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cavity microwave

cavity microwave, Total:341 items.

In the international standard classification, cavity microwave involves: Electronic components in general, Components and accessories for telecommunications equipment, Electronic tubes, Magnetic materials, Integrated circuits. Microelectronics, Dentistry, Components for electrical equipment, Semiconductor devices, Analytical chemistry, Terminology (principles and coordination), Insulating fluids, Vocabularies, Insulating materials, Audio, video and audiovisual engineering, Electromechanical components for electronic and telecommunications equipment, Packaging materials and accessories, Rectifiers. Convertors. Stabilized power supply, Conducting materials, Equipment for petroleum and natural gas industries, Power stations in general, Testing of metals, Water quality, Fluid power systems, Wastes, Electricity. Magnetism. Electrical and magnetic measurements, Valves, Electrical and electronic testing, Radiation measurements, Geology. Meteorology. Hydrology, Electrical engineering in general, Piezoelectric and dielectric devices, Telecommunication systems.


Professional Standard - Electron, cavity microwave

  • SJ/T 10143-1991 Detail specification for electronic components--Semiconductor integrated circuits--CT54LS112/CT74LS112 dual J-K negative-edge flip-flop
  • SJ 1626-1980 Ferrite isolators and circulators (waveguide) intended for applications at microwave frequencies
  • SJ 1725-1981 Gas-filled microwave switching tubes,Type RX-61
  • SJ 980-1975 Gas-filled microwave switching tubes,Type RX-21
  • SJ 1724-1981 Gas-filled microwave switching tubes,Type RX-56
  • SJ 1726-1981 Gas-filled microwave switching tubes,Type RX-109
  • SJ 2008-1982 Gas-filled microwave switching tubes,Type RX-5
  • SJ 2244-1982 Gas-filled microwave switching tubes,Type RX-54
  • SJ 2245-1982 Gas-filled microwave switching tubes,Type RX-7
  • SJ 2009-1982 Gas-filled microwave switching tubes,Type RX-49
  • SJ 1723-1981 Gas-filled microwave switching tubes,Type RX-32
  • SJ/T 11077-1996 Guidelines for the drafting of specifications for microwave ferrites
  • SJ 343-1973 Generic specification for gas-filled microwave switching tubes
  • SJ 2246-1982 Gas-filled microwave switching tubes,Type RX-202, RX-203
  • SJ/T 11263-2002 Sectional specification for permanent ferrite magnets for microwave oven magnetron
  • SJ 20514-1995 Specification for silicon epitaxial wafer for microwave power transistor
  • SJ 50033.48-1994 Semiconductor discrete device.Detail specification for type 2DV8CP silicon microwave detector diode
  • SJ 1625-1980 Ferrite isolators and circulators (coaxial) intended for applications at microwave frequencies
  • SJ 2915-1988 Terms and definitions for single crystal microwave ferrite devices
  • SJ 2405-1983 Generic specification for hold type ferrite switch intended for applications at microwave frequencies
  • SJ 50033/77-1995 Semiconductor discrete devices.Detail specification for type 3DA331 Silicon microwave power transistor
  • SJ 50033/74-1995 Semiconductor discrete devices.Detail specification for type 3DA325 silicon microwave power transistor
  • SJ 50033/155-2002 Semiconductor discrete devices Detail specification for type 3DG252 silicon microwave linearity transistor
  • SJ/T 11414-2010 Dimensions and tolerances of permanent magnet ferrite for microwave oven magnetron
  • SJ 50033/76-1995 Semiconductor discrete devices.Detail specification for type 3DG218 Silicon microwave low-noise transistor
  • SJ 20155-1992 General specification for radio frequency radiation absorber(microwave absorbing material)
  • SJ 1624-1980 Generic specification for ferrite isolators and circulators intended for applications at microwave frequency
  • SJ/T 10214-1991 Measuring method for demagnetized state permeability of microwave ferrite materials
