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Transistor material

Transistor material, Total:15 items.

In the international standard classification, Transistor material involves: Physics. Chemistry, Semiconductor devices.

Korean Agency for Technology and Standards (KATS), Transistor material

• KS C IEC 62860:2018 Test methods for the characterization of organic transistors and materials

KR-KS, Transistor material

• KS C IEC 62860-2018 Test methods for the characterization of organic transistors and materials
• KS C IEC 62860-2018(2023) Test methods for the characterization of organic transistors and materials

British Standards Institution (BSI), Transistor material

• BS IEC 62860:2013 Test methods for the characterization of organic transistors and materials

Institute of Electrical and Electronics Engineers (IEEE), Transistor material

• IEEE Std 1620-2004 Standard for Test Methods for the Characterization of Organic Transistors and Materials
• IEEE Std 1620-2008 IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
• IEEE/IEC 62860-2013 IEC/IEEE Test methods for the characterization of organic transistors and materials
• IEC 62860:2013*IEEE Std 1620:2008 IEC/IEEE Test methods for the characterization of organic transistors and materials
• IEC 62860:2013(E) IEEE Std 1620-2008 IEC/IEEE Test methods for the characterization of organic transistors and materials
• IEEE Unapproved Draft Std P1620/D7, Oct 2007 IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials
• IEEE Unapproved Draft Std P1620/D8 Apr 2008 IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials

International Electrotechnical Commission (IEC), Transistor material

• IEC 62860:2013 Test Methods for the Characterization of Organic Transistors and Materials

American National Standards Institute （ANSI), Transistor material

• ANSI/IEEE 1620:2008 Standard for Test Methods for the Characterization of Organic Transistors and Materials

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Transistor material

• IEEE 1620-2008 Test Methods for the Characterization of Organic Transistors and Materials (IEEE Computer Society)
• IEEE 1620-2004 Standard Test Methods for the Characterization of Organic Transistors and Materials (IEEE Computer Society Document)

Others:   silicon transistor, capacitor transistor, phototransistor, effect transistor, transistor output, transparent transistor, Transistor Capacitance, phototransistor, Transistor material, thin film transistor, silicon transistor, ionic transistor, Transistor count, Transistor development, Transistor count, Transistor-Transistor Logic Circuits, Transistor Transistor Logic Integrated Circuit, transistor circuit, capacitor transistor, Transistor Capacitance.