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electronic test

electronic test, Total:94 items.

In the international standard classification, electronic test involves: Aerospace electric equipment and systems, Hand-held tools, Semiconductor devices, Electrical wires and cables, On-board equipment and instruments, Aircraft and space vehicles in general, Electronic tubes, Analytical chemistry, Electricity. Magnetism. Electrical and magnetic measurements, Products of the textile industry.


U.S. Military Regulations and Norms, electronic test

American Society of Mechanical Engineers (ASME), electronic test

U.S. Air Force, electronic test

(U.S.) Joint Electron Device Engineering Council Soild State Technology Association, electronic test

United States Navy, electronic test

Military Standard of the People's Republic of China-General Armament Department, electronic test

  • GJB 9133-2017 Military electronic test instrument terminology
  • GJB 3947-2000 General specification for military electronic test equipment
  • GJB 3947A-2009 General apecification for military electronic test equipment
  • GJB 9134-2017 Model naming method for military electronic test instruments
  • GJB 6927-2009 Procedure and requirements for check and accept of military electronic measuring instruments
  • GJB 6926-2009 Requirement for drafting product specification of military electronic measuring instrument
  • GJB 8360-2015 Design margin and simulated misuse test of military electronic test instruments
  • GJB 3311A-2011 Microwave tube test method
  • GJB 3311-1998 Microwave tube test method

PL-PKN, electronic test

Standard Association of Australia (SAA), electronic test

  • AS 3547.2:2023 Breath alcohol electronic testing devices for personal use

Society of Automotive Engineers (SAE), electronic test

Professional Standard - Electron, electronic test

  • SJ 20369-1993 General specification for military electronic test equipment.General
  • SJ 20373-1993 General specification for military electronic test equipment.Safety requirements
  • SJ 20371-1993 General specification for military electronic test equipments.Requirements and test methods of power supply
  • SJ 20377-1993 General specification for military electronic test equipment.Quality assurance provision
  • SJ/Z 9010.0-1987 Measurements of electrical properties of electronic tubes and valves--Part 0: Precautions relating to methods of measurement of electronic tubes and valves
  • SJ 20376-1993 General specification for military electronic test equipment.Requirements and identification marking and package
  • SJ 20372-1993 General specification for military electronic test equipment.Enviremental requirements and test methods
  • SJ 20374-1993 General specification for military electronic test equipment.Requirements and test methods of electromagnetic compatibility
  • SJ 20375-1993 General specification for military electronic test equipment.Requirements and methods for reliability test
  • SJ 20370-1993 General specification for military electronic test equipment.Basic requirements for design and construction
  • SJ/Z 9010.21-1987 Measurements of electrical properties of electronic tubes and valves--Part 21: Methods of measurement for cross-modulation in electronic tubes and valves
  • SJ/Z 9036-1987 Electrical and electronic measuring and testing equipment

North Atlantic Treaty Organization Standards Agency, electronic test

Aeronautical Radio Inc., electronic test

National Metrological Verification Regulations of the People's Republic of China, electronic test

ISA - International Society of Automation, electronic test

  • ISA S82.02-1988 Safety Standard for Electrical and Electronic Test@ Measuring@ Controlling and Related Equipment Electrical and Electronic Test and Measuring Equipment (Partial Revision and Redesignation of ANSI C39.5-1974)
  • ISA 82.02.01-1999 Safety Standard for Electrical and Electronic Test@ Measuring@ Controlling@ and Related Equipment - General Requirements
  • ISA S82.01-1994 Safety Standard for Electrical and Electronic Test@ Measuring@ Controlling and Related Equipment - General Requirements Harmonized Standard to IEC Publication 1010-1

Defense Logistics Agency, electronic test

American Society for Testing and Materials (ASTM), electronic test

  • ASTM D5015-02(2008) Standard Test Method for pH of Atmospheric Wet Deposition Samples by Electrometric Determination

Korean Agency for Technology and Standards (KATS), electronic test

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, electronic test

  • GB 12117-1989 Measuring methods for electronic analog voltmeters
  • GB/T 12117-1989 Measuring methods for electronic analog voltmeters
  • GB/T 3306-2001 Measurements of the electrical properties of low-power electronic tubes
  • GB/T 11446.3-1997 Generic rules for test methods of electronic grade water
  • GB/T 11446.3-2013 Generic rules for test methods of electronic grade water
  • GB/T 7274-2015 Methods for the measurement of direct inter-electrode capacitances of electronic tubes and valves
  • GB/T 7274-1987 Methods for the measurement of direct interelectrode capacitances of electronic tubes and valves

CZ-CSN, electronic test

SE-SIS, electronic test

HU-MSZT, electronic test

US-RTCA, electronic test

  • RTCA DO-171-1980 RECOMMENDATIONS ON POLICIES AND PROCEDURES FOR OFF-THE-SHELF ELECTRONIC TEST EQUIPMENT ACQUISITION AND SUPPORT

Association Francaise de Normalisation, electronic test

Institute of Electrical and Electronics Engineers (IEEE), electronic test

  • IEEE 1505.1-2015 The Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE Std 1505.1-2008 IEEE Trial-Use Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE Unapproved Draft Std P1505.1_D8, Jan 2008 IEEE Draft Trial-Use Standard for Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Standard 1505
  • IEEE P1505.1/D4, July 2018 IEEE Draft Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE 1505.1-2019 IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE Std 1505.1-2019 IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE Std 1505.1-2008 (Full-Use) IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

IEEE - The Institute of Electrical and Electronics Engineers@ Inc., electronic test

  • IEEE P1505.1/D4-2018 The Common Test Interface Pin Map Configuration for High-Density@ Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
  • IEEE P1505.1/D6-2019 Standard for the Common Test Interface Pin Map Configuration for High-Density@ Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, electronic test

  • GB/T 35445-2017 Silk—Electronic test method for defects and evenness of raw silk

IEC - International Electrotechnical Commission, electronic test

  • IEC 63003:2015 Standard for the common test interface pin map configuration for high-density@ single-tier electronics test requirements utilizing IEEE Std 1505 (Edition 1.0)




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