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Ray Stress Analyzer

Ray Stress Analyzer, Total:199 items.

In the international standard classification, Ray Stress Analyzer involves: Radiation protection, Radiation measurements, Non-destructive testing, Testing of metals, Metalliferous minerals, Occupational safety. Industrial hygiene, Nuclear energy engineering, Analytical chemistry, Power stations in general, Non-metalliferous minerals, Linear and angular measurements, Surface treatment and coating, Optics and optical measurements, Education, Television and radio broadcasting, Refractories, Lubricants, industrial oils and related products, Inorganic chemicals, Mechanical testing, Petroleum products in general, Medical equipment, Coals, Power transmission and distribution networks, Technical drawings, Optical equipment, Powder metallurgy, Applications of information technology, Reinforced plastics.

Professional Standard - Machinery, Ray Stress Analyzer

JB/T 9394-1999 Specifications for the X-ray stressometers
JB/T 9394-2011 Non-destructive testing instruments.Specifications for the X-ray stressometers
JB/T 9399-1999 Main parameter series for the X-ray analytical instrumentation
JB/T 9399-2010 Main parameter series for the X-ray analytical instrumentation

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Ray Stress Analyzer

GB 16355-1996 Radiation protection standards for X-ray diffraction and fluorescence analysis equipment
GB/T 8359-1987 Carbides in high speed steel--Quantitative phase analysis--Method of X-ray diffractometer
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale
GB/T 20726-2015 Microbeam analysis.Selected instrumental performance parameters for the specification and checking of energy dispersive X-ray spectrometers for use in electron probe microanalysis
GB/T 22571-2008 Surface chemical analysis.X-ray photoelectron spectrometers.Calibration of energy scales
GB/Z 41285.5-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of sealed radioactive sources—Part 5:Building precautionary measures of radiation protection for the γ radi
GB/T 28892-2012 Surface chemical analysis.X-ray photoelectron spectroscopy.Description of seleted instrumental performance parameters
GB/Z 41285.1-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of sealed radioactive sources—Part 1:Stationary and mobile handling for γ radiography
GB/Z 41285.3-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of sealed radioactive sources—Part 3:Organization of radiation protection during handling and transport for
GB/T 19421.1-2003 Test methods of crystalline layered sodium disilicate--Qualitative analysis of delta-crystalline layered sodium disilicate--Method of X-ray diffractometer
GB/Z 41285.4-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of sealed radioactive sources—Part 4:Construction and testing of mobile apparatus for γ radiography
GB/T 12162.4-2010/ISO 4037 4-2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010/ISO 4037 4:2004 X and gamma reference radiation for calibrating dosimeters and dose rate meters and determining their energy response Part 4: Calibration of site and personal dosimeters in low energy X-ray reference radiation fields
GB/T 12162.4-2010 X and gamma reference radiation for calibrating dosemeters and doserate meters and for determining their response as a function of photon energy.Part 4:Calibration of area and personal dosemeters in low energy X reference radiation fields
GB/Z 41285.6-2022 Non-destructive testing instruments—Radiation protection rules for the technical application of sealed radioactive sources—Part 6:Inspection,service and functional test of mobile apparatus for γ radio

German Institute for Standardization, Ray Stress Analyzer

DIN EN 15305 Berichtigung 1:2009-04 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305:2009-01 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN EN 15305 Berichtigung 1:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008, Corrigendum to DIN EN 15305:2009-01; German version EN 15305:2008/AC:2009
DIN EN 15305:2009 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction; German version EN 15305:2008
DIN IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube (IEC 62495:2011)
DIN ISO 16129:2020-11 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN ISO 15632:2015 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
DIN IEC 61453:2008 Nuclear Instrumentation - Scintillation gamma ray detector systems for the assay of radionuclides - Calibration and functional checks (IEC 61453:2007)
DIN ISO 15632:2022-09 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA) (ISO 15632:2...
DIN ISO 15472:2020-05 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN ISO 15472:2020 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales (ISO 15472:2010); Text in English
DIN 51577-4:1994 Testing of mineral oil hydrocarbons and similar products; determination of chlorine and bromine content; analysis by energy dispersive X-ray spectrometry with low cost instruments
DIN ISO 16129:2020 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer (ISO 16129:2018); Text in English
DIN EN ISO 21587-1:2007-12 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007); German version EN ISO 21587-1:2007
DIN ISO 10110-2:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 2: Material imperfections; stress birefringence (ISO 10110-2:1996)
DIN EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007); English version of DIN EN ISO 21587-1:2007-12
DIN EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica (ISO 10058-1:2008); German version EN ISO 10058-1:2008

