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transmission electron microscopy

transmission electron microscopy, Total:8 items.

In the international standard classification, transmission electron microscopy involves: Optics and optical measurements, Analytical chemistry, Protection against dangerous goods.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, transmission electron microscopy

• GB/T 30543-2014 Nanotechnologies.Characterization of single-wall carbon nanotubes using transmission electron microscopy

国家市场监督管理总局、中国国家标准化管理委员会, transmission electron microscopy

• GB/T 35098-2018 Microbeam analysis—Transmission electron microscopy—Morphological identification method of plant viruses by transmission electron microscopy

Korean Agency for Technology and Standards (KATS), transmission electron microscopy

• KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

KR-KS, transmission electron microscopy

• KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, transmission electron microscopy

• GB/T 34002-2017 Microbeam analysis—Analytical transmission electron microscopy—Methods for calibrating image magnification by using reference materials having periodic structures

International Organization for Standardization (ISO), transmission electron microscopy

• ISO 19214:2017 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of wirelike crystals by transmission electron microscopy

Professional Standard - Machinery, transmission electron microscopy

• JB/T 5383-1991 Specification for transmission electron microscope

American Society for Testing and Materials (ASTM), transmission electron microscopy

• ASTM D6480-19 Standard Test Method for Wipe Sampling of Surfaces, Indirect Preparation, and Analysis for Asbestos Structure Number Surface Loading by Transmission Electron Microscopy

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