and production methods
  • BS ISO 22581:2021 Surface chemical analysis. Near real-time information from the X-ray photoelectron spectroscopy survey scan. Rules for identification of, and correction for, surface contamination by carbon-containing compounds
  • BS EN 60601-2-43:2010 Medical electrical equipment - Particular requirements for basic safety and essential performance of X-ray equipment for interventional procedures
  • BS EN 60601-2-44:2009+A2:2016 Medical electrical equipment - Particular requirements for the basic safety and essential performance of X-ray equipment for computed tomography

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, x-rays and high-energy electron beams

  • GB/T 25184-2010 Verification method for X-ray photoelectron spectrometers
  • GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
  • GB/T 15447-1995 Conversion method of absorbed doses in different materials irradiated by X,γ rays and electron beams
  • GB/T 15447-2008 Conversion method of absorbed doses in different materials irradiated by X、γ rays and election beams
  • GB/T 19500-2004 General rules for X-ray photoelectron spectroscopic analysis method
  • GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
  • GB/T 17359-1998 General specification of X-ray EDS quantitative analysis for EPMA and SEM
  • GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
  • GB/T 30704-2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Guidelines for analysis
  • GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
  • GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
  • GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
  • GB/Z 32490-2016 Procedure for determination of background by X-ray photoelectron spectroscopy for surface chemical analysis
  • GB/T 25185-2010 Surface chemical analysis.X-ray photoelectron spectroscopy.Reporting of methods used for charge control and charge correction
  • GB/T 28633-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
  • GB/T 17507-2008 General specification of thin biological standards for X-ray EDS microanalysis in transmission electron microscope
  • GB/T 17507-1998 General specification of thin biological standards for X-Ray-Ray EDS microanalysis in electron microscope
  • GB/T 31470-2015 Standard practice for determination of the specimen area contributing to the detected signal in Auger electron spectrometers and some X-ray photoelectron spectrometers
  • GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
  • GB/T 2679.11-2008 Paper and board.Qualitative analysis of mineral filler and mineral coating.SEM/EDAX Method
  • GB/T 25188-2010 Thickness measurements for ultrathin silicon oxide layers on silicon wafers X-ray photoelectron spectroscopy
  • GB/T 2679.11-1993 Paper and board. Qualitative analysis of mineral filler and mineral coating. SEM/EDAX method
  • GB/T 29556-2013 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution,analysis area,and sample area viewed by the analyser
  • GB/T 17361-1998 Identification method of authigenic clay mineral in sedimentary rock by SEM & XEDS
  • GB/T 32869-2016 Nanotechnologies.Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • GB/T 30702-2014 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
  • GB/Z 21277-2007 Rapid screening of lead,mercury,chromium,cadmium and bromine of regulated substances in electrical and electronic equipment.X-ray fluorescence spectrometry

RU-GOST R, x-rays and high-energy electron beams

  • GOST 22091.2-1984 X-ray devices. The methods of measuring of the current and the voltage of injection of X-ray betatrons
  • GOST R ISO/ASTM 51431-2012 Practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing
  • GOST 34157-2017 Standard Practice for Dosimetry in Electron Beam and X-Ray (Bremsstrahlung) Irradiation Facilities for Food Processing
  • GOST 8.473-1982 State system for ensuring the uniformity of measurements. State special standard and state verification schedule for measuring exposure dose, mean exposure rate, mean energy fluence and mean density of pulsed X-ray radiation fluence energy
  • GOST R IEC 60526-2001 High-voltage cable plug and socket connections for medical X-ray equipment
  • GOST R 56811-2015 Polymer composites. Radiography of the outer layers and the material of the inner layer of the sandwich constructions
  • GOST R 50267.2.54-2013 Medical electrical equipment. Part 2-54. Particular requirements for basic safety and essential performance of the X-ray equipment for radiography and radioscopy
  • GOST 17226-1971 Measureres for exposure rate measuring of gamma and X radiations with photon energy of 8 to 480 fj. Technical requirements and test methods
  • GOST R ISO 16243-2016 State system for insuring the uniformity of measurements Surface chemical analysis. Recording and reporting data in X-ray photoelectron spectroscopy (XPS)

