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Electron Microscopic Characterization Methods
Electron Microscopic Characterization Methods, Total:79 items.
In the international standard classification, Electron Microscopic Characterization Methods involves: Optics and optical measurements, Materials for the reinforcement of composites, Electronic display devices, Analytical chemistry, Metrology and measurement in general, Raw materials for rubber and plastics, Physics. Chemistry, Optical equipment, Vocabularies, Education, Optoelectronics. Laser equipment, Air quality, Linear and angular measurements, Products of the chemical industry, Production of metals, Testing of metals, Ceramics, Technical drawings, Protection against crime.
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Electron Microscopic Characterization Methods
- GB/T 30543-2014 Nanotechnologies.Characterization of single-wall carbon nanotubes using transmission electron microscopy
- GB/T 32869-2016 Nanotechnologies.Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- GB/T 18907-2002 Method of selected area electron diffraction for transmission electron microscopes
- GB/T 18907-2013 Microbeam analysis.Analytical electron microscopy.Selected-area electron diffraction analysis using a transmission electron microscope
- GB/T 31227-2014 Test method for the surface roughness by atomic force microscope for sputtered thin films
- GB/T 21638-2008 Guide for electron beam microanalysis of defect in steel materials
- GB/T 21637-2008 Method of morphological identification of coronavirus by using transmission electron microscopy
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
SE-SIS, Electron Microscopic Characterization Methods
- SIS SS 11 11 14-1984 Steel — Determination of slag inclusions — Microscopic methods — Manual representation
- SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method
Group Standards of the People's Republic of China, Electron Microscopic Characterization Methods
American Society for Testing and Materials (ASTM), Electron Microscopic Characterization Methods
- ASTM E986-97 Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM E986-04(2017) Standard Practice for Scanning Electron Microscope Beam Size Characterization
- ASTM D3849-95a(2000) Standard Test Method for Carbon Black - Primary Aggregate Dimensions from Electron Microscope Image Analysis
- ASTM D3849-07 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-22 Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-02 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-04 Standard Test Method for Carbon Black-Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-14a Standard Test Method for Carbon Black—Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E766-14 Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope
- ASTM D3849-13 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM D3849-14 Standard Test Method for Carbon Blackmdash;Morphological Characterization of Carbon Black Using Electron Microscopy
- ASTM E2090-00 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Clean Room Wipers Using Optical and Scanning Electron Microscopy
- ASTM E2090-12 Standard Test Method for Size-Differentiated Counting of Particles and Fibers Released from Cleanroom Wipers Using Optical and Scanning Electron Microscopy
International Organization for Standardization (ISO), Electron Microscopic Characterization Methods
- ISO/CD 19214:2023 Microbeam analysis — Analytical electron microscopy — Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
- ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
Guangdong Provincial Standard of the People's Republic of China, Electron Microscopic Characterization Methods
- DB44/T 1216-2013 Characterization of graphene using scanning electron microscopy and X-ray spectroscopy
- DB44/T 1215-2013 Characterization of Single-Walled Carbon Nanotubes Using Scanning Electron Microscopy and Energy Spectroscopy
CN-STDBOOK, Electron Microscopic Characterization Methods
- 图书 a-4565 Practical Methods for Electron Microanalysis
Danish Standards Foundation, Electron Microscopic Characterization Methods
- DS/ISO/TS 10797:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
Association Francaise de Normalisation, Electron Microscopic Characterization Methods
- FD T16-209:2012 Nanotechnologies - Characterization of single-wall carbon nanotubes using transmission electron microscopy
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
- FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
British Standards Institution (BSI), Electron Microscopic Characterization Methods
- PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
- BS EN ISO 14880-4:2006 Optics and photonics - Microlens arrays - Test methods for geometrical properties
- BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
- DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- 20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Electron Microscopic Characterization Methods
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
- GB/T 34331-2017 Test method of Cucumber green mottle mosaic virus by transmission electron microscopy
Professional Standard - Machinery, Electron Microscopic Characterization Methods
Professional Standard - Education, Electron Microscopic Characterization Methods
- JY/T 011-1996 General Principles of Transmission Electron Microscopy
- JY/T 0581-2020 General Rules for Analysis Methods of Transmission Electron Microscopy
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
国家市场监督管理总局、中国国家标准化管理委员会, Electron Microscopic Characterization Methods
- GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy
- GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets
Korean Agency for Technology and Standards (KATS), Electron Microscopic Characterization Methods
Japanese Industrial Standards Committee (JISC), Electron Microscopic Characterization Methods
- JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
- JIS H 7804:2005 Method for particle size determination in metal catalysts by electron microscope
- JIS R 1683:2007 Test method for surface roughness of ceramic thin films by atomic force microscopy
- JIS R 1683:2014 Test method for surface roughness of ceramic thin films by atomic force microscopy
Professional Standard - Petroleum, Electron Microscopic Characterization Methods
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
Shanghai Provincial Standard of the People's Republic of China, Electron Microscopic Characterization Methods
- DB31/T 297-2003 Calibration method of magnification of scanning electron microscope
- DB31/T 315-2004 Calibration method of magnification of transmission electron microscope
国家能源局, Electron Microscopic Characterization Methods
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
GOSTR, Electron Microscopic Characterization Methods
- PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
- PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry
German Institute for Standardization, Electron Microscopic Characterization Methods
- DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
ES-UNE, Electron Microscopic Characterization Methods
- UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Electron Microscopic Characterization Methods
- GJB 5384.22-2005 Test methods of performance for pyrotechnic composition Part 21: Concentration determination of solid smoke particles quantities Electron microscope method
Military Standard of the People's Republic of China-General Armament Department, Electron Microscopic Characterization Methods
- GJB 8684.22-2015 Test methods for pyrotechnic properties - Part 22: Determination of smoke solid particle number concentration by electron microscopy
Professional Standard - Public Safety Standards, Electron Microscopic Characterization Methods
- GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)