Association Francaise de Normalisation, Ray Stress Analyzer

NF EN 15305:2009 Essais non-destructifs - Méthode d'essai pour l'analyse des contraintes résiduelles par diffraction des rayons X
NF A09-185*NF EN 15305:2009 Non-destructive testing - Test Method for Residual Stress analysis by X-ray Diffraction.
NF A09-285:1999 Non destructive testing - Test methods for residual stress analysis by X-ray diffraction
NF X21-008:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive ray spectrometers for use in electron probe microanalysis
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
NF EN 16424:2014 Caractérisation des déchets - Méthode de dépistage pour la détermination de la composition élémentaire au moyen d'analyseurs portables de fluorescence X
NF X11-683:1981
NF S10-008-2:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 2 : material imperfections. Stress birefringence.
NF B40-670-1*NF EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1 : apparatus, reagents, dissolution and gravimetric silica
NF EN ISO 21587-1:2007 Analyse chimique des produits réfractaires d'aluminosilicates (méthode alternative à la méthode par fluorescence de rayons X) - Partie 1 : appareillage, réactifs, dissolution et teneur en silice par gravimétrie
NF EN ISO 13196:2015 Qualité du sol - Analyse rapide d'une sélection d'éléments dans les sols à l'aide d'un spectromètre de fluorescence X à dispersion d'énergie portable ou portatif
NF B49-329-1*NF EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1 : apparatus, reagents, dissolution and determination of gravimetric silica

Professional Standard - Building Materials, Ray Stress Analyzer

JC/T 1085-2008 X-ray fluorescence analyzer for cement

未注明发布机构, Ray Stress Analyzer

BS EN 15305:2008(2009) Non - destructive Testing — Test Method for Residual Stress analysis by X - ray Diffraction
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS ISO 10110-2:1996(1999) Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 2 : Material imperfections — Stress birefringence

Professional Standard - Nuclear Industry, Ray Stress Analyzer

EJ/T 767-1993 X-ray fluorescence analyzer excited by radioactive sources
EJ/T 684-1992 Portable source excited X-ray fluorescence analyzer
EJ/T 684-2016 Portable Energy Dispersive X-ray Fluorescence Analyzer

American National Standards Institute （ANSI), Ray Stress Analyzer

ANSI/ASTM E915:1996 Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ANSI/IEEE 1260:2007 Guide on the Prediction, Measurement, and Analysis of AM Broadcast Reradiation by Power Lines

Danish Standards Foundation, Ray Stress Analyzer

DS/EN 15305/AC:2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
DS/EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica

Lithuanian Standards Office , Ray Stress Analyzer

LST EN 15305-2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN 15305-2008/AC-2009 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
LST EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007)

AENOR, Ray Stress Analyzer

UNE-EN 15305:2010 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
UNE-EN ISO 21587-1:2008 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica (ISO 21587-1:2007)

