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initial oxidation potential

initial oxidation potential, Total:320 items.

In the international standard classification, initial oxidation potential involves: Water quality, Soil quality. Pedology, Power stations in general, Analytical chemistry, Surface treatment and coating, Non-ferrous metals, Integrated circuits. Microelectronics, Edible oils and fats. Oilseeds, Energy and heat transfer engineering in general, Sterilization and disinfection, Welding, brazing and soldering, Air quality, Vocabularies, Environmental protection, Inorganic chemicals, Fruits. Vegetables, Nuclear energy engineering, Glass, Products of non-ferrous metals, Fuels, Corrosion of metals, Ferroalloys, Natural gas, Metrology and measurement in general, Radiocommunications, Electricity. Magnetism. Electrical and magnetic measurements, Electrical accessories, Products of the chemical industry, Semiconductor devices, Testing of metals.

Professional Standard - Water Conservancy, initial oxidation potential

SL 94-1994 Determination of oxidation-reduction potential (Electrometric method )

Professional Standard - Environmental Protection, initial oxidation potential

HJ 746-2015 Soil—Determination of redox potential—Potential method
HJ/T 46-1999 Technical conditions of detector of sulphur dioxide concentration for constant potential electrolysis method
HJ 693-2014 Stationary source emission.Determination of nitrogen oxides.Fixed potential by electrolysis method
HJ 57-2017 Stationary source emission - Determination of sulfur dioxide - Fixed potential by electrolysis method
HJ 973-2018 Determination of Carbon Monoxide in Exhaust Gas from Fixed Pollution Sources Constant Potential Electrolysis
HJ/T 57-2000 Determination of sulphur dioxide from exhausted gas of stationary source.Fixed-potential electrolysis method

Korean Agency for Technology and Standards (KATS), initial oxidation potential

KS C IEC 60746-5-2014(2019) Expression of performance of electrochemical analyzers — Part 5: Oxidation-reduction potential or redox potential
KS I ISO 11271-2016(2021) Soil quality－Determination of redox potential－Field method
KS D ISO 2376:2012 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
KS D ISO 2376:2013 Anodizing of aluminium and its alloys-Determination of electric breakdown potential
KS B ISO 10156:2018 Gas cylinders — Gases and gas mixtrures — Determination of fire potential and oxidizing ability for the selection of cylinder valve outlets

German Institute for Standardization, initial oxidation potential

DIN IEC 60746-5:1996-07 Expression of performance of electrochemical analyzers - Part 5: Oxidation-reduction potential or redox potential (IEC 60746-5:1992)
DIN ISO 11271:2022-11 Soil quality - Determination of redox potential - Field method (ISO 11271:2022); Text in German and English / Note: Date of issue 2022-10-14*Intended as replacement for DIN ISO 11271 (2003-03).
DIN EN ISO 27107:2010-08 Animal and vegetable fats and oils - Determination of peroxide value - Potentiometric end-point determination (ISO 27107:2008, corrected version 2009-05-15); German version EN ISO 27107:2010
DIN ISO 11271:2003-03 Soil quality - Determination of redox potential - Field method (ISO 11271:2002) / Note: To be replaced by DIN ISO 11271 (2022-11).
DIN ISO 11271:2023-11 Soil quality - Determination of redox potential - Field method (ISO 11271:2022)
DIN 38404-6:1984-05 German standard methods for the examination of water, waste water and sludge; physical and physico-chemical parameters (group C); determination of the oxidation reduction (redox) potential (C 6)
DIN 38404-6 Berichtigung 1:2018-12 German standard methods for the examination of water, waste water and sludge - Physical and physico-chemical parameters (group C) - Part 6: Determination of the oxidation reduction (redox) potential (C 6); Corrigendum 1

VN-TCVN, initial oxidation potential

TCVN 7594-2006 Soil quality.Determination of redox potential.Field method

Professional Standard - Electricity, initial oxidation potential

DL/T 1480-2015 Test method for oxidation-reduction potential of water

GOSTR, initial oxidation potential

GOST R 59012-2020 Hard coals. Determination of oxidation by potentiometric titration

KR-KS, initial oxidation potential

KS I ISO 11271-2016 Soil quality－Determination of redox potential－Field method
KS D ISO 2376-2012 Anodizing of aluminium and its alloys－Determination of electric breakdown potential
KS B ISO 10156-2018 Gas cylinders — Gases and gas mixtrures — Determination of fire potential and oxidizing ability for the selection of cylinder valve outlets

PL-PKN, initial oxidation potential

PN T06513-02-1990 Measurement of redox potential value Industrial analyzers
PN T06513-03-1989 Redox potential value Laboratory measuring instruments General reguirements and tests
PN Z04005-04-1987 Air purity protection Tests for alkalies Determination of potassium hydroxide in work places by potentiometric method

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, initial oxidation potential

GB/T 20245.5-2013 Expression of performance of electrochemical analyzers.Part 5:Oxidation-reduction potential or redox potential
GB/T 8754-2006 Anodizing of aluminium and its alloys. Insulation check.by measurement of breakdown potential
GB 21346-2022 The norm of energy consumption per unit product of electrolytic aluminum and alumina
GB 28234-2011 Safety and sanitation standard for acidic electrolyzed-oxidizing water generator
GB/T 11064.3-1989 Lithium carbonate--Determination of lithium chloride content--Potentiometric method
GB/T 8754-1988 Anodizing of aluminium and aluminium alloys--Insulation check by measurement of breakdown potential
GB 8754-1988 Aluminum and aluminum alloy anodic oxidation application breakdown potential measurement method to test insulation
GB/T 11064.3-2013 Methods for chemical analysis of lithium carbonate,lithium hydroxide monohydrate and lithium chloride.Part 3:Determination of lithium chloride content.Potentiometric method
GB/T 5686.1-2008 Ferromanganese, ferromanganese-silicon, nitrogen-bearing ferromanganese and manganese metal. Determination of manganese content. Potentiometric method and titrimetric mothod after ammonium nitrate & perchloric acid oxidation
GB/T 5686.1-2022 Ferromanganese，ferromanganese-silicon，nitrogen-bearing ferromanganese and manganese metal—Determination of manganese content—Potentiometric method， titrimetric method after ammonium nitrate oxidation
GB/T 11060.6-2011 Natural gas.Determination of sulfur compounds.Part 6: Determination of hydrogen sulfide, mercaptan sulfur and carbonyl sulfide sulfur by potentiometry
GB/T 7730.1-2002 Ferromanganese and blast furnace ferromanganese--Determination of manganese content--Potentiometric method and titrimetric method after ammonium nitrate oxidation
GB/T 4699.2-2008 Ferrochromium and ferrosilicochromium. Determination of chromium content. The ammonium persulfate oxidation titrimetric method and potentiometric titration method

