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Semi-dry time current

Semi-dry time current, Total:123 items.

In the international standard classification, Semi-dry time current involves: Transformers. Reactors, Linear and angular measurements, Semiconductor devices, Rectifiers. Convertors. Stabilized power supply, Burners. Boilers, Integrated circuits. Microelectronics, Electricity. Magnetism. Electrical and magnetic measurements, Radiocommunications, Optoelectronics. Laser equipment, Audio, video and audiovisual engineering, Installations in buildings, Aerospace electric equipment and systems, Power transmission and distribution networks, Electrical engineering in general, Galvanic cells and batteries, Industrial automation systems, Lubricants, industrial oils and related products, Electrical wires and cables, Interface and interconnection equipment, Semiconducting materials.


Institute of Electrical and Electronics Engineers (IEEE), Semi-dry time current

American National Standards Institute （ANSI), Semi-dry time current

  • ANSI/IEEE C57.12.59:2002 Guide for Dry-Type Transformer Through-Fault Current Duration
  • ANSI/IEEE C57.109:1993 Guide for Liquid-Immersed Transformer Through-Fault Current Duration
  • ANSI/IEEE C57.110:2008 Recommended Practice for Establishing Liquid-Filled and Dry-Type Power and Distribution Transformer Capability When Supplying Nonsinusoidal Load Currents

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Semi-dry time current

  • IEEE C57.12.59 ERTA-2006 Guide for Dry-Type Transformer Through-Fault Current Duration
  • IEEE C57.12.59-1989 Guide for Dry-Type Transformer Through-Fault Current Duration
  • IEEE C57.12.59-2001 Guide for Dry-Type Transformer Through-Fault Current Duration
  • IEEE C57.12.59-2015 Guide for Dry-Type Transformer Through-Fault Current Duration
  • IEEE C57.109-1985 GUIDE FOR TRANSFORMER THROUGH-FAULT-CURRENT DURATION
  • IEEE C57.109-1993 Guide for Liquid-Immersed Transformer Through-Fault-Current Duration
  • IEEE C57.110-2008 Recommended Practice for Establishing Liquid-Filled and Dry- Type Power and Distribution Transformer Capability When Supplying Nonsinusoidal Load Currents
  • IEEE C57.110-2018 Recommended Practice for Establishing Liquid Immersed and Dry-Type Power and Distribution Transformer Capability when Supplying Nonsinusoidal Load Currents

HU-MSZT, Semi-dry time current

United States Navy, Semi-dry time current

German Institute for Standardization, Semi-dry time current

  • DIN V 32879-1:1995 Optoelectronic measurement of distance using time-of-flight principle - Part 1: Incoherent time-of-flight principle
  • DIN EN 62374-1:2011-06 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010); German version EN 62374-1:2010 + AC:2011
  • DIN EN 62374:2008-02 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
  • DIN EN 62374:2008 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007); German version EN 62374:2007
  • DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
  • DIN 40763-2:1990 Nickel-cadmium batteries; cells with fibre structured plates; cells in plastic containers; discharge current, final discharge voltages, discharge time
  • DIN 40763-2:1990-09 Nickel-cadmium batteries; cells with fibre structured plates; cells in plastic containers; discharge current, final discharge voltages, discharge time
  • DIN EN 2349-305:2007 Aerospace series - Requirements and test procedures for relays and contactors - Part 305: Bounce time; German and English version EN 2349-305:2006
  • DIN EN 2349-304:2007 Aerospace series - Requirements and test procedures for relays and contactors - Part 304: Operate and release time; German and English version EN 2349-304:2006
  • DIN 50440:1998 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method

RU-GOST R, Semi-dry time current

  • GOST 18986.7-1973 Semiconductor diodes. Methods for measuring life time
  • GOST 18986.9-1973 Semiconductor diodes. Method for measuring pulse direct voltage and forword recovery time
  • GOST 24613.15-1977 Optoelectronic integrated microcircuits. Method for measuring consumption carrent of switching and its duration of logic signal switches
  • GOST IEC 62054-21-2017 Electricity metering (a.c.). Tariff and load control. Part 21. Particular requirements for time switches