Professional Standard - Medicine, x-rays and high-energy electron beams

  • YY 9706.268-2022 Medical electrical equipment Part 2-68: X-ray image guides for electron accelerators, light ion beam therapy equipment and radionuclide beam therapy equipment
  • YY/T 0829-2011 Characteristics and test methods for imaging system of positron emission and X-ray computed tomography
  • YY 0775-2010 Teleradiotherapy treatment planning system accuracy of dosimetric calculation and test methods for high energy X(γ) beam
  • YY/T 1408-2016 Performance characteristics and test methods of imaging system of single photon emission and X-ray computed tomograph

VN-TCVN, x-rays and high-energy electron beams

  • TCVN 7249-2008 Standard practice for dosimetry in electron beam and X-ray (bremsstrahlung) irradiation facilities for food processing

Korean Agency for Technology and Standards (KATS), x-rays and high-energy electron beams

  • KS D ISO 21270:2005 Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 21270-2005(2020) Surface chemical analysis-X-ray photoelectron and Auger electron spectrometers-Linearity of intensity scale
  • KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS D ISO 15470-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Description of selected instrumental performance parameters
  • KS A 4722-1996(2016) High voltage cable plug and socket for medical X-ray equipment
  • KS A 4509-1991(1996) METHODS OF EVALUATION DOSE EQUIVALENT BY FILM BADGES FOR X-RAYS, GAMMA RAYS AND THERMAL NEUTRONS
  • KS D ISO 19318-2005(2020) Surface chemical analysis-X-ray photoelectron spectroscopy-Reporting of methods used for charge control and charge correction
  • KS D ISO 15472-2003(2018)
  • KS A IEC 60532-2016(2021) Radiation protection instrumentation-Installed dose ratemeters, warning assemblies and monitors-X and gamma radiation of energy between 50 keV and 7 MeV
  • KS C IEC 60526:2021 High-voltage cable plug and socket connections for medical X-ray equipment
  • KS C IEC 60601-2-68:2018 Medical electrical equipment ─ Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators,
  • KS C IEC 60601-2-54:2012 Medical electrical equipment-Parts 2-54:Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • KS D ISO 19319-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS C IEC 60613:2003 Electrical, thermal and loading characteristics of rotating anode X-ray tubes for medical diagnosis
  • KS C IEC 60613:2017 Electrical and loading characteristics of X-ray tube assemblies for medical diagnosis
  • KS D ISO 22489:2012 Microbeam analysis-Electron probe microanalysis-Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
  • KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 19319:2005 Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
  • KS D ISO 18118-2005(2020) Surface chemical analysis-Auger electron spectroscopy and X-ray photoelectron spectroscopy-Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
  • KS A IEC 61525-2003(2013) Radiation protection instrumentation-X, gamma, high energy beta and neutron radiations-Direct reading personal dose equivalent and/or dose equivalent rate monitors
  • KS A IEC 61525:2016 Radiation protection instrumentation-X, gamma, high energy beta and neutron radiations-Direct reading personal dose equivalent and/or dose equivalent rate monitors
  • KS A ISO 4037-1-2003(2018)
  • KS C IEC 60601-2-44:2011 Medical electrical equipment-Part 2-44:Particular requirements for the basic safety and essential performance of x-ray equipment for computed tomography
  • KS C IEC 60601-2-44:2017 Medical electrical equipment-Part 2-44:Particular requirements for the basic safety and essential performance of x-ray equipment for computed tomography
  • KS C IEC 60601-2-54:2020 Medical electrical equipments — Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • KS A ISO 4037-2-2003(2018)

American Society for Testing and Materials (ASTM), x-rays and high-energy electron beams

  • ASTM ISO/ASTM 51431-05 Standard Practice for Dosimetry in Electron Beam and X-Ray (Bremsstrahlung) Irradiation Facilities for Food Processing
  • ASTM E2108-16 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E996-10(2018) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-19 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E995-16 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E996-04 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E996-10 Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E995-11 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-Ray Photoelectron Spectroscopy
  • ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM E1523-97 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
  • ASTM E1523-15 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
  • ASTM E2735-14(2020) Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
  • ASTM E2108-10 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E902-94(1999) Standard Practice for Checking the Operating Characteristics of X-Ray Photoelectron Spectrometers
  • ASTM E2108-00 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E2108-05 Standard Practice for Calibration of the Electron Binding-Energy Scale of an X-Ray Photoelectron Spectrometer
  • ASTM E1217-11(2019) Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E1523-03 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
  • ASTM E1523-09 Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
  • ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
  • ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
  • ASTM E995-04 Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
  • ASTM ISO/ASTM 51649-15 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
  • ASTM F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
  • ASTM F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
  • ASTM ISO/ASTM 51649-05 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM ISO/ASTM 51649-02 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM ISO/ASTM51649-15 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM ISO/ASTM51649-02 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM ISO/ASTM51649-05 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV
  • ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
  • ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
  • ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
  • ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
  • ASTM ISO/ASTM 51818-09 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 80 and 300 keV
  • ASTM ISO/ASTM 51818-20 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 80 and 300 keV
  • ASTM ISO/ASTM51818-20 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 80 and 300 keV
  • ASTM ISO/ASTM51818-09 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 80 and 300 keV
  • ASTM ISO/ASTM51818-13 Standard Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 80 and 300 keV
  • ASTM D8064-16 Standard Test Method for Elemental Analysis of Soil and Solid Waste by Monochromatic Energy Dispersive X-ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams
  • ASTM F2853-10 Standard Test Method for Determination of Lead in Paint Layers and Similar Coatings or in Substrates and Homogenous Materials by Energy Dispersive X-Ray Fluorescence Spectrometry Using Multiple Monochromatic Excitation Beams

Professional Standard - Electron, x-rays and high-energy electron beams

  • SJ/T 10458-1993 Standard guide for specimen handling in auger electron spectroscopy and X-ray photoelectron spectroscopy
  • SJ/T 10714-1996 Standard practice for checking the operation characteristics of X-ray photoelectron spectrometers
  • SJ/Z 9010.14-1987 Measurements of electrical properties of electronic tubes--Part 14: Methods of measurement of radar and osciloscope cathode-ray tubes

未注明发布机构, x-rays and high-energy electron beams

  • BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
  • BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution

National Metrological Technical Specifications of the People's Republic of China, x-rays and high-energy electron beams

  • JJF 1026-1991 Absorbed Dose Determination in Photon and Electron Beams

Indonesia Standards, x-rays and high-energy electron beams

IAEA - International Atomic Energy Agency, x-rays and high-energy electron beams

  • SSG-8-2010 Radiation Safety of Gamma@ Electron and X Ray Irradiation Facilities

