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SEM image

SEM image, Total:13 items.

In the international standard classification, SEM image involves: Analytical chemistry, Optical equipment.

Jiangsu Provincial Standard of the People's Republic of China, SEM image

• DB32/T 4546-2023 Technical specifications for automated inspection of diatom images using scanning electron microscopes

Guangdong Provincial Standard of the People's Republic of China, SEM image

• DB44/T 1527-2015 Microbeam Analysis Scanning Electron Microscope Image Clarity Evaluation Method

国家市场监督管理总局、中国国家标准化管理委员会, SEM image

• GB/T 27788-2020 Microbeam analysis—Scanning electron microscopy—Guidelines for calibrating image magnification

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, SEM image

• GB/T 27788-2011 Microbeam analysis.Scanning electron microscopy.Guidelines for calibrating image magnification

Korean Agency for Technology and Standards (KATS), SEM image

• KS D ISO 16700:2013 Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification
• KS D ISO 16700-2013(2018) Microbeam analysis－Scanning electron microscopy－Guidelines for calibrating image magnification

International Organization for Standardization (ISO), SEM image

• ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
• ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Association Francaise de Normalisation, SEM image

• NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
• XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
• XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image

British Standards Institution (BSI), SEM image

• BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification

Japanese Industrial Standards Committee (JISC), SEM image

• JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification

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