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Reducer sample collector

Reducer sample collector, Total:497 items.

In the international standard classification, Reducer sample collector involves: Analytical chemistry, Glass, Laboratory medicine, Medical equipment, Protection against fire, Installations in buildings, Solar energy engineering, Pharmaceutics, Rubber and plastics products, Dentistry, Postal services, Optoelectronics. Laser equipment, Semiconductor devices, Fibre optic communications, Plant and equipment for the food industry, Agricultural machines, implements and equipment, Soil quality. Pedology, Precision mechanics, Road engineering, Construction materials, Integrated circuits. Microelectronics, Water quality, Aerospace electric equipment and systems, Compressors and pneumatic machines, Milk and milk products, Non-destructive testing, Electric traction equipment, Vocabularies, Electromagnetic compatibility (EMC), Hand-held tools, Air quality, Telecommunication terminal equipment, Internal combustion engines for road vehicles, Occupational safety. Industrial hygiene, Biology. Botany. Zoology, Particle size analysis. Sieving, Wastes, Laundry appliances, Equipment for entertainment, Industrial automation systems, Fluid power systems, Electronic component assemblies, Open systems interconnection (OSI), Test conditions and procedures in general, Interface and interconnection equipment, Electromechanical components for electronic and telecommunications equipment, Capacitors, Applications of information technology, Internal combustion engines.


Professional Standard - Geology, Reducer sample collector

PT-IPQ, Reducer sample collector

Korean Agency for Technology and Standards (KATS), Reducer sample collector

  • KS L 2326-1978 Sampling method for glass containers
  • KS B 8295-2015(2021) Solar thermal collectors(Flat plate, Evacuated-tube, Fixed concentrating type)
  • KS C IEC 60747-5:2004 Semiconductor devices-Discrete devices-Part 5:Optoelectronic devices
  • KS C IEC 60747-10-2004(2015) Semiconductor devices-Part 10:Generic specification for discrete devices and integrated circuits
  • KS C IEC 60748-3-1:2002 Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
  • KS C IEC 60748-2-8:2002 Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 8:Blank detail specification for integrated circuits static read/write memories
  • KS C IEC 60747-10:2004 Semiconductor devices-Part 10:Generic specification for discrete devices and integrated circuits
  • KS B ISO 9806-1-2003(2013) Test methods for solar collectors-Part 1:Thermal performance of glazed liquid heating collectors including pressure drop
  • KS C IEC 60748-4:2004 Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
  • KS C IEC 60748-3:2002 Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-2:2001 Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-2-2001(2021) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-2-2001(2016) Semiconductor devices-integrated circuits-Part 2:Digital integrated circuits
  • KS C IEC 60748-4-2004(2020) Semiconductor devices-Integrated circuits-Part 4:Interface integrated circuits
  • KS C IEC 60748-3-2002(2017) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60748-3-2002(2022) Semiconductor devices-Integrated circuits Part 3:Analogue integrated circuits
  • KS C IEC 60747-2:2006 Semiconductor devices-Discrete devices and integrated circuits-Part 2:Rectifier diodes
  • KS C IEC 60747-2-2006(2016) Semiconductor devices-Discrete devices and integrated circuits-Part 2:Rectifier diodes
  • KS C IEC 60747-5-1:2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General
  • KS B ISO 3857-3-2002(2012) Compressors, pneumatic tools and machines-Vocabulary-Part 3:Pneumatic tools and machines
  • KS C IEC 60748-2-6-2002(2022) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits Section 6:Blank detail specification for microprocessor integrated circuits
  • KS C IEC 60748-2-6-2002(2017) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits Section 6:Blank detail specification for microprocessor integrated circuits
  • KS C IEC 60748-2-11:2002 Semiconductor devices-Integrated circuits-Part 2-11:Digital integrated circuits-Blank detail specification for single supply integrated circuit,electrically erasable, and programmable read-only memory
  • KS B ISO 9806-3:2003 Test methods for solar collectors-Part 3:Thermal performance of unglazed liquid heating collectors (sensible heat transfer only) including pressure drop
  • KS C IEC 60748-5:2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-5:2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS B ISO 10218-2-2012(2017) Robots and robotic devices-Safety requirements for industrial robots-Part 2:Robot systems and integration
  • KS B ISO 10218-2-2012(2022) Robots and robotic devices-Safety requirements for industrial robots-Part 2:Robot systems and integration
  • KS C IEC 60747-4-2:2002 Semiconductor devices-Discrete devices-Part 4-2:Microwave diodes and transistors-Integrated-circuit microwave amplifiers-Blank detail specification
  • KS C IEC 60748-3-1-2002(2017) Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
  • KS C IEC 60748-3-1-2002(2022) Semiconductor devices-Integrated circuits-Part 3:Analogue integrated circuits-Section 1:Blank detail specification for monolithic integrated operational amplifiers
  • KS C IEC 60747-5-1:2004 Discrete semiconductor devices and integrated circuits-Part 5-1:Optoelectronic devices-General
  • KS C IEC 60747-5-3:2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
  • KS C IEC 60748-5:2003 Semiconductor devices-Integrated circuits-Part 5:Semicustom integrated circuits
  • KS C IEC 60748-2-10:2001 Semiconductor integrated circuits-Part 2:Digital integrated circuits Section 10-Blank detail specification for integrated circuit dynamic read/write memories(excluding uncommitted logic arrays)
  • KS C IEC 60748-2-8-2002(2017) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 8:Blank detail specification for integrated circuits static read/write memories
  • KS C IEC 60748-2-8-2002(2022) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 8:Blank detail specification for integrated circuits static read/write memories
  • KS C IEC 60747-5-3:2004 Semiconductor devices-Discrete devices-Part 5-3:optoelectronic devices-Measuring method
  • KS B ISO 22975-3:2016 Solar energy ― Collector components and materials ― Part 3: Absorber surface durability
  • KS B ISO 22975-3-2016(2021) Solar energy ― Collector components and materials ― Part 3: Absorber surface durability
  • KS C IEC 60748-1:2002 Semiconductor devices-Integrated circuits-Part 1:General
  • KS C IEC 60748-1:2019 Semiconductor devices — Integrated circuits — Part 1: General
  • KS C IEC 60748-1:2021 Semiconductor devices — Integrated circuits — Part 1: General
  • KS C IEC 62149-5-2005(2010) Fibre optic active components and devices-Performance standards-Part 5:ATM-PON transceivers with LD driver and CDR ICs
  • KS R ISO 14469-1:2006 Road vehicles-Compressed natural gas(CNG) refuelling connector-Part 1:20 MPa(200 bar) connector
  • KS C IEC 60748-2-12-2002(2017) Semiconductor devices-Integrated circuits-Part 2:Digital integrated circuits-Section 12:Digital integrated circuits-Blank detail specification for programmable logic devices(PLDs)