Professional Standard - Judicatory, x-rays and high-energy electron beams

Association Francaise de Normalisation, x-rays and high-energy electron beams

  • NF M60-513:1990 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY. PHOTON REFERENCE RADIATIONS AT ENERGIES BETWEEN 4 MEV AND 9 MEV.
  • NF X21-071:2011 Surface Chemical Analysis - X-ray photoelectron Spectroscopy - Guidelines for analysis.
  • NF X21-073*NF ISO 16243:2012 Surface chemical analysis - Recording and reporting data in X-ray photoelectron spectroscopy (XPS).
  • NF ISO 16243:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie de photoélectrons par rayons X (XPS)
  • NF M60-512:1984 X AND GAMMA REFERENCE RADIATIONS FOR CALIBRATING DOSEMETERS AND DOSE RATEMETERS AND FOR DETERMINING THEIR RESPONSE AS A FUNCTION OF PHOTON ENERGY.
  • NF C74-068*NF EN 60601-2-68:2015 Medical electrical equipment - Part 2-68 : particular requirements for basic safety and essential performance of X-ray based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam the
  • NF EN 300430:1999 Télécommunications - Transmission et multiplexage (TM) - Faisceaux hertziens numériques (DRRS). Faisceaux hertziens numériques à haute capacité transportant des signaux 1 X STM-1, et fonctionnant dans la bande de fréquences des 18 GHz avec un es...
  • NF EN 60526:2005 Raccordements par fiche et réceptacle des câbles haute tension pour équipements à rayons X à usage médical
  • NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
  • NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
  • NF A09-230-1:1999 Non-destructive testing. Measurement and evaluation of the X-ray tube voltage. Part 1 : voltage divider method.
  • NF C74-167*NF EN 60601-2-54:2009 Medical electrical equipment - Part 2-54 : particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
  • NF A09-230-3:1999 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 3 : spectrometric method.
  • FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
  • NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
  • NF EN 60601-2-45/A1:2015 Appareils électromédicaux - Partie 2-45 : exigences particulières pour la sécurité de base et les performances essentielles des appareils de mammographie à rayonnement X et des appareils mammographiques stéréotaxiques
  • NF EN 60601-2-45:2011 Appareils électromédicaux - Partie 2-45 : exigences particulières pour la sécurité de base et les performances essentielles des appareils de mammographie à rayonnement X et des appareils mammographiques stéréotaxiques
  • NF C74-215:2005 Radionuclide imaging devices - Characteristics and test conditions - Part 1 : positron emission tomographs.
  • NF M60-512-2:2000 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Part 2 : dosimetry for radiation protection over the energy ranges 8 keV to 1,3 MeV and 4 MeV to 9 MeV.
  • NF A09-231-5*NF EN 12543-5:1999 Non-destructive testing. Characteristics of focal spots in industrial X-ray systems for use in non-destructive testing. Part 5 : measurement of the effective focal spot size of mini and micro focus X-ray tubes.
  • NF EN 60601-2-54/A2:2019 Appareils électromédicaux - Partie 2-54 : exigences particulières pour la sécurité de base et les performances essentielles des appareils à rayonnement X utilisés pour la radiographie et la radioscopie
  • NF EN 60601-2-54:2009 Appareils électromédicaux - Partie 2-54 : exigences particulières pour la sécurité de base et les performances essentielles des appareils à rayonnement X utilisés pour la radiographie et la radioscopie
  • NF EN 60601-2-54/A1:2015 Appareils électromédicaux - Partie 2-54 : exigences particulières pour la sécurité de base et les performances essentielles des appareils à rayonnement X utilisés pour la radiographie et la radioscopie
  • NF EN 61674:2013 Appareils électromédicaux - Dosimètres à chambres d'ionisation et/ou à détecteurs à semi-conducteurs utilisés en imagerie de diagnostic à rayonnement X
  • NF A09-230-2:2000 Non-destructive testing - Measurement and evaluation of the X-ray tube voltage - Part 2 : constancy check by the thick filter method.
  • NF ETS 300234:1998 Télécommunications - Transmission et multiplexage (TM) - Faisceaux hertziens numériques à haute capacité transportant des signaux 1 x STM-1, et fonctionnant dans des bandes de fréquences avec un espacement entre canaux d'environ 30 MHz et des di...
  • NF M60-512-3:2000 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy - Part 3 : calibration of area and personal dosemeters and the measurement of their response as a function of
  • NF C74-167/A2*NF EN 60601-2-54/A2:2019 Medical electrical equipment - Part 2-54 : particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • NF C74-167/A1*NF EN 60601-2-54/A1:2015 Medical electrical equipment - Part 2-54 : particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • NF C74-204/A1:2006 Medical electrical equipment - Dosimeters with ionization chambers and/or semi-conductor detectors as used in X-ray diagnostic imaging
  • NF EN IEC 61223-3-7:2022 Essais d'évaluation et de routine dans les services d'imagerie médicale - Partie 3-7 : essais d'acceptation et de constance - Performance d'imagerie des appareils à rayonnement X pour la tomodensitométrie dentaire à faisceau conique

Fujian Provincial Standard of the People's Republic of China, x-rays and high-energy electron beams

  • DB35/T 110-2000 Electron probe and scanning electron microscope X-ray energy spectrum analysis method for paint physical evidence detection

中华人民共和国国家卫生和计划生育委员会, x-rays and high-energy electron beams

  • GBZ 141-2002 Specifications for radialogical protection test of γ-rays and electrom irradiation facilities

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, x-rays and high-energy electron beams

  • GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
  • GB/T 33502-2017 Surface chemical analysis—Recording and reporting data in X-ray photoelectron spectroscopy(XPS)

KR-KS, x-rays and high-energy electron beams

  • KS D ISO 15472-2003(2023)
  • KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
  • KS C IEC 60526-2021 High-voltage cable plug and socket connections for medical X-ray equipment
  • KS C IEC 60601-2-68-2018 Medical electrical equipment ─ Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators,
  • KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
  • KS C IEC 60601-2-54-2020 Medical electrical equipments — Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy

American National Standards Institute (ANSI), x-rays and high-energy electron beams

  • ANSI N43.3-1993 American National Standard for General radiation safety - Installations using Non-Medical X-ray and Sealed Gamma-Ray Sources, Energies Up To 10 MeV
  • ANSI N43.3-2008 General Radiation Safety - Installations Using Non-Medical X-Ray and Sealed Gamma-Ray Sources, Energies Up to 10 MeV
  • ANSI/HPS N43.16-2021 Radiation Safety for Cargo and Vehicle Security Screening Systems Using X-ray or Gamma Radiation, Energies Up to 10 MeV
  • ANSI/ASTM E1649:2013 Practice for Dosimetry in an Electron Beam Facility for Radiation Processing at Energies Between 300 keV and 25 MeV

国家市场监督管理总局、中国国家标准化管理委员会, x-rays and high-energy electron beams

  • GB/T 41073-2021 Surface chemical analysis—Electron spectroscopies—Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
  • GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis
  • GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
  • GB/T 41105.3-2021 Non-destructive testing—Measurement and evaluation of the X-ray tube voltage—Part 3:Spectrometric method

Professional Standard - Public Safety Standards, x-rays and high-energy electron beams

  • GA/T 1939-2021 Forensic Science Current Spot Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1522-2018 Forensic Science Shooting Residue Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1938-2021 Forensic Science Metal Inspection Scanning Electron Microscopy/X-Ray Spectroscopy
  • GA/T 1937-2021 Forensic Science Rubber Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1521-2018 Forensic Science Plastics Elemental Composition Examination Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1519-2018 Forensic Science Toner Elemental Composition Inspection Scanning Electron Microscopy/X-ray Spectroscopy
  • GA/T 1520-2018 Forensic science black powder, pyrotechnic powder element composition inspection scanning electron microscope/X-ray energy spectrometry
  • GA/T 823.3-2018 Methods of Examination of Paint Evidence in Forensic Science Part 3: Scanning Electron Microscopy/X-ray Spectroscopy

Guangdong Provincial Standard of the People's Republic of China, x-rays and high-energy electron beams

  • DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
  • DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy

Lithuanian Standards Office , x-rays and high-energy electron beams

  • LST EN 60601-2-68-2015 Medical electrical equipment - Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam
  • LST EN 60526-2005 High-voltage cable plug and socket connections for medical X-ray equipment (IEC 60526:1978, modified)
  • LST EN 60601-2-54-2009 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2009)

Canadian Standards Association (CSA), x-rays and high-energy electron beams

  • CAN/CSA-C22.2 NO.60601-2-68-2015 Medical electrical equipment - Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam

European Committee for Electrotechnical Standardization(CENELEC), x-rays and high-energy electron beams

  • EN 60601-2-68:2015 Medical electrical equipment - Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam
  • EN 60613:2010 Electrical and loading characteristics of X-ray tube assemblies for medical diagnosis
  • FprEN IEC 60601-2-54:2022 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy

Japanese Industrial Standards Committee (JISC), x-rays and high-energy electron beams

  • JIS K 0145:2002 Surface chemical analysis -- X-ray photoelectron spectrometers -- Calibration of energy scales
  • JIS K 0189:2013 Microbeam analysis.Electron probe microanalysis.Determination of experimental parameters for wavelength dispersive X-ray spectroscopy
  • JIS K 0152:2014 Surface chemical analysis.X-ray photoelectron spectroscopy.Repeatability and constancy of intensity scale
  • JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
  • JIS Z 4751-2-54:2012 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • JIS Z 4751-2-54:2017 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • JIS Z 4751-2-44:2012 Medical electrical equipment -- Part 2-44: Particular requirements for the basic safety and essential performance of X-ray equipment for computed tomography
  • JIS T 0601-2-207:2015 Medical electrical equipment -- Part 2-207: Particular requirements for the basic safety and essential performance of xenon ray beam therapy equipment