Group Standards of the People's Republic of China, initial oxidation potential

T/ZSZJX 006-2020 Water quality－Determination of the chemical oxygen demand－Potentiometric titration
T/HATSI 0022-2023 Technical specification for green-design product assessment—High oxidation potential disinfectant with hypochlorite

American Society for Testing and Materials (ASTM), initial oxidation potential

ASTM D1498-14(2022)e1 Standard Test Method for Oxidation-Reduction Potential of Water
ASTM UOP291-15 Total Chloride in Alumina and Silica-Alumina Catalysts by Microwave Digestion and Potentiometric Titration
ASTM D1498-14 Standard Test Method for Oxidation-Reduction Potential of Water
ASTM D1498-08 Standard Test Method for Oxidation-Reduction Potential of Water
ASTM G200-09 Standard Test Method for Measurement of Oxidation-Reduction Potential (ORP) of Soil
ASTM G200-20 Standard Test Method for Measurement of Oxidation-Reduction Potential (ORP) of Soil
ASTM G200-09(2014) Standard Test Method for Measurement of Oxidation-Reduction Potential 40;ORP41; of Soil
ASTM D873-12(2018) Standard Test Method for Oxidation Stability of Aviation Fuels (Potential Residue Method)
ASTM D873-02(2007) Standard Test Method for Oxidation Stability of Aviation Fuels (Potential Residue Method)
ASTM UOP291-13 Total Chloride in Alumina and Silica-Alumina Catalysts by Microwave Digestion and Potentiometric Titration
ASTM D3610-00 Standard Test Method for Total Cobalt In Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method
ASTM D3610-00(2004) Standard Test Method for Total Cobalt In Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method
ASTM D3610-22 Standard Test Method for Total Cobalt in Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method
ASTM D3610-00(2015) Standard Test Method for Total Cobalt in Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method
ASTM D3610-00(2010) Standard Test Method for Total Cobalt In Alumina-Base Cobalt-Molybdenum Catalyst by Potentiometric Titration Method
ASTM F616M-96 Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
ASTM F616M-96(2003) Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)
ASTM C1413-05 Standard Test Method for Isotopic Analysis of Hydrolyzed Uranium Hexafluoride and Uranyl Nitrate Solutions by Thermal Ionization Mass Spectrometry
ASTM E18-08 Standard Test Methods for Rockwell Hardness of Metallic Materials
ASTM E1899-97 Standard Test Method for Hydroxyl Groups Using Reaction with p-Toluenesulfonyl Isocyanate (TSI) and Potentiometric Titration with Tetrabutylammonium Hydroxide
ASTM E18-08a Standard Test Methods for Rockwell Hardness of Metallic Materials
ASTM E1899-23 Standard Test Method for Hydroxyl Groups Using Reaction with p-Toluenesulfonyl Isocyanate (TSI) and Potentiometric Titration with Tetrabutylammonium Hydroxide
ASTM E1899-16 Standard Test Method for Hydroxyl Groups Using Reaction with p-Toluenesulfonyl Isocyanate (TSI) and Potentiometric Titration with Tetrabutylammonium Hydroxide
ASTM D5997-96(2005) Standard Test Method for On-Line Monitoring of Total Carbon, Inorganic Carbon in Water by Ultraviolet, Persulfate Oxidation, and Membrane Conductivity Detection
ASTM D5997-96(2009) Standard Test Method for On-Line Monitoring of Total Carbon, Inorganic Carbon in Water by Ultraviolet, Persulfate Oxidation, and Membrane Conductivity Detection

British Standards Institution (BSI), initial oxidation potential

BS EN ISO 2376:2010 Anodizing of aluminium and its alloys. Determination of electric breakdown potential
BS EN ISO 27107:2008 Animal and vegetable fats and oils - Determination of peroxide value - Potentiometric end-point determination
BS ISO 11271:2022 Tracked Changes. Soil quality. Determination of redox potential. Field method
BS ISO 15158:2014 Corrosion of metals and alloys. Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
BS 2000-138:2002 Methods of test for petroleum and its products. Determination of oxidation stability of aviation fuel. Potential residue method
BS EN 15168:2006 Surface active agents - Determination of hydroxyl value - p-Toluensulfonyl isocyanate (TSI) method and potentiometric titration with tetrabutylammonium hydroxide

Danish Standards Foundation, initial oxidation potential

DS/EN ISO 2376:2010 Anodizing of aluminium and its alloys - Determination of electric breakdown potential
DS/ISO 11271:2004 Soil quality - Determination of redox potential - Field method
DS/EN ISO 27107:2010 Animal and vegetable fats and oils - Determination of peroxide value - Potentiometric end-point determination (ISO 27107:2008, corrected version 2009-05-15)
DS/EN 15168:2007 Surface active agents - Determination of hydroxyl value - p-Toluensulfonyl isocyanate (TSI) method and potentiometric titration with tetrabutylammonium hydroxide

Defense Logistics Agency, initial oxidation potential

DLA SMD-5962-94532-1994 MICROCIRCUIT, CMOS, 64-BIT MICROPROCESSOR
DLA SMD-5962-86706 REV C-2010 MICROCIRCUIT, MEMORY, DIGITAL, BIPOLAR, 1K x 8-bit, REGISTERED PROM WITH PROGRAMMABLE INITIALIZE, MONOLITHIC SILICON
DLA SMD-5962-94533-1994 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-87763 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, DUAL 12-BIT, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-79012 REV A-1986 MICROCIRCUITS, DIGITAL, CMOS, STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-79014 REV B-1987 MICROCIRCUIT, DIGITAL, CMOS, HEX INVERTER BUFFER, MONOLITHIC SILICON
DLA SMD-5962-89711 REV B-2006 MICROCIRCUIT, DIGITAL, CMOS 64-BIT OUTPUT CORRELATOR, MONOLITHIC SILICON
DLA SMD-5962-89982 REV B-2004 MICROCIRCUIT, DIGITAL, CHMOS, 16-BIT MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-92331-1993 MICROCIRCUIT, DIGITAL, CMOS, COORDINATE TRANSFORMER, 16X16 BIT, MONOLITHIC SILICON
DLA SMD-5962-90678 REV A-2005 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT, MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-84088 REV D-2001 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, MONOLITHIC SILICON
DLA SMD-5962-89446-1991 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT VARIABLE LENGTH SHIFT REGISTERS, MONOLITHIC SILICON
DLA SMD-5962-94537-1994 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT MEMORY PROCESSING UNIT, MONOLITHIC SILICON
DLA SMD-5962-89959 REV C-1996 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT CASCADABLE ALU, MONOLITHIC SILICON
DLA SMD-5962-93260 REV B-1996 MICROCIRCUIT, DIGITAL, CMOS, 12 X 10-BIT MATRIX MULTIPLIER, MONOLITHIC SILICON
DLA SMD-5962-89462 REV B-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 16-BIT AND 8/16-BIT MICROPROCESSOR MONOLITHIC SILICON
DLA SMD-5962-96683-1996 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, 4 BIT ARITHMETIC LOGIC UNIT, MONOLITHIC SILICON
DLA SMD-5962-84150 REV E-2002 MICROCIRUIT, DIGITAL, HIGH-SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, MONOLITHIC SILICON
DLA SMD-5962-89731-1989 MICROCIRCUITS, DIGITAL, FAST, CMOS, 8-BIT TRANSCEIVER WITH PARITY, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88778 REV A-2002 MICROCIRCUIT, CMOS, 12-BIT BUFFERED MULTIPLYING, DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-84067 REV D-2005 MICROCIRCUIT, DIGITAL, CMOS, OCTAL LATCHING BUS DRIVER, MONOLITHIC SILICON
DLA SMD-5962-77056-1977 MICROCIRCUITS, DIGITAL, CMOS, HEX, OPEN DRAIN, N-CHANNEL BUFFERS
DLA SMD-5962-89616 REV C-2001 MICROCIRCUIT, LINEAR, CMOS 8-BIT A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89674 REV C-2001 MICROCIRCUITS, LINEAR, CMOS, 14-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89676 REV C-2001 MICROCIRCUIT, LINEAR, CMOS, 16-BIT, ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89679 REV B-2001 MICROCIRCUIT, LINEAR, CMOS 12-BIT ANALOG-TO-DIGITAL CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-93150 REV A-1994 MICROCIRCUIT, DIGITAL, CMOS, 96-BIT FLOATING POINT DUAL PORT PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-93179 REV B-2002 MICROCIRCUIT, LINEAR, A/D CONVERTER, 12-BIT, CMOS, MONOLITHIC SILICON
DLA SMD-5962-84091 REV F-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, HEX INVERTING SCHMITT TRIGGER, MONOLITHIC SILICON
DLA SMD-5962-89772-1992 MICROCIRCUIT, CHMOS, 16-BIT MICROCONTROLLER WITH 8-BIT OR 16-BIT EXTERNAL BUS, MONOLITHIC SILICON
DLA SMD-5962-79016 REV B-1992 MICROCIRCUIT, DIGITAL, CMOS, 1-TO-64 BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-94542-1994 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT LOCAL AREA NETWORK COPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89665-1989 MICROCIRCUIT, DIGITAL, FAST, CMOS, 9-BIT WIDE BUFFERED REGISTERS, MONOLITHIC SILICON
DLA SMD-5962-88501 REV G-2007 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-88612 REV A-1990 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-93105 REV C-1996 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT HIGH INTEGRATION MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-93170 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, 8-16 BIT PARALLEL INTERFACE/TIMER MONOLITHIC SILICON
DLA SMD-5962-90512-1992 MICROCIRCUIT, DIGITAL, HMOS, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-84073 REV G-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, HEX D-TYPE FLIP-FLOP WITH CLEAR, MONOLITHIC SILICON
DLA SMD-5962-90501 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT SERIAL/PARALLEL-IN, SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-82022 REV A-2001 MICROCIRCUIT, DIGITAL, CMOS, HEX D FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-89596 REV D-2004 MICROCIRCUIT, DIGITAL, NMOS, 16-BIT MICROCONTROLLER, MONOLITHIC SILICON
DLA SMD-5962-94523 REV A-1996 MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 BIT PARALLEL MULTIPLIER, MONOLITHIC SILICON