German Institute for Standardization, Reducer sample collector

  • DIN 43240:1974 Pantograph carbons; assembly dimensions
  • DIN EN 14820:2004 Single-use containers for human venous blood specimen collection; German version EN 14820:2004
  • DIN 19672-1:1968 Apparatus for drawing soil samples in agricultural engineering; apparatus for soil sampling in undisturbed situation
  • DIN 6274:1982-04 Internal combustion engines for general purposes; Compressed air containers with valve block; 38 mm bore; Assembly
  • DIN EN 12504-1:2021-02 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression; German version EN 12504-1:2019 + AC:2020
  • DIN EN ISO 6717:2020 In vitro diagnostic medical devices - Single-use containers for the collection of specimens, other than blood, from humans (ISO/DIS 6717:2020); German and English version prEN ISO 6717:2020
  • DIN 12835:2003 Apparatus for dairy analysis - Sample bottles for milk
  • DIN 12835:2003-01 Apparatus for dairy analysis - Sample bottles for milk
  • DIN EN 50206-1:1999 Railway applications - Rolling stock - Pantographs: Characteristic tests - Part 1: Pantographs for main line vehicles; German version EN 50206-1:1998
  • DIN EN ISO 6717:2021-12 In vitro diagnostic medical devices - Single-use containers for the collection of specimens from humans other than blood (ISO 6717:2021); German version EN ISO 6717:2021
  • DIN EN 12504-1:2017 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression; German and English version prEN 12504-1:2017
  • DIN EN 60747-16-1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007
  • DIN EN 60747-16-5:2021-08 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020); German version EN 60747-16-5:2013 + A1:2020 / Note: DIN EN 60747-16-5 (2014-04) remains valid alongside this standard until 2023...
  • DIN EN IEC 60747-16-6:2021-08 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019); German version EN IEC 60747-16-6:2019
  • DIN EN 60747-16-1:2017-10 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 - A1:2007 - A2:2017); German version EN 60747-16-1:2002 + A1:2007 + A2:2017 / Note: DIN EN 60747-16-1 (2007-10) remains valid alongside this standard unt...
  • DIN EN 16186-2:2017 Railway applications - Driver's cab - Part 2: Integration of displays, controls and indicators
  • DIN 1989-2:2004 Rainwater harvesting systems - Part 2: Filters
  • DIN IEC 60747-2:2001 Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
  • DIN IEC 60747-2:2001-02 Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes (IEC 60747-2:2000)
  • DIN 10457:1988-02 Apparatus for dairy analysis; sample bottles of plastic for milk
  • DIN EN ISO 6710:2017 Single-use containers for human venous blood specimen collection (ISO 6710:2017); German version EN ISO 6710:2017
  • DIN EN 60747-16-3:2018-04 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017 / Note: DIN EN 60747-16-3 (2009-11) remains valid alongside this st...
  • DIN EN ISO 10218-2:2012-06 Robots and robotic devices - Safety requirements for industrial robots - Part 2: Robot systems and integration (ISO 10218-2:2011); German version EN ISO 10218-2:2011 / Note: To be replaced by DIN EN ISO 10218-2 (2021-03).
  • DIN EN 62047-10:2012-03 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (IEC 62047-10:2011); German version EN 62047-10:2011
  • DIN EN ISO 8637-1:2020-10 Extracorporeal systems for blood purification - Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators (ISO 8637-1:2017); German version EN ISO 8637-1:2020
  • DIN EN IEC 62769-3:2022-09 Field Device Integration (FDI) - Part 3: Server (IEC 62769-3:2021); English version EN IEC 62769-3:2021 / Note: DIN EN 62769-3 (2016-03) remains valid alongside this standard until 2024-03-12.
  • DIN EN 61291-6-1:2009-03 Opticial amplifiers - Part 6-1: Interfaces - Command set (IEC 61291-6-1:2008); German version EN 61291-6-1:2008
  • DIN EN 61115:1994 Expression of performance of sample handling systems for process analyzers (IEC 61115:1992); German version EN 61115:1993
  • DIN EN 16186-6:2022 Railway applications - Driver's cab - Part 6: Integration of displays, controls and indicators for tram vehicles; German and English version prEN 16186-6:2021
  • DIN EN 13205-5:2014-09 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 5: Aerosol sampler performance test and sampler comparison carried out at workplaces; German version EN 13205-5:2014
  • DIN EN ISO 22975-3:2014-10 Solar energy - Collector components and materials - Part 3: Absorber surface durabillity (ISO 22975-3:2014); German version EN ISO 22975-3:2014
  • DIN EN 61291-6-1:2009 Opticial amplifiers - Part 6-1: Interfaces - Command set (IEC 61291-6-1:2008); German version EN 61291-6-1:2008

