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Optical Wavelength Parameters
Optical Wavelength Parameters, Total:59 items.
In the international standard classification, Optical Wavelength Parameters involves: Analytical chemistry, Fibre optic communications, Optics and optical measurements, Optical equipment, Radiation measurements, Medical equipment.
International Organization for Standardization (ISO), Optical Wavelength Parameters
- ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 14594:2003 Analyse par microfaisceaux - Analyse par microsonde électronique (Microsonde de Castaing) - Lignes directrices pour la détermination des paramètres expérimentaux pour la spectrométrie à dispersion de longueur d'onde
- ISO 14594:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- ISO 14594:2003/Cor 1:2009 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy; Technical Corrigendum 1
- ISO/CD 7944 Optics and optical instruments — Reference wavelengths
- ISO/DIS 7944:2023 Optics and optical instruments — Reference wavelengths
- ISO 7944:1984 Optics and optical instruments; Reference wavelengths
- ISO 7944:1998 Optics and optical instruments - Reference wavelengths
Korean Agency for Technology and Standards (KATS), Optical Wavelength Parameters
- KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594:2012 Microbeam analysis－Electron probe microanalysis－Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS B ISO 7944-2011(2021) Optics and optical instruments－Reference wavelengths
- KS B ISO 7944-2011(2016) Optics and optical instruments－Reference wavelengths
- KS B ISO 7944:2011 Optics and optical instruments－Reference wavelengths
KR-KS, Optical Wavelength Parameters
- KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
British Standards Institution (BSI), Optical Wavelength Parameters
- 23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 14594:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS ISO 14594:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
- BS EN 61290-4-1:2011 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
- BS EN 61290-4-1:2016 Optical amplifiers. Test methods. Gain transient parameters. Two-wavelength method
- BS EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
Association Francaise de Normalisation, Optical Wavelength Parameters
- NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
- NF EN ISO 7944:1998 Optique et instruments d'optique - Longueurs d'onde de référence
- NF C93-805-4-1:2011 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method.
- NF C93-805-4-1*NF EN 61290-4-1:2017 Optical amplifiers - Test methods - Part 4-1 : gain transient parameters - Two-wavelength method
- NF EN 61290-4-1:2017 Amplificateurs optiques - Méthodes d'essai - Partie 4-1 : paramètres de gain transitoire - Méthode à deux longueurs d'onde
- NF S10-020*NF EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths
International Electrotechnical Commission (IEC), Optical Wavelength Parameters
- IEC 62802:2017 Measurement method of a half-wavelength voltage and a chirp parameter for Mach-Zehnder optical modulator in high-frequency radio on fibre (RoF) systems
- IEC 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
- IEC 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
RU-GOST R, Optical Wavelength Parameters
- GOST R 50314-1992 Optics. Reference wavelengths
- GOST 8.198-1985 State system for ensuring the uniformity of measurements. State special standard and state verification schedule for means measuring pulse laser radiation power and dynamic parameters of laser detectors in the wavelength range of 0,4-10,6 um
- GOST R 50785-1995 Optical filtres. Types and main parameters
- GOST R ISO 7944-2013 Optics and optical instruments. Reference wavelengths
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Optical Wavelength Parameters
Danish Standards Foundation, Optical Wavelength Parameters
Japanese Industrial Standards Committee (JISC), Optical Wavelength Parameters
- JIS B 7090:1999 Optics and optical instruments -- Reference wavelengths
- JIS C 6122-4-1:2013 Optical amplifiers.Test methods.Part 4-1: Transient parameters.Measurement of gain parameters using two-wavelength method
未注明发布机构, Optical Wavelength Parameters
Lithuanian Standards Office , Optical Wavelength Parameters
AENOR, Optical Wavelength Parameters
German Institute for Standardization, Optical Wavelength Parameters
- DIN EN ISO 7944:1998-07 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
- DIN EN 61290-4-1:2017-06 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (IEC 61290-4-1:2016); German version EN 61290-4-1:2016 / Note: DIN EN 61290-4-1 (2012-04) remains valid alongside this standard until 2019-10-31.
- DIN EN ISO 7944:1998 Optics and optical instruments - Reference wavelengths (ISO 7944:1998); German version EN ISO 7944:1998
European Committee for Electrotechnical Standardization（CENELEC）, Optical Wavelength Parameters
- EN 61290-4-1:2011 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
- EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method
ES-UNE, Optical Wavelength Parameters
- UNE-EN 61290-4-1:2016 Optical amplifiers - Test methods - Part 4-1: Gain transient parameters - Two-wavelength method (Endorsed by Asociación Española de Normalización in February of 2017.)
Professional Standard - Machinery, Optical Wavelength Parameters
National Metrological Verification Regulations of the People's Republic of China, Optical Wavelength Parameters
Group Standards of the People's Republic of China, Optical Wavelength Parameters