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Micro Electronic Weighing Spoon

Micro Electronic Weighing Spoon, Total:467 items.

In the international standard classification, Micro Electronic Weighing Spoon involves: Aerospace electric equipment and systems, Integrated circuits. Microelectronics, Electrical and electronic testing, Equipment for petroleum and natural gas industries, Measurement of volume, mass, density, viscosity, Terminology (principles and coordination), Analytical chemistry, Vocabularies, Optical equipment, Microprocessor systems, Ferroalloys, SOCIOLOGY. SERVICES. COMPANY ORGANIZATION AND MANAGEMENT. ADMINISTRATION. TRANSPORT, Testing of metals, Electromechanical components for electronic and telecommunications equipment, Water quality, Linear and angular measurements, Materials for aerospace construction, Surface treatment and coating, Non-ferrous metals, Air quality, Soil quality. Pedology, Metalliferous minerals, Protection against crime, Electricity. Magnetism. Electrical and magnetic measurements, Conducting materials, Electronic component assemblies, Electrical accessories, Test conditions and procedures in general, Environmental testing, Electronic tubes, General methods of tests and analysis for food products, Fuels, Nuclear energy engineering, Semiconductor devices, Optics and optical measurements, Electronic components in general, Coals, Energy and heat transfer engineering in general, Plastics, Semiconducting materials, Wastes, Photography, Jewellery, Radiocommunications, Products of the chemical industry, Medical sciences and health care facilities in general, Edible oils and fats. Oilseeds, Capacitors, Physics. Chemistry, Ferrous metals, Resistors, Ceramics, Electromagnetic compatibility (EMC), Road vehicle systems, Fertilizers, Metrology and measurement in general, Products of the textile industry, Document imaging applications, Textile fibres, Milk and milk products.

International Organization for Standardization (ISO), Micro Electronic Weighing Spoon

ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
ISO 23833:2013 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23833:2006 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
ISO 23420:2021 Microbeam analysis — Analytical electron microscopy — Method for the determination of energy resolution for electron energy loss spectrum analysis
ISO 24639:2022 Microbeam analysis — Analytical electron microscopy — Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
ISO 22309:2006 Microbeam analysis - Quantitative analysis using energy-dispersive spectrometry (EDS)
ISO 22489:2006 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
ISO 22489:2016 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
ISO 14595:2003 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) (Première édition)
ISO/PRF 14595 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
ISO 14595:2023 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials (CRMs)
ISO/TS 16965:2013 Soil quality.Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)
ISO 9220:1988 Metallic coatings; measurement of coating thickness; scanning electron microscope method
ISO 13067:2011 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size
ISO 9220:2022 Metallic coatings — Measurement of coating thickness — Scanning electron microscope method
ISO/DIS 14594 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
ISO 19463:2018 Microbeam analysis - Electron probe microanalyser (EPMA) - Guidelines for performing quality assurance procedures
ISO 23749:2022 Microbeam analysis — Electron backscatter diffraction — Quantitative determination of austenite in steel
ISO 13067:2020 Microbeam analysis — Electron backscatter diffraction — Measurement of average grain size
ISO 14595:2003/Cor 1:2005 Analyse par microfaisceaux - Microanalyse par sonde à électrons - Lignes directrices pour les spécifications des matériaux de référence certifiés (CRM) RECTIFICATIF TECHNIQUE 1 (Première édition)
ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
ISO/DIS 24173:2023 Microbeam analysis — Guidelines for orientation measurement using electron backscatter diffraction
ISO 16592:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 16592:2012 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method
ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
ISO 23692:2021 Microbeam analysis - Electron probe microanalysis - Quantitative analysis of Mn dendritic segregation in continuously cast steel product
ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
ISO 17470:2004 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO 17470:2014 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
ISO/CD 16965:2023 Environmental solid matrices — Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)
ISO 21033:2016 Animal and vegetable fats and oils - Determination of trace elements by inductively coupled plasma optical emission spectroscopy (ICP-OES)
ISO 11452-5:1995 Road vehicles - Electrical disturbances by narrowband radiated electromagnetic energy - Component test methods - Part 5: Stripline
ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy
ISO 15151:2018 | IDF 229:2018 Milk, milk products, infant formula and adult nutritionals — Determination of minerals and trace elements — Inductively coupled plasma atomic emission spectrometry (ICP-AES) method
ISO 17751-2:2014 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method
ISO 17751-2:2023 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends — Part 2: Scanning electron microscopy method

U.S. Military Regulations and Norms, Micro Electronic Weighing Spoon

ARMY MIL-S-52156 D-1988 SURVEYING SET, ELECTRONIC DISTANCE MEASURING MICROWAVE

Taiwan Provincial Standard of the People's Republic of China, Micro Electronic Weighing Spoon

CNS 12865.11-2005 Noise margin measurements for digital microelectronic devices
CNS 12865-11-2005 Noise margin measurements for digital microelectronic devices
CNS 12865-9-1991 Method of Test for Digital Microelectronics ( Delay Measurements )
CNS 12865.9-1991 Method of Test for Digital Microelectronics ( Delay Measurements )
CNS 6673-1980 Method of Test for Concentrating and Measuring Trace Quantities of Copper in High - Purity Water Used in the Electronics Industry

Chongqing Provincial Standard of the People's Republic of China, Micro Electronic Weighing Spoon

DB50/T 540-2014 Microelectronic Thermal Mass Gas Flow Meter

PL-PKN, Micro Electronic Weighing Spoon

PN T04813-1971 Low power elec?ronic ?ubet M?Hiod of m?a?ur?men? of micropkonic noiic wHh aicHation by tapping
PN-EN IEC 61788-7-2020-12 E Superconductivity -- Part 7: Electronic characteristic measurements -- Surface resistance of high-temperature superconductors at microwave frequencies (IEC 61788-7:2020)

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Micro Electronic Weighing Spoon

