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electron microscope description

electron microscope description, Total:7 items.

In the international standard classification, electron microscope description involves: Electronic display devices, Optical equipment, Mobile services, Physics. Chemistry.

American Society for Testing and Materials (ASTM), electron microscope description

• ASTM E986-04 Standard Practice for Scanning Electron Microscope Beam Size Characterization
• ASTM E986-04(2010) Standard Practice for Scanning Electron Microscope Beam Size Characterization

American National Standards Institute （ANSI), electron microscope description

• ANSI/TIA/EIA 664-000-A-2000 Wireless Features Description

International Organization for Standardization (ISO), electron microscope description

• ISO/TS 10798:2011 Nanotechnologies - Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
• ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements

Japanese Industrial Standards Committee (JISC), electron microscope description

• JIS K 0132:1997 General rules for scanning electron microscopy

Professional Standard - Commodity Inspection, electron microscope description

• SN/T 4388-2015 Leather identification.Scanning electron microscopy and optical microscopy

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