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Carrier Raman

Carrier Raman, Total:19 items.

In the international standard classification, Carrier Raman involves: Testing of metals, Electricity. Magnetism. Electrical and magnetic measurements, Structures of buildings, Semiconductor devices.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Carrier Raman

• GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
• GB/T 29843-2013 General specification for DC electronic load
• GB/T 8757-1988 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
• GB/T 8757-2006 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum

International Telecommunication Union (ITU), Carrier Raman

• ITU-T G.665 ARABIC-2005 Generic characteristics of Raman amplifiers and Raman amplified subsystems
• ITU-T G.665 CHINESE-2005 Generic characteristics of Raman amplifiers and Raman amplified subsystems
• ITU-T G.665 RUSSIAN-2005 Generic characteristics of Raman amplifiers and Raman amplified subsystems

National Metrological Technical Specifications of the People's Republic of China, Carrier Raman

• JJF 1462-2014 Calibration Specification for DC Electronic Loads

VN-TCVN, Carrier Raman

• TCVN 5099-1990 Hosiery.Test method for the determination of sole in tensile loading

British Standards Institution (BSI), Carrier Raman

• BS 8100-4:1995 Lattice towers and masts - Code of practice for loading of guyed masts

Professional Standard - Aviation, Carrier Raman

• HB 7881-2008 General requirements for direct current power supplies of airborne electronic

International Electrotechnical Commission (IEC), Carrier Raman

• IEC TS 62607-6-2:2023 Nanomanufacturing - Key control characteristics - Part 6-2: Graphene - Number of layers: atomic force microscopy, optical transmission, Raman spectroscopy

Association Francaise de Normalisation, Carrier Raman

• NF C80-202*NF EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors
• NF EN 62416:2010 Dispositifs à semiconducteurs - Essai de porteur chaud sur les transistors MOS

CO-ICONTEC, Carrier Raman

• ICONTEC 1031-1981

Danish Standards Foundation, Carrier Raman

• DS/EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors

ES-UNE, Carrier Raman

• UNE-EN 62416:2010 Semiconductor devices - Hot carrier test on MOS transistors (Endorsed by AENOR in September of 2010.)

German Institute for Standardization, Carrier Raman

• DIN EN 62416:2010-12 Semiconductor devices - Hot carrier test on MOS transistors (IEC 62416:2010); German version EN 62416:2010

国家市场监督管理总局、中国国家标准化管理委员会, Carrier Raman

• GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

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