  • SJ 50033/170-2007 Semiconductor discrete devices Detail specification for type 3DA516 silicon microwave pulse power transistor
  • SJ 50033/171-2007 Semiconductor discrete devices Detail specification for type 3DA518 silicon microwave pulse power transistor
  • SJ 50033/172-2007 Semiconductor discrete devices Detail specification for type 3DA519 silicon microwave pulse power transistor
  • SJ 50033/173-2007 Semiconductor discrete devices Detail specification for type 3DA520 silicon microwave pulse power transistor
  • SJ 50033/176-2007 Semiconductor discrete devices Detail specification for type 3DA523 silicon microwave pulse power transistor
  • SJ 50033/169-2004 Semiconductor discrete devices Detail specification for type 3DA510 silicon microwave polse power transistor
  • SJ 50033/168-2004 Semiconductor discrete devices Detail specification for type 3DA509 silicon microwave pulse power transistor
  • SJ 50033/166-2004 Semiconductor discrete devices Detail specification for type 3DA507 silicon microwave pulse power transistor
  • SJ 50033/174-2007 Semiconductor discrete devices Detail specification for type 3DA521 silicon microwave pulse power transistor
  • SJ 50033/156-2002 Semiconductor discrete devices Detail specification for type 3DA505 silicon microwave pulse power transistor
  • SJ 50033/167-2004 Seiconductor discrete devices Detail specification for type 3DA508 silicon microwave pulse power transistor
  • SJ 50033/175-2007 Semiconductro discrete devices Detail specification for type 3DA522 silicon microwave pulse power transistor
  • SJ 50033/145-2000 Semiconductor discrete devices.Detail specification for type 3DA503 silicon microwave pulse power transistor
  • SJ 50033/157-2002 Semiconductor discrete devices Detail specification for type 3DA506 silicon microwave pulse power transistor
  • SJ 2748-1987 Blank detail specification for single-gate low noise microwave FETs
  • SJ 50033/140-1999 Semiconductor discrete devices Detail specification for type 3DA502 silicon microwave pulse power transistor
  • SJ 50033/42-1994 Semiconductor discrete device.Detail specification for type CSO467 GaAs microwave FET
  • SJ 50033/78-1995 Semiconductor discrete devices.Detail specification for type CS0464 GaAs microwave FET
  • SJ 50033/153-2002 Semiconductor discrete devices Detail specification for type 2CK141 microwave switch diode
  • SJ 50033/152-2002 Semiconductor discrete devices Detail specification for type 2CK140 microwave switch diode
  • SJ 50033/79-1995 Semiconductor discrete devices.Detail specification for type CS0536 GaAs microwave power FET
  • SJ 50033/120-1997 Semiconductor discrete devices Detail specification for type CS205 GaAs microwave power field effect transistor
  • SJ 50033.51-1994 Semiconductor discrete devices.Detail specification for type CS0558 GaAs microwave dual gate FET
  • SJ 50033.52-1994 semiconductor discrete device.Detail specification for type CS0529 GaAs microwave Power field effect transistor
  • SJ 50033.54-1994 Semiconductor discrete device.Detail specification for type CS0532 GaAs microwave power field effect transistor
  • SJ 50033/119-1997 Semiconductor discrete devices Detail specification for type CS204 GaAs microwave power field effect transistor
  • SJ 50033/81-1995 Semiconductor discrete devices.Detail specification for type CS0524 GaAs microwave power FET
  • SJ 50033/80-1995 Semiconductor discrete devices.Detail specification for type CS0513 GaAs microwave power FET
  • SJ 50033.53-1994 Semiconductor discrete device.Detail specification for type CS0530 and CS0531 GaAs microwave Power field effect transistor
  • SJ 50033/106-1996 semiconductor discrete device.Detail specification for type CS203 GaAs microwave Low noise field effect transistor
  • SJ 20512-1995 Test methods for permittivity and permeability of microwave high loss solid materials

Military Standard of the People's Republic of China-General Armament Department, cavity microwave