DLA SMD-5962-94564-1994 MICROCIRCUIT, DIGITAL, CMOS, 24-BIT GENERAL PURPOSE DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89653 REV A-1991 MICROCIRCUIT, LINEAR, CMOS, 8-BIT VIDEO D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89655 REV B-2004 MICROCIRCUIT, LINEAR, 12-BIT CMOS, HIGH-SPEED A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89657 REV B-2001 MICROCIRCUIT, LINEAR, DUAL, CMOS, 12-BIT, D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-94608-1994 MICROCIRCUIT, DIGITAL, CMOS, 12-BIT CASCADABLE MULTIPLIER-SUMMER, MONOLITHIC SILICON
DLA SMD-5962-88543 REV C-2006 MICROCIRCUIT, DIGITAL, FAST CMOS, 8-BIT IDENTITY COMPARATOR, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88568-1988 MICROCIRCUITS, DIGITAL, NMOS, SINGLE COMPONENT, 8-BIT MICROCOMPUTER, MONOLITHIC SILICON
DLA SMD-5962-92317 REV E-2000 MICROCIRCUIT, DIGITAL, CMOS, OCTAL PI-BUS TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-87806 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-88765 REV B-2002 MICROCIRCUIT, LINEAR, CMOS, MICROPROCESSOR COMPATIBLE, DUAL 12-BIT DIGITAL-TO-ANALOG CONVERTERS, MONOLITHIC SILICON
DLA SMD-5962-86010 REV C-2004 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, UNBUFFERED HEX INVERTER, MONOLITHIC SILICON
DLA SMD-5962-94574 REV A-2002 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT TTL/BTL REGISTERED TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-89707-1989 MICROCIRCUITS, DIGITAL, HIGH-SPEED CMOS, BCD DECADE COUNTER, SYNCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-93156 REV B-2000 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 8-BIT
DLA SMD-5962-93187 REV L-2007 MICROCIRCUIT, HYBRID, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 128K X 32-BIT
DLA SMD-5962-89517 REV A-1994 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT SLICE MICROPROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89967 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, REGISTERED 8K X 8-BIT PROM, MONOLITHIC SILICON
DLA SMD-5962-77031 REV A-1979 MICROCIRCUITS, DIGITAL, CMOS, 14-STAGE RIPPLE- CARRY BINARY COUNTER/DIVIDER AND OSCILLATOR
DLA SMD-5962-93262 REV D-2006 MICROCIRCUIT, LINEAR, CMOS, 6-BIT FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89747 REV B-2003 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX INVERTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89777 REV C-2007 MICROCIRCUIT, LINEAR, CMOS, 8-BIT A/D FLASH, CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-92201 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, NINE-BIT PARITY GENERATOR/CHECKER, MONOLITHIC SILICON
DLA SMD-5962-88574 REV A-1994 MICROCIRCUIT, DIGITAL, HCMOS 8-INPUT, NOR/OR GATE, MONOLITHIC SILICON
DLA SMD-5962-88595 REV A-1989 MICROCIRCUITS, DIGITAL, NMOS, 256 X 4 STATIC RAM (SRAM) MONOLITHIC SILICON
DLA SMD-5962-90553 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SYNCHRONOUS BINARY DOWN COUNTER, MONOLITHIC SILICON
DLA SMD-5962-86862 REV B-1989 MICROCIRCUITS, DIGITAL, FAST CMOS, UNIVERSAL SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89481 REV A-2004 MICROCIRCUIT, LINEAR, CMOS, 12-BIT, MULTIPLYING D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89512 REV D-1995 MICROCIRCUIT, DIGITAL, CMOS, 56-BIT DIGITAL SIGNAL PROCESSOR, MONOLITHIC SILICON
DLA SMD-5962-89702 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, DUAL J-K FLIP-FLOP WITH SET AND RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89704 REV B-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89741-1990 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER WITH I/P LATCH, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-87808 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS UP/DOWN DECADE COUNTER WITH ASYNCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-89436 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT UNIVERSAL SHIFT REGISTER WITH TRI-STATE OUTPUTS, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-85001 REV D-2005 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, HEX BUFFER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-85002 REV E-2005 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, HEX BUFFER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-94611 REV R-2004 MICROCIRCUIT, HYBRID, MEMORY, DIGITAL, 512K X 32-BIT, STATIC RANDOM ACCESS MEMORY, CMOS
DLA SMD-5962-89953 REV A-2006 MICROCIRCUIT, DIGITAL, ADVANCED HIGH-SPEED CMOS, DUAL 4-STAGE SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88533 REV C-1994 MICROCIRCUIT, DIGITAL, CMOS, ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
DLA SMD-5962-90590 REV B-2002 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER WITH OPEN DRAIN OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-86816 REV C-2003 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-86817 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 8-BIT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-88733 REV D-1997 MICROCIRCUIT, DIGITAL, CMOS, 16 X 16 BIT MULTIPLIER, ACCUMULATOR, MONOLITHIC SILICON