ES-UNE, Semi-dry time current

  • UNE-EN 62374-1:2010 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (Endorsed by AENOR in March of 2011.)
  • UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)

Association Francaise de Normalisation, Semi-dry time current

  • NF C53-228:1989 Semiconductor convertors. Switches for uninterruptible power systems (vps switches).
  • NF EN 62374:2008 Dispositifs à semiconductors - Essai de rupture diélectrique en fonction du temps (TDDB) pour films diélectriques de grille
  • NF L58-100-304*NF EN 2349-304:2007 Aerospace series - Requirements and test procedures for relays and contactors - Part 304 : operate and release time
  • NF C96-017*NF EN 62374:2008 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films
  • NF EN 60909-3:2010 Courants de court-circuit dans les réseaux triphasés à courant alternatif - Partie 3 : courants durant deux court-circuits monophasés simultanés séparés à la terre et courants de court-circuit partiels s'écoulant à travers la terre
  • NF EN IEC 60938-2:2021 Inductances fixes d'antiparasitage - Partie 2 : spécification intermédiaire sur les bobines d'arrêt pour ligne électrique
  • NF C46-023:1988 ELECTROMAGNETIC COMPATIBILITY MAINLY FOR INDUSTRIAL-PROCESS MEASUREMENT AND CONTROL EQUIPMENT. ELECTRICAL FAST TRANSIENTS BURST REQUIREMENTS.
  • NF L58-100-305*NF EN 2349-305:2007 Aerospace series - Requirements and test procedures for relays and contactors - Part 305 : bounce time

未注明发布机构, Semi-dry time current

  • BS EN 62374-1:2010(2011) Semiconductor devices Part 1 : Time - dependent dielectric breakdown (TDDB) test for inter - metal layers
  • BS EN 60909-3:2010(2013) Short - circuit currents in three - phase a . c systems Part 3 : Currents during two separate simultaneous line - to - earth short - circuits and partial short - circuit currents flowing through earth

Defense Logistics Agency, Semi-dry time current

Danish Standards Foundation, Semi-dry time current

  • DS/EN 62374-1/AC:2011 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
  • DS/EN 62374-1:2011 Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers
  • DS/EN 60909-3:2010 Short-circuit currents in three-phase a.c systems - Part 3: Currents during two separate simultaneous line-to-earth short-circuits and partial short-circuit currents flowing through earth
  • DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • DS/EN 62054-21:2005 Electricity metering (a.c.) - Tariff and load control -- Part 21: Particular requirements for time switches

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Semi-dry time current

  • GB/T 10236-1988 Guide for evaluation of interference effects and compatibility technology between semiconductor convertors and power supply systen
  • GB/T 10236-2006 Guide for compatibility and protection of interference effects between semiconductor convertors and power supply system

CZ-CSN, Semi-dry time current

  • CSN 35 8745-1973 Semiconductor devices. Transistore. Measurement of open-circuit reverse voltage transfer ratio and tinie coefíicient at high frequencies

International Electrotechnical Commission (IEC), Semi-dry time current

  • IEC 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
  • IEC 60146-5:1988 Semiconductor convertors; part 5: switches for uninterruptible power systems (UPS switches)
  • IEC 60146-4:1986 Semiconductor convertors - Part 4: Method of specifying the performance and test requirements of uninterruptible power systems
  • IEC 60853-3:2002 Calculation of the cyclic and emergency current rating of cables - Part 3: Cyclic rating factor for cables of all voltages, with partial drying of the soil

Society of Motion Picture and Television Engineers (SMPTE), Semi-dry time current

  • SMPTE RP 188-1999 Transmission of Time Code and Control Code in the Ancillary Data Space of a Digital Television Data Stream

International Telecommunication Union (ITU), Semi-dry time current

  • ITU-R QUESTION 2457-2006 Interference to the standard frequency and time signal service in the low-frequency band caused by noise from electrical sources
  • ITU-T K.33-1996 Limits for People Safety Related to Coupling into Telecommunications System form A.C. Electric Power and A.C. Electrified Railway Installations in Fault Conditions - Series K: Protection Against Interference Study Group 5; 19 pp
  • ITU-R P.452-16-2015 Prediction procedure for the evaluation of interference between stations on the surface of the Earth at frequencies above about 0.1 GHz
  • ITU-R F.1495-2-2012 Interference criteria to protect the fixed service from time varying aggregate interference from other radiocommunication services sharing the 17.7-19.3 GHz band on a co-primary basis
  • ITU-R RA.1513-1 FRENCH-2003 Levels of data loss to radio astronomy observations and percentage-of-time criteria resulting from degradation by interference for frequency bands allocated to the radio astronomy on a primary basis Question ITU-R 227/7
  • ITU-R RA.1513-1 SPANISH-2003 Levels of data loss to radio astronomy observations and percentage-of-time criteria resulting from degradation by interference for frequency bands allocated to the radio astronomy on a primary basis Question ITU-R 227/7
  • ITU-R F.1495-1 SPANISH-2007 Interference criteria to protect the fixed service from time varying aggregate interference from other radiocommunication services sharing the 17.7-19.3 GHz band on a co-primary basis Criterios de interferencia para proteger al servicio fijo de la interf
  • ITU-T K.33 FRENCH-1996 Limits for People Safety Related to Coupling into Telecommunications System form A.C. Electric Power and A.C. Electrified Railway Installations in Fault Conditions - Series K: Protection Against Interference Study Group 5; 19 pp
  • ITU-R BT.1366-1998 Transmission of Time Code and Control Code in the Ancillary Data Space of a Digital Television Stream According to ITU-R BT.656, ITU-R BT.799 and ITU-R BT.1120

ITU-R - International Telecommunication Union/ITU Radiocommunication Sector, Semi-dry time current

  • QUESTION 245/7-2006 Interference to the standard frequency and time signal service in the low-frequency band caused by noise from electrical sources
  • ITU-R BT.1366-1-2007 Transmission of time code and control code in the ancillary data space of a digital television stream according to ITU-R BT.656@ ITU-R BT.799 and ITU-R BT.1120

Hunan Provincial Standard of the People's Republic of China, Semi-dry time current

  • DB43/T 2553-2023 Technical specification for constant current charging time detection of lithium-ion battery clusters for power energy storage

Lithuanian Standards Office , Semi-dry time current

  • LST EN 62374-2008 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films (IEC 62374:2007)
  • LST EN 62374-1-2011 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)
  • LST EN 62374-1-2011/AC-2011 Semiconductor devices -- Part 1: Time-dependent dielectric breakdown (TDDB) test for inter-metal layers (IEC 62374-1:2010)
  • LST EN 60909-3-2010 Short-circuit currents in three-phase a.c systems -- Part 3: Currents during two separate simultaneous line-to-earth short-circuits and partial short-circuit currents flowing through earth (IEC 60909-3:2009)
  • LST EN 60747-16-10-2004 Semiconductor devices. Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004)

British Standards Institution (BSI), Semi-dry time current

  • BS EN 62374:2008 Semiconductor devices. Time dependent dielectric breakdown (TDDB) test for gate dielectric films
  • BS EN 62374:2007 Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films
  • BS EN 2349-305:2007 Aerospace series - Requirements and test procedures for relays and contactors - Bounce time
  • BS EN 2349-305:2006 Aerospace series - Requirements and test procedures for relays and contactors - Part 305: Bounce time
  • BS EN 2349-304:2007 Aerospace series - Requirements and test procedures for relays and contactors - Operate and release time
  • BS EN 2349-304:2006 Aerospace series - Requirements and test procedures for relays and contactors - Part 304: Operate and release time

Professional Standard - Energy, Semi-dry time current

  • DL/T 5623-2021 Design code for flue gas circulating fluidized bed semi-dry desulfurization system in thermal power plant