  • GJB 8513-2015 General specification for cavity filters
  • GJB 9150-2017 Microwave parameter testing method for microwave power transistors
  • GJB 3158-1998 General specification for bulk acoustic microwave delay lines
  • GJB 2276-1995 Specification for microwave absorbers for waveguide dummy loads
  • GJB 1933-1994 General specification for microwave ferrite switches
  • GJB 1933A-2011 General specification for microwave ferrite switches
  • GJB 3235-1998 General specification for microwave ferrite phase shifters
  • GJB 3235A-2011 General speicification for microwave ferrite phase shifters
  • GJB 3492-1998 General specifications for microwave solid-state power amplifiers
  • GJB 9340-2018 Satellite microwave imaging system satellite-ground integration index system
  • GJB 1557A-2021 Semiconductor discrete device microwave diode dimensions
  • GJB 1557-1992 Semiconductor discrete device microwave diode dimensions
  • GJB/Z 41.1-1993 Military semiconductor discrete device series spectrum microwave diodes
  • GJB 33/24-2021 Detailed Specification for CS0406-10 Silicon Field Effect Microwave Pulse Power Transistor
  • GJB 33/25-2021 Detailed Specification for CS0406-350 Silicon Field Effect Microwave Pulse Power Transistor

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, cavity microwave

  • GB/T 7265.2-1987 Test method for the complex permittivity of solid dielectric materials at microwave frequencies--
  • GB 7265.2-1987 Test method of microwave complex permittivity of solid dielectric "open cavity" method
  • GB/T 42836-2023 Microwave semiconductor integrated circuit mixer
  • GB/T 42837-2023 microwave semiconductor integrated circuit amplifier
  • GB/T 21039.1-2007 Semiconductor devices Discrete devices Part 4-1: Microwave diodes and transistors-Microwave field effect transistors Blank detail specification
  • GB/T 5832.3-2011 Determination of moisture in gases.Part 3:The method of Cavity Ring-Down Spectroscopy
  • GB 7265.1-87 Test method for complex permittivity of solid dielectric materials at microwave frequencies--Perturbation method
  • GB/T 7265.1-1987 Test method for complex permittivity of solid dielectric materials at microwave frequencies--Perturbation method
  • GB 7265.1-1987 Test Method for Microwave Complex Permittivity of Solid Dielectric Perturbation Method
  • GB/T 9534-1988 Test method for complex permittivity of solid dielectric materials at millimeter wave frequencies using "Quasi-Optic cavity" technique
  • GB/T 19404-2003 Microwave ferrite components-measuring methods for major properties
  • GB/T 5597-1999 Test method for complex permittivity of solid dielectric materials at microwave frequencies
  • GB/T 20516-2006 Semiconductor devices. discrete devices. Part 4: Microwave devices
  • GB/T 20870.1-2007 Semiconductor devices Part 16-1 Microwave integrated circuits Amplifiers
  • GB/T 20870.5-2023 Semiconductor Devices Part 16-5: Microwave Integrated Circuit Oscillators
  • GB/T 20870.2-2023 Semiconductor Devices Part 16-2: Microwave Integrated Circuit Prescalers
  • GB/T 16481-1996 Standard spectrum tables of microwave plasma torch-atomic emitting spectrum of rare earth
  • GB/T 42709.7-2023 Semiconductor devices microelectromechanical devices Part 7: MEMS bulk acoustic wave filters and duplexers for radio frequency control and selection
  • GB/T 9533-1988 Test method for dielectric properties of microwave solid dielectric materials Coaxial terminal short circuit method
  • GB/T 20870.10-2023 Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures

PL-PKN, cavity microwave

  • PN T06561-1971 Microwave measuring instruments Cavity wavemeter General requirements and tests

Group Standards of the People's Republic of China, cavity microwave

  • T/CSTM 00751-2022 Measurement of dielectric properties of solid-state dielectric materials in microwave frequency range—The closed cavity method
  • T/BEA 40002-2022 Calibration Specification for Microwave ECR Plasma Generator
  • T/CNFIA 166-2023 Microwaveable aseptic paper-based composite packaging for liquid food
  • T/CAB 0154-2022 Microwavable paper-based laminated material for aseptic packaging of liquid food
  • T/GVS 006-2022 Method of measuring output deviation stability for semiconductor RF power supply and microwave power supply
  • T/NAIA 0137-2022 Determination of Iron and Arsenic in Industrial Sulfur by Microwave Digestion-Inductively Coupled Plasma Emission Spectrometry

