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scanning electron analysis
scanning electron analysis, Total:34 items.
In the international standard classification, scanning electron analysis involves: Optical equipment, Analytical chemistry, Education, Vocabularies.
Korean Agency for Technology and Standards (KATS), scanning electron analysis
International Organization for Standardization (ISO), scanning electron analysis
- ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 16700:2016 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- ISO 22493:2014 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO 22493:2008 Microbeam analysis - Scanning electron microscopy - Vocabulary
- ISO/TS 21383:2021 Microbeam analysis - Scanning electron microscopy - Qualification of the scanning electron microscope for quantitative measurements
- ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- ISO 21466:2019 Microbeam analysis — Scanning electron microscopy — Method for evaluating critical dimensions by CD-SEM
Association Francaise de Normalisation, scanning electron analysis
- NF X21-005:2006 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification.
- NF X21-010:2009 Microbeam analysis - Scanning electron microscopy - Vocabulary.
- XP X21-015*XP ISO/TS 24597:2011 Microbeam analysis - Scanning electron microscopy - Methods of evaluating image sharpness
- XP ISO/TS 24597:2011 Analyse par microfaisceaux - Microscopie électronique à balayage - Méthodes d'évaluation de la netteté d'image
British Standards Institution (BSI), scanning electron analysis
- BS ISO 16700:2004 Microbeam analysis - Scanning electron microscopy - Guidelines for calibrating image magnification
- BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
- BS ISO 21466:2019 Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CDSEM
- 18/30319114 DC BS ISO 20171. Microbeam analysis. Scanning electron microscopy. Tagged image file format for Scanning electron microscopy(TIFF/SEM)
- 18/30344520 DC BS ISO 21466. Microbeam analysis. Scanning electron microscopy. Method for evaluating critical dimensions by CD-SEM
- BS ISO 16700:2016 Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, scanning electron analysis
- GB/T 33834-2017 Microbeam analysis—Scanning electron microscopy—Scanning electron microscope analysis of biological specimens
- GB/T 33838-2017 Microbeam analysis—Scanning electron microscopy—Methods of evaluating image sharpness
Professional Standard - Education, scanning electron analysis
- JY/T 0584-2020 General Rules for Analytical Methods of Scanning Electron Microscopy
- JY/T 010-1996 General principles of analytical scanning electron microscopy
Professional Standard - Petroleum, scanning electron analysis
- SY/T 5162-2014 Analytical method of rock sample by scanning electron microscope
- SY/T 5162-1997 Analytical method of rock sample by scanning electron microscope
- SY 5162-2014 Scanning Electron Microscopy Analysis Method for Rock Samples
国家能源局, scanning electron analysis
- SY/T 5162-2021 Scanning electron microscopy analysis method of rock samples
General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, scanning electron analysis
- GB/T 18295-2001 Analysis method of sandstone sample of petroleum and gas reservoir by scanning electron microscope
- GB/T 23414-2009 Microbeam analysis.Scanning electron microscopy.Vocabulary
KR-KS, scanning electron analysis
Japanese Industrial Standards Committee (JISC), scanning electron analysis
- JIS K 0149-1:2008 Microbeam analysis -- Scanning electron microscopy -- Guidelines for calibrating image magnification