DLA SMD-5962-89518 REV A-2002 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-89533-1989 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-89590 REV A-1994 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 512 X 8 BIT SERIAL EEPROM, MONOLITHIC SILICON
DLA SMD-5962-94527 REV E-2004 MICROCIRCUIT, LINEAR, CMOS, QUAD, SERIAL INTERFACE, 8-BIT D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89946 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS DECADE UP/DOWN COUNTER, MONOLITHIC SILICON
DLA SMD-5962-88613 REV B-1991 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT ERROR DETECTION AND CORRECTION UNIT, MONOLITHIC SILICON
DLA SMD-5962-93157 REV G-2002 MICROCIRCUIT, MEMORY, HYBRID AND MONOLITHIC, DIGITAL, STATIC RANDOM ACCESS MEMORY, CMOS, 256K X 8-BIT
DLA SMD-5962-93239 REV B-2005 MICROCIRCUIT, DIGITAL, CMOS, SCAN PATH LINKERS WITH 4-BIT ID BUS, MONOLITHIC SILICON
DLA SMD-5962-89534 REV C-1991 MICROCIRCUITS, DIGITAL, CMOS, 80-BIT NUMERIC PROCESSOR EXTENSION, MONOLITHIC SILICON
DLA SMD-5962-89743 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, HEX D-TYPE FLIP-FLOP WITH RESET, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-96668 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, DUAL 64-STAGE STATIC SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-84074 REV E-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, INVERTING OCTAL BUFFER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-81017 REV G-2005 MICROCIRCUIT, DIGITAL, CMOS, 4 BIT PARALLEL-IN/PARALLEL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-84096 REV G-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, OCTAL BUFFER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-84099 REV G-2002 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, OCTAL, D- TYPE FLIP-FLOP WITH CLEAR, MONOLITHIC SILICON
DLA SMD-5962-84155 REV E-2005 MICROCIRCUIT, DIGITAL, LOW-POWER SCHOTTKY TTL, OCTAL BUFFER GATES WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-89852 REV A-2006 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT ADDRESSABLE LATCH, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89989-1990 MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, OCTAL BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-88594 REV C-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 256 X 4 STATIC RAM (SRAM), MONOLITHIC SILICON
DLA SMD-5962-88608 REV A-2004 MICROCIRCUIT, DIGITAL, FAST, CMOS, 10-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88656 REV A-2004 MICROCIRCUIT, DIGITAL, FAST CMOS, 9-BIT NONINVERTING REGISTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88661-1989 MICROCIRCUIT, DIGITAL, FAST CMOS 9-BIT NON-INVERTING BUS TRANSCEIVER, MONOLITHIC SILICON
DLA SMD-5962-92197 REV A-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL BIDIRECTIONAL TRANSCEIVER WITH 8-BIT PARITY GENERATOR/CHECKER, THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-89614 REV F-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-84089 REV D-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, QUAD D-TYPE FLIP-FLOP, WITH CLEAR MONOLITHIC SILICON
DLA SMD-5962-77025 REV J-2005 MICROCIRCUIT, DIGITAL, CMOS, 8-STAGE SHIFT REGISTER/LATCH WITH THREE- STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-89671 REV B-2002 MICROCIRCUIT, LINEAR, DUAL 12-BIT BUFFERED MULTIPLYING CMOS D/A CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-92177 REV B-2007 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 8-BIT BIDIRECTIONAL TRANSCEIVER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-90692 REV C-1996 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROCONTROLLER WITH ON CHIP EPROM, MONOLITHIC SILICON
DLA SMD-5962-05214 REV A-2007 MICROCIRCUIT, DIGITAL, CMOS, RADIATION HARDENED, PROGRAMMABLE SKEW CLOCK BUFFER, MONOLITHIC SILICON
DLA SMD-5962-84072 REV F-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCHES WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-84162 REV D-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT SERIAL-IN/PARALLEL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89672 REV A-2001 MICROCIRCUIT, LINEAR, DUAL 12-BIT, DOUBLE-BUFFERED MULTIPLYING CMOS, DIGITAL-TO-ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-89682 REV A-1999 MICROCIRCUITS, DIGITAL, ADVANCED CMOS, OCTAL TRANSCEIVER/REGISTER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-89732-1989 MICROCIRCUITS, DIGITAL, FAST, CMOS, OCTAL BUFFER/LINE DRIVER WITH THREE-STATE OUTPUT, MONOLITHIC SILICON
DLA SMD-5962-87756 REV D-2005 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH MASTER RESET, MONOLITHIC SILICON
DLA SMD-5962-89951-1990 MICROCIRCUITS, MEMORY, DIGITAL, NMOS 256 X 4 BIT, NONVOLATILE STATIC RAM, MONOLITHIC SILICON
DLA SMD-5962-92345 REV B-2001 MICROCIRCUIT, CMOS, 12-BIT, SERIAL INPUT, MULTIPLYING, DIGITAL TO ANALOG CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-86826 REV C-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BIDIRECTIONAL UNIVERSAL SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-92333 REV C-2006 MICROCIRCUIT, DIGITAL, CMOS, 8-BIT EPROM MICROCONTROLLER WITH 10 BIT A/D, CAPTIVE/COMPARE TIMER, MONOLITHIC SILICON
