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Jingjing

Jingjing, Total:42 items.

In the international standard classification, Jingjing involves: Semiconducting materials, Installations in buildings, Testing of metals, Glass, Piezoelectric and dielectric devices, Iron and steel products, Lamps and related equipment, Construction materials, Non-ferrous metals.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Jingjing

GB/T 31092-2014 Monocrystalline sapphire ingot
GB/T 31092-2022 Monocrystalline sapphire bar
GB/T 1555-1997 Test methods for determining the orientation of a semiconductor single crystal
GB/T 1555-2023 Method for Determination of Crystalline Orientation of Semiconductor Single Crystal
GB/T 1555-2009 Testing methods for determining the orientation of a semiconductor single crystal
GB/T 42676-2023 X-ray Diffraction Method for Testing the Quality of Semiconductor Single Crystal
GB/T 30118-2013 Single crystal wafers for surface acoustic wave (SAW) device applications.Specifications and measuring methods
GB/T 11072-1989 Indium antimonide polycrystal, single crystals and as-cut slices
GB/T 11072-2009 Indium antimonide polycrystal,single crystals and as-cut slices
GB/T 31958-2023 Substrate glass for amorphous silicon thin film transistor liquid crystal display
GB/T 19345-2003 Amorphous and nanocrystalline soft magnetic alloy strips
GB/T 5238-2009 Monocrystalline germanium and monocrystalline germanium slices
GB/T 5238-2009(英文版) Monocrystalline germanium and monocrystalline germanium slices

Group Standards of the People's Republic of China, Jingjing

T/ZZB 0497-2018 Single crystal wafers for surface acoustic wave device applications
T/CECA 83-2023 Lithium tantalate and lithium niobate reduced single crystal wafers— technical requirements and measurement methods for lightness and color difference
T/CBCSA 36-2021 Corundum polycrystalline slab

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Jingjing

GB/T 34210-2017 Test method for determining the orientation of sapphire single crystal

Professional Standard - Electron, Jingjing

SJ/T 11500-2015 Test method for measuring crystallographic orientation of monocrystalline silicon carbide
SJ/T 11501-2015 Test method for determining crystal type of monocrystalline silicon carbide
SJ 3244.3-1989 Methods of measurement for crystal-orientation of single crystal of Gallium arsenide and Indium phosphide

国家市场监督管理总局、中国国家标准化管理委员会, Jingjing

GB/T 39137-2020 Determination for the orientation of refractory metal single crystal
GB/T 5238-2019 Monocrystalline germanium and monocrystalline germanium slices

Association Francaise de Normalisation, Jingjing

NF B30-004:1974 GLASS.CRYSTAL,CRYSTAL GLASS,CRYSTALLIN.
NF B30-004:2023 Cristal, cristallin et verre sonore
NF C93-616:2013 Single Crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
NF C93-616*NF EN 62276:2018 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Japanese Industrial Standards Committee (JISC), Jingjing

JIS C 6760:2014 Single crystal wafers for surface acoustic wave (SAW) device applications .Specifications and measuring methods

IEC - International Electrotechnical Commission, Jingjing

PAS 62276-2001 Single Crystal Wafers Applied for Surface Acoustic Wave Device - Specification and Measuring Method (Edition 1.0)

Danish Standards Foundation, Jingjing

DS/EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

CENELEC - European Committee for Electrotechnical Standardization, Jingjing

EN 62276:2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

European Committee for Electrotechnical Standardization（CENELEC）, Jingjing

EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

German Institute for Standardization, Jingjing

DIN EN 62276:2017-08 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2016); German version EN 62276:2016 / Note: DIN EN 62276 (2013-08) remains valid alongside this standard until 2019-11-28.
DIN EN IEC 62276:2023-05 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English / Note: Date of issue 2023-04-28*Intended as replacement for DIN EN 62276 (2017-08).
DIN EN IEC 62276:2023 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 49/1401/CD:2022); Text in German and English

ES-UNE, Jingjing

UNE-EN 62276:2016 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (Endorsed by Asociación Española de Normalización in January of 2017.)

AENOR, Jingjing

UNE 43603:1979 GLASS, NOMENCLATURE AND TERMINOLOGY. CRYSTAL. CRYSTAL GLASS

Lithuanian Standards Office , Jingjing

LST EN 62276-2006 Single crystal wafers for surface acoustic wave (SAW) device appplications. Specifications and measuring methods (IEC 62276:2005)
LST EN 62276-2013 Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2012)

British Standards Institution (BSI), Jingjing

23/30468947 DC BS EN 62276. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods

International Organization for Standardization (ISO), Jingjing

PRF IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods
IWA 43:2023 Glass types — Crystal glass, crystal and lead crystal — Specifications and test methods

SE-SIS, Jingjing

SIS SS 16 11 57-1982 Plastics - Amorphous thermoplastic moulding materials - Preparation of test specimens with a defined level of shrinkage - Part 2: Test specimens in the form of rectangular plates (Injection moulding)