European Committee for Electrotechnical Standardization（CENELEC）, Semi-dry time current

  • EN 62374:2007 Semiconductor devices - Time Dependent Dielectric Breakdown (TDDB) test for gate dielectric films

AENOR, Semi-dry time current

  • UNE-EN 60909-3:2011 Short-circuit currents in three-phase a.c systems -- Part 3: Currents during two separate simultaneous line-to-earth short-circuits and partial short-circuit currents flowing through earth
  • UNE-EN 62054-21:2005 Electricity metering (a.c.) - Tariff and load control -- Part 21: Particular requirements for time switches

RO-ASRO, Semi-dry time current

  • STAS 11200/499-1983 Graphical symbols GRAPHICAL SYMBOL FOR CURRENT IMPULSE TIME (SPOT WELDING, PROJECTION WELDING AND SEAM WELDING)

Professional Standard - Radio Television Film, Semi-dry time current

  • GY/T 181-2002 Protecting distance of radio radiation interference from AC electrified railway to television relay broadcasting and transposer station(s)

Professional Standard - Machinery, Semi-dry time current

  • JB/T 8453-1996 Semiconductor converters - Part 5: Switches for uninterruptible power supply equipment (UPS switches)

JP-JEITA, Semi-dry time current

  • JEITA TT4501B-2006 Marking method of reaching distance of sound and operating time of dry cells on the transistor megaphone

Professional Standard - Electricity, Semi-dry time current

  • DL/T 1100.5-2019 Time Synchronization System for Power System Part 5: Technical Requirements for Anti-spoofing and Anti-jamming

Standard Association of Australia （SAA）, Semi-dry time current

  • IEC 60909-3:2009 RLV Short-circuit currents in three-phase AC systems — Part 3: Currents during two separate simultaneous line-to-earth short circuits and partial short-circuit currents flowing through earth

PL-PKN, Semi-dry time current

  • PN T01504-59-1987 Diodes Measuring methods Reverse recovery time t? and reverse recovery current i,r
  • PN E93100-05-1987 Electrical accessories Installation fuses of rated voltage up to 1000 V and rated current up to 200 A Fuse-links Dimensions and time/current characteristics

Korean Agency for Technology and Standards (KATS), Semi-dry time current

  • KS C IEC 62054-21-2017(2022) Electricity metering (a.c.) ― Tariff and load control ― Part 21: Particular requirements for time switches
  • KS C IEC 60853-3-2014(2019) Calculation of the cyclic and emergency current rating of cables — Part 3: Cyclic rating factor for cables of all voltages, with partial drying of the soil

European Committee for Standardization (CEN), Semi-dry time current

  • EN 2349-304:2006 Aerospace series - Requirements and test procedures for relays and contactors - Part 304: Operate and release time
  • EN 62054-21:2004 Electricity metering (a.c.) ?Tariff and load control Part 21: Particular requirements for time switches
  • EN 2349-305:2006 Aerospace series - Requirements and test procedures for relays and contactors - Part 305: Bounce time

Indonesia Standards, Semi-dry time current

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, Semi-dry time current

  • JEDEC JESD202-2006 Method for Characterizing the Electromigration Failure Time Distribution of Interconnects Under Constant-Current and Temperature Stress
  • JEDEC JESD66-1999 Transient Voltage Suppressor Standard for Thyristor Surge Protective Device Rating Verification and Characteristic Testing

American Society for Testing and Materials (ASTM), Semi-dry time current

  • ASTM D6795-02 Standard Test Method for Measuring the Effect on Filterability of Engine Oils After Treatment with Water and Dry Ice and a Short (30-min) Heating Time
  • ASTM D6795-02(2007) Standard Test Method for Measuring the Effect on Filterability of Engine Oils After Treatment with Water and Dry Ice and a Short (30-min) Heating Time

U.S. Military Regulations and Norms, Semi-dry time current

  Semi-dry voltage and current, Semi-dry current, half dry time, Semi-dry time current, half dry how long.

 



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