VN-TCVN, Reducer sample collector

  • TCVN 7612-2007 Single-use containers for venous blood specimen collection

Association Francaise de Normalisation, Reducer sample collector

  • NF S93-240:2005 Single-use containers for venous blood specimen collection.
  • NF S91-103-3*NF EN ISO 3630-3:2021 Dentistry - Endodontic instruments - Part 3 : compactors
  • NF EN IEC 61869-13:2021 Transformateurs de mesure - Partie 13 : concentrateur autonome (SAMU)
  • NF C96-005:1994 Discrete devices and integrated circuits. Part 5 : optoelectronic devices.
  • NF P98-230-1:1992 Tests relating to pavements. Preparation of materials bound with cementitious binders or aggregates mixes. Part 1 : specimen copaction using vibrocompression.
  • NF ISO 3857-2:2016 Compresseurs, outils et machines pneumatiques - Vocabulaire - Partie 2 : compresseurs
  • NF T90-353:1995 Water quality. Sampling in deep waters for macro-invertebrates. Guidance on the use of colonization, qualitative and quantitative samplers.
  • NF EN ISO 6717:2021 Dispositifs médicaux de diagnostic in vitro - Récipients à usage unique pour le prélèvement d'échantillons d'origine humaine autres que le sang
  • NF EN ISO 10439-3:2015 Industries du pétrole, de la pétrochimie et du gaz naturel - Compresseurs axiaux et centrifuges et compresseurs-détenteurs - Partie 3 : compresseurs centrifuges et axiaux à multiplicateur intégré
  • NF EN IEC 62878-1:2019 Techniques d'assemblage avec appareil(s) integré(s) - Partie 1 : spécification générique pour substrats avec appareil(s) intégré(s)
  • NF C96-016-5*NF EN 60747-16-5:2014 Semiconductor devices - Part 16-5 : microwave integrated circuits - Oscillators
  • NF C96-016-1/A1*NF EN 60747-16-1/A1:2013 Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
  • NF C96-228-2*NF EN 62228-2:2017 Integrated circuits - EMC evaluation of transceivers - Part 2 : LIN transceivers
  • NF C96-228-7*NF EN IEC 62228-7:2022 Integrated circuits - EMC evaluation of transceivers - Part 7 : CXPI transceivers
  • NF C96-016-1/A2*NF EN 60747-16-1/A2:2017 Semiconductor devices - Part 16-1 : microwave integrated circuits - Amplifiers
  • NF EN IEC 60747-16-8:2023 Dispositifs à semiconducteurs - Partie 16-8 : circuits intégrés hyperfréquences - Limiteurs
  • NF EN 60747-16-1/A1:2013 Dispositifs à semiconducteurs - Partie 16-1 : circuits intégrés hyperfréquences - Amplificateurs
  • NF EN 60747-16-1:2003 Dispositifs à semiconducteurs - Partie 16-1 : circuits intégrés hyperfréquences - Amplificateurs
  • NF EN IEC 60747-16-6:2019 Dispositifs à semiconducteurs - Partie 16-6 : circuits intégrés hyperfréquences - Multiplicateurs de fréquence
  • NF EN 60747-16-5/A1:2020 Dispositifs à semiconducteurs - Partie 16-5 : circuits intégrés hyperfréquences - Oscillateurs
  • NF EN 60747-16-1/A2:2017 Dispositifs à semiconducteurs - Partie 16-1 : circuits intégrés hyperfréquences - Amplificateurs
  • NF EN IEC 60747-16-7:2023 Dispositifs à semiconducteurs - Partie 16-7 : circuits intégrés hyperfréquences - Atténuateurs
  • NF EN 60747-16-5:2014 Dispositifs à semiconducteurs - Partie 16-5 : Circuits intégrés hyperfréquences - oscillateurs
  • NF EN IEC 62228-7:2022 Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 7 : émetteurs-récepteurs CXPI
  • NF EN IEC 62228-6:2022 Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 6 : émetteurs-récepteurs PSI5
  • NF EN 62228-2:2017 Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 2 : émetteurs-récepteurs LIN
  • NF EN IEC 62228-3:2019 Circuits intégrés - Évaluation de la CEM des émetteurs-récepteurs - Partie 3 : émetteurs-récepteurs CAN
  • NF C96-042:1989 Semiconductor Devices Integrated circuits Part 2:Digital integrated circuits
  • NF C96-002:2001 Semiconductor devices - Discrete devices and integrated circuits - Part 2 : rectifier diodes.
  • NF C96-007:1989 Semiconductor devices. Discrete devices and integrated circuits. Part 7 : bipolar transistors.
  • NF C96-005-1/A1*NF EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
  • NF C96-005-1*NF EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Part 5-1 : optoelectronic devices - General
  • NF EN 60747-5-1/A1:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
  • NF EN 60747-5-1/A2:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
  • NF EN 60747-5-1:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-1 : dispositifs optoélectroniques - Généralités
  • NF EN ISO 10218-2:2011 Robots et dispositifs robotiques - Exigences de sécurité pour les robots industriels - Partie 2 : système robots et intégration
  • NF C96-228-5*NF EN IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5 : Ethernet transceivers
  • NF EN 60747-16-3/A2:2017 Dispositifs à semiconducteurs - Partie 16-3 : circuits intégrés hyperfréquences - Convertisseurs de fréquence
  • NF EN 60747-16-3/A1:2013 Dispositifs à semiconducteurs - Partie 16-3 : circuits intégrés hyperfréquences - Convertisseurs de fréquence
  • NF EN 60747-16-3:2003 Dispositifs à semiconducteurs - Partie 16-3 : circuits intégrés hyperfréquences - Convertisseurs de fréquence
  • NF EN IEC 62228-5:2021 Circuits intégrés - Evaluation de la CEM des émetteurs-récepteurs - Partie 5 : émetteurs-récepteurs Ethernet
  • NF C96-008:1985 Semiconductor devices. Discrete devices and integrated circuits. Part 8 : field-effect transistors.
  • NF C96-005-1/A2*NF EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Partie 5-1 : optoelectronic devices - General
  • NF EN ISO 8637-1:2020 Systèmes extracorporels pour la purification du sang - Partie 1 : hémodialyseurs, hémodiafiltres, hémofiltres et hémoconcentrateurs
  • NF EN IEC 60335-2-89/A11:2022 Appareils électrodomestiques et analogues - Sécurité - Partie 2­89 : Exigences particulières pour les appareils de réfrigération et fabriques de glace à usage commercial avec une unité de fluide frigorigène ou un motocompresseur incorporés o...
  • NF C96-005-3*NF EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Part 5-3 : optoelectronic devices - Measuring methods
  • NF C96-005-3/A1*NF EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Partie 5-3 : optoelectronic devices - Measuring methods
  • NF EN 60747-5-3:2001 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3 : dispositifs optoélectroniques - Méthodes de mesure
  • NF EN 60747-5-3/A1:2002 Dispositifs discrets à semiconducteurs et circuits intégrés - Partie 5-3 : dispositifs optoélectroniques - Méthodes de mesure
  • NF E61-110-2*NF EN ISO 10218-2:2011 Robots and robotic devices - Safety requirements for industrial robots - Part 2 : robot system and integration
  • NF C96-050-10*NF EN 62047-10:2012 Semiconductor devices - Micro-electromechanical devices - Part 10: micro-pillar compression test for MEMS materials
  • NF E51-251-3*NF ISO 12500-3:2009 Filters for compressed air - Test methods - Part 3 : particulates
  • NF ISO 12500-3:2009 Filtres pour air comprimé - Méthodes d'essai - Partie 3 : particules
  • NF S99-501-12:2012 Biological evaluation of medical devices - Part 12 : sample preparation and reference materials.
  • NF S99-501-12*NF EN ISO 10993-12:2021 Biological evaluation of medical devices - Part 12 : sample preparation and reference materials
  • NF C93-802-6-1*NF EN 61291-6-1:2009 Optical amplifiers - Part 6-1 : interfaces - Command set
  • NF X20-703:1988 COLLECTIVE BREATH ANALYSER. SPECIFICATION AND TEST METHODS.
  • NF C46-769-3*NF EN 62769-3:2015 Field device integration (FDI) - Part 3 : FDI server
  • NF C46-769-3*NF EN IEC 62769-3:2021 Field Device Integration (FDI) - Part 3 : FDI Server
  • NF C96-041/A1:1991 Semiconductor Devices Integrated circuits Part 1:General
  • NF EN IEC 62769-3:2021 Intégration des appareils de terrain (FDI®) - Partie 3 : serveur
  • NF X43-283-5*NF EN 13205-5:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 5 : aerosol sampler performance test and sampler comparison carried out at workplaces
  • NF EN IEC 62878-2-5:2019 Technologie d'ensemble avec appareil(s) intégré(s) - Partie 2-5 : lignes directrices - Mise en œuvre d'un format de données 3D pour un substrat avec appareil(s) intégré(s)