GB/T 29249-2012 Electronic weighing moisture analyzer of oven drying
GB 7667-1996 The dose of X-rays leakage from electron microscope
GB 7667-2003 The dose of X-rays leakage from electron microscope
GB/T 28634-2012 Microbeam analysis.Electron probe microanalysis.Quantitative point analysis for bulk specimen using wavelength dispersive X-ray spectroscopy
GB/T 19267.6-2003 Physical and chemical examination of trace evidence in forensic sciences--Part 6: Scanning electron microscopy
GB/T 15247-2008 Microbeam analysis.Electron probe microanalysis.Guidelines for determining the carbon content of steels using calibration curve method
GB/T 15246-2022 Microbeam analysis—Quantitative analysis of sulfide minerals by electron probe microanalysis
GB/T 2423.32-1985 Basic environmental testing procedures for electric and electronic products--Solderability testing by the wetting balance method
GB/T 2424.21-1985 Basic environmental testing procedures for electric and electronic products--Guidance on solderability testing by the wetting balance method
GB/T 17473.1-2008 Test method of precious metals pastes used for microelectronics.Determination of solids content
GB/T 2423.32-2008 Environmental testing for electric and electronic products.Part 2:Test methods.Test Ta:Solderability test by the wetting balance method
GB/T 19267.6-2008 Physical and chemical examination of trace evidence in forensic sciences.Part 6:Scanning electron microscope/X ray energy dispersive spectrometry
GB/T 17473.1-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of solids content
GB/T 18873-2002 General specification of transmission electron microscope(TEM)--X-ray energy dispersive spectrum(EDS) quantitative microanalysis for thin biological specimens
GB/T 18873-2008 General guide of transmission electron microscope (TEM)-X-ray energy dispersive spectrometry (EDS) quantitative microanalysis for thin biological specimens
GB/T 43196-2023 Nanotechnology Scanning Electron Microscopy to Measure Nanoparticle Size and Shape Distribution
GB/T 17363.1-2009 Nondestructive mensuration of gold content in the gold products.Part 1:Method of electron probe microanalysis
GB/T 24794-2009 Photographic chemicals.Measurement methods of the trace elements in the organic compounds.Inductively coupled plasma atomic emission spectrometry(ICP-AES)
GB/T 27598-2011 Photographic chemicals.Measurement methods of the trace elements in the inorganic compounds.Inductively coupled plasma atomic emission spectrometry(ICP-AES)
GB/T 223.81-2007 Iron,steel and alloy-Determination of total aluminum and total aluminum and total boron contents-Microwave digestion-inductively coupled plasma mass spectrometric method
GB/T 32869-2016 Nanotechnologies.Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
GB/T 22462-2008 Nano,Sub-micron scale film on steel.Quantitative depth profile analysis.Glow discharge atomic emission spectrometry

Professional Standard - Machinery, Micro Electronic Weighing Spoon

JB/T 11536.2-2013 Electronic Weighing Hoppers Part 2: Specifications
JB/T 11536.1-2013 Electronic Weighing Hopper Part 1: Types and Basic Parameters

Korean Agency for Technology and Standards (KATS), Micro Electronic Weighing Spoon

KS D ISO 23833:2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 14595:2012 Microbeam analysis-Electron probe microanalysis-Guidelines for the specification of certified reference materials(CRMs)
KS D 2716-2008 Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 16592-2011(2021) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D 2716-2008(2018) Measurement of nanoparticle diameter－Transmission electron microscope
KS D ISO 22489:2012 Microbeam analysis－Electron probe microanalysis－Quantitative point analysis for bulk specimens using wavelength-dispersive x-ray spectroscopy
KS D ISO 22489:2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO TR 17270:2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 14595:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D 8544-2006 Metallic coating-Measurement of coating thickness-Transmission electron microscopy method
KS D 8544-2016(2021) Metallic coating－Measurement of coating thickness－Transmission electron microscopy method
KS D ISO 11437-2-2012(2017) Nickel alloys－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 2：Determination of lead content
KS D ISO 9220:2009 Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2022) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 9220-2009(2017) Metallic coatings－Measurement of coating thickness－Scanning electron microscope method
KS D ISO 14594:2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 11437-2-2012(2022) Nickel alloys－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 2：Determination of lead content
KS D 1674-2019 Methods for inductively coupled plasma spectrometric analysis of trace elements in gold
KS D ISO 16592:2011 Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 16592-2011(2016) Microbeam analysis－Electron probe microanalysis－Guidelines for determining the carbon content of steels using a calibration curve method
KS D ISO 15632:2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS C 6111-3-2007(2022) Electronic characteristic measurements－Intrinsic surface impedance of high-TC superconductor films at microwave frequencies
KS I ISO 13794-2008(2018) Ambient air－Determination of asbestos fibres－Indirect-transfer transmission electron microscopy method
KS C 6111-3-2007(2017) Electronic characteristic measurements－Intrinsic surface impedance of high-TC superconductor films at microwave frequencies
KS D ISO 11437-1-2012(2022) Nickel alloys－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 1：General requirements and sample dissolution
KS D ISO 11437-1-2012(2017) Nickel alloys－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 1：General requirements and sample dissolution
KS C CISPR 19-2004 Electromagnetic compatibility(EMC)- Guidance on the use of the substitution method for measurement of radiation from microwave ovens for frequencies above 1 GHz
KS C IEC 61788-16:2020 Superconductivity — Part 16: Electronic characteristic measurements — Power-dependent surface resistance of superconductors at microwave frequencies
KS D 1702-2015 Platium－Determination of trace-element content by inductively coupled plasma spectrometric analysis－Matrix matching method
KS R ISO 11452-5:2013 Road vehicles－Component test methods for electrical disturbances from narrowband radiated electromagnetic energy－Part 5：Stripline
KS R ISO 11452-5:2002 Road vehicles-Electrical disturbances by narrowband radiated electromagnetic energy-Component test methods-Part 5:Stripline
KS C IEC 60512-14-2:2009 Connectors for electronic equipment-Tests and measurements-Part 14-2:Sealing tests-Test 14b:Sealing-Fine air leakage
KS C IEC 60512-14-2:2014 Connectors for electronic equipment－Tests and measurements－Part 14-2：Sealing tests－Test 14b：Sealing－Fine air leakage
KS K ISO 17751-2:2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method

KR-KS, Micro Electronic Weighing Spoon

KS D ISO 23833-2018 Microbeam analysis — Electron probe microanalysis(EPMA) — Vocabulary
KS D ISO 14595-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D 2716-2023 Measurement of nanoparticle diameter — Transmission electron microscope
KS D ISO 22489-2018 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO TR 17270-2007 Microbeam analysis－Analytical transmission electron microscopy－Technical report on the determination of the experimental parameters for electron energy loss spectroscopy
KS D ISO 14595-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the specification of certified reference materials(CRMs)
KS D ISO 11438-4-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 4：Determination of tin content
KS D ISO 11438-3-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 3：Determination of antimony content
KS D ISO 11438-5-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 5：Determination of tellurium content
KS D ISO 11438-6-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 6：Determination of thallium content
KS D ISO 11438-8-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 8：Determination of indium content
KS D ISO 14594-2018 Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 22489-2018(2023) Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive x-ray spectroscopy
KS D ISO 14594-2018(2023) Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
KS D ISO 11438-2-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 2：Determination of lead content
KS D ISO 11438-7-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 7：Determination of silver content
KS C ISO 19749-2023 Nanotechnologies — Measurements of particle size and shape distributions by scanning electron microscopy
KS C ISO 21363-2023 Nanotechnologies — Measurements of particle size and shape distributions by transmission electron microscopy
KS D ISO 15632-2018 Microbeam analysis — Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
KS D ISO 11438-1-2012 Ferronickel－Determination of trace-element content by electrothermal atomic absorption spectrometric method－Part 1：General requirement and sample dissolution
KS C IEC 61788-16-2020 Superconductivity — Part 16: Electronic characteristic measurements — Power-dependent surface resistance of superconductors at microwave frequencies
KS K ISO 17751-2-2019 Textiles — Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends — Part 2: Scanning electron microscopy method

