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UV silicon photocell

UV silicon photocell, Total:140 items.

In the international standard classification, UV silicon photocell involves: Insulating materials, Semiconducting materials, Solar energy engineering, Components for electrical equipment, Testing of metals, Aircraft and space vehicles in general, Electrical wires and cables, Aerospace electric equipment and systems, Environmental protection, Analytical chemistry, Integrated circuits. Microelectronics, Electrical and electronic testing, Natural gas, Occupational safety. Industrial hygiene, Components and accessories for telecommunications equipment, Medical sciences and health care facilities in general, Body care equipment, Fibre optic communications, Non-ferrous metals.

Group Standards of the People's Republic of China, UV silicon photocell

T/ZZB 2854-2022 UV insulating films of crystalline silicon photovoltaic modules—polyethylene terephthalate films
T/ZZB 1389-2019 Monocrystalline silicon photovoltaic cells
T/CPIA 0020-2020 Electroluminescence Test Method for Crystalline Silicon Photovoltaic Cells
T/CPIA 0048.1-2022 Manufacturing guidelines for crystalline silicon standard photovoltaic cells for production lines Part 1: Homogeneous crystalline silicon photovoltaic cells
T/GDWCA 0101-2023 UV irradiation crosslinking equipment for wires and cables
T/CSTM 00463-2023 Classification of black rings in N-type crystalline silicon photovoltaic cells
T/CSTM 00463-2022 Classification of black rings in N-type crystalline silicon photovoltaic cells
T/CEC 287-2019 Technical Requirements for Back Contact Crystalline Silicon Photovoltaic Cells
T/CPIA 0041-2022 Test method for thermally assisted light-induced attenuation of crystalline silicon photovoltaic cells
T/CSTM 00465-2022 Test method of damp heat degradation of crystalline silicon photovoltaic cells
T/CSTM 00461-2022 Test method for electrode peel strength of crystalline silicon PV cells
T/GDWCA 0085-2022 Ultraviolet light irradiation cross-linked polyethylene insulating compounds for wires and cables
T/SQIA 057-2023 Technical requirements for carbon footprint assessment of crystalline silicon photovoltaic cell
T/CSTM 00587-2023 Test method for flexural strength of crystalline silicon cells—Four-point flexural
T/ZSA 39-2020 Characterization of Graphene - Work function - Ultraviolet photoelectron spectroscopy (UPS) method
T/ZGIA 002-2020 Graphene Test Methods Determination of Work Function Ultraviolet Photoelectron Spectroscopy
T/CPIA 0030.1-2021 Paste for crystalline silicon photovoltaic cells Part 1: back field aluminum paste sintered aluminum paste
T/CPIA 0030.3-2021 Paste for crystalline silicon photovoltaic cells Part 3: Front side silver paste sintered silver paste
T/CPIA 0030.2-2021 Paste for crystalline silicon photovoltaic cells Part 2: Backside silver paste sintered type silver paste

British Standards Institution (BSI), UV silicon photocell

BS EN IEC 63202-1:2019 Photovoltaic cells - Measurement of light-induced degradation of crystalline silicon photovoltaic cells
PD IEC TS 63202-2:2021 Photovoltaic cells. Electroluminescence imaging of crystalline silicon solar cells
PD IEC TS 63202-4:2022 Photovoltaic cells - Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells
BS EN 4650:2010 Aerospace series - Wire and cable marking process, UV Laser
BS EN 4650:2023 Tracked Changes. Aerospace series. Wire and cable marking process, UV Laser
BS EN 61215:2005 Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval
BS CECC 90113:1987 Specification for harmonized system of quality assessment for electronic components - Blank detail specification - MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
BS EN 50289-4-17:2011 Communication cables. Specifications for test methods. Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable
BS EN 2267-010:2005 Cables, electrical, for general purpose — Operating temperatures between -55 ℃ and 260 ℃ — Part 010: DR family, single UV laser printable — Product standard
BS EN 2267-010:2006 Aerospace series. Cables, electrical for general purpose. Operating temperatures between -55°C and 260°C. DR family, single UV laser printable. Product standard
BS EN 2266-005:2006 Aerospace series - Cables, electrical, for general purpose - Operating temperatures between -55 °C and 200 °C - UV laser printable - Product standard
BS EN 2267-010:2013 Aerospace series. Cables, electrical, for general purpose. Operating temperatures between - 55°C and 260°C. DR family, single UV laser printable. Product standard
BS EN 50289-4-17:2015 Tracked Changes. Communication cables. Specifications for test methods. Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable
BS EN 2266-005:2005 Cables, electrical, for general purpose — Operating temperatures between
22/30466943 DC BS EN 60794-1-214. Optical fibre cables - Part 1-214. Generic specification. Basic optical cable test procedures. Environmental test methods. Cable UV resistance test, Method F14

European Committee for Electrotechnical Standardization（CENELEC）, UV silicon photocell

EN IEC 63202-1:2019 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
EN 50289-4-17:2015 Communication cables - Specifications for test methods - Part 4-17: Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable

Association Francaise de Normalisation, UV silicon photocell

NF C57-331*NF EN IEC 63202-1:2019 Photovoltaic cells - Part 1 : measurement of light-induced degradation of crystalline silicon photovoltaic cells
NF EN IEC 63202-1:2019 Cellules photovoltaïques - Partie 1 : mesure de la dégradation induite par la lumière des cellules photovoltaïques au silicium cristallin
NF EN 4650:2023 Série aérospatiale - Procédé de marquage des fils et câbles par laser UV
NF L52-251*NF EN 4650:2010 Aerospace series - Wire and cable marking process, UV Laser
NF C86-252-001:1987 Detail Specification for MOS Ultravioletlight Erasable,Electrically Programmable Read Only Memories Silicon Monolithic Circuits
NF C86-252:1988 Components for Electronic Equipment MOS ultraviolet light erasable,electrically programmable read only memories silicon monolithic circuits Collection of detail specifications within the scope of the French Standard NF C 86-252(CECC 90 113)
NF EN 3475-706:2006 Série aérospatiale - Câbles électriques à usage aéronautique - Méthodes d'essais - Partie 706 : marquabilité laser UV
NF EN 2266-005:2006 Série aérospatiale - Câbles, électriques, d'usage général - Températures de fonctionnement comprises entre - 55 oC et 200 oC - Partie 005 : marquables au laser UV - Norme de produit
NF EN 2267-005:2006 Série aérospatiale - Câbles, électriques, d'usage général - Températures de fonctionnement comprises entre - 55 oC et 260 oC - Partie 005 : marquables au laser UV - Norme de produit
NF C73-827/A1:2010 Household and similar electrical appliances - Safety - Part 2-27 : particular requirements for appliances for skin exposure to ultraviolet and infrared radiation.
NF C93-537-4-17*NF EN 50289-4-17:2016 Communication cables - Specifications for test methods - Part 4-17 : test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable
NF EN 50289-4-17:2016 Câbles de communication - Spécifications des méthodes d'essai - Partie 4-17 : méthodes d'essai pour évaluer la résistance aux UV des gaines des câbles électriques et des câbles à fibre optique
NF C93-537-4-17:2011 Communication cables - Specifications for test methods - Part 4-17 : test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable.

International Electrotechnical Commission (IEC), UV silicon photocell

IEC 63202-1:2019 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
IEC TS 63202-2:2021 Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells
IEC TS 63202-4:2022 Photovoltaic cells - Part 4: Measurement of light and elevated temperature induced degradation of crystalline silicon photovoltaic cells

ES-UNE, UV silicon photocell

UNE-EN IEC 63202-1:2020 Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells
UNE-EN 4650:2023 Aerospace series - Wire and cable marking process, UV Laser (Endorsed by Asociación Española de Normalización in April of 2023.)
UNE-EN 50289-4-17:2016 Communication cables - Specifications for test methods - Part 4-17: Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable

Fujian Provincial Standard of the People's Republic of China, UV silicon photocell

DB35/T 1126-2011 Low-light amorphous silicon solar cell

SAE - SAE International, UV silicon photocell

SAE AS5649-2007 Wire and Cable Marking Process@ UV Laser

Society of Automotive Engineers (SAE), UV silicon photocell

SAE AS5649-2012 Wire and Cable Marking Process, UV Laser
SAE AS5649A-2019 Wire and Cable Marking Process, UV Laser
SAE AIR5558-2009 Ultraviolet (UV) Laser Marking Performance of Aerospace Wire Constructions

Taiwan Provincial Standard of the People's Republic of China, UV silicon photocell