DLA SMD-5962-92209 REV C-1996 MICROCIRCUIT, DIGITAL, FAST CMOS, 4 BIT PRESETTABLE BINARY COUNTER WITH ASYNCHRONOUS RESET, TTL COMPATIBLE INPUTS AND LIMITED OUTPUT VOLTAGE SWING, MONOLITHIC SILICON
DLA SMD-5962-89484 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, REGISTERED 8K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-84075 REV E-2002 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT SYNCHRONOUS BINARY COUNTER WITH ASYNCHRONOUS CLEAR, MONOLITHIC SILICON
DLA SMD-5962-84095 REV C-2002 MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, 8-BIT PARALLEL-IN SERIAL-OUT SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-89947 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 12-STAGE RIPPLE-CARRY BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-90705-1991 MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, BCD DECADE COUNTER, ASYNCHRONOUS RESET, MONOLITHIC SILICON
DLA SMD-5962-93166 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, POWER SWITCHED, 32K x 8-BIT PROM, MONOLITHIC SILICON
DLA SMD-5962-89519 REV F-1998 MICROCIRCUIT, DIGITAL, CMOS, 16-BIT MICROPROCESSOR, MIL-STD-1750 INSTRUCTION SET ARCHITECTURE, MONOLITHIC SILICON
DLA SMD-5962-86071 REV C-2002 MICROCIRCUIT, DIGITAL, BIPOLAR, ADVANCED SCHOTTKY, TTL, SHIFT REGISTER, MONOLITHIC SILICON
DLA SMD-5962-84071 REV G-2002 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, THREE-STATE OCTAL D-TYPE FLIP-FLOP, MONOLITHIC SILICON
DLA SMD-5962-89849 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, OCTAL D-TYPE FLIP-FLOP, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-90574-1990 MICROCIRCUITS, DIGITAL, HIGH SPEED CMOS, 8-BIT SYNCHRONOUS BCD DOWN COUNTER, TTL, COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88650 REV A-1996 MICROCIRCUIT, LINEAR, CMOS, 8-BIT, MICROPROCESSOR COMPATIBLE, A/D CONVERTER WITH TRACK/HOLD, MONOLITHIC SILICON
DLA SMD-5962-93175 REV B-1999 MICROCIRCUIT, DIGITAL, ADVANCED BIPOLAR CMOS, 16-BIT BUS TRANSCEIVER WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-93244-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 512K X 8 BIT 5-VOLT PROGRAMMING EEPROM, MONOLITHIC SILICON
DLA SMD-5962-88556 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, ANALOG MULTIPLEXER/DEMULTIPLEXER, DOUBLE-POLE FOUR-POSITION, MONOLITHIC SILICON
DLA SMD-5962-90686-1999 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER WITH OPEN DRAIN OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88705 REV A-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 10-BIT D-TYPE FLIP-FLOP WITH THREESTATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88766 REV A-2004 MICROCIRCUIT, DIGITAL-LINEAR, 12-BIT CMOS DIGITAL TO ANALOG CONVERTER WITH, OUTPUT AMPLIFIER AND REFERENCE, MONOLITHIC SILICON
DLA SMD-5962-90564 REV D-2006 MICROCIRCUIT, DIGITAL, CHMOS, SINGLE-CHIP, 8-BIT MICROCONTROLLER WITH 16K BYTES OF EPROM PROGRAM MEMORY, MONOLITHIC SILICON
DLA SMD-5962-06238 REV A-2007 MICROCIRCUIT, DIGITAL, RADIATION HARDENED, ADVANCED CMOS, 8-BIT UNIVERSAL SHIFT/STORAGE REGISTER WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-89593 REV D-1995 MICROCIRCUIT, DIGITAL, CMOS, 32-BIT DMA CONTROLLER WITH INTEGRATED SYSTEM SUPPORT PERIPHERALS, MONOLITHIC SILICON
DLA SMD-5962-89678 REV A-2001 MICROCIRCUIT, LINEAR, QUAD 8-BIT MULTIPLYING CMOS, DIGITAL-TO-ANALOG CONVERTER WITH MEMORY, MONOLITHIC SILICON
DLA SMD-5962-92176 REV B-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL BUFFER/LINE DRIVER WITH NONINVERTING THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-92178 REV A-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL TRANSPARENT D-TYPE LATCH WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-92179 REV A-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, OCTAL D-TYPE FLIP-FLOP WITH THREE-STATE OUTPUTS, MONOLITHIC SILICON
DLA SMD-5962-92183 REV C-2003 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, HEX INVERTER WITH SCHMITT TRIGGER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-92200 REV A-2006 MICROCIRCUIT, DIGITAL, ADVANCED CMOS, 10-BIT TRANSPARENT LATCH WITH THREE-STATE OUTPUTS, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88674-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT, NONINVERTING , BUS INTERFACE REGISTERS, TTL COMPATIBLE, MONOLITHIC SILICON
DLA SMD-5962-88575-1989 MICROCIRCUITS, DIGITAL, FAST CMOS, 10-BIT NONINVERTING BUS INTERFACE LATCH WITH THREE-STATE OUTPUT, MONOLITHIC SILICON
DLA SMD-5962-88671 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT BINARY UP/DOWN COUNTER WITH TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88672 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 4-BIT MAGNITUDE COMPARATOR, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-88675-1988 MICROCIRCUITS, DIGITAL, FAST CMOS, 8-BIT NONINVERTING BUS INTERFACE LATCH, TTL COMPATIBLE, MONOLITHIC SILICON