Standard Association of Australia (SAA), x-rays and high-energy electron beams

  • AS ISO 15472:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
  • AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
  • AS/NZS 4545.1:1999 Radionuclide imaging devices - Characteristics and test conditions - Positron emission tomographs
  • AS ISO 19318:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction
  • AS ISO 19319:2006 Surface chemical analysis - Augur electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution, analysis area and sample area viewed by the analyser
  • AS ISO 24237:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Repeatability and constancy of intensity scale
  • AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
  • AS 60601.2.54:2018 Medical electrical equipment, Part 2.54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (IEC 60601-2-54:2018 (ED. 1.2), MOD)
  • AS/NZS IEC 60601.1.3:2015
  • AS/NZS IEC 60601.2.28:2015

Electronic Components, Assemblies and Materials Association, x-rays and high-energy electron beams

  • ECA TEP 170-1972 X-Radiation Detection and Measurements for Microwave Tubes, Recommended Practice on

CZ-CSN, x-rays and high-energy electron beams

  • CSN 36 4771-1998 High voltage cable plug and socket connections for medical X-ray equipment

International Electrotechnical Commission (IEC), x-rays and high-energy electron beams

  • IEC 60526:1978/COR1:2010 High-voltage cable plug and socket connections for medical X-ray equipment; Corrigendum 1
  • IEC 60601-2-54:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2018 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-68:2014 Medical electrical equipment - Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide beam
  • IEC 60601-2-54:2009/AMD1:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2009/AMD2:2018 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy; Amendment 2
  • IEC 60601-2-54:2009 IEC 60601-2-54, Ed. 1: Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-35:2020 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2022 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2022 RLV Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2009+AMD1:2015+AMD2:2018 CSV Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2009/COR1:2010 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-54:2009/COR2:2011 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC 60601-2-44:2009 Medical electrical equipment - Part 2-44: Particular requirements for the basic safety and essential performance of X-ray equipment for computed tomography
  • IEC 60601-2-54:2009+AMD1:2015 CSV Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • IEC TS 62607-6-21:2022 Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material - Elemental composition, C/O ratio: X-ray photoelectron spectroscopy
  • IEC 61675-1/AMD1:2008 Radionuclide imaging devices - Characteristics and test conditions - Part 1: Positron emission tomographs; Amendment 1
  • IEC 60846-2:2007 Radiation protection instrumentation - Ambient and/or directional dose equivalent (rate) meters and/or monitors for beta, X and gamma radiation - Part 2: High range beta and photon dose and dose rate portable instruments for emergency radiation protection
  • IEC 61223-3-7:2021 Evaluation and routine testing in medical imaging departments - Part 3-7: Acceptance and constancy tests - Imaging performance of X-ray equipment for dental cone beam computed tomography

Danish Standards Foundation, x-rays and high-energy electron beams

  • DS/EN 60526:2004 High-voltage cable plug and socket connections for medical X-ray equipment
  • DS/EN 60601-2-54:2009 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis

AENOR, x-rays and high-energy electron beams

  • UNE-EN 60526:2005 High-voltage cable plug and socket connections for medical X-ray equipment
  • UNE-EN 60601-2-54:2010 Medical electrical equipment -- Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy

SE-SIS, x-rays and high-energy electron beams

  • SIS SS-ISO 8963:1990 Dosimetry of X and γ reference radiations for radiation protection over the energy range from 8 keV to 1,3 MeV
  • SIS SS-ISO 8769:1990 Reference sources for the calibration of sur- face contamination monitors — Beta-emit- ters (maximum beta energy greater than 0,15 MeV) and alpha-emitters
  • SIS SS-ISO 7503-1:1990 Evaluation of surface contamination — Part 1: Beta-emitters (maximum beta energy greater than 0,15 MeV) and alpha-emitters

GOSTR, x-rays and high-energy electron beams

  • PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
  • PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry

SAE - SAE International, x-rays and high-energy electron beams

  • SAE J1742-2005 Connections for High Voltage On-Board Vehicle Electrical Wiring Harnesses - Test Methods and General Performance Requirements

Society of Automotive Engineers (SAE), x-rays and high-energy electron beams

  • SAE J1742-2022 Connections for High Voltage On-Board Vehicle Electrical Wiring Harnesses - Test Methods and General Performance Requirements
  • SAE J1742-2010 Connections for High Voltage On-Board Road Vehicle Electrical Wiring Harnesses Test Methods and General Performance Requirements
  • SAE J1742-1998 Connections for High Voltage On-Board Road Vehicle Electrical Wiring Harnesses - Test Methods and General Performance Requirements