Group Standards of the People's Republic of China, Micro Electronic Weighing Spoon

T/ICMTIA ESG0022-2022 Preparation and weighing method of mixed gas in electronic industry
T/CESA 1186-2022 Test method for silanol content on surface of silica powder for electronic packaging—Acid-base titration
T/SCS 000012-2021 Determination of trace elements in boron carbide–silicon carbide pellets by Inductively coupled plasma optical emission spectrometry
T/CAQI 134-2020 Gems—Determination of trace elements—Laser ablation-inductively coupled plasma mass spectrometry
T/CSIQ 78001-2017 Determination of total lead content in the non-metallic accessories of garment－Microwave digestion-inductively coupled plasma atomic emission spectrometric method
T/CSTM 00376-2021 Vanadium Titanium Magnetite ore—The determination of scandium, niobium, zirconium, gallium, germanium, indium, selenium, tellurium and bismuth contents—Microwave digestion- Inductively coupled plasma mass spectrometric method

British Standards Institution (BSI), Micro Electronic Weighing Spoon

BS ISO 23420:2021 Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 23833:2013 Microbeam analysis. Electron probe microanalysis (EPMA) Vocabulary
BS ISO 24639:2022 Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
20/30380369 DC BS ISO 23420. Microbeam analysis. Analytical electron microscopy. Method for the determination of energy resolution for electron energy loss spectrum analysis
BS ISO 19463:2018 Microbeam analysis. Electron probe microanalyser (EPMA). Guidelines for performing quality assurance procedures
21/30404763 DC BS ISO 24639. Microbeam analysis. Analytical electron microscopy. Calibration procedure of energy scale for elemental analysis by electron energy loss spectroscopy
BS ISO 11438-5:1993 Ferronickel. Determination of trace-element content by electrothermal atomic absorption spectrometric method - Determination of tellurium content
BS ISO 11438-6:1993 Ferronickel. Determination of trace-element content by electrothermal atomic absorption spectrometric method - Determination of thallium content
BS ISO 11438-7:1993 Ferronickel. Determination of trace-element content by electrothermal atomic absorption spectrometric method - Determination of silver content
BS ISO 11438-8:1993 Ferronickel. Determination of trace-element content by electrothermal atomic absorption spectrometric method - Determination of indium content
BS ISO 23692:2021 Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
BS EN 60512-1-4:1997 Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. General. Test 1d. Contact protection effectiveness (scoop-proof)
BS ISO 14595:2023 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
20/30393735 DC BS ISO 23692. Microbeam analysis. Electron probe microanalysis. Quantitative analysis of Mn dendritic segregation in continuously cast steel product
PD ISO/TS 16965:2013 Soil quality. Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)
BS ISO 22489:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy
BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
BS EN ISO 9220:1989 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
BS ISO 14595:2003 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs)
BS ISO 14595:2014 Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
19/30394914 DC BS ISO 15632. Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energydispersive X-ray spectrometers for use in electron probe microscope or an electron probe microanalyser (EPMA)
BS EN 61788-7:2002 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
BS EN 61788-7:2007 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
BS EN 160200-2:1998 Harmonized system of quality assessment for electronic components - Sectional specification - Microwave modular electronic units of assessed quality - Index of test methods
22/30430960 DC BS ISO 14595. Microbeam analysis. Electron probe microanalysis. Guidelines for the specification of certified reference materials (CRMs)
BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS ISO 13067:2020 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS 4319-1:1968 Methods of measurement of the electrical properties of electronic tubes and valves (excluding microwave devices) - Essential conditions for measuring equivalent input and output admittances
BS ISO 22036:2008 Soil quality. Determination of trace elements in extracts of soil by inductively coupled plasma-atomic emission spectrometry (ICP-AES)
BS ISO 23749:2022 Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS EN IEC 61788-7:2020 Superconductivity - Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies
BS EN 61788-16:2013 Superconductivity. Electronic characteristic measurements. Power-dependent surface resistance of superconductors at microwave frequencies
BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
BS ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
21/30394409 DC BS ENISO 9220. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
23/30425940 DC BS ISO 14594. Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
BS EN 61788-7:2006 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
BS ISO 19749:2021 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN ISO 9220:2022 Tracked Changes. Metallic coatings. Measurement of coating thickness. Scanning electron microscope method
19/30365236 DC BS ISO 13067. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
BS CECC 00013:1985 Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
BS EN ISO 21363:2022 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
BS EN ISO 19749:2023 Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS ISO 21363:2020 Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
21/30398224 DC BS ISO 23749. Microbeam analysis. Electron backscatter diffraction. Quantitative determination of austenite in steel
BS EN 61788-15:2011 Superconductivity. Electronic characteristic measurements. Intrinsic surface impedance of superconductor films at microwave frequencies
BS EN 62047-9:2011 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
BS EN 62047-9:2013 Semiconductor devices. Micro-electromechanical devices. Wafer to wafer bonding strength measurement for MEMS
23/30435799 DC BS ISO 24173. Microbeam analysis. Guidelines for orientation measurement using electron backscatter diffraction
18/30370111 DC BS EN 61788-7. Superconductivity. Part 7. Electronic characteristic measurements. Surface resistance of superconductors at microwave frequencies
BS EN 190110:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: digital microprocessor integrated circuits
BS EN 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements - Sealing tests - Test 14b - Sealing - Fine air leakage
18/30351714 DC BS ISO 21363. Nanotechnologies. Measurements of particle size and shape distributions by transmission electron microscopy
18/30351679 DC BS ISO 19749. Nanotechnologies. Measurements of particle size and shape distributions by scanning electron microscopy
BS EN 190110:1993 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: digital microprocessor integrated circuits
BS EN 60835-2-5:1995 Methods of measurement for equipment used in digital microwave radio transmission systems. Measurements on terrestrial radio-relay systems. Digital signal processing sub-system
BS ISO 21033:2016 Animal and vegetable fats and oils. Determination of trace elements by inductively coupled plasma optical emission spectroscopy (ICP-OES)
BS EN 134104:1991 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: compression type trimmer capacitors (qualification approval)
BS EN 134104:1995 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: compression type trimmer capacitors (qualification approval)
BS DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
BS ISO 15632:2021 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers (EDS) for use with a scanning electron microscope (SEM) or an electron probe microanalyser (EPMA)
BS EN 15765:2009 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICPMS) after pressure digestion
BS EN 15765:2010 Foodstuffs. Determination of trace elements. Determination of tin by inductively coupled plasma mass spectrometry (ICPMS) after pressure digestion
BS EN 134101:1995 Specification for harmonized system of quality assessment for electronic components - Blank detail specification: single turn disc trimmer capacitors (qualification approval)
BS EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Determination of chemical composition by electron probe microanalysis (EPMA)
DD CEN/TS 15111:2005 Foodstuffs. Determination of trace elements. Determination of iodine in dietetic foods by ICP-MS (inductively coupled plasma mass spectrometry)
BS QC 790110:1992 Specification for harmonized system of quality assessment for electronic components - Semiconductor devices - Integrated circuits - Blank detail specification - Microprocessor integrated circuits
BS EN ISO 17751-2:2023 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Scanning electron microscopy method
DD ISO/TS 10798:2011 Nanotechnologies. Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
BS EN ISO 17751-2:2016 Textiles. Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends. Scanning Electron Microscopy method
BS EN 16319:2013 Fertilizers. Determination of trace elements. Determination of cadmium, chromium, lead and nickel by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution
BS EN ISO 15151:2020 Milk, milk products, infant formula and adult nutritionals. Determination of minerals and trace elements. Inductively coupled plasma atomic emission spectrometry (ICP-AES) method