International Organization for Standardization (ISO), initial oxidation potential

ISO 11271:2022 Soil quality — Determination of redox potential — Field method
ISO 8298:2000 Nuclear fuel technology - Determination of milligram amounts of plutonium in nitric acid solutions - Potentiometric titration with potassium dichromate after oxidation by CE(IV) and reduction by FE(II)

(U.S.) Ford Automotive Standards, initial oxidation potential

FORD ESB-M64J27-A4-1993 OXIDATION POTENTIAL CONTROL ADDITIVE Shown on ESB-M64J27-A1

CZ-CSN, initial oxidation potential

CSN 44 1876-1982 Bauxite. Determination of chromium (III)oxide. The potentiometric and photometric methods.
CSN 44 1875-1983 Bauxite. Determination of vanadium oxide. The potenciometric and photometric methods.
CSN 70 0632 Cast.1-1986 Glass testing methods. Chemical analysis of glass. Determination of lead oxide. Volumetric method with complexone 3 (after the electrolytic separation)

Professional Standard - Machinery, initial oxidation potential

JB/T 7948.2-1999 Methods for chemical analysis of melted welding fluxes.The potentiometric method for determination of manganese oxide content

Professional Standard - Aviation, initial oxidation potential

HB/Z 339.1-1999 Analytical method of chromic acid anodic oxidation solution of aluminum alloy Determination of free chromium trioxide and total chromium trioxide content by potentiometric titration
HB/Z 5086.3-2000 Analytical method for cyanide electroplating copper solution Potentiometric titration for determination of sodium hydroxide content
HB/Z 5105.1-2000 Electrochemical Polishing Solution Analysis Method Potentiometric Titration Determination of Chromium Trioxide Content
HB/Z 5084.2-2000 Analytical method of cyanide electroplating zinc solution by potentiometric titration to determine the content of sodium hydroxide
HB/Z 5085.3-1999 Analytical method of cyanide electroplating cadmium solution Potentiometric titration for determination of sodium hydroxide content
HB/Z 5105.2-2000 Electrochemical Polishing Solution Analysis Method Potentiometric Titration Determination of Chromium Trioxide Content
HB/Z 5109.9-2001 Analysis method for passivation solution Determination of chromium trioxide content in copper plating passivation solution through potentiometric titration
HB/Z 5107.18-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 18:Determination of ammonium chloride (sodium chloride)content in nitric acid oxidation solution by potentiometric method
HB/Z 5091.1-1999 Analysis method for chrome plating solution Determination of chromium trioxide content through potentiometric titration
HB/Z 5107.17-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 17:Determination of nitric acid content in nitric acid oxidation solution by potentiometric method
HB/Z 5092.1-2001 Electroplating Black Chromium Solution Analysis Method Potentiometric Titration Determination of Chromium Trioxide Content
HB/Z 5091.2-1999 Analysis method for chrome plating solution Determination of dichromium trioxide content through potentiometric titration
HB/Z 5109.3-2001 Analysis method for passivation solution Determination of chromium trioxide in zinc plating, cadmium plating triacid passivation solution through potentiometric titration
HB/Z 5107.7-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 7:Determination of glacial acetic acid content in glacial acetic acid oxidation solution by potentiometric method
HB/Z 5107.9-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 9:Determination of chlorine content in glacial acetic acid oxidation solution by potentiometric method
HB/Z 5107.16-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 16:Determination of potassium bichromate content in nitric acid oxidation solution by potentiometric method
HB/Z 5093.2-2000 Analytical method of alkaline electroplating tin solution Potentiometric titration to determine the content of sodium hydroxide
HB/Z 5107.5-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 5:Determination of glacial acetic acid content in aluminum potassium sulfate oxidation solution by potentiometric method
HB/Z 5107.6-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 6:Determination of potassium bichromate content in glacial acetic acid oxidation solution by potentiometric method
HB/Z 5107.3-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 3:Determination of potassium bichromate content in aluminum potassium sulfate oxidation solution by potentiometric method
HB/Z 5107.11-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 11:Determination of sodium bichromate content in sodium bichromate and magnesium sulfate oxidation solution by potentiometric method
HB/Z 5107.12-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 12:Determination of potassium bichromate content in potassium bichromate and magnesium sulfate oxidation solution by potentiometric method
HB/Z 5107.14-2004 Methods for analysis of chemical oxidation solution for magnesium alloy-Part 14:Determination of ammonia sulfate content in potassium bichromate and magnesium sulfate oxidation solution by potentiometric method
HB/Z 5110.2-2000 Electrochemical degreasing and chemical degreasing solution analysis method Potentiometric titration determination of sodium hydroxide, sodium carbonate, trisodium phosphate
HB 20055.2-2011 Methods for analysis of chemical milling solutions for aluminum alloy.Part 2:Determination of sodium hydroxide content by potentiometric titrimetric method
HB/Z 5099.5-2000 Analytical method of electroplating silver solution Potentiometric titration determination of potassium hydroxide content in hard silver plating solution
HB/Z 5104.2-1999 Analytical method of sulfuric acid anodic oxidation solution of aluminum alloy - Determination of aluminum content by potentiometric titration
HB/Z 339.2-1999 Analytical method of aluminum alloy chromic acid anodizing solution for determination of chloride ion content by potentiometric titration
HB/Z 5104.3-1999 Analysis method for aluminum alloy sulphide acid anodizing solution Determination of chloride Ion content through potentiometric titration
HB/Z 5104.1-1999 Analytical method of aluminum alloy sulfuric acid anodic oxidation solution Potentiometric titration determination of free sulfuric acid and combined sulfuric acid

RU-GOST R, initial oxidation potential

GOST ISO 27107-2016 Animal and vegetable fats and oils. Determination of peroxide value by potentiometric end-point method
GOST R 8.702-2010 State system for ensuring the uniformity of measuremenets. Measuring electrodes for oxidation-reduction potential determination (ORP). Verification procedure

Military Standard of the People's Republic of China-General Armament Department, initial oxidation potential

GJB 760-1989 Controlled potential coulometric method for determination of total plutonium content in plutonium dioxide

Lithuanian Standards Office , initial oxidation potential

LST EN ISO 2376:2010 Anodizing of aluminium and its alloys - Determination of electric breakdown potential (ISO 2376:2010)
LST EN ISO 27107:2010 Animal and vegetable fats and oils - Determination of peroxide value - Potentiometric end-point determination (ISO 27107:2008, corrected version 2009-05-15 )
LST EN 15168-2007 Surface active agents - Determination of hydroxyl value - p-Toluensulfonyl isocyanate (TSI) method and potentiometric titration with tetrabutylammonium hydroxide

AENOR, initial oxidation potential

UNE-EN ISO 2376:2011 Anodizing of aluminium and its alloys - Determination of electric breakdown potential (ISO 2376:2010)
UNE-ISO 11271:2007 Soil quality -- Determination of redox potential -- Field method. (ISO 11271:2002)
UNE 51118:1983 STANDARD TEST METHOD FOR OXIDATION STABILITY OF AVIATION FUELS (POTENTIAL RESIDUE METHOD)
UNE-EN ISO 27107:2010 Animal and vegetable fats and oils - Determination of peroxide value - Potentiometric end-point determination (ISO 27107:2008, corrected version 2009-05-15)
UNE-EN 15168:2007 Surface active agents - Determination of hydroxyl value. p-Toluensulfonyl isocyanate (TSI) method and potentiometric titration with tetrabutylammonium hydroxide