British Standards Institution (BSI), Ray Stress Analyzer

BS EN 15305:2008 Non-destructive testing - Test method for residual stress analysis by X-ray diffraction
PD ISO/TS 18507:2015 Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS ISO 16129:2018 Tracked Changes. Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
BS 1902-9.1:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of alumino-silicate refractories by X-ray fluorescence
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS 1902-9.2:1987 Methods of testing refractory materials - Chemical analysis by instrumental methods - Analysis of silica refractories by X-ray fluorescence
BS EN ISO 10058-1:2009 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method). Apparatus, reagents, dissolution and determination of gravimetric silica
BS 1902 Sec.9.1:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of alumino-silicate refractories by X-ray fluorescence
BS EN ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica (ISO 10058-1:2008)
BS 1902 Sec.9.2:1987 Methods of testing refractory materials. Chemical analysis by instrumental methods. Analysis of silica refractories by X-ray fluorescence
BS EN ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Apparatus, reagents, dissolution and gravimetric silica
BS ISO 10110-2:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Material imperfections - Stress birefringence
BS ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements alignment and positioning, data collection, data analysis and reporting
BS ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry. Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

Japanese Industrial Standards Committee (JISC), Ray Stress Analyzer

JIS M 8205:2000 Iron ores -- X-ray fluorescence spectrometric analysis
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

Occupational Health Standard of the People's Republic of China, Ray Stress Analyzer

GBZ 115-2002 Radiological standards for X-ray Diffraction and fluorescence analysis equipment

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Ray Stress Analyzer

GB/T 36017-2018 Non-destructive testing instruments—X-ray fluorescence analysis tube
GB/T 22571-2017 Surface chemical analysis—X-ray photoelectron spectrometers—Calibration of energy scales
GB/T 35734-2017 Portable tube-excited X-ray fluorescence analysis equipment－Classification, safety requirements and test
GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
GB/T 35465.2-2017 Test method for fatigue properties of polymer matrix composite materials -Part 2: Statistical analysis of linear or linearized stress-life(S-N) and strain-life(ε-N) fatigue data

National Metrological Technical Specifications of the People's Republic of China, Ray Stress Analyzer

JJF 1079-2002 Calibration Specification for Cathode Ray Tube(CRT)Color Analyzers
JJF 1133-2005 Calibration Specification of Gold Gauge Utilizing X-ray Fluorescence Spectrometry

American Society for Testing and Materials (ASTM), Ray Stress Analyzer

ASTM E915-96 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-16 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-96(2002) Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-19 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-10 Standard Test Method for Verifying the Alignment of X-Ray Diffraction Instrumentation for Residual Stress Measurement
ASTM E915-21 Standard Practice for Verifying the Alignment of X-Ray Diffraction Instruments for Residual Stress Measurement
ASTM E1361-90(1999) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2021) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM B975-18e1 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-18 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-22 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM B975-15 Standard Test Method for Measurement of Internal Stress of Metallic Coatings by Split Strip Evaluation (Deposit Stress Analyzer Method)
ASTM E1005-10 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance, E 706(IIIA)
ASTM E1005-97 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance, E 706(IIIA)
ASTM E1005-15 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance
ASTM E1005-16 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance
ASTM E1361-02 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2007) Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM E1361-02(2014)e1 Standard Guide for Correction of Interelement Effects in X-Ray Spectrometric Analysis
ASTM D7751-12 Standard Test Method for Determination of Additive Elements in Lubricating Oils by EDXRF Analysis
ASTM E739-91(1998) Standard Practice for Statistical Analysis of Linear or Linearized Stress-Life (S-N) and Strain-Life (e-N) Fatigue Data
ASTM E1005-03e1 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance, E 706(IIIA)
ASTM E1005-03 Standard Test Method for Application and Analysis of Radiometric Monitors for Reactor Vessel Surveillance, E 706(IIIA)
ASTM E739-91(2004)e1 Standard Practice for Statistical Analysis of Linear or Linearized Stress-Life (S-N) and Strain-Life (949;-N) Fatigue Data
ASTM E739-10(2015) Standard Practice for Statistical Analysis of Linear or Linearized Stress-Life (S-N) and Strain-Life (&x3b5;-N) Fatigue Data
ASTM E739-10 Standard Practice for Statistical Analysis of Linear or Linearized Stress-Life (S-N) and Strain-Life (&949;-N) Fatigue Data
ASTM E739-23 Standard Guide for Statistical Analysis of Linear or Linearized Stress-Life (S-N) and Strain-Life (ε-N) Fatigue Data
ASTM F1375-92(2012) Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
ASTM B761-02e1 Standard Test Method for Particle Size Distribution of Metal Powders and Related Compounds by X-Ray Monitoring of Gravity Sedimentation