CNS 15116-2007 UV test for photovoltaic (PV) modules

Defense Logistics Agency, UV silicon photocell

DLA SMD-5962-91545 REV F-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-89476 REV A-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABALE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-85135 REV B-1988 MICROCIRCUITS, DIGITAL, 64K X 8-BIT, UV EPROM, MONOLITHIC SILICON
DLA SMD-5962-86864 REV A-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ULTRAVIOLET ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA MIL-M-38510/507 B VALID NOTICE 1-2010 Microcircuits, Memory, Digital, CMOS Ultraviolet Erasable Programmable Array Logic, Monolithic Silicon
DLA SMD-5962-89469 REV C-2011 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-91584 REV A-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-91772 REV A-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88726 REV F-2010 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ULTRAVIOLET ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-87515 REV B-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 8K X 8 UV EPROM, MONOLITHIC SILICON
DLA SMD-5962-88680-1991 MICROCIRCUITS, MEMORY, DIGITAL, 2K X 8 POWER DOWN UV EPROM, MONOLITHIC SILICON
DLA SMD-5962-89537 REV B-2006 MICROCIRCUITS, MEMORY, DIGITAL, 16K X 8 UV EPROM, MONOLITHIC SILICON
DLA SMD-5962-93248-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-90754 REV B-2012 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE ASYNCHRONOUS REGISTERED PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA MIL-M-38510/224 VALID NOTICE 4-2010 Microcircuits, Memory, Digital, MOS, 32K X 8, Ultraviolet Erasable Programmable Read-Only Memory (EPROM) Monolithic Silicon
DLA SMD-5962-93245-1993 MICROCIRCUITS, DIGITAL, MEMORY, CMOS, EXTENDED VOLTAGE, UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-94510 REV A-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88549 REV A-1992 MICROCIRCUIT, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-93144 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE, LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-85135 REV C-2009 MICROCIRCUIT, MEMORY, DIGITAL, NMOS, 64K x 8-BIT UV ERASEABLE PROGRAMMABLE READ ONLY MEMORY(UVEPROM), MONOLITHIC SILICON
DLA SMD-5962-90989 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-87661 REV F-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 8-BIT ULTRA VIOLET ERASABLE PROGRAMMABLE READ ONLY MEMORY (UVEPROM), MONOLITHIC SILICON
DLA SMD-5962-91772-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-87744 REV A-2010 MICROCIRCUIT, MEMORY, DIGITAL, NMOS, 64K X 16-Bit (1M) UV ERASABLE PROGRAMMABLE READ ONLY MEMORY (UVEPROM), MONOLITHIC SILICON
DLA SMD-5962-88548 REV A-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-88678 REV B-2005 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88724 REV D-2007 MICROCIRCUIT, DIGITAL, MEMORY, CMOS UV ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-88726 REV E-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, ULTRAVIOLET ERASABLE, PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-85102 REV E-2005 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 8K X 8 UV ERASABLE PROM, MONOLITHIC SILICON
DLA SMD-5962-91584-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-92062 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89468 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASEABLE PROGRAMMABLE LOGIC ARRAY, MONOLITHIC SILICON
DLA SMD-5962-89469 REV B-1994 MICROCIRCUIT, MEMORY, DIGITAL, CMOS UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89476-1992 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, UV ERASABLE PROGRAMMABLE LOGIC DEVICE, MONOLITHIC SILICON
DLA SMD-5962-89817 REV C-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 32K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-92322-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 64K X 8-BIT FAST COLUMN ACCESS UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-90658 REV A-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 4K X 8 UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-86063 REV H-2006 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 262, 144-BIT (32K X 8) UV ERASABLE PROM, MONOLITHIC SILICON
DLA SMD-5962-87648 REV E-2006 MICROCIRCUITS, MEMORY, DIGITAL, CMOS, 64K X 8 UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-89614 REV F-2003 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 128K X 8-BIT UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-89815 REV B-2007 MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 2K X 8 REGISTERED UVEPROM, MONOLITHIC SILICON
DLA SMD-5962-93122-1993 MICROCIRCUIT, MEMORY, DIGITAL, CMOS 2K X 16-BIT STATE MACHINE UVEPROM, MONOLITHIC SILICON

工业和信息化部, UV silicon photocell

SJ/T 11629-2016 Online photoluminescence analysis method of silicon wafers and cells for solar cells
SJ/T 11631-2016 Test method for appearance defects of silicon wafers for solar cells

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, UV silicon photocell

GB/T 29055-2019(英文版) Multi crystalline silicon wafers for photovoltaic solar cell
GB/T 29054-2019(英文版) Casting multi crystalline silicon brick for photovoltaic solar cell
GB/T 29850-2013 Test method for measuring compensation degree of silicon materials used for photovoltaic applications
GB/T 6495.11-2016 Photovoltaic devices.Part 11: Test method of initial light-induced degradation of crystalline silicon solar cell
GB 7795-1987 Diagnostic criteria and principles of management of occupational acute electric ophthalmia(Kerato-conjunctivitis caused by ultraviolet rays)
GB/T 31854-2015 Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
GB/T 29849-2013 Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
GB/T 29851-2013 Test method for measuring boron and aluminium in silicon materials used for photovoltaic applications by secondary ion mass spectrometry
GB/T 29852-2013 Test method for measuring phosphorus, arsenic and antimony in silicon materials used for photovoltaic applications by secondary ion mass spectrometry