Professional Standard - Aerospace, cavity microwave

  • QJ 2617-1994 Acceptance specification for microwave field effect transistor (microwave FET) package
  • QJ 2300-1992 Microwave Ferrite Materials and Device Series Type Spectrum

IET - Institution of Engineering and Technology, cavity microwave

AENOR, cavity microwave

  • UNE 20585:1977 GUIDE FOR THE DRAFTING OF SPECIFICATIONS FOR MICROWAVE FERRITES
  • UNE-ISO 13689:2005 Refrigerated light hydrocarbon fluids -- Measurement of liquid levels in tanks containing liquefied gases -- Microwave-type level gauge.

Jilin Provincial Standard of the People's Republic of China, cavity microwave

  • DB22/T 2532-2016 Operating procedures for the use of miniscrew implants in orthodontic treatment

Association Francaise de Normalisation, cavity microwave

International Electrotechnical Commission (IEC), cavity microwave

Danish Standards Foundation, cavity microwave

  • DS/EN 61609:1999 Microwave ferrite components - Guide for the drafting of specifications
  • DS/EN 61830:1998 Microwave ferrite components - Measuring methods for major properties
  • DS/EN 60747-16-4/A1:2011 Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
  • DS/EN 60747-16-4:2004 Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches
  • DS/EN 60747-16-1/A1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • DS/EN 60747-16-1:2002 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers
  • DS/EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • DS/EN 60747-16-3/A1:2009 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • DS/EN 60747-16-3:2002 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters
  • DS/ISO 11350:2012 Water quality - Determination of the genotoxicity of water and waste water - Salmonella/microsome fluctuation test (Ames fluctuation test)
  • DS/EN 61788-7:2007 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
  • DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

German Institute for Standardization, cavity microwave

  • DIN EN 61609:1999 Microwave ferrite components - Guide for the drafting of specifications (IEC 61609:1996); German version EN 61609:1999
  • DIN EN 61830:1998 Microwave ferrite components - Measuring methods for major properties (IEC 61830:1997); German version EN 61830:1998
  • DIN EN 61830:1998-10 Microwave ferrite components - Measuring methods for major properties (IEC 61830:1997); German version EN 61830:1998
  • DIN EN 61609:1999-12 Microwave ferrite components - Guide for the drafting of specifications (IEC 61609:1996); German version EN 61609:1999
  • DIN EN 60747-16-4:2018-04 Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004 + A1:2009 + A2:2017); German version EN 60747-16-4:2004 + A1:2011 + A2:2017 / Note: DIN EN 60747-16-4 (2011-08) remains valid alongside this standard until...
  • DIN EN 60747-16-1:2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 + A1:2007); German version EN 60747-16-1:2002 + A1:2007
  • DIN EN 60747-16-5:2021-08 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013 + A1:2020 + COR1:2020); German version EN 60747-16-5:2013 + A1:2020 / Note: DIN EN 60747-16-5 (2014-04) remains valid alongside this standard until 2023...
  • DIN EN IEC 60747-16-6:2021-08 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (IEC 60747-16-6:2019); German version EN IEC 60747-16-6:2019
  • DIN EN 60747-16-1:2017-10 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001 - A1:2007 - A2:2017); German version EN 60747-16-1:2002 + A1:2007 + A2:2017 / Note: DIN EN 60747-16-1 (2007-10) remains valid alongside this standard unt...
  • DIN EN 60747-16-3:2018-04 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009 + A2:2017); German version EN 60747-16-3:2002 + A1:2009 + A2:2017 / Note: DIN EN 60747-16-3 (2009-11) remains valid alongside this st...
  • DIN EN IEC 60747-16-9:2022 Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English
  • DIN EN 60747-16-5/A1:2019 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 47E/649/CD:2019); Text in German and English
  • DIN EN IEC 60747-16-7:2021-07 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 47E/734/CD:2020); Text in English / Note: Date of issue 2021-06-04
  • DIN EN IEC 60747-16-9:2022-06 Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters (IEC 47E/768/CD:2021); Text in German and English / Note: Date of issue 2022-05-27
  • DIN EN IEC 60747-16-8:2021-07 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (IEC 47E/735/CD:2020); Text in English / Note: Date of issue 2021-06-04
  • DIN EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
  • DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004