Association Francaise de Normalisation, Micro Electronic Weighing Spoon

NF X21-009:2008 Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary.
NF ISO 24173:2009 Analyse par microfaisceaux - Lignes directrices pour la mesure d'orientation par diffraction d'électrons rétrodiffusés
NF X21-001:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for the specification of certified reference materials (CRMs).
NF X21-003:2006 Microbeam analysis - Electron probe microanalysis - Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry.
NF C93-681/A1:1989 Electronical Components of assessed quality Incandescent miniature lamps Detail specifications
NF X21-014:2012 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size.
NF X21-006:2007 Microbeam analysis - Electron probe microanalysis - Quantitative point analysis for bulk specimens using wavelength-dispersive X-ray spectroscopy.
NF A91-108:1995 Metallic coatings. Measurement of coating thickness. Scanning electron microscope method.
NF A91-108*NF EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
NF EN ISO 9220:2022 Revêtements métalliques - Mesurage de l'épaisseur de revêtement - Méthode au microscope électronique à balayage
NF V03-098*NF EN 15111:2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry).
NF X21-011*NF ISO 24173:2009 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction
NF T16-404:2020 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF T16-403*NF ISO 19749:2021 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy
NF T16-404*NF EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy
NF X21-002:2007 Microbeam analysis - Electron probe microanalysis - Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy.
NF X21-007:2008 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steel using a calibration curve method.
NF C31-888-7*NF EN IEC 61788-7:2020 Superconductivity - Part 7 : electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
NF C31-888-7*NF EN 61788-7:2006 Superconductivity - Part 7 : electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
NF C31-888-7:2003 Superconductivity - Part 7 : electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies.
NF X43-050:2021 Air quality - Determination of the asbestos fiber concentration by transmission electron microscopy - Indirect method
NF C86-241:1986 Harmonized system of quality assessment for electronic components. Digital microprocessor integrated circuits. Blank detail specification.
NF X43-050:1996 Air quality. Determination of the asbestos fiber concentration by transmission electron microscopy. Indirect method.
NF X21-013*NF ISO 11938:2012 Microbeam analysis - Electron probe microanalysis - Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy.
NF EN 61788-16:2013 Supraconductivité - Partie 16 : mesures de caractéristiques électroniques - Résistance de surface des supraconducteurs aux hyperfréquences en fonction de la puissance
NF T60-230*NF ISO 21033:2016 Animal and vegetable fats and oils - Determination of trace elements by inductively coupled plasma optical emission spectroscopy (ICP-OES)
NF C26-433:1972 Céramiques à base d'oxyde de béryllium (glucine) (teneur en oxyde de béryllium supérieure à 99 %) pour substrats isolants destinés aux microstructures électroniques - Spécifications
NF EN IEC 61788-7:2020 Supraconductivité - Partie 7 : mesurages des caractéristiques électroniques - Résistance de surface des supraconducteurs haute température critique aux hyperfréquences
NF C31-888-15*NF EN 61788-15:2012 Superconductivity - Part 15 : electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
NF EN 61788-15:2012 Supraconductivité - Partie 15 : mesures de caractéristiques électroniques - Impédance de surface intrinsèque de films supraconducteurs aux fréquences micro-ondes
NF EN 60512-14-2:2006 Connecteurs pour équipements électroniques - Essais et mesures - Partie 14-2 : essais d'étanchéité - Essai 14b : étanchéité - Micro-fuite d'air
NF C93-400-14-2*NF EN 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements - Part 14-2 : sealing tests - Test 14b : sealing - Fine air leakage
NF U42-418:2013 Fertilizers - Determination of trace elements - Determination of arsenic by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution
NF EN ISO 21424:2020 Lait, produits laitiers, formules infantiles et produits nutritionnels pour adultes - Détermination de la teneur en minéraux et en oligo-éléments - Méthode par spectrométrie de masse avec plasma à couplage inductif (ICP-SM)
FD T16-203:2011 Nanotechnologies - Characterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
NF U42-419:2014 Fertilizers - Determination of trace elements - Determination of cadmium, chromium, lead and nickel by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution
NF EN 60835-2-5:1996 Méthodes de mesure applicables au matériel utilisé pour les systèmes de transmission numérique en hyperfréquence - Partie 2 : mesures applicables aux faisceaux hertziens terrestres - Section 5 : sous-ensemble de traitement du signal numérique.
NF EN 1071-4:2006 Céramiques techniques avancées - Méthodes d'essai pour revêtements céramiques - Partie 4 : détermination de la composition chimique par microanalyse avec sonde électronique (MASE)
NF C20-700-2-69:2013 Environmental testing - Part 2-69 : tests - Test Te : solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method
NF G07-142-2*NF EN ISO 17751-2:2016 Textiles - Quantitative analysis of cashmere, wool, other speciality animal fibres and their blends - Part 2 : scanning electron microscopy method
NF V04-445*NF EN ISO 15151:2020 Milk, milk products, infant formula and adult nutritionals - Determination of minerals and trace elements - Inductively coupled plasma atomic emission spectrometry (ICP-AES) method
NF EN ISO 17751-2:2016 Textiles - Analyse quantitative du cachemire, de la laine, d'autres fibres animales spéciales et leurs mélanges - Partie 2 : méthode par microscopie électronique à balayage

SE-SIS, Micro Electronic Weighing Spoon

SIS SS IEC 615:1983 Electronic measuring equipment - Terminology for microwave apparatus
SIS SS-ISO 9220:1989 Metallic coatings — Measurements of coating thickness — Scanning electron microscope method

Professional Standard - Aviation, Micro Electronic Weighing Spoon

HB 8422-2014 Quantitative detection method of EPMA for trace elements in alloys
HB 7716.14-2002 Spectrometric analysis of titanium alloys Part 14:Determination of yttrium content-Inductively coupled plasma atomic emission spectrometric method

