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Gauge film

Gauge film, Total:15 items.

In the international standard classification, Gauge film involves: Photography, Rubber and plastics products, Non-destructive testing.

Professional Standard - Machinery, Gauge film

• JB/T 4167-1999 Membrane type pneumatic measuring instrument

American Society for Testing and Materials (ASTM), Gauge film

• ASTM E2244-05 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2244-11 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2244-11(2018) Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2246-02 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2246-05 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2244-02 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2245-05 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2245-02 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2246-11 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2244-11e1 Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2245-11e1 Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer
• ASTM E2246-11e1 Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

American National Standards Institute （ANSI), Gauge film

• ANSI/ASTM D4272:1999 Plastic Film by Instrumented Dart Drop, Test Method for Impact Resistance of (08.03)

German Institute for Standardization, Gauge film

• PAS 1022-2004 Reference procedure for the determination of optical and dielectric material properties and the layer thickness of thin films by ellipsometry

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