British Standards Institution (BSI), cavity microwave

  • BS EN 60747-16-4:2004+A2:2017 Semiconductor devices - Microwave integrated circuits. Switches
  • BS EN 61609:1999 Microwave ferrite components. Guide for the drafting of specifications
  • BS EN 60747-16-1:2002+A1:2007 Semiconductor devices — Part 16-1: Microwave integrated circuits — Amplifiers
  • BS EN 60747-16-4:2004+A1:2011 Semiconductor devices. Microwave integrated circuits. Switches
  • BS EN 60747-16-5:2013 Semiconductor devices. Microwave integrated circuits. Oscillators
  • BS EN IEC 60747-16-6:2019 Semiconductor devices. Microwave integrated circuits. Frequency multipliers
  • BS EN 60747-16-1:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Amplifiers
  • BS EN 60747-16-3:2002+A2:2017 Semiconductor devices - Microwave integrated circuits. Frequency converters
  • BS EN 60747-16-5:2013+A1:2020 Semiconductor devices - Microwave integrated circuits. Oscillators
  • BS IEC 60747-4:2008 Semiconductor devices - Discrete devices - Microwave diodes and transistors
  • BS IEC 60747-4:2007+A1:2017 Semiconductor devices. Discrete devices - Microwave diodes and transistors
  • BS EN 60747-16-4:2004 Discrete semiconductor devices - Microwave integrated circuits - Switches
  • BS EN 61830:1998 Microwave ferrite components. Measuring methods for major properties
  • BS IEC 60747-16-2:2001 Semiconductor devices. Microwave integrated circuits. Frequency prescalers
  • BS EN 60747-16-3:2002+A1:2009 Semiconductor devices — Part 16-3: Microwave integrated circuits — Frequency converters
  • BS 6493 Sec.1.4:1992 Semiconductor devices. Discrete devices. Recommendations for microwave diodes and transistors
  • BS EN 60747-16-3:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Frequency converters
  • BS EN 60747-16-10:2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
  • BS EN 61788-7:2002 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
  • BS EN 61788-7:2007 Superconductivity - Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
  • BS EN 60747-16-1:2002 Discrete semiconductor devices and integrated circuits - Microwave integrated circuits - Amplifiers
  • BS EN IEC 61788-7:2020 Superconductivity - Electronic characteristic measurements. Surface resistance of high-temperature superconductors at microwave frequencies
  • 21/30436870 DC BS IEC 60747-16-9. Semiconductor devices - Part 16-9. Microwave integrated circuits. Phase shifters
  • 20/30414411 DC BS EN 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators
  • 20/30414415 DC BS EN 60747-16-8. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters
  • 20/30431960 DC BS EN 60747-16-8. Semiconductor devices. Part 16-8. Microwave integrated circuits. Limiters
  • BS EN 61788-16:2013 Superconductivity. Electronic characteristic measurements. Power-dependent surface resistance of superconductors at microwave frequencies
  • BS EN 61788-15:2011 Superconductivity. Electronic characteristic measurements. Intrinsic surface impedance of superconductor films at microwave frequencies
  • BS EN 61788-7:2006 Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
  • 20/30431959 DC BS EN IEC 60747-16-7. Semiconductor devices. Part 16-7. Microwave integrated circuits. Attenuators
  • 19/30393894 DC BS EN 60747-16-5 AMD1. Semiconductor devices. Part 16-5. Microwave integrated circuits. Oscillators
  • 23/30472390 DC BS EN 60747-16-11 Semiconductor devices - Part 16-11. Microwave integrated circuits - Power detectors
  • BS DD IEC/PAS 61338-1-5:2010 Waveguide type dielectric resonators - General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
  • BS EN 61338-1-5:2015 Waveguide type dielectric resonators. General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