Japanese Industrial Standards Committee (JISC), Reducer sample collector

  • JIS T 3233:2011 Evacuated single-use containers for venous blood specimen collection
  • JIS T 3233:2005 Evacuated single-use containers for venous blood specimen collection
  • JIS T 3254:2007 Single-use syringes for blood gas specimen collection
  • JIS T 3254:2013 Single-use syringes for blood gas specimen collection
  • JIS B 8433-2:2015 Robots and robotic devices -- Safety requirements for industrial robots -- Part 2: Robot systems and integration
  • JIS B 8391-1:2000 Compressed air dryers -- Part 1: Specifications and testing
  • JIS B 8391-1:2010 Compressed-air dryers -- Part 1: Specifications and testing
  • JIS T 3217:2005 Plastic collapsible containers for human blood and blood components
  • JIS C 6121-6-1:2013 Optical amplifiers -- Part 6-1: Interfaces -- Command set
  • JIS X 6319-1:2005 Specification of implementation for integrated circuit(s) cards -- Part 1: Integrated circuit(s) cards with contacts
  • JIS X 6319-1:2010 Specification of implementation for integrated circuit cards -- Part 1: Integrated circuit cards with contacts

Professional Standard - Public Safety Standards, Reducer sample collector

应急管理部, Reducer sample collector

European Committee for Standardization (CEN), Reducer sample collector

  • EN ISO 6710:2017 Single-use containers for human venous blood specimen collection
  • EN 14820:2004 Single-use containers for human venous blood specimen collection
  • EN 13205-5:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 5: Aerosol sampler performance test and sampler comparison carried out at workplaces
  • EN ISO 10993-12:2021 Biological evaluation of medical devices - Part 12: Sample preparation and reference materials (ISO 10993-12:2021)
  • EN ISO 10993-12:1996 Biological Evaluation of Medical Devices - Part 12: Sample Preparation and Reference Materials ISO 10993-12 : 1996
  • EN ISO 8637-1:2020 Extracorporeal systems for blood purification - Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators (ISO 8637-1:2017)

Professional Standard - Medicine, Reducer sample collector

  • YY 0314-1999 Single-use containers for venous blood specimen collection
  • YY/T 0314-2007 Single-use containers for human venous blood specimen collection
  • YY/T 0314-2007(A1) Single-use containers for human venous blood specimen collection
  • YY 0314-2007 Single-use containers for human venous blood specimen collection
  • YY/T 0617-2007 Single-use containers for human capillary blood specimen collection
  • YY 0612-2007 Single-use receptacles for human arterial blood specimen collection
  • YY/T 1416.3-2016 Test method for additive in single-use containers for human venous blood specimen collection.Part 3:Heparin
  • YY/T 1416.4-2016 Test method for additive in single-use containers for human venous blood specimen collection.Part 4:Fluoride
  • YY/T 1416.2-2016 Test method for additive in single-use containers for human venous blood specimen collection.Part 2: Sodium citrate

International Organization for Standardization (ISO), Reducer sample collector

  • ISO 6710:1995 Single-use containers for venous blood specimen collection
  • ISO 6710:2017 Single-use containers for human venous blood specimen collection
  • ISO 3630-3:2015 Dentistry - Endodontic instruments - Part 3: Compactors: pluggers and spreaders
  • ISO 9806-3:1995 Test methods for solar collectors - Part 3: Thermal performance of unglazed liquid heating collectors (sensible heat transfer only) including pressure drop
  • ISO 7183-2:1996 Compressed air dryers - Part 2: Performance ratings
  • ISO 3857-3:1979 Compressors, pneumatic tools and machines — Vocabulary — Part 3: Pneumatic tools and machines
  • ISO 10218-2:2011 Robots and robotic devices - Safety requirements for industrial robots - Part 2: Robot systems and integration
  • ISO 9806-1:1994 Test methods for solar collectors - Part 1: Thermal performance of glazed liquid heating collectors including pressure drop
  • ISO 12500-4:2009 Filters for compressed air - Methods of test - Part 4: Water
  • ISO/DIS 8637-1 Extracorporeal systems for blood purification — Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators
  • ISO/CD 8637-1 Extracorporeal systems for blood purification — Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators
  • ISO 10993-12:2002 Biological evaluation of medical devices - Part 12: Sample preparation and reference materials
  • ISO/IEC 24739-1:2009 Information technology - AT Attachment with Packet Interface - 7 - Part 1: Register Delivered Command Set, Logical Register Set (ATA/ATAPI-7 V1)
  • ISO 12500-3:2009 Filters for compressed air - Test methods - Part 3: Particulates
  • ISO 8637-1:2017 Extracorporeal systems for blood purification - Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators
  • ISO 14469-3:2006 Road vehicles - Compressed natural gas (CNG) refuelling connector - Part 3: 25 MPa (250 bar) connector

IN-BIS, Reducer sample collector

Professional Standard - Urban Construction, Reducer sample collector

British Standards Institution (BSI), Reducer sample collector

  • BS EN 14820:2004 Single-use containers for human venous blood specimen collection
  • BS EN ISO 6710:2017 Single-use containers for human venous blood specimen collection
  • BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
  • BS IEC 60747-16-2:2001 Semiconductor devices. Microwave integrated circuits. Frequency prescalers
  • BS IEC 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
  • BS EN 60747-5-1:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. General
  • BS EN 60747-5-1:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - General
  • BS EN 60747-16-3:2002+A1:2009 Semiconductor devices — Part 16-3: Microwave integrated circuits — Frequency converters
  • BS EN IEC 62228-7:2022 Integrated circuits. EMC evaluation of transceivers - Part 7. CXPI transceivers
  • BS 4552-1:1979 Fuel filters, strainers and sedimentors for compression-ignition engines - Methods of test
  • BS EN 13071:2002 Selective waste collection containers - Above-ground mechanically-lifted containers with capacity from 80 l to 5000 l for selective collection of waste
  • BS EN 13071-2:2009 Stationary waste containers up to 5000 l, top lifted and bottom emptied - Additional requirements for underground or partly underground systems
  • BS IEC 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
  • BS IEC 60747-2:2000 Discrete semiconductor devices and integrated circuits - Rectifier diodes
  • BS EN 60747-5-3:1998 Discrete semiconductor devices and integrated circuits. Optoelectronic devices. Measuring methods
  • BS EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits - Optoelectronic devices - Measuring methods
  • BS ISO 21741:2020 Stationary source emissions. Sampling and determination of mercury compounds in flue gas using gold amalgamation trap
  • BS IEC 60747-14-1:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - General and classification - Sensor generals and classification for semiconductor sensors
  • BS IEC 60747-14-2:2001 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
  • BS IEC 60747-14-2:2000 Discrete semiconductor devices and integrated circuits - Semiconductor devices - Semiconductor sensors - Hall elements
  • BS EN IEC 62769-3:2021 Field Device Integration (FDI). Server
  • 19/30349187 DC BS ISO 21741. Stationary source emissions. Sampling and determination of mercury compounds in flue gas using gold amalgamation trap
  • BS IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Semicustom integrated circuits
  • 21/30421475 DC BS IEC 62228-6. Integrated circuit. EMC Evaluation of transceivers. Part 6. PSI5 transceivers
  • 19/30376552 DC BS EN 62228-7. Integrated circuits. EMC evaluation of transceivers. Part 7. CXPI transceivers
  • BS EN 60747-16-4:2004 Discrete semiconductor devices - Microwave integrated circuits - Switches

