ZH
RU
ES

microscope atomic force

microscope atomic force, Total:11 items.

In the international standard classification, microscope atomic force involves: Linear and angular measurements, Analytical chemistry, Physics. Chemistry.

American Society for Testing and Materials (ASTM), microscope atomic force

• ASTM E2382-04(2020) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04 Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
• ASTM E2382-04(2012) Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy

International Organization for Standardization (ISO), microscope atomic force

• ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• ISO 23729:2022 Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

British Standards Institution (BSI), microscope atomic force

• BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
• BS ISO 23729:2022 Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
• 21/30412880 DC BS ISO 23729. Surface chemical analysis. Atomic force microscopy. Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size

ESDU - Engineering Sciences Data Unit, microscope atomic force

• SPB-M6-3-2010 Apr.08: Atomic Force Microscopy (background to technique)

Group Standards of the People's Republic of China, microscope atomic force

• T/CSTM 00003-2019 Thickness measurements of two-dimensional materials Atomic force microscopy (AFM)

Others:   atomic force microscope, atomic force, Atomic Force Microscope Detection, Atomic Force Microscope Detection, +++++ Atomic Force, Atomic force microscope, Atomic Force Microscopy Substrates, which atomic force microscope, atomic force microscope, Atomic Force Microscopy Protocol, Atomic Force Microscopy Probe, afm atomic force microscope, atomic force microscope, microscope atomic force, atomic force microscope, AFM, atomic force microscope, Atomic Force Microscopy Sample Preparation, Atomic AFM, /atomic force.