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Electromagnetic Miniature Fatigue Testing Machine

Electromagnetic Miniature Fatigue Testing Machine, Total:18 items.

In the international standard classification, Electromagnetic Miniature Fatigue Testing Machine involves: Integrated circuits. Microelectronics, Semiconductor devices, Electromechanical components for electronic and telecommunications equipment, Power stations in general.

National Metrological Technical Specifications of the People's Republic of China, Electromagnetic Miniature Fatigue Testing Machine

JJF 1315.1-2011 Program of Pattern Evaluation for Fatigue Testing Machines―Part 1 ： Axial Force-applied Fatigue Testing Machines
JJF 1315.2-2011 Program of Pattern Evaluation for Fatigue Testing Machines―Part 2 :Rotating Pure Bending Fatigue Testing Machines

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electromagnetic Miniature Fatigue Testing Machine

GB/T 38447-2020 Micro-electromechanical system technology—Fatigue testing method of MEMS structure using resonant vibration

British Standards Institution (BSI), Electromagnetic Miniature Fatigue Testing Machine

BS EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Axial fatigue testing methods of thin film materials

European Committee for Electrotechnical Standardization（CENELEC）, Electromagnetic Miniature Fatigue Testing Machine

EN 62047-12:2011 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures
EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

Danish Standards Foundation, Electromagnetic Miniature Fatigue Testing Machine

DS/EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials
DS/EN 62047-12:2012 Semiconductor devices - Micro-electromechanical devices - Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures

Association Francaise de Normalisation, Electromagnetic Miniature Fatigue Testing Machine

NF EN 62047-6:2010 Dispositifs à semiconducteurs - Dispositifs microélectromécaniques - Partie 6 : méthodes d'essais de fatigue axiale des matériaux en couche mince
NF C96-050-6*NF EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Part 6 : axial fatigue testing methods of thin film materials
NF C96-050-12*NF EN 62047-12:2012 Semiconductor devices - Micro-electromechanical devices - Part 12 : bending fatigue testing method of thin film materials using resonant vibration of MEMS structures.

German Institute for Standardization, Electromagnetic Miniature Fatigue Testing Machine

DIN EN 62047-6:2010-07 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010
DIN EN 62047-6:2010 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009); German version EN 62047-6:2010

International Electrotechnical Commission (IEC), Electromagnetic Miniature Fatigue Testing Machine

IEC 62047-6:2009 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials

Professional Standard - Electricity, Electromagnetic Miniature Fatigue Testing Machine

DL/T 1013-2018 Test guidelines for microcomputer excitation regulators of large and medium hydroelectric generators
DL/T 1013-2006 Test and adjustment guide of microcomputer-based excitation regulator for large and medium hydraulic generators

Lithuanian Standards Office , Electromagnetic Miniature Fatigue Testing Machine

LST EN 62047-6-2010 Semiconductor devices - Micro-electromechanical devices - Part 6: Axial fatigue testing methods of thin film materials (IEC 62047-6:2009)
LST EN 62047-12-2011 Semiconductor devices - Micro-electromechanical devices -- Part 12: Bending fatigue testing method of thin film materials using resonant vibration of MEMS structures (IEC 62047-12:2011)