国家药监局, Reducer sample collector

  • YY/T 0617-2021 Disposable human peripheral blood sample collection container
  • YY/T 0314-2021 Disposable human venous blood sample collection container
  • YY/T 0612-2022 Disposable human arterial blood sample collector (arterial blood gas needle)
  • YY/T 1416.5-2021 Method for determination of dosage added in disposable human venous blood sample collection containers Part 5: Glycine

Group Standards of the People's Republic of China, Reducer sample collector

ZA-SANS, Reducer sample collector

American Society for Testing and Materials (ASTM), Reducer sample collector

  • ASTM E1199-87(2004) Standard Practice for Sampling Zooplankton with a Clarke-Bumpus Plankton Sampler
  • ASTM D4135-82(2004) Standard Practice for Sampling Phytoplankton With Depth-Integrating Samplers
  • ASTM D4348-84(1995) Standard Practice for Collecting Benthic Macroinvertebrates with Home (Scoop) Grab Sampler
  • ASTM D3267-91(2000)e1 Standard Test Method for Separation and Collection of Particulate and Water-Soluble Gaseous Fluorides in the Atmosphere (Filter and Impinger Method)
  • ASTM D4598-87 Practice for Sampling Workplace Atmospheres to Collect Gases or Vapors with Liquid Sorbent Diffusional Samplers
  • ASTM E119-08 Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-08a Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-09a Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-09b Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-09c Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-10 Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E119-98 Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E1468-92(1997) Standard Practice for Collecting Benthic Macroinvertebrates with the Basket Sampler
  • ASTM E119-22 Standard Test Methods for Fire Tests of Building Construction and Materials
  • ASTM E1199-87(2012) Standard Practice for Sampling Zooplankton with a Clarke-Bumpus Plankton Sampler
  • ASTM E1469-92(1997) Standard Practice for Collecting Benthic Macroinvertebrates with Multiple-Plate Samplers
  • ASTM E11-16 Standard Specification for Woven Wire Test Sieve Cloth and Test Sieves
  • ASTM D4597-03 Standard Practice for Sampling Workplace Atmospheres to Collect Gases or Vapors with Solid Sorbent Diffusive Samplers
  • ASTM D4134-82(2004) Standard Practice for Sampling Phytoplankton with a Clarke-Bumpus Plankton Sampler
  • ASTM D4347-84(2002) Standard Practice for Collecting Benthic Macroinvertebrates with Shipek (Scoop) Grab Sampler
  • ASTM D4407-84(1995) Standard Practice for Collecting Benthic Macroinvertebrates With Orange Peel Grab Sampler
  • ASTM D4347-84(1995) Standard Practice for Collecting Benthic Macroinvertebrates with Shipek (Scoop) Grab Sampler
  • ASTM D4407-84(2002) Standard Practice for Collecting Benthic Macroinvertebrates With Orange Peel Grab Sampler
  • ASTM D4597-10(2021) Standard Practice for Sampling Workplace Atmospheres to Collect Gases or Vapors with Solid Sorbent Diffusive Samplers
  • ASTM D4597-10 Standard Practice for Sampling Workplace Atmospheres to Collect Gases or Vapors with Solid Sorbent Diffusive Samplers
  • ASTM D4346-84(1997) Standard Practice for Collecting Benthic Macroinvertebrates with Okean 50 Grab Sampler
  • ASTM D6640-01(2015) Standard Practice for Collection and Handling of Soils Obtained in Core Barrel Samplers for Environmental Investigations
  • ASTM D4346-84(2003) Standard Practice for Collecting Benthic Macroinvertebrates with Okean 50 Grab Sampler
  • ASTM D4401-84(1995) Standard Practice for Collecting Benthic Macroinvertebrates With Petersen Grab Sampler
  • ASTM D4401-84(2002) Standard Practice for Collecting Benthic Macroinvertebrates With Petersen Grab Sampler
  • ASTM D8170-20 Standard Guide for Using Disposable Handheld Soil Core Samplers for the Collection and Storage of Soil for Volatile Organic Analysis

RO-ASRO, Reducer sample collector

  • STAS 12903-1990 Solar colleetors. Plane solar collectors. Classification and symbolization
  • SR ISO 3857-3:1996 Compressors, pneumatic tools and machines - Vocabulary - Part 3: Pneumatic tools and machines
  • SR CEI 748-3+A1-1991 Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Reducer sample collector

  • GB/T 29730-2013 Distribution manifold of cold/hot water
  • GB/T 20440-2006 Technical requirements of dense wavelength division multiplexer/demultiplexer
  • GB/T 15651-1995 Semiconductor devices. Discrete devices and integrated circuits. Part 5: Optoelectronic devices
  • GB/T 17573-1998 Semiconductor devices. Discrete devices and integrated circuits. Part 1: General
  • GB/T 20870.2-2023 Semiconductor Devices Part 16-2: Microwave Integrated Circuit Prescalers
  • GB/T 4589.1-2006 Semiconductor devices. Part 10: Generic specification for discrete devices and integrated circuits
  • GB/T 14115-1993 General principles of measuring methods of Sample/Hold amplifiers for semiconductor integrated circuits
  • GB/T 20870.1-2007 Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers
  • GB/T 20870.5-2023 Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
  • GB/T 10893.2-2006 Compressed air dryers.Part 2: Performance ratings
  • GB/T 17574-1998 Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits
  • GB/T 17940-2000 Semiconductor devices Integrated circuits Part 3:Analogue integrated circuits
  • GB/T 41771.3-2022 Field device integration—Part 3: Server
  • GB/T 4023-2015 Semiconductor devices Discrete devices and integrated circuits Part 2: Rectifier diodes
  • GB/T 4023-1997 Semiconductor devices. Discrete devices and integrated circuits. Part 2: Rectifier diodes
  • GB/T 20515-2006 Semiconductor devices. Integrated circuits. Part 5: Semicustom integrated circuits
  • GB 11291.2-2013 Robots and robotic devices.Safety requirements for industrial robots.Part 2: Robot systems and integration
  • GB/T 10893.1-2012 Compressed air dryers.Part 1:Specifications and testing
  • GB/T 17574.10-2003 Semiconductor devices-Integrated circuits-Part 2-10:Digital integrated circuits-Blank detail specification for integrated circuit dynamic read/write memories
  • GB/T 16886.12-2005 Biological evaluation of medical devices-Part 12:Sample preparation and reference materials
  • GB/T 16886.12-2000 Biological evaluation of medical devices--Part 12: Sample preparation and reference materials
  • GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
  • GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
  • GB/T 19768-2005 Process Analyzer Sample Handling System Performance Representation
  • GB/T 4589.1-1989 Semiconductor devices!*Generic specification for discrete devices and integrated circuits
  • GB/T 15651.3-2003 Discrete semiconductor devices and integrated circuits Part 5-3:Optoelectronic devices Measuring methods
  • GB/T 12844-1991 Series and products of nonlinear circuits for semiconductor integrated circuits--Products of sample/hold amplifiers
  • GB/T 16464-1996 Semiconductor devices. Integrated circuits. Part 1: General