未注明发布机构, Micro Electronic Weighing Spoon

DIN EN 160200-1:1998 Electronic microwave modules with assessed quality
BS EN 160201:1998 Harmonized system of quality assessment for electronic components — Blank detail specification — Microwave modular electronic units of assessed quality — Capability approval
BS EN 160200-1:1998 Harmonized system ofquality assessment for electronic components Sectional specification : Microwave modular electronic units of assessed quality — Part 1 : Capability approval procedure
BS CECC 13:1985(1999) Harmonized system of quality assessment for electronic components : Basic specification : Scanning electron microscope inspection of semiconductor dice
DIN EN 160200-2:1998 Microwave modular electronic units of assessed quality — Part 2: Index of test methods
DIN EN ISO 21363:2022 Nanotechnologies – measurements of particle size and particle shape distributions using transmission electron microscopy
BS EN 61788-15:2011(2012) Superconductivity Part 15 : Electronic characteristic measurements – Intrinsic surface impedance of superconductor films at microwave frequencies
BS EN 15763:2009(2010) Foodstuffs — Determination of trace elements — Determination of arsenic, cadmium, mercury and lead in foodstuffs by inductively coupled plasma mass spectrometry (ICP - MS)

IN-BIS, Micro Electronic Weighing Spoon

Institute of Environmental Sciences and Technology, Micro Electronic Weighing Spoon

IEST RP-CC024.1-1994 MEASURING AND REPORTING VIBRATION IN MICROELECTRONICS FACILITIES
IEST RP-CC024.1-2002 MEASURING AND REPORTING VIBRATION IN MICROELECTRONICS FACILITIES (5TH PRINTING)
IEST RP-CC004.3-2004 MEASURING AND REPORTING VIBRATION IN MICROELECTRONICS FACILITIES (5TH PRINTING)

Professional Standard - Electron, Micro Electronic Weighing Spoon

SJ/T 9527-1993 Digital micro-computer--Quality grading standard

Hebei Provincial Standard of the People's Republic of China, Micro Electronic Weighing Spoon

DB13/T 1187.1-2010 Service Specifications for Weighing Social Justice Measuring Stations Part 1: Electronic Truck Scale Weighing
DB13/T 1187.2-2010 Service Specifications for Weighing Social Justice Measuring Stations Part 2: Electronic Rail Scale Weighing

国家市场监督管理总局、中国国家标准化管理委员会, Micro Electronic Weighing Spoon

GB/T 17360-2020 Microbeam analysis—Method of quantitative determination for low contents of silicon and manganese in steels using electron probe microanalyzer
GB/T 6730.81-2020 Iron ores—Determination of multiple trace elements—Inductively coupled plasma mass spectrometric method
GB/T 41076-2021 Microbeam analysis—Electron backscatter diffraction—Quantitative determination of austenite in steel
GB/T 6609.1-2018 Chemical analysis methods and determination of physical performance of alumina—Part 1：Determination of trace elements content—Inductively coupled plasma atomic emission spectrometry method
GB/T 36655-2018 Test method for alpha crystalline silicon dioxide content of spherical silica powder for electronic packaging—XRD method

RU-GOST R, Micro Electronic Weighing Spoon

GOST 30350-1996 Analog integrated circuits. General requirements to apparatus and conditions for measurement of electrical parameters
GOST R 8.631-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for verification
GOST R 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes
GOST R 8.636-2007 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Methods for calibration
GOST 8.594-2009 State system for ensuring the uniformity of measurements. Scanning electron microscopes. Method for verification
GOST R ISO 13067-2016 State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
GOST R 8.697-2010 State system for ensuring the uniformity of measurements. Interpenar spacings in crystals. Method for measurement by means of a transmission electron microscope
GOST EN 15111-2015 Foodstuffs. Determination of trace elements. Determination of iodine by ISP-MS (inductively coupled plasma mass spectrometry)
GOST ISO 22036-2014 Soil quality. Determination of trace elements in extracts of soil by inductively coupled plasma-atomic emission spectrometry (ICP-AES)
GOST R 8.775-2011 State system for ensuring the uniformity of measurements. Disperse composition of gas atmospheres. Determination of nano particle size by differential electrical mobility analysis for aerosol particles
GOST 13.1.703-1991 Reprography. Micrography. Test-charts for image quality inspection computer output microform

Electronic Components, Assemblies and Materials Association, Micro Electronic Weighing Spoon

ECA TEP 170-1972 X-Radiation Detection and Measurements for Microwave Tubes, Recommended Practice on

Association of German Mechanical Engineers, Micro Electronic Weighing Spoon

VDI 3492-2004 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3492-2013 Indoor air measurement - Ambient air measurement - Measurement of inorganic fibrous particles - Scanning electron microscopy method
VDI 3861 Blatt 2-2008 Stationary source emissions - Measurement of inorganic fibrous particles in exhaust gas - Scanning electron microscopy method
VDI 2083 Blatt 13.2-2009 Cleanroom technology - Quality, production and distribution of ultrapure water - Microelectronics and other technical applications

Danish Standards Foundation, Micro Electronic Weighing Spoon

DS/ISO/TS 16965:2013 Soil quality - Determination of trace elements using inductively coupled plasma mass spectrometry (ICP-MS)
DS/EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method
DS/ISO 19749:2021 Nanotechnologies – Measurements of particle size and shape distributions by scanning electron microscopy
DS/EN 61788-7:2007 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
DS/EN 160201:1998 Blank detail specification: Microwave modular electronic units of assessed quality - Capability Approval
DS/EN 61788-16:2013 Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies
DS/EN 15111:2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry)
DS/EN 160200-1:1998 Sectional Specification: Microwave modular electronic units of assessed quality - Part 1: Capability approval procedure
DS/EN 160200-2:2000 Sectional specification: Microwave modular electronic units of assessed quality - Part 2: Index of test methods
DS/EN 61788-15:2012 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
DS/EN 15765:2010 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion
DS/EN 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage
DS/ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
DS/EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, Micro Electronic Weighing Spoon

GB/T 22586-2018 Electronic characteristic measurements—Surface resistance of superconductors at microwave frequencies

European Committee for Standardization (CEN), Micro Electronic Weighing Spoon

EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
EN ISO 9220:1994 Metallic Coatings - Measurement of Coating Thickness - Scanning Electron Microscope Method (ISO 9220 : 1988)
EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021)
prEN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
prEN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)
PD CEN/TS 16319:2012 Fertilizers - Determination of trace elements - Determination of cadmium, chromium, lead and nickel by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution

German Institute for Standardization, Micro Electronic Weighing Spoon

DIN EN ISO 9220:2022-05 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022); German version EN ISO 9220:2022
DIN ISO 13067:2021-08 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN SPEC 52407:2015-03 Nanotechnologies - Methods for preparation and assessment for particle measurements with atomic force microscopy (AFM) and transmission scanning electron microscopy (TSEM)
DIN ISO 13067:2015 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
DIN ISO 24173:2013-04 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN ISO 22036:2009-06 Soil quality - Determination of trace elements in extracts of soil by inductively coupled plasma - atomic emission spectrometry (ICP-AES) (ISO 22036:2008) / Note: To be replaced by DIN EN ISO 22036 (2022-07).
DIN EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021); German and English version prEN ISO 9220:2021
DIN ISO 13067:2021 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2020)
DIN 44402 Bb.1:1986 Measurement of the electrical properties of electronic tubes; IEC-standards, DIN-standards (including microwave tubes and photosensitive devices; pin-base, concepts, CECC-system)
DIN EN 60512-1-4:1998-02 Electromechanical components for electronic equipment - Basic testing procedures and measuring methods - Part 1: General; Section 4: Test 1d: Contact protection effectiveness (scoop-proof) (IEC 60512-1-4:1997); German version EN 60512-1-4:1997
DIN ISO 16592:2015 Microbeam analysis - Electron probe microanalysis - Guidelines for determining the carbon content of steels using a calibration curve method (ISO 16592:2012)
DIN EN 15111:2007-06 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry); German version EN 15111:2007
DIN ISO 24173:2013 Microbeam analysis - Guidelines for orientation measurement using electron backscatter diffraction (ISO 24713:2009)
DIN 22022-5:2001-02 Solid fuels - Determination of trace elements - Part 5: Atomic absorption spectrometry applying the electrothermal atomization
DIN 50440:1998 Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method
DIN EN 61788-7:2007 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies (IEC 61788-7:2006); German version EN 61788-7:2006
DIN EN ISO 19749:2023-07 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021); German version EN ISO 19749:2023
DIN EN ISO 21363:2022-03 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020); German version EN ISO 21363:2022
DIN EN 15765:2010 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion; German version EN 15765:2009
DIN EN ISO 9220:1995 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988); German version EN ISO 9220:1994
DIN 44402 Beiblatt 1:1986-12 Measurement of the electrical properties of electronic tubes; IEC-standards, DIN-standards (including microwave tubes and photosensitive devices; pin-base, concepts, CECC-system)
DIN EN 60512-14-2:2006-11 Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006); German version EN 60512-14-2:2006 / Note: DIN IEC 60512-7 (1994-05) remains valid alongside this stand...
DIN 45922-11:1987 Harmonized system of quality assessment for electronic components; sectional specification: lead screw actuated and rotary preset potentiometers
DIN EN 15765:2010-04 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion; German version EN 15765:2009
DIN CEN/TS 16317:2012 Fertilizers - Determination of trace elements - Determination of arsenic by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution; German version CEN/TS 16317:2012
DIN 50451-4:2007 Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
DIN EN 60068-2-69:2007 Environmental testing - Part 2-69: Tests - Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method (IEC 60068-2-69:2007); German version EN 60068-2-69:2007
DIN EN IEC 61788-7:2021 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies (IEC 61788-7:2020); German version EN IEC 61788-7:2020
DIN EN 1071-4:2006-05 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA); German version EN 1071-4:2006
DIN CEN/TS 16319:2012 Fertilizers - Determination of trace elements - Determination of cadmium, chromium, lead and nickel by inductively coupled plasma-atomic emission spectrometry (ICP-AES) after aqua regia dissolution; German version CEN/TS 16319:2012
DIN EN 60835-2-5:1995-04 Methods of measurement for equipment used in digital microwave radio transmission systems - Part 2: Measurement on terrestrial radio relay-systems - Section 5: Digital signal processing sub-system (IEC 60835-2-5:1993); German version EN 60835-2-5:1995
DIN EN 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006); German version EN 60512-14-2:2006
DIN EN ISO 17751-2:2016-11 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibers and their blends - Part 2: Scanning Electron Microscopy method (ISO 17751-2:2016); German version EN ISO 17751-2:2016 / Note: To be replaced by DIN EN ISO 17751-2 (2022-09).
DIN EN ISO 17751-2:2022-09 Textiles - Quantitative analysis of cashmere, wool, other specialty animal fibres and their blends - Part 2: Scanning electron microscopy method (ISO/DIS 17751-2:2022); German and English version prEN ISO 17751-2:2022 / Note: Date of issue 2022-08-19*I...

Japanese Industrial Standards Committee (JISC), Micro Electronic Weighing Spoon

JIS K 3850-1:2000 Measuring method for airborne fibrous particles -- Part 1: Optical microscopy method and scanning electron microscopy method
JIS K 3850-3:2000 Measuring method for airborne fibrous particles -- Part 3: Indirect-transfer transmission electron microscopy method
JIS K 3850-2:2000 Measuring method for airborne fibrous particles -- Part 2: Direct-transfer transmission electron microscopy method
JIS K 0190:2010 Microbeam analysis -- Electron probe microanalysis -- Guidelines for qualitative point analysis by wavelength dispersive X-ray spectrometry
JIS C 5402-14-2:2016 Connectors for electronic equipment -- Tests and measurements -- Part 14-2: Sealing tests -- Test 14b: Sealing -- Fine air leakage
JIS C 60068-2-69:2009 Environmental testing -- Part 2-69: Tests -- Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method

Professional Standard - Commodity Inspection, Micro Electronic Weighing Spoon

SN/T 1600-2005 Determination of Trace Elements in Coal by Inductively Coupled Plasma-Atomic Emission Spectrometry
SN/T 3708-2013 Determination of silicon and phosphorus content in ferrochromium.Microwave digestion-inductively coupled plasma atomic emission spectrometric method

American Society for Testing and Materials (ASTM), Micro Electronic Weighing Spoon