工业和信息化部/国家能源局, Ray Stress Analyzer

JB/T 12962.2-2016 Energy dispersive X-ray fluorescence spectrometer Part 2: Elemental analyzers
JB/T 12962.3-2016 Energy dispersive X-ray fluorescence spectrometer Part 3: Coating thickness analyzer

Professional Standard - Ferrous Metallurgy, Ray Stress Analyzer

YB/T 5336-2006 Quantitative Analysis of Carbide Phase in High Speed Steel by X-ray Diffraction Method

Korean Agency for Technology and Standards (KATS), Ray Stress Analyzer

KS D ISO 14706-2003(2018)
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 15632:2012 Microbeam analysis－Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS D ISO 15470-2005(2020) Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS E ISO 10086-1:2007 Coal－Methods for evaluating flocculants for use in coal preparation－Part 1：Basic parameters
KS L ISO 10058-1:2012 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method)-Part 1:Apparatus, reagents, dissolution and determination of gravimetric silica
KS D ISO 16413:2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
KS B ISO 10110-2-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS B ISO 10110-2:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS B ISO 10110-2:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence
KS L ISO 21587-1:2012 Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 1：Apparatus, reagents, dissolution and determination of gravimetric silica
KS L ISO 21587-1-2012(2022) Chemical analysis of aluminosilicate refractory products(alternative to the X-ray fluorescence method)－Part 1：Apparatus, reagents, dissolution and determination of gravimetric silica

International Electrotechnical Commission (IEC), Ray Stress Analyzer

IEC 61452:1995 Nuclear instrumentation - Measurement of gamma-ray emission rates of radionuclides - Calibration and use of germanium spectrometers
IEC 62495:2011 Nuclear instrumentation - Portable X-ray fluorescence analysis equipment utilizing a miniature X-ray tube
IEC 61453:2007 Nuclear instrumentation - Scintillation gamma ray detector systems for the assay of radionuclides - Calibration and routine tests

Professional Standard - Electricity, Ray Stress Analyzer

DL/T 1151.22-2012 Analytical methods of scale and corrosion products in power plants.Part 22: standard test methods of X-ray fluorescence spectrometry and X-ray diffraction

KR-KS, Ray Stress Analyzer

KS D ISO 14706-2003(2023)
KS D ISO 15472-2003(2023)
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 16413-2021 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
KS B ISO 10110-2-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 2：Material imperfections－Stress birefringence

API - American Petroleum Institute, Ray Stress Analyzer

API REPORT 85-16-1986 Stress Analysis of API Type 16B and 16BX Hubs

IN-BIS, Ray Stress Analyzer

IS 12803-1989

Professional Standard - Customs, Ray Stress Analyzer

HS/T 12-2006 Quantitative analysis of talc, chlorite, magnesite mixed phase.Method of X-ray diffractometer

European Committee for Standardization (CEN), Ray Stress Analyzer

EN 15305:2008 Non-destructive Testing - Test Method for Residual Stress analysis by X-ray Diffraction
EN ISO 20565-1:2008 Chemical analysis of chrome-bearing refractory products and chrome-bearing raw materials (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica
EN ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica (ISO 10058-1:2008)

International Organization for Standardization (ISO), Ray Stress Analyzer

ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 15632:2021 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
ISO 15632:2012 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15632:2002 Microbeam analysis - Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors
ISO 16129:2018 Surface chemical analysis — X-ray photoelectron spectroscopy — Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 15470:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO/CD 5861 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO/DIS 5861:2023 Surface chemical analysis — X-ray photoelectron spectroscopy — Method of intensity calibration for quartz-crystal monochromated Al Kα XPS instruments
ISO 10058-1:2008 Chemical analysis of magnesite and dolomite refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and determination of gravimetric silica
ISO 10110-2:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 2: Material imperfections - Stress birefringence
ISO 21587-1:2007 Chemical analysis of aluminosilicate refractory products (alternative to the X-ray fluorescence method) - Part 1: Apparatus, reagents, dissolution and gravimetric silica
ISO 16413:2013 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry - Instrumental requirements, alignment and positioning, data collection, data analysis and reporting
ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analysis and reporting