Association Francaise de Normalisation, initial oxidation potential

NF T20-554:1989 Hydrogen peroxide for industrial use. Determination of apparent pH (pha). Potentiometric method.
NF T90-260:2023 Qualité de l'eau - Caractérisation des méthodes d'analyses - Mesure du potentiel d'oxydoréduction dans l'eau
NF EN ISO 27107:2010 Corps gras d'origines animale et végétale - Détermination de l'indice de peroxyde - Détermination avec point d'arrêt potentiométrique
NF M07-013:1982 Liquid fuels and lubricating oils. Oxidation stability of aviation fuels. Potential residue method.
NF A05-207*NF ISO 15158:2014 Corrosion of metals and alloys - Method of measuring the pitting potential for stainless steels by potentiodynamic control in sodium chloride solution
NF EN ISO 10156:2017 Bouteilles à gaz - Gaz et mélanges de gaz - Détermination du potentiel d'inflammabilité et d'oxydation pour le choix des raccords de sortie de robinets
NF M60-402*NF ISO 8298:2001 Nuclear fuel technology - Determination of milligram amounts of plutonium in nitric acid solutions - Potentiometric titration with potassium dichromate after oxidation by Ce(IV) and reduction by Fe(II).

Professional Standard - Non-ferrous Metal, initial oxidation potential

YS/T 710.1-2009 Method for chemical analysis of cobalt oxide.Part 1:Determination of cobalt content.Potentiometric method

Shanxi Provincial Standard of the People's Republic of China, initial oxidation potential

DB14/T 692-2012 Determination of peroxide value of agricultural nuts by automatic potentiometric titration

International Telecommunication Union (ITU), initial oxidation potential

ITU-R M.587-1 SPANISH-1986 COAST STATION IDENTITIES AND INITIATION OF LOCATION REGISTRATION IN AN AUTOMATED VHF/UHF MARITIME MOBILE TELEPHONE SYSTEM
ITU-R M.587-1-1986 Coast Station Identities and Initiation of Location Registration in an Automated VHF/UHF Maritime Mobile Telephone System - Section 8C - Maritime Mobile Service; Telephony and Related Subjects

Professional Standard - Nuclear Industry, initial oxidation potential

EJ/T 1212.2-2008 Test methods for analysis of sintered gadolinium oxide-uranium dioxide pellets.Part2: Determination of isotopic uramium composition by thermal ionization mass spectrometry
EJ/T 20164-2018 Automatic potentiometric titration method for determination of uranium content in reprocessed uranium trioxide powder
EJ/T 20223-2018 Determination of uranium isotopic composition in reprocessed uranium trioxide powder by thermal ionization mass spectrometry
EJ/T 973-1995 Determination of Uranium Isotope Abundance in Uranium Dioxide Powder and Pellets by Thermal Ionization Mass Spectrometry
EJ/T 973-2016 Determination of Uranium Isotopic Abundance in Uranium Dioxide Powder and Pellets by Thermal Ionization Mass Spectrometry
EJ/T 1212.5-2008 Test methods for analysis of sintered gadolinium oxide-uranium dioxide pellets.Part5: Determination of uranium content by ferrous sulfate reduction in phosphoric acid and dichromate titration method
EJ/T 277-1986 Precise Determination of Uranium in High Purity U3O8 by Ferrous Sulfate Reduction/Potassium Dichromate Potentiometric Titration

工业和信息化部, initial oxidation potential

YS/T 1157.1-2016 Methods for chemical analysis of crude cobalt hydroxide Part 1: Determination of cobalt content by potentiometric titration
YS/T 1157.4-2016 Methods for chemical analysis of crude cobalt hydroxide Part 4: Determination of manganese content by potentiometric titration
SJ/T 11636-2016 Determination of tetramethylammonium hydroxide in developing solutions for the electronics industry by automatic potentiometric titration
YB/T 4174.3-2022 Methods of analysis for calcium silicon alloys Part 3: Determination of calcium oxide content by potentiometric titration
YS/T 1445.2-2021 Chemical analysis method for nickel-cobalt-aluminum three-element composite hydroxide Part 2: Determination of cobalt content by potentiometric titration method

Universal Oil Products Company (UOP), initial oxidation potential

UOP 291-2013 Total Chloride in Alumina and Silica-Alumina Catalysts by Microwave Digestion and Potentiometric Titration
UOP 291-2015 Total Chloride in Alumina and Silica-Alumina Catalysts by Microwave Digestion and Potentiometric Titration

U.S. Military Regulations and Norms, initial oxidation potential

ARMY MIL-M-63320 A NOTICE 1-1997 MILITARY SPECIFICATION MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-M-63320 A (4)-1990 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-M-63320 A-1981 MICROCIRCUIT, DIGITAL, CMOS (INITIAL LOGIC)
ARMY MIL-M-63321 A NOTICE 1-1997 MICROCIRCUIT, DIGITAL, CMOS (FINAL LOGIC)

Professional Standard - Commodity Inspection, initial oxidation potential

SN/T 4306-2015 Determination of chromium oxide content in chromeore.Automatic potentiometric titration with microwave digestion method

IN-BIS, initial oxidation potential

IS 8554-1977

Professional Standard - Agriculture, initial oxidation potential

水和废水监测分析方法 3.1.10-2003 Part III Comprehensive Indicators and Inorganic Pollutants Chapter I Physical and Chemical Indicators Ten Oxidation-Reduction Potential (B)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, initial oxidation potential

GJB 5969.2-2007 Test methods for microsphere uranium dioxide with coated niobium for submarine nuclear power plant.Part 2: Determination of uranium by ferrous sulfate reduction and potassium dichrormate titration method

未注明发布机构, initial oxidation potential

GJB 8793.2-2015 Testing method for niobium-coated uranium dioxide microspheres used in submarine nuclear power plants Part 2: Determination of uranium Ferrous sulfate reduction-potassium dichromate oxidation potentiometric titration method

European Committee for Standardization (CEN), initial oxidation potential

EN 15168:2006 Surface active agents - Determination of hydroxyl value - p-Toluensulfonyl isocyanate (TSI) method and potentiometric titration with tetrabutylammonium hydroxide