ASTM F459-84(2001) Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
ASTM F459-84(1995)e1 Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
ASTM F459-13 Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
ASTM F459-13(2018) Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
ASTM B748-90(2021) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2016) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2001) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM F1845-97 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
ASTM F1845-97(2002) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
ASTM F1845-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
ASTM F459-06 Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
ASTM F1593-97 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
ASTM F1593-97(2002) Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
ASTM F1593-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
ASTM F1710-08 Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
ASTM B748-90(2006) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(1997) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM B748-90(2010) Standard Test Method for Measurement of Thickness of Metallic Coatings by Measurement of Cross Section with a Scanning Electron Microscope
ASTM D5756-02 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
ASTM D5756-95 Standard Test Method for Microvacuum Sampling and Indirect Analysis of Dust by Transmission Electron Microscopy for Asbestos Mass Concentration
ASTM F1467-99(2005)e1 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM F3139-15(2023) Standard Test Method for Analysis of Tin-Based Solder Alloys for Minor and Trace Elements Using Inductively Coupled Plasma Atomic Emission Spectrometry
ASTM E1588-95(2001) Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM E1588-08 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-10e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E1588-95 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy-Dispersive Spectroscopy
ASTM D7111-15 Standard Test Method for Determination of Trace Elements in Middle Distillate Fuels by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
ASTM D7111-16(2021) Standard Test Method for Determination of Trace Elements in Middle Distillate Fuels by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
ASTM F1227-89(1999) Test Method for Total Mass Loss of Materials and Condensation of Outgassed Volatiles on Microelectronics-Related Substrates (Withdrawn 2000)
ASTM E1588-20 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM D7111-16 Standard Test Method for Determination of Trace Elements in Middle Distillate Fuels by Inductively Coupled Plasma Atomic Emission Spectrometry (ICP-AES)
ASTM E1588-16 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM C1301-95 Standard Test Method for Major and Trace Elements in Limestone and Lime by Inductively Coupled Plasma-Atomic Emission Spectroscopy (ICP) and Atomic Absorption (AA)
ASTM C1301-22 Standard Test Method for Major and Trace Elements in Limestone and Lime by Inductively Coupled Plasma-Atomic Emission Spectroscopy (ICP) and Atomic Absorption (AA)
ASTM C1301-95(2009)e1 Standard Test Method for Major and Trace Elements in Limestone and Lime by Inductively Coupled Plasma-Atomic Emission Spectroscopy (ICP) and Atomic Absorption (AA)
ASTM E280-98(2004)e1 Standard Reference Radiographs for Heavy-Walled (4 &189; to 12-in. [114 to 305-mm]) Steel Castings
ASTM E1588-07e1 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-ray Spectrometry
ASTM E1588-07 Standard Guide for Gunshot Residue Analysis by Scanning Electron Microscopy/ Energy Dispersive X-ray Spectrometry
ASTM E280-21 Standard Reference Radiographs for Heavy-Walled (412 to 12 in. (114 to 305 mm)) Steel Castings
ASTM E2809-22 Standard Guide for Using Scanning Electron Microscopy/Energy Dispersive X-Ray Spectroscopy (SEM/EDS) in Forensic Polymer Examinations
ASTM E1588-16a Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM E1588-17 Standard Practice for Gunshot Residue Analysis by Scanning Electron Microscopy/Energy Dispersive X-Ray Spectrometry
ASTM D7201-06(2011) Standard Practice for Sampling and Counting Airborne Fibers, Including Asbestos Fibers, in the Workplace, by Phase Contrast Microscopy (with an Option of Transmission Electron Microscopy)
ASTM F1467-99 Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
ASTM F1467-99(2005) Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits

ES-UNE, Micro Electronic Weighing Spoon

UNE-EN ISO 9220:2022 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:2022)
UNE-EN ISO 21363:2022 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020) (Endorsed by Asociación Española de Normalización in February of 2022.)
UNE-EN ISO 19749:2023 Nanotechnologies - Measurements of particle size and shape distributions by scanning electron microscopy (ISO 19749:2021) (Endorsed by Asociación Española de Normalización in May of 2023.)
UNE-EN 160201:1997 BLANK DETAIL SPECIFICATION: MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY CAPABILITY APPROVAL (Endorsed by AENOR in July of 1998.)
UNE-EN IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies (Endorsed by Asociación Española de Normalización in June of 2020.)
UNE-EN 61788-16:2013 Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies (Endorsed by AENOR in May of 2013.)
UNE-EN 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies (Endorsed by AENOR in March of 2012.)
UNE-EN 160200-2:1997 SECTIONAL SPECIFICATION: MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY. PART 2: INDEX OF TEST METHODS (Endorsed by AENOR in July of 1998.)
UNE-EN 160200-1:1997 SECTIONAL SPECIFICATION: MICROWAVE MODULAR ELECTRONIC UNITS OF ASSESSED QUALITY. PART 1: CAPABILITY APPROVAL PROCEDURE (Endorsed by AENOR in July of 1998.)
UNE-EN 60835-2-5:1994 METHODS OF MEASUREMENT FOR EQUIPMENT USED IN DIGITAL MICROWAVE RADIO TRANSMISSION SYSTEMS. PART 2: MEASUREMENTS ON TERRESTRIAL RADIO-RELAY SYSTEMS. SECTION 5: DIGITAL SIGNAL PROCESSING SUB-SYSTEMS. (Endorsed by AENOR in May of 1995.)
UNE-EN 1071-4:2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA) (Endorsed by AENOR in April of 2006.)
UNE-EN ISO 20647:2021 Infant formula and adult nutritionals - Determination of minerals and trace elements - Inductively coupled plasma mass spectrometry (ICP-MS) method (ISO 20647:2015)

Guangdong Provincial Standard of the People's Republic of China, Micro Electronic Weighing Spoon

DB44/T 1935-2016 Determination of Trace Elements in Hair by Inductively Coupled Plasma-Atomic Emission Spectrometry

Professional Standard - Building Materials, Micro Electronic Weighing Spoon

JC/T 2132-2012 Determination of doped and trace elements in barium strontium titanate (BST).Inductively coupled plasma atomic emission spectrometric method

PH-BPS, Micro Electronic Weighing Spoon

PNS ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy

ESD - ESD ASSOCIATION, Micro Electronic Weighing Spoon

TR3.0-01-2002 Alternate Techniques for Measuring Ionizer Offset Voltage and Discharge Time (Formerly TR13-02)

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, Micro Electronic Weighing Spoon

GJB 950.3A-2008 Analysis methods for minor elements of precious metals and their alloys.Part 3:Determination of minor palladium ang rhodium in platinum alloys by inductively coupled plasma atomic emission spectrometric method
GJB 950.2A-2008 Analysis methods for minor elements of precious metals and their alloys.Part 2: Determination of minor gold and iron in platinum and platinum alloys, palladium alloys by inductively coupled plasma atomic emission sPedrometric method
GJB 950.1A-2008 Analysis methods for minor elements of precious metals and their alloys. Part 1: Determination of minor lead, antimony, bismuth, and iron in gold and gold alloys, silve and silve alloys, palladium alloys by inductively coupled plasma atomic emission spect

Professional Standard - Public Safety Standards, Micro Electronic Weighing Spoon

GA/T 909-2010 Collecting and packaging method for trace evidence-Gunshot residue(SEM/EDS examination)

Professional Standard - Electricity, Micro Electronic Weighing Spoon

DL/T 1474-2015 Method for measuring hydrophobicity of composite insulators used in AC and DC systems with nominal voltage higher than 1000V

AENOR, Micro Electronic Weighing Spoon

UNE-EN ISO 9220:1996 METALLIC COATINGS. MEASUREMENT OF COATING THICKNESS. SCANNING ELECTRON MICROSCOPE METHOD. (ISO 9220:1988).
UNE-EN 15111:2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry)
UNE-EN 15765:2010 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion
UNE-EN 60512-14-2:2007 Connectors for electronic equipment - Tests and measurements -- Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006).