National Aeronautics and Space Administration (NASA), Ray Stress Analyzer

NASA NACA-TN-3288-1954 On the analysis of linear and nonlinear dynamical systems from transient-response data

EEMUA - Engineering Equipment and Materials Users Association, Ray Stress Analyzer

PUB NO 209-2015 Guide to the development and implementation of on-line analyser applications (Edition 1)

Engineering Equipment and Materials Users Association （EEMUA), Ray Stress Analyzer

EEMUA PUB NO 209-2015 Guide to the development and implementation of on-line analyser applications (Edition 1)

Professional Standard - Education, Ray Stress Analyzer

JY/T 0588-2020 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Single Crystal X-ray Diffraction
JY/T 008-1996 General Rules for Determination of Crystal and Molecular Structure of Small Molecular Compounds by Four-Circle Single Crystal X-ray Diffractometer

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Ray Stress Analyzer

IEEE 1260-1996 Guide on the Prediction@ Measurement@ and Analysis of AM Broadcast Reradiation by Power Lines
IEEE 1260-2018 Guide on the Prediction@ Measurement@ and Analysis of AM Broadcast Reradiation by Power Lines
IEEE P1260/D4-2018 Draft Guide for the Prediction@ Measurement@ and Analysis of AM Broadcast Reradiation by Power Lines
IEEE P1260/D3-2018 Draft Guide for the Prediction@ Measurement@ and Analysis of AM Broadcast Reradiation by Power Lines
IEEE 643 CORR 1-2013 Guide for Power-Line Carrier Applications Corrigendum 1: Modal Analysis Power Equation Correction

European Telecommunications Standards Institute (ETSI), Ray Stress Analyzer

ETSI TR 103 343-2015 PowerLine Telecommunications (PLT); Powerline HDMI analysis for very short range link HD and UHD applications (V1.1.1)

ETSI - European Telecommunications Standards Institute, Ray Stress Analyzer

TR 103 343-2015 PowerLine Telecommunications (PLT); Powerline HDMI analysis for very short range link HD and UHD applications (V1.1.1)

Institute of Electrical and Electronics Engineers (IEEE), Ray Stress Analyzer

IEEE Std 1260-1996 IEEE Guide on the Prediction, Measurement, and Analysis of AM Broadcast Reradiation by Power Lines
IEEE Std 1260-2018 IEEE Guide on the Prediction,Measurement, and Analysis of AM Broadcast Reradiation by Power Lines
IEEE P1260/D4, May 2018 IEEE Approved Draft Guide on the Prediction, Measurement, and Analysis of AM Broadcast Reradiation by Power Lines
IEEE P1260/D3, February 2018 IEEE Draft Guide on the Prediction, Measurement, and Analysis of AM Broadcast Reradiation by Power Lines
IEEE Std 643-2004/COR 1-2013 IEEE Guide for Power-Line Carrier Applications Corrigendum 1: Modal Analysis Power Equation Correction
IEEE P643-2004/Cor1/D3, August 2013 IEEE Guide for Power-Line Carrier Applications Corrigendum 1: Modal Analysis Power Equation Correction
IEEE Std 643-2004/Cor 1-2013 (Corrigendum to IEEE Std 643-2004) IEEE Guide for Power-Line Carrier Applications Corrigendum 1: Modal Analysis Power Equation Correction
IEEE 643/COR 1-2013 Guide for Power-Line Carrier Applications Corrigendum 1: Modal Analysis Power Equation Correction

Standard Association of Australia （SAA）, Ray Stress Analyzer

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

RU-GOST R, Ray Stress Analyzer

GOST R 57080-2016 Medical electrical equipment. H-Ray Bone Densitometer (Absorptiometer). Technical requirements for governmental purchases