ES-UNE, cavity microwave

  • UNE-EN 61609:1999 MICROWAVE FERRITE COMPONENTS. GUIDE FOR THE DRAFTING OF SPECIFICATIONS (Endorsed by AENOR in June of 1999.)
  • UNE-EN 61830:1998 MICROWAVE FERRITE COMPONENTS. MEASURING METHODS FOR MAJOR PROPERTIES. (Endorsed by AENOR in June of 1998.)
  • UNE-EN 60747-16-4:2004 Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in November of 2004.)
  • UNE-EN 60747-16-4:2004/A1:2011 Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (Endorsed by AENOR in April of 2011.)
  • UNE-EN 60747-16-4:2004/A2:2017 Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
  • UNE-EN 60747-16-1:2002 Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (Endorsed by AENOR in July of 2002.)
  • UNE-EN IEC 60747-16-7:2023 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN IEC 60747-16-8:2023 Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters (Endorsed by Asociación Española de Normalización in February of 2023.)
  • UNE-EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by Asociación Española de Normalización in October of 2020.)
  • UNE-EN IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers (Endorsed by Asociación Española de Normalización in October of 2019.)
  • UNE-EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (Endorsed by AENOR in October of 2013.)
  • UNE-EN 60747-16-3:2002 Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters. (Endorsed by AENOR in December of 2002.)
  • UNE-EN 60747-16-3:2002/A1:2009 Semiconductor devices -- Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by AENOR in July of 2009.)
  • UNE-EN 60747-16-3:2002/A2:2017 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (Endorsed by Asociación Española de Normalización in January of 2018.)
  • UNE-EN 60747-16-1:2002/A1:2007 Semiconductor devices -- Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007). (Endorsed by AENOR in May of 2007.)
  • UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)

Korean Agency for Technology and Standards (KATS), cavity microwave

  • KS C IEC 60747-4-1-2002(2017) Semiconductor devices-Discrete devices-Part 4-1:Microwave diodes and transistors-Microwave field effect transistors-Blank detail specification
  • KS C IEC 60747-4-1:2002 Semiconductor devices-Discrete devices-Part 4-1:Microwave diodes and transistors-Microwave field effect transistors-Blank detail specification
  • KS C 2123-1997(2002) MEASURING METHODS FOR FERRITE CORES FOR MICROWAVE DEVICES
  • KS C 2123-1982 MEASURING METHODS FOR FERRITE CORES FOR MICROWAVE DEVICES
  • KS C 6111-5-2008(2018) Measurements of the thickness of superconductor films at microwave frequencies
  • KS C IEC 60747-4-2-2002(2022) Semiconductor devices-Discrete devices-Part 4-2:Microwave diodes and transistors-Integrated-circuit microwave amplifiers-Blank detail specification
  • KS C IEC 60747-4-2-2002(2017) Semiconductor devices-Discrete devices-Part 4-2:Microwave diodes and transistors-Integrated-circuit microwave amplifiers-Blank detail specification
  • KS C IEC 60747-4:2006 Semiconductor devices-Discrete devices-Part 4:Microwave diodes and transistors
  • KS C IEC 60747-4:2017 Semiconductor devices-Discrete devices-Part 4:Microwave diodes and transistors
  • KS C IEC 60747-4:2022 Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors
  • KS C IEC 60747-4-2:2002 Semiconductor devices-Discrete devices-Part 4-2:Microwave diodes and transistors-Integrated-circuit microwave amplifiers-Blank detail specification
  • KS C 6111-4-2007(2017) Homogeneity in the surface resistance of large high-Tc superconductor films at microwave frequencies
  • KS M ISO 13689-2003(2008) Refrigerated light hydrocarbon fluids-Measurement of liquid levelsin tanks containing liquefied gases-Microwave-type level gauge
  • KS C 6111-3-2007(2022) Electronic characteristic measurements-Intrinsic surface impedance of high-TC superconductor films at microwave frequencies

Guangdong Provincial Standard of the People's Republic of China, cavity microwave