Military Standards (MIL-STD), UV silicon photocell

DOD A-A-54996-1994 LIGHT, ULTRAVIOLET, SPECIMEN EXAMINING (110 VOLTS, 60 CYCLE, AC OR BATTERY OPERATED)

SE-SIS, UV silicon photocell

SIS SS CECC 90113-1987 Blank detailspecification: MOS ultra-violet light erasable electrically programmable read only memories silicon monolitic circuits

RU-GOST R, UV silicon photocell

GOST R IEC 61829-2013 Crystalline silicon photovoltaic batteries. On-site measurement of I-V characteristics

Danish Standards Foundation, UV silicon photocell

DS/EN 4650:2010 Aerospace series - Wire and cable marking process, UV Laser

Lithuanian Standards Office , UV silicon photocell

LST EN 4650-2010 Aerospace series - Wire and cable marking process, UV Laser

German Institute for Standardization, UV silicon photocell

DIN EN 4650:2023-06 Aerospace series - Wire and cable marking process, UV Laser; German and English version EN 4650:2023
DIN 45940-1130:1989 Harmonized system of quality assessment for electronic components; blank detail specification: MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
DIN EN 4650:2020 Aerospace series - Wire and cable marking process, UV Laser; English version prEN 4650:2020
DIN EN 4650:2023 Aerospace series - Wire and cable marking process, UV Laser; German and English version EN 4650:2023
DIN EN 50289-4-17:2011 Communication cables - Specifications for test methods - Part 4-17: Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable; German version EN 50289-4-17:2011

ASD-STAN - Aerospace and Defence Industries Association of Europe - Standardization, UV silicon photocell

PREN 4650-2008 Aerospace series Wire and cable marking process@ UV Laser (Edition P 1)

Professional Standard - Electron, UV silicon photocell

SJ/T 11830-2022 Crystalline Silicon Photovoltaic Cell Intelligent Manufacturing Data Collection Guide

European Committee for Standardization (CEN), UV silicon photocell

EN 4650:2010 Aerospace series - Wire and cable marking process, UV laser

国家市场监督管理总局、中国国家标准化管理委员会, UV silicon photocell

GB/T 41072-2021 Surface chemical analysis—Electron spectroscopies—Guidelines for ultraviolet photoelectron spectroscopy analysis

Professional Standard - Aerospace, UV silicon photocell

QJ 2291-1992 Test specifications for silicon photovoltaic cells and their assemblies for solar sensors

Aerospace, Security and Defence Industries Association of Europe (ASD), UV silicon photocell

ASD-STAN PREN 4650-2008 Aerospace series Wire and cable marking process, UV Laser (Edition P 1)

国家能源局, UV silicon photocell

SY/T 7657.4-2021 Determination of natural gas using photoacoustic spectroscopy-infrared spectroscopy-fuel cell combined method Part 4: Determination of hydrogen content by fuel cell method
SY/T 7657.1-2021 Determination of natural gas using photoacoustic spectroscopy-infrared spectroscopy-fuel cell combined method Part 1: General principles
SY/T 7657.2-2021 Determination of natural gas using photoacoustic spectroscopy-infrared spectroscopy-fuel cell combined method Part 2: Determination of methane content by photoacoustic spectroscopy
SY/T 7657.3-2021 Part 3 of the combined photoacoustic spectroscopy-infrared spectroscopy-fuel cell determination method for natural gas: Determination of the content of ethane and above alkanes, carbon dioxide and carbon monoxide by infrared spectroscopy

中华人民共和国国家卫生和计划生育委员会, UV silicon photocell

GBZ 9-2002 Diagnostic Criteria of Occupational Acute Electric Ophthahlmia(Kerato-Conjunctivitis Caused by Ultraviolet Rays)

American Society for Testing and Materials (ASTM), UV silicon photocell

ASTM E1039-99 Standard Test Method for Calibration of Silicon Non-Concentrator Photovoltaic Primary Reference Cells Under Global Irradiation (Withdrawn 2004)

ES-AENOR, UV silicon photocell

UNE 104-281 Pt.5-17-1988

CENELEC - European Committee for Electrotechnical Standardization, UV silicon photocell

EN 50289-4-17:2011 Communication cables - Specifications for test methods - Part 4-17: Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable

AENOR, UV silicon photocell

UNE-EN 50289-4-17:2012 Communication cables - Specifications for test methods -- Part 4-17: Test methods for UV resistance evaluation of the sheath of electrical and optical fibre cable

Inner Mongolia Provincial Standard of the People's Republic of China, UV silicon photocell

DB15/T 927-2015 Determination of Lanthanum, Ce, Praseodymium, Neodymium, Zinc, Magnesium, Iron and Silicon in Battery-Grade Mischmetal by Inductively Coupled Plasma Optical Emission Spectrometry