国家邮政局, Reducer sample collector

TR-TSE, Reducer sample collector

  • TS 2948-1978 TEA SAMPLING PART II-SAMPLING FORM SMALL CONTAINERS

GOSTR, Reducer sample collector

  • GOST R EN 14254-2010 In vitro diagnostic medical devices. Single-use receptacles for the collection of specimens, other than blood, from humans

AENOR, Reducer sample collector

  • UNE-EN 14254:2004 In vitro diagnostic medical devices - Single-use receptacles for the collection of specimens, other than blood, from humans
  • UNE-EN 12504-1:2009 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression
  • UNE 68095-2:1997 EQUIPMENT FOR CROP PROTECTION. PORTABLE SPRAYERS. PART 2: COMPRESSION KNAP SACK SPRAYERS.
  • UNE 500520:2002 Automatic weather stations networks. Criteria for the localization of sites and installation of sensors. Acquisition characteristics and sampling.
  • UNE-EN 13205-5:2015 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 5: Aerosol sampler performance test and sampler comparison carried out at workplaces

RU-GOST R, Reducer sample collector

  • GOST 29283-1992 Semiconductor devices. Discrete devices and integrated circuits. Part 5. Optoelectronic devices
  • GOST ISO 6710-2011 Single-use containers for venous blood specimen collection. Technical requirements and test methods
  • GOST 29209-1991 Semiconductor devices. Discrete devices and integrated circuits. Part 2. Rectifire diodes
  • GOST R 60.1.2.2-2016 Robots and robotic devices. Safety requirements for industrial robots. Part 2. Robot systems and integration
  • GOST 29108-1991 Semiconductor devices. Integrated circuits. Part 3. Analog integrated circuits
  • GOST 29107-1991 Semiconductor devices. Integrated circuits. Part 2. Digital integrated circuits
  • GOST 29109-1991 Semiconductor devices. Integrated circuits. Part 4. Interface integrated circuits

国家粮食局, Reducer sample collector

ES-UNE, Reducer sample collector

  • UNE-EN ISO 6717:2022 In vitro diagnostic medical devices - Single-use containers for the collection of specimens from humans other than blood (ISO 6717:2021)
  • UNE-EN 12504-1:2020 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression
  • UNE-EN 12504-1:2020/AC:2021 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression
  • UNE-EN IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
  • UNE-EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
  • UNE-EN 60747-16-1:2002 Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)
  • UNE-EN IEC 60747-16-7:2023 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN IEC 60747-16-8:2023 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN IEC 62228-6:2022 Integrated circuit - EMC Evaluation of transceivers - Part 6: PSI5 transceivers (Endorsed by Asociación Española de Normalización in January of 2023.)
  • UNE-EN 62228-2:2017 Integrated circuits - EMC Evaluation of transceivers - Part 2: LIN transceivers (Endorsed by Asociación Española de Normalización in March of 2017.)
  • UNE-EN IEC 62228-7:2022 Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers (Endorsed by Asociación Española de Normalización in May of 2022.)
  • UNE-EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
  • UNE-EN 60747-16-3:2002/A2:2017 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
  • UNE-EN 60747-16-3:2002/A1:2009 Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by AENOR in July of 2009.)
  • UNE-EN IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers (Endorsed by Asociación Española de Normalización in July of 2021.)
  • UNE-EN 60747-16-3:2002 Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters. (Endorsed by AENOR in December of 2002.)
  • UNE-EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials (Endorsed by AENOR in December of 2011.)
  • UNE-EN ISO 8637-1:2020 Extracorporeal systems for blood purification - Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators (ISO 8637-1:2017)
  • UNE-EN 62769-3:2015 Field Device Integration - Part 3: FDI Server (Endorsed by AENOR in August of 2015.)
  • UNE-EN IEC 62769-3:2021 Field Device Integration (FDI) - Part 3: Server (Endorsed by Asociación Española de Normalización in May of 2021.)
  • UNE-EN 61291-6-1:2008 Opticial amplifiers -- Part 6-1: Interfaces - Command set (Endorsed by AENOR in February of 2009.)
  • UNE-EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods (Endorsed by AENOR in November of 2002.)
  • UNE-EN 60747-5-3:2001 Discrete semiconductor devices and integrated circuits -- Part 5-3: Optoelectronic devices - Measuring methods. (Endorsed by AENOR in October of 2001.)
  • UNE-EN IEC 62769-3:2023 Field Device Integration (FDI®) - Part 3: Server (Endorsed by Asociación Española de Normalización in June of 2023.)