Professional Standard - Environmental Protection, cavity microwave

  • HJ 765-2015 Waste solid-Distilling of organic compound - Microwave extraction
  • HJ 702-2014 Solid Waste— Determination of Mercury, Arsenic, Selenium, Bismuth, Antimony— Microwave Dissolution / Atomic Fluorescence Spectrometry

Japanese Industrial Standards Committee (JISC), cavity microwave

  • JIS C 2565:1992 Measuring methods for ferrite cores for microwave device
  • JIS B 8356-6:2011 Hydraulic fluid power -- Filters -- Evaluation of filter performance -- Part 6: Filter elements -- Determination of resistance to flow fatigue using particulate contaminant
  • JIS H 7307:2005 Superconductivity -- Part 7: Electoronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies
  • JIS H 7307:2010 Superconductivity -- Part 7: Electronic characteristic measurements -- Surface resistance of superconductors at microwave frequencies

IECQ - IEC: Quality Assessment System for Electronic Components, cavity microwave

  • QC 750115-2000 Semiconductor Devices - Discrete Devices - Part 4-1: Microwave Diodes and Transistors - Microwave Field Effect Transistors - Blank Detail Specification (IEC 60747-4-1:2000)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, cavity microwave

  • GB/T 35679-2017 Measuring method for electromagnetic parameters of solid materials at microwave frequencies using waveguide
  • GB/T 22586-2018 Electronic characteristic measurements—Surface resistance of superconductors at microwave frequencies
  • GB/T 35680-2017 Measuring method for electromagnetic parameters of liquid materials at microwave frequencies using an open-ended coaxial probe

European Committee for Electrotechnical Standardization(CENELEC), cavity microwave

  • EN 61609:1999 Microwave Ferrite Components Guide for the Drafting of Specifications
  • EN 61830:1998 Microwave Ferrite Components Measuring Methods for Major Properties
  • EN 60747-16-5:2013 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • EN 60747-16-5:2013/A1:2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators
  • EN IEC 60747-16-6:2019 Semiconductor devices - Part 16-6: Microwave integrated circuits - Frequency multipliers
  • EN 60747-16-4:2004 Semiconductor devices Part 16-4: Microwave integrated circuits - Switches (Incorporates Amendment A1: 2011)
  • EN 61788-7:2006 Superconductivity Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies
  • EN 60747-16-3:2002 Semiconductor devices Part 16-3: Microwave integrated circuits - Frequency converters (Incorporates Amendment A1: 2009)

Professional Standard - Radio Television Film, cavity microwave

  • GY/T 4-1982 Transmission system for microwave relay circuits dedicated to broadcasting and television

Lithuanian Standards Office , cavity microwave

  • LST EN 61609-2001 Microwave ferrite components. Guide for the drafting of specifications (IEC 61609:1996)
  • LST EN 61830-2001 Microwave ferrite components. Measuring methods for major properties (IEC 61830:1997)
  • LST EN 60747-16-4-2004 Semiconductor devices. Part 16-4: Microwave integrated circuits. Switches (IEC 60747-16-4:2004)
  • LST EN 60747-16-3-2003 Semiconductor devices. Part 16-3: Microwave integrated circuits. Frequency converters (IEC 60747-16-3:2002)
  • LST EN 60747-16-1-2003 Semiconductor devices. Part 16-1: Microwave integrated circuits. Amplifiers (IEC 60747-16-1:2001)
  • LST EN 60747-16-4-2004/A1-2011 Semiconductor devices -- Part 16-4: Microwave integrated circuits - Switches (IEC 60747-16-4:2004/A1:2009)
  • LST EN 60747-16-3-2003/A1-2009 Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002/A1:2009)
  • LST EN 60747-16-1-2003/A1-2007 Semiconductor devices - Part 16-1: Microwave integrated circuits - Amplifiers (IEC 60747-16-1:2001/A1:2007)
  • LST EN 60747-16-5/A1-2020 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (IEC 60747-16-5:2013/A1:2020)

