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scanning observation

scanning observation, Total:2 items.

In the international standard classification, scanning observation involves: Ceramics.

SE-SIS, scanning observation

• SIS SS CECC 00013-1985 Basic specification: Scanning electron microscope inspection of semiconductor dice

Japanese Industrial Standards Committee (JISC), scanning observation

• JIS R 1633:1998 Sample preparation method of fine ceramics and fine ceramic powders for scanning electron microscope observation

Others:   Observer, scanning observation, observation deck, environmental observation, Analysis and observation, instrument observation, for observation, layer observation, environmental observation, observe, observe the sample, scanning observation, visual observation, observation equipment, Observation, observation observation, Observe while scanning, scanning observation, observe particles, Observation layer.