International Electrotechnical Commission (IEC), Reducer sample collector

  • IEC 60747-5:1992 Semiconductor devices; discrete devices and integrated circuits; part 5: optoelectronic devices
  • IEC 62228-2:2016 Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
  • IEC 60747-10:1991 Semiconductor devices; part 10: generic specification for discrete devices and integrated circuits
  • IEC 60747-16-7:2022 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
  • IEC 60747-16-1:2001/AMD1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60747-16-3:2002+AMD1:2009+AMD2:2017 CSV Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • IEC 60747-16-1:2001+AMD1:2007 CSV Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-1:2001+AMD1:2007+AMD2:2017 CSV Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-3:2002+AMD1:2009 CSV Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • IEC 62228-6:2022 Integrated circuit - EMC evaluation of transceivers - Part 6: PSI5 transceivers
  • IEC 62228-7:2022 Integrated circuits - EMC evaluation of transceivers - Part 7: CXPI transceivers
  • IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
  • IEC 60747-16-5:2013+AMD1:2020 CSV Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60747-16-8:2022 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
  • IEC 60747-16-1:2017 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-2:2001+AMD1:2007 CSV Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
  • IEC 60748-2:1997 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits
  • IEC 60748-3:1986 Semiconductor devices. Integrated circuits.. Part 3 : Analogue integrated circuits
  • IEC 60748-4:1987 Semiconductor devices - Intergrated circuits.. Part 4: Interface integrated circuits.
  • IEC 60747-2:2000 Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes
  • IEC 60747-1/AMD3:1996 Semiconductor devices - Discrete devices and integrated circuits - Part 1: General; Amendment 3
  • IEC 60748-2-6:1992 Semiconductor devices; integrated circuits; part 2: digital integrated circuits; section six: blank detail specification for microprocessor integrated circuits
  • IEC 60747-16-3:2002 Semiconductor devices - Part 16-3: Microwave integrated circuits; Frequency converters
  • IEC 62228-5:2021 Integrated circuits - EMC evaluation of transceivers - Part 5: Ethernet transceivers
  • IEC 60748-5:1997 Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits
  • IEC 60747-5-1:1997/AMD2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General; Amendment 2
  • IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
  • IEC 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices; General
  • IEC 62769-3:2021 Field device integration (FDI) - Part 3: Server
  • IEC 62769-3:2023 RLV Field Device Integration (FDI?) - Part 3: Server
  • IEC 62769-3:2021 RLV Field Device Integration (FDI) - Part 3: Server
  • IEC 62769-3:2023 Field Device Integration (FDI?) - Part 3: Server
  • IEC 61115:1992 Expression of performance of sample handling systems for process analyzers
  • IEC 60747-16-2:2001 Semiconductor devices - Part 16-2: Microwave integrated circuits; Frequency prescalers
  • IEC 60747-16-2:2001/AMD1:2007 Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers; Amendment 1
  • IEC 60747-16-2:2008 Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers
  • IEC 60747-1/AMD1:1991 Semiconductor devices; discrete devices and integrated circuits; part 1: general; amendment 1
  • IEC 60747-10:1991/AMD3:1996 Amendment 3 - Semiconductor devices - Part 10: Generic specification for discrete devices and integrated circuits
  • IEC 60748-3-1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; section 1: blank detail specification for monolithic integrated operational amplifiers
  • IEC 60748-2-10:1994 Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits; section 10: Blank detail specification for integrated circuit dynamic read/write memories
  • IEC 60747-5-3:1997/AMD1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
  • IEC 60747-5-3:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
  • IEC 60747-16-3:2002/AMD2:2017 Amendment 2 - Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • IEC 60747-16-1:2001/AMD2:2017 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • IEC 60747-16-5:2013/AMD1:2020 Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60747-16-5:2013/AMD1:2020/COR1:2020 Corrigendum 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • IEC 60748-1:1984 Semiconductor devices. Integrated circuits.. Part 1 : General
  • IEC 61291-6-1:2008 Optical amplifiers - Part 6-1: Interfaces - Command set
  • IEC 62769-3:2015 Field Device Integration (FDI) - Part 3: FDI Server
  • IEC 60748-1:2002 Semiconductor devices - Integrated circuits - Part 1: General
  • IEC 60748-3:1986/AMD2:1994 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 2
  • IEC 60748-3:1986/AMD1:1991 Semiconductor devices; integrated circuits; part 3: analogue integrated circuits; amendment 1
  • IEC 62830-2:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
  • IEC 62830-3:2017 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 3: Vibration based electromagnetic energy harvesting

Military Standards (MIL-STD), Reducer sample collector

Taiwan Provincial Standard of the People's Republic of China, Reducer sample collector

Danish Standards Foundation, Reducer sample collector

  • DS/EN 12504-1:2020 Testing concrete in structures – Part 1: Cored specimens – Taking, examining and testing in compression
  • DS/EN 12504-1:2009 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression
  • DS/EN 60747-16-1/A1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • DS/EN 60747-16-1:2002 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • DS/EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • DS/EN IEC 62228-5:2021 Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers
  • DS/IEC 748-3+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 3: analogue integrated circuits
  • DS/IEC 748-4+Amd.1:1993 Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits
  • DS/EN 60747-5-1/A2:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
  • DS/EN 60747-5-1/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
  • DS/EN 60747-5-1:2002 Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
  • DS/EN 60747-16-3/A1:2009 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • DS/EN 60747-16-3:2002 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • DS/EN ISO 10218-2:2013 Robots and robotic devices - Safety requirements for industrial robots - Part 2: Robot systems and integration
  • DS/EN 62047-10:2011 Semiconductor devices - Micro-electromechanical devices - Part 10: Micro-pillar compression test for MEMS materials
  • DS/EN ISO 8637-1:2021 Extracorporeal systems for blood purification – Part 1: Haemodialysers, haemodiafilters, haemofilters and haemoconcentrators
  • DS/EN 61291-6-1:2008 Optical amplifiers - Part 6-1: Interfaces - Command set
  • DS/EN IEC 62769-3:2021 Field Device Integration (FDI) – Part 3: Server
  • DS/EN 60747-5-3/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
  • DS/EN 60747-5-3:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
  • DS/ISO 21741:2020 Stationary source emissions – Sampling and determination of mercury compounds in flue gas using gold amalgamation trap

CU-NC, Reducer sample collector

  • NC 54-387-1987 Construction Materials. Sediments. Obtainment of Suspensión Particle Samples from the Platform by Means of Collectors Vessels

KP-CSK, Reducer sample collector

  • KPS 6422-2-2002 Compressors, pneumatic tools and machines-Vocabulary-Part 2:Compressors
  • KPS 6422-3-2002 Compressors, pneumatic tools and machines-Vocabulary-Part 3:Pneumatic tools and machines

Defense Logistics Agency, Reducer sample collector

Society of Automotive Engineers (SAE), Reducer sample collector

  • SAE AS81703-1998 Connectors, Electric, Circular, Miniature, Rack and Panel or Push-Pull Coupling, Environment Resisting FSC 5935
  • SAE J3112-2017 A/C Compressor Oil Separator Effectiveness Test Standard

SAE - SAE International, Reducer sample collector

  • SAE AS81703B-2018 Connectors, Electric, Circular, Miniature, Rack and Panel or Push-Pull Coupling, Environment Resisting FSC 5935
  • SAE AS81703A-2012 Connectors, Electric, Circular, Miniature, Rack and Panel or Push-Pull Coupling, Environment Resisting FSC 5935
  • SAE J3112-2019 A/C Compressor Oil Separator Effectiveness Test Standard

工业和信息化部/国家能源局, Reducer sample collector

  • JB/T 12953-2016 Rotary air-water separator for compressed air system
  • JB/T 12727.5-2016 Non-destructive testing instrument specimens Part 5: Penetrant testing specimens
  • JB/T 12727.4-2016 Non-destructive testing instrument specimens Part 4: Specimens for magnetic particle testing
  • JB/T 12727.3-2016 Non-destructive testing instrument specimens Part 3: Electromagnetic (eddy current) testing specimens
  • JB/T 13202.4-2017 Diesel engine particle capture system Part 4: Particle trap technical conditions

HU-MSZT, Reducer sample collector

工业和信息化部, Reducer sample collector

  • JB/T 12727.2-2020 Nondestructive testing instrument specimens Part 2: Radiographic testing specimens

Military Standard of the People's Republic of China-General Armament Department, Reducer sample collector

  • GJB 597/1-1988 Detailed specifications for CMOS counters/dividers for semiconductor integrated circuits

Lithuanian Standards Office , Reducer sample collector

  • LST EN 12504-1-2009 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression
  • LST EN 12504-1/AC-2021 Testing concrete in structures - Part 1: Cored specimens - Taking, examining and testing in compression

BE-NBN, Reducer sample collector

SE-SIS, Reducer sample collector

Association of German Mechanical Engineers, Reducer sample collector

PL-PKN, Reducer sample collector

  • PN T01103-1992 Semiconductor devices. Generic specification for discrete devices and integrated circuits
  • PN M52002 ArkusZ05-1974 Dust collection systems Wash collectors Striking dust collectors TerminolOigy, classification and symibols
  • PN M52002 ArkusZ06-1974 Dust collection systems Wash collectors Roli down dust collectors Terminology, classification and symbols
  • PN M52002 ArkusZ04-1974 Dust collection systems Wash collectors Impeller dust collectors Terminoloigy, classification and symfools
  • PN M52002 ArkusZ08-1974 Dust colleotion systems Wash collectorsElectrostatic precLpitators TeTminology, classificaition and symbols

European Committee for Electrotechnical Standardization(CENELEC), Reducer sample collector

CENELEC - European Committee for Electrotechnical Standardization, Reducer sample collector

  • EN IEC 62228-3:2019 Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

Professional Standard - Post and Telecommunication, Reducer sample collector

  • YD/T 692-1994 Quality grading criteria of public telegraph diversity receivers
  • YD/T 1320-2004 Technical requirements and tests methods of optical Dense Wavelength Division Multiplexer/demultiplexer

Jiangsu Provincial Standard of the People's Republic of China, Reducer sample collector

  • DB32/T 3762.21-2023 Technical Specifications for Novel Coronavirus Detection Part 21: Virus Enrichment, Concentration and Detection of Sewage Samples

TH-TISI, Reducer sample collector

  • TIS 2126-2002 Semiconductor devices.part 10: generic specification for discrete devices and integrated circuits
  • TIS 1670-2009 Semiconductor devices.discrete devices and integrated circuits.part 2: rectifier diodes
  • TIS 2395.12-2008 Biological evaluation of medical devices.part 12: sample preparation and reference materials

PH-BPS, Reducer sample collector

  • PNS IEC 62830-2:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 2: Thermo power based thermoelectric energy harvesting
  • PNS IEC 62830-4:2021 Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 4: Test and evaluation methods for flexible piezoelectric energy harvesting devices

American National Standards Institute (ANSI), Reducer sample collector

  • ANSI E1.37-1-2012 Additional Message Sets for ANSI E1.20 (RDM) - Part 1: Dimmer Message Sets

Aeronautical Radio Inc., Reducer sample collector

Indonesia Standards, Reducer sample collector

  • SNI IEC 60747-2:2009 Semiconductor devices - Discrete devices and integrated circuits - Part 2: Rectifier diodes

Professional Standard - Electron, Reducer sample collector

  • SJ/Z 9014.3-1987 Semiconductor components - Discrete components and integrated circuits Part 6 Thyristors
  • SJ 20743-1999 Heat sink handbook Part 1:Thermal resistance curves
  • SJ/T 10072-1991 Detail specification for electronic component.Semiconductor integrated circuit-type CE8602 500MHz÷divider

KR-KS, Reducer sample collector

  • KS C IEC 60747-5-1-2020 Discrete semiconductor devices and integrated circuits —Part 5-1: Optoelectronic devices — General
  • KS C IEC 60748-5-2021 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60748-5-2019 Semiconductor devices — Integrated circuits —Part 5: Semicustom integrated circuits
  • KS C IEC 60747-5-3-2020 Discrete semiconductor devices and integrated circuits —Part 5-3: Optoelectronic devices — Measuring methods
  • KS C IEC 60748-1-2021 Semiconductor devices — Integrated circuits — Part 1: General
  • KS C IEC 60748-1-2019 Semiconductor devices — Integrated circuits — Part 1: General

未注明发布机构, Reducer sample collector

  • BS EN 60747-5-1:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 1 : Optoelectronic devices — General
  • BS EN 60747-5-3:2001(2003) Discretesemiconductor devices and integrated circuits — Part 5 - 3 : Optoelectronic devices — Measuring methods

CEN - European Committee for Standardization, Reducer sample collector

  • EN ISO 10218-2:2011 Robots and robotic devices - Safety requirements for industrial robots - Part 2: Robot systems and integration
  • EN ISO 10993-12:2009 Biological evaluation of medical devices - Part 12: Sample preparation and reference materials
  • EN ISO 10993-12:2007 Biological evaluation of medical devices - Part 12: Sample preparation and reference materials
  • EN ISO 10993-12:2012 Biological evaluation of medical devices - Part 12: Sample preparation and reference materials
  • EN ISO 10993-12:2004 Biological Evaluation of Medical Devices - Part 12: Sample Preparation and Reference Materials
  • EN 16186-2:2017 Railway applications - Driver's cab - Part 2: Integration of displays@ controls and indicators

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Reducer sample collector

API - American Petroleum Institute, Reducer sample collector

Tianjin Provincial Standard of the People's Republic of China, Reducer sample collector

  • DB12/T 1056-2025 Requirements for setting up domestic waste sorting collection containers
  • DB12/T 1056-2021 Requirements for setting up domestic waste sorting collection containers

AT-OVE/ON, Reducer sample collector

  • OVE EN 60747-16-5-2021 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (german version)

Standard Association of Australia (SAA), Reducer sample collector

Professional Standard - Postal Service, Reducer sample collector

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., Reducer sample collector

  • IEEE C37.27-1972 Application Guide for Low-Voltage AC non-integrally fused power Circuit Breakers (using Separately-Mounted Current-Limiting Fuses)

Professional Standard - Machinery, Reducer sample collector

  • JB/T 7114.1-2013 Rules for determination of the types of power capacitor products.Part 1: Capacitor unit, capacitor of the assembling type and capacitor of tank type

CH-SNV, Reducer sample collector





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