American National Standards Institute (ANSI), cavity microwave

Defense Logistics Agency, cavity microwave

RO-ASRO, cavity microwave

KR-KS, cavity microwave

  • KS C IEC 60747-4-2017 Semiconductor devices-Discrete devices-Part 4:Microwave diodes and transistors
  • KS C IEC 60747-4-2022 Semiconductor devices — Discrete devices — Part 4: Microwave diodes and transistors

未注明发布机构, cavity microwave

  • BS IEC 60747-4:2007+A1:2017(2020) Semiconductor devices — Discrete devices Part 4 : Microwave diodes and transistors
  • BS ISO 13689:2001 Refrigerated light hydrocarbon fluids — Measurement of liquid levels in tanks containing liquefied gases — Microwave - type level gauge

RU-GOST R, cavity microwave

  • GOST R 50730.2-1995 Microwave ferrite devices. Methods of measurement of losses at high power level
  • GOST R 50730.5-1995 Microwave ferrite devices. Methods of measurement of voltage standing wave ratio (VSWR) and maximum VSWR at high power level
  • GOST R 50730.1-1995 Microwave ferrite devices. General requirements for measurement of parametres at high power level
  • GOST R 50730.4-1995 Microwave ferrite devices. Methods of measurement of phase shift at high power level
  • GOST R 50730.3-1995 Microwave ferrite devices. Methods of measurement of return losses and isolation at high power level
  • GOST R 8.623-2006 State system for ensuring the uniformity of measurements. Relative dielectric permittivity and the loss tangent of solid dielectrics. Procedures of measurements at microwave frequencies

Professional Standard - Electricity, cavity microwave

  • DL/T 1370-2014 Determination of elemental composition in limestone Method for determination by microwave digestion-inductively coupled plasma atomic emission spectrometry (ICP-AES)

American Society for Testing and Materials (ASTM), cavity microwave

  • ASTM D6010-96 Standard Practice for Closed Vessel Microwave Solvent Extraction of Organic Compounds from Solid Matrices
  • ASTM D5568-14 Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide
  • ASTM D5568-22 Standard Test Method for Measuring Relative Complex Permittivity and Relative Magnetic Permeability of Solid Materials at Microwave Frequencies Using Waveguide

Shandong Provincial Standard of the People's Republic of China, cavity microwave

  • DB37/T 4542-2022 Determination of hexavalent chromium in solid waste by microwave digestion-inductively coupled plasma emission spectrometry

AT-OVE/ON, cavity microwave

  • OVE EN 60747-16-5-2021 Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators (german version)
  • OVE EN IEC 60747-16-7:2021 Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators (IEC 47E/757/CDV) (english version)

United States Navy, cavity microwave

IEC - International Electrotechnical Commission, cavity microwave

  • IEC 60747-16-4:2017 Semiconductor devices – Part 16-4: Microwave integrated circuits – Switches (Edition 1.2; Consolidated Reprint)
  • IEC 60747-16-3:2017 Semiconductor devices – Part 16-3: Microwave integrated circuits – Frequency converters (Edition 1.2; Consolidated Reprint)

CENELEC - European Committee for Electrotechnical Standardization, cavity microwave

  • EN 61788-7:2002 Superconductivity Part 7: Electronic characteristic measurements - Surface resistance of superconductors at microwave frequencies

International Organization for Standardization (ISO), cavity microwave

  • ISO 3724:2007 Hydraulic fluid power - Filter elements - Determination of resistance to flow fatigue using particulate contaminant

Professional Standard - Ocean, cavity microwave

  • HY/T 132-2010 Pretreatment guideline of heavy metals analysis in the marine sediments and organisms-Microwave assisted acid digestion

Qinghai Provincial Standard of the People's Republic of China, cavity microwave

  • DB63/T 1871-2020 Determination of Seven Metal Elements in Forage Grass by Microwave Digestion/Inductively Coupled Plasma Mass Spectrometry

Professional Standard - Post and Telecommunication, cavity microwave

  • GF 008.5-1994 Technical index system for maintenance of telecommunication network [Volume Five] Technical indices for maintenance of microwave circuit and equipment




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