Lithuanian Standards Office , Micro Electronic Weighing Spoon

LST EN ISO 9220:2001 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO 9220:1988)
LST EN 60512-1-4-2001 Electromechanical components for electronic equipment. Basic testing procedures and measuring methods. Part 1: General. Section 4: Test 1d: Contact protection effectiveness (scoop-proof) (IEC 60512-1-4:1997)
LST EN 61788-7-2007 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies (IEC 61788-7:2006)
LST EN 15111-2007 Foodstuffs - Determination of trace elements - Determination of iodine by ICP-MS (inductively coupled plasma mass spectrometry)
LST EN 15765-2010 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion
LST EN 61788-15-2012 Superconductivity -- Part 15: Electronic characteristic measurements -- Intrinsic surface impedance of superconductor films at microwave frequencies (IEC 61788-15:2011)
LST EN 60512-14-2-2006 Connectors for electronic equipment - Tests and measurements -- Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage (IEC 60512-14-2:2006)
LST EN 1071-4-2006 Advanced technical ceramics - Methods of test for ceramic coatings - Part 4: Determination of chemical composition by electron probe microanalysis (EPMA)
LST EN 60835-2-5-2002 Methods of measurement for equipment used in digital microwave radio transmission systems. Part 2: Measurements on terrestrial radio-relay systems. Section 5: Digital signal processing sub-system (IEC 60835-2- 5:1993)

AT-ON, Micro Electronic Weighing Spoon

OENORM EN ISO 9220:2021 Metallic coatings - Measurement of coating thickness - Scanning electron microscope method (ISO/DIS 9220:2021)
OENORM EN ISO 21363:2021 Nanotechnologies - Measurements of particle size and shape distributions by transmission electron microscopy (ISO 21363:2020)

Anhui Provincial Standard of the People's Republic of China, Micro Electronic Weighing Spoon

DB34/T 3803-2021 Determination of trace elements uranium and thorium in coal by inductively coupled plasma mass spectrometry

Professional Standard - Energy, Micro Electronic Weighing Spoon

NB/T 20215-2013 Type test of movable micro-fission chamber for pressurized water reactor nuclear power plants in-core neutron flux measurement
NB/T 11245-2023 Determination of Trace Elements in Solid Biomass Fuels by Inductively Coupled Plasma-Atomic Emission Spectrometry

Professional Standard - Coal, Micro Electronic Weighing Spoon

MT/T 1014-2006 Determination of major and miner elements in coal ash by Inductively Coupled Plasma.Atomic emission spectrometry

Professional Standard - Nuclear Industry, Micro Electronic Weighing Spoon

EJ/T 20170-2018 Determination of 20 trace impurity elements in metallic uranium by inductively coupled plasma atomic emission spectrometry

International Electrotechnical Commission (IEC), Micro Electronic Weighing Spoon

IEC 61788-7:2020 RLV Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
IEC 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements - Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage
IEC 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
IEC 60835-2-5:1993 Methods of measurement for equipment used in digital microwave radio transmission systems; part 2: measurements on terrestrial radio-relay systems; section 5: digital signal processing sub-system
IEC 60068-2-69:1995 Environmental testing - Part 2: Tests - Test Te: Solderability testing of electronic components for surface mount technology by the wetting balance method
IEC 60068-2-69:2007 Environmental testing - Part 2-69: Tests - Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method

European Committee for Electrotechnical Standardization（CENELEC）, Micro Electronic Weighing Spoon

EN IEC 61788-7:2020 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies
EN 61788-16:2013 Superconductivity - Part 16: Electronic characteristic measurements - Power-dependent surface resistance of superconductors at microwave frequencies
EN 160200-2:1997 Sectional Specification: Microwave Modular Electronic Units of Assessed Quality Part 2: Index of Test Methods
EN 60835-3-7:1995 Methods of Measurement for Equipment Used in Digital Microwave Radio Transmission Systems Part 3: Measurements on Satellite Earth Stations Section 7: Figure-of-Merit of Receiving System
EN 60068-2-69:2007 Environmental testing - Part 2-69: Tests - Test Te: Solderability testing of electronic components for surface mounting devices (SMD) by the wetting balance method
EN 60068-2-69:2017 Environmental testing - Part 2-69: Tests - Test Te/Tc: Solderability testing of electronic components and printed boards by the wetting balance (force measurement) method
EN 60835-2-5:1995 Methods of Measurement for Equipment Used in Digital Microwave Radio Transmission Systems Part 2: Measurements on Terrestrial Radio-Relay Systems Section 5: Digital Signal Processing Sub-System
EN 60512-14-2:2006 Connectors for electronic equipment - Tests and measurements Part 14-2: Sealing tests - Test 14b: Sealing - Fine air leakage

工业和信息化部, Micro Electronic Weighing Spoon

SH/T 1829-2020 Determination of trace element content in plastic polyethylene and polypropylene resins by inductively coupled plasma optical emission spectrometry

CENELEC - European Committee for Electrotechnical Standardization, Micro Electronic Weighing Spoon

EN 160201:1997 Blank Detail Specification: Microwave Modular Electronic Units of Assessed Quality Capability Approval
EN 61788-15:2011 Superconductivity - Part 15: Electronic characteristic measurements - Intrinsic surface impedance of superconductor films at microwave frequencies
EN 160200-1:1997 Sectional Specification: Microwave Modular Electronic Units of Assessed Quality Part 1: Capability Approval Procedure (Ratified European Text)
EN 60068-2-69:1996 Environmental Testing Part 2: Tests Test Te: Solderability Testing of Electronic Components for Surface Mount Technology by the Wetting Balance Method

Military Standard of the People's Republic of China-General Armament Department, Micro Electronic Weighing Spoon

GJB 950.1A-2021 Analysis methods of trace elements of precious metals and their alloys Part 1: Determination of trace amounts of lead, antimony, bismuth, iron, zinc and cadmium in gold and gold alloys, silver and silver alloys and palladium alloys by inductively coupled

CEN - European Committee for Standardization, Micro Electronic Weighing Spoon

EN 15765:2009 Foodstuffs - Determination of trace elements - Determination of tin by inductively coupled plasma mass spectrometry (ICP-MS) after pressure digestion
PD CEN/TS 15111:2005 Foodstuffs Determination of trace elements Determination of iodine in dietetic foods by ICP-MS (inductively coupled plasma mass spectrometry)

RO-ASRO, Micro Electronic Weighing Spoon

STAS 8293-1990 Industrial-process measurement and control. Differential relative and absolute pressure analogue electronic transducers. General technical requirements

Professional Standard - Agriculture, Micro Electronic Weighing Spoon

NY/T 4313-2023 Determination of Arsenic, Cadmium, Lead, Chromium, Copper and Zinc in Biogas Slurry Microwave Digestion-Inductively Coupled Plasma Mass Spectrometry

GOSTR, Micro Electronic Weighing Spoon

PNST 508-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by scanning electron microscopy and energy dispersive X-ray spectrometry
PNST 507-2020 Nanotechnologies. Single-wall carbon nanotubes. Characterization by using transmission electron microscopy and energy dispersive X-ray spectrometry

AT-OVE/ON, Micro Electronic Weighing Spoon

OVE EN IEC 61788-7:2021 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies ((IEC 61788-7:2020) EN IEC 61788-7:2020) (german version)