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test cu

test cu, Total:13 items.

In the international standard classification, test cu involves: Radiocommunications, Semiconductor devices.

FI-SFS, test cu

• SFS 2905-1975

Association Francaise de Normalisation, test cu

• NF C31-888-6*NF EN 61788-6:2012 Superconductivity - Part 6 : mechanical properties measurement - Room temperature tensile test of Cu/Nb-Ti composite superconductors

Professional Standard - Post and Telecommunication, test cu

• YD/T 1763.1-2011 TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu) interface.Part 1:physical,electrical and logical characteristics of ME
• YD/T 1763.1-2008 TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME(Cu)Interface.Part 1:Physical,Electrical and Logical Characteristics
• YD/T 1763.4-2008 TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME(Cu)Interface.Part 4:USIM Conformance
• YD/T 1763.2-2008 TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME(Cu)Interface.Part 2:Application Characteristics of USIM
• YD/T 1763.2-2011 TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME (Cu) interface.part 2:USIM Application characartics of ME
• YD/T 2582.1-2013 Test method for Cu interface between Universal Integrated Circuit Card (UICC) and terminal in LTE digital cellular mobile communication network Part 1: Application characteristics of Universal Subscriber Identity Module (USIM) supporting LTE
• YD/T 1763.3-2008 TD-SCDMA/WCDMA Digital Cellular Mobile Communication Network Test Methods for USIM-ME(Cu)Interface.Part 3:USAT Characteristics
• YD/T 1763.3-2011 TD-SCDMA/WCDMA digital cellular mobile telecommunication network test methods for UICC-ME(Cu) interface.Part 3:USAT characteristics of ME
• YD/T 2582.2-2013 Test method for Cu interface between Universal Integrated Circuit Card (UICC) and terminal in LTE digital cellular mobile communication network Part 2: Features of Universal Subscriber Identity Module Application Toolkit (USAT) supporting LTE

工业和信息化部, test cu

• YD/T 1763.4.4-2016 TD-SCDMA/WCDMA Digital cellular mobile communication network Universal Integrated Circuit Card (UICC) and terminal Cu interface test method Part 4: UICC supporting Universal Subscriber Identity Module (USIM) application

Korean Agency for Technology and Standards (KATS), test cu

• KS C 6111-2004 TEST METHODS OF D.C. CRITICAL CURRENT OF Cu/Nb-Ti COMPOSITE SUPERCONDUCTORS

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