European Committee for Standardization (CEN), x-rays and high-energy electron beams

  • EN 60613:1990 Electrical, thermal and loading characteristics of rotating anode X-ray tubes for medical diagnosis

ES-UNE, x-rays and high-energy electron beams

  • UNE-EN 60601-2-68:2015 Medical electrical equipment - Part 2-68: Particular requirements for the basic safety and essential performance of X-ray-based image-guided radiotherapy equipment for use with electron accelerators, light ion beam therapy equipment and radionuclide be...
  • UNE-EN 60601-2-54:2010/A1:2015 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy
  • UNE-EN 60601-2-45:2011/A1:2015 Medical electrical equipment - Part 2-45: Particular requirements for the basic safety and essential performance of mammographic X-ray equipment and mammographic stereotactic devices (Endorsed by AENOR in November of 2015.)
  • UNE-EN 60601-2-54:2009/A2:2019 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (Endorsed by Asociación Española de Normalización in July of 2019.)
  • UNE-EN 60601-2-45:2011 Medical electrical equipment -- Part 2-45: Particular requirements for the basic safety and essential performance of mammographic X-ray equipment and mammographic stereotactic devices (Endorsed by AENOR in July of 2011.)
  • UNE-EN IEC 61223-3-7:2022 Evaluation and routine testing in medical imaging departments - Part 3-7: Acceptance and constancy tests - Imaging performance of X-ray equipment for dental cone beam computed tomography (Endorsed by Asociación Española de Normalización in March of ...

BE-NBN, x-rays and high-energy electron beams

  • NBN-HD 364-1994 High-voltage cable plug and socket connections for medical X-ray equipment

Professional Standard - Commodity Inspection, x-rays and high-energy electron beams

  • SN/T 2003.4-2006 Determination of lead, mercury, chromium, cadmium and bromine in electrical and electronic equipment. Part 4: Qualitative screening by energy dispersive X-ray fluorescence spectrometric method
  • SN/T 2003.5-2006 Determination of lead,mercury,chromium,cadmium and bromine in electrical and electronic equipment-Part 5:Quantitative screening by energy dispersive X-ray fluorescence spectrometric method
  • SN/T 2003.3-2006 Determination of Lead, Mercury, Chromium, Cadmium and Bromine in electrical and electronic equipments - Part 3: Qualitative screening by X-ray fluorescence spectrometric method

NEMA - National Electrical Manufacturers Association, x-rays and high-energy electron beams

  • NEMA XR 7-1979 High-Voltage X-Ray Cables and Receptacles (Revision 1 - January 1980; Revision 2 - October 1987)

CENELEC - European Committee for Electrotechnical Standardization, x-rays and high-energy electron beams

  • EN 60601-2-54:2009 Medical electrical equipment - Part 2-54: Particular requirements for the basic safety and essential performance of X-ray equipment for radiography and radioscopy (Incorporates Amendment A1: 2015)

Professional Standard - Machinery, x-rays and high-energy electron beams

  • JB/T 11602.3-2013 Non-desturctive testing instruments.Measurement and evaluation of the X-ray tube voltage.Part 3: Spectrometric detect

Professional Standard - Non-ferrous Metal, x-rays and high-energy electron beams

  • YS/T 644-2007 Determination method of Pt-Rn alloy film.Determination of alloyed Pt content and alloyed Rn content by X-ray photoelectron spectroscopy

TR-TSE, x-rays and high-energy electron beams

  • TS 2453-1976 MEASUREMENTS OF THE ELECTRICAL PROPERTIES OF ELECTRONIC TUBES AND VALVES PART 13 : METHODS OF MEASUREMENT OF EMISSION CORRENT FROM HOT CATHODES FOR HIGH- VACUUM ELECTRONIC TUBES AND VALVES
  • TS 2454-1976 MEASUREMENTS OF THE ELECTRICAL PROPERTIES OF ELECTRONIC TUBES AND VALVES PART 14 : METHODS OF MEASUREMENT OF RADAR AND OSCILLOSCOPE CATHODERAY TUBES

IX-IX-IEC, x-rays and high-energy electron beams

  • IEC TS 62607-6-17:2023 Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based material - Order parameter: X-ray diffraction and transmission electron microscopy




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