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scanning probe microscope
scanning probe microscope, Total:47 items.
In the international standard classification, scanning probe microscope involves: Non-ferrous metals, Education, Optics and optical measurements, Analytical chemistry, Optical equipment, Vocabularies, Linear and angular measurements, Mechanical testing, Non-destructive testing.
Korean Agency for Technology and Standards (KATS), scanning probe microscope
National Metrological Technical Specifications of the People's Republic of China, scanning probe microscope
- JJF 1351-2012 Calibration Specification for Scanning Probe Microscopes
Professional Standard - Education, scanning probe microscope
- JY/T 0582-2020 General Rules for Scanning Probe Microscopy Analytical Methods
- JY/T 010-1996 General principles of analytical scanning electron microscopy
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, scanning probe microscope
- GB/T 29190-2012 Measurement methods of drift rate of scanning probe microscope
- GB/T 42659-2023 Surface Chemical Analysis Scanning Probe Microscopy Determination of Geometric Quantities Using Scanning Probe Microscopy: Measurement System Calibration
- GB/T 22461.2-2023 Glossary of Surface Chemical Analysis Part 2: Scanning Probe Microscopy Terminology
- GB/T 42543-2023 Determination of the Normal Elastic Constant of a Cantilever Beam by Surface Chemical Analysis Scanning Probe Microscopy
British Standards Institution (BSI), scanning probe microscope
- BS ISO 18115-2:2013 Surface chemical analysis. Vocabulary. Terms used in scanning-probe microscopy
- BS ISO 28600:2011 Surface chemical analysis. Data transfer format for scanning-probe microscopy
- BS ISO 18115-2:2021 Surface chemical analysis. Vocabulary - Terms used in scanning-probe microscopy
- BS ISO 27911:2011 Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- BS ISO 18115-2:2010 Surface chemical analysis - Vocabulary - Terms used in scanning-probe microscopy
- BS ISO 11775:2015 Surface chemical analysis. Scanning-probe microscopy. Determination of cantilever normal spring constants
- BS ISO 11039:2012 Surface chemical analysis. Scanning-probe microscopy. Measurement of drift rate
- BS ISO 11952:2019 Surface chemical analysis. Scanning-probe microscopy. Determination of geometric quantities using SPM: Calibration of measuring systems
- BS ISO 21222:2020 Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 19/30351707 DC BS ISO 21222. Surface chemical analysis. Scanning probe microscopy. Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- 12/30265696 DC BS ISO 18115-2 AMD1. Surface chemical analysis. Vocabulary. Part 2. Terms used in scanning-probe microscopy
- BS ISO 13083:2015 Surface chemical analysis. Scanning probe microscopy. Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
International Organization for Standardization (ISO), scanning probe microscope
- ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
- ISO 11039:2012 Surface chemical analysis - Scanning-probe microscopy - Measurement of drift rate
- ISO 18115-2:2021 Surface chemical analysis — Vocabulary — Part 2: Terms used in scanning-probe microscopy
- ISO 27911:2011 Surface chemical analysis - Scanning-probe microscopy - Definition and calibration of the lateral resolution of a near-field optical microscope
- ISO 28600:2011 Surface chemical analysis - Data transfer format for scanning-probe microscopy
- ISO 11775:2015 Surface chemical analysis - Scanning-probe microscopy - Determination of cantilever normal spring constants
- ISO 21222:2020 Surface chemical analysis — Scanning probe microscopy — Procedure for the determination of elastic moduli for compliant materials using atomic force microscope and the two-point JKR method
- ISO 18115-2:2010 Analyse chimique des surfaces — Vocabulaire — Partie 2: Termes utilisés en microscopie à sonde à balayage (Première édition)
- ISO 11952:2019 Surface chemical analysis — Scanning-probe microscopy — Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 11952:2014 Surface chemical analysis - Scanning-probe microscopy - Determination of geometric quantities using SPM: Calibration of measuring systems
- ISO 18115-2:2013 Surface chemical analysis.Vocabulary.Part 2: Terms used in scanning-probe microscopy
- ISO 13083:2015 Surface chemical analysis - Scanning probe microscopy - Standards on the definition and calibration of spatial resolution of electrical scanning probe microscopes (ESPMs) such as SSRM and SCM for 2D-dopant imaging and other purposes
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, scanning probe microscope
- GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy
Association of German Mechanical Engineers, scanning probe microscope
- VDI/VDE 2656 Blatt 1-2008 Determination of geometrical quantities by using of Scanning Probe Microscopes - Calibration of measurement systems
Association Francaise de Normalisation, scanning probe microscope
- NF X21-069-2:2010 Surface chemical analysis - Vocabulary - Part 2 : terms used in scanning-probe microscopy.
Japanese Industrial Standards Committee (JISC), scanning probe microscope
- JIS K 0147-2:2017 Surface chemical analysis -- Vocabulary -- Part 2: Terms used in scanning-probe microscopy
未注明发布机构, scanning probe microscope
- JIS K 0182:2023 Surface chemical analysis -- Scanning-probe microscopy -- Determination of cantilever normal spring constants
RU-GOST R, scanning probe microscope
- GOST 8.593-2009 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for verification
- GOST R 8.635-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Method for calibration
- GOST R ISO 27911-2015 State system for ensuring the uniformity of measurements. Surface chemical analysis. Scanning-probe microscopy. Definition and calibration of the lateral resolution of a near-field optical microscope
- GOST R 8.630-2007 State system for ensuring the uniformity of measurements. Atomic-force scanning probe microscopes. Methods for verification
- GOST R 8.700-2010 State system for ensuring the uniformity of measurements. Method of surface roughness effective height measurements by means of scanning probe atomic force microscope
American Society for Testing and Materials (ASTM), scanning probe microscope
- ASTM E1813-96e1 Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- ASTM E1813-96(2002) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy
- ASTM E1813-96(2007) Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy