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behind the polarimeter

behind the polarimeter, Total:196 items.

In the international standard classification, behind the polarimeter involves: Optics and optical measurements, Road engineering, Medical equipment, Radiation measurements, Dentistry, Analytical chemistry, Linear and angular measurements, Radiation protection, Optical equipment, Technical drawings, Products of the chemical industry, Geology. Meteorology. Hydrology, Optoelectronics. Laser equipment, External sewage systems, General methods of tests and analysis for food products, Graphic technology, Woodworking equipment, Surface treatment and coating, Resistors.

Professional Standard - Machinery, behind the polarimeter

JB/T 5593-1991 Polarimeter
JB/T 9320-1999 Plane-gratings spectrographs
JB/T 8231-1999 The basic parameters of the plane-gratings spectrographs
JB/T 8204-1996 Rolling bearing laser ball surface roughness measuring instrument

IN-BIS, behind the polarimeter

IS 8661-1977

National Metrological Verification Regulations of the People's Republic of China, behind the polarimeter

JJG 536-2015 Verification Regulation of Polarimeter and Polarimetric Saccharimeters
JJG 536-1998 Verification Regulation of Polarimeter and Saccharimeter
JJG(交通) 086-2007 Auto-detect Meter of Back-insert Type for Road Denection
JJG(交通) 076-2010 Vehicle Bearing Road Laser Rut-meter
JJG 交通076-2010 Vehicle-mounted road surface laser rutting instrument
JJG(交通) 075-2010 Vehicle Bearing Road Laser Profilometer
JJG 交通075-2010 Vehicle-mounted road surface laser roughness meter
JJG(地质) 1011-1990 Verification regulations for one-meter planar grating spectrograph
JJG(地质) 1012-1990 Verification rules for two-meter planar grating spectrograph
JJG(交通) 076-2007 Vehicle bearing road laser rut-meter
JJG 076-2010 Verification rules for vehicle-mounted road laser rutting instrument
JJG(交通) 075-2007 Vehicle bearing road laser profilometer
JJG 075-2010 Verification regulations for vehicle-mounted road surface laser roughness meter

National Metrological Technical Specifications of the People's Republic of China, behind the polarimeter

JJF 1573-2016 Program of Pattern Evaluation of Polarimeters and Polarimetric saccharimeters
JJF 1929-2021 Calibration Specification for Rotating Disc Electrode Atomic Emission Spectrometers
JJF 2007-2022 Calibration Specification for Optical Fiber End-Face Interferometers
JJF 1406-2013 Calibration Specification for Terrestrial Laser Scanners
JJF 1739-2019 Calibration Specification for Digital Laser Spherical Interferometers

Group Standards of the People's Republic of China, behind the polarimeter

T/STIC 110066-2021 High speed automatic polarimeter

Professional Standard - Traffic, behind the polarimeter

JT/T 699-2007 Auto-detect meter of back-insert type for road deflection
JT/T 677-2007 Vehicle bearing road laser rut-meter
JT/T 677-2009 Vehicle bearing road laser rut-meter
JT/T 676-2007 Vehicle bearing road laser profilometer
JT/T 676-2009 Vehicle bearing road laser profilometer
JT/T 840-2012 Vehicle bearing road laser texture-meter

Association Francaise de Normalisation, behind the polarimeter

NF S12-130*NF ISO 16971:2015 Ophthalmic instruments - Optical coherence tomograph for the posterior segment of the human eye
NF ISO 16971:2015 Instruments ophtalmiques - Tomographe de cohérence optique du segment postérieur de l'oeil humain
NF S10-049:2003 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements.
NF X21-054*NF ISO 17973:2006 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis.
NF A91-114:1995 Metallic coatings. Measurement of coating thickness. Profilometric method.
NF X21-061:2008 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution.
NF S10-008-7:2008 Optics and photonics - Preparation of drawings for optical elements and systems - Part 7 : surface imperfection tolerances.
NF S10-008-5:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 5 : surface form tolerances.
NF S10-008-7:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 7 : surface imperfection tolerances.
NF C93-593-1*NF EN 61580-1:2002 Methods of measurement for waveguides - Part 1 : decoupling and rotation of the plane of polarization
NF S10-008-9:1996 Optics and optical instruments. Preparation of drawings for optical elements and systems. Part 9 : surface treatment and coating.
NF X21-055:2006 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales.
FD S11-485*FD ISO/TR 18476:2018 Ophthalmic optics and instruments - Free form technology - Spectacle lenses and measurement

Military Standard of the People's Republic of China-General Armament Department, behind the polarimeter

GJB 2234A-2014 Method of post data-processing for photoelectric theodolite
GJB 2234-1994 Post-data processing method of photoelectric theodolite

Korean Agency for Technology and Standards (KATS), behind the polarimeter

KS P ISO 16971:2020 Ophthalmic instruments — Optical coherence tomograph for the posterior segment of the human eye
KS P ISO 7711-2:2020 Dentistry — Rotary diamond instruments — Part 2: Discs
KS D ISO 17973:2011 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
KS B 0506-1975 Instruments for the Measurement of Surface Roughness by the Interferometric Method
KS B ISO 15368:2006 Optics and optical instruments-Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
KS B ISO 15368-2006(2021) Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
KS B ISO 10110-12:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 12:Aspheric surfaces
KS B ISO 10110-12:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 12: Aspheric surfaces
KS B ISO 14997:2004 Optics and optical instruments-Test methods for surface imperfections of optical elements
KS B ISO 14997:2014 Optics and optical instruments — Test methods for surface imperfections of optical elements
KS B ISO 15368-2006(2016) Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
KS D ISO 17974:2011 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
KS D ISO 15472:2003 Surface chemical analysis-X-ray photoelectron spectrometers-Calibration of energy scales
KS B ISO 10110-8:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-8-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-5:2013 Optics and optical instruments ― Preparation of drawings for optical elements and systems ― Part 5: Surface form tolerances
KS B ISO 10110-7:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-5:2008 Optics and optical instruments-Preparation of drawings for optical elements and systems-Part 5:Surface form tolerances
KS B ISO 10110-9:2007 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS B ISO 10110-14:2010 Optics and photonics-Preparation of drawings for optical elements and systems-Part 14:Wavefront deformation tolerance
KS B ISO 10110-7:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-7-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-9-2017(2022) Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS B ISO 10110-9:2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS D ISO 15470:2005 Surface chemical analysis－X-ray photoelectron spectroscopy－Description of selected instrumental performance parameters
KS D ISO 4519:2009 Electrodeposited metallic coatings and related finishes－Sampling procedures for inspection by attributes
KS D ISO 21270:2005 Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale
KS D ISO 14706-2003(2018)
KS B ISO 9345-1:2006 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1:2016 Optics and optical instruments Microscopes - Imaging distances related to mechanical reference planes - Part 1 Tube length 160 mm
KS B ISO 9345-1-2023 Image distance of optical and optical instrument microscopes relative to mechanical reference planes Part 1: 160 mm tube length
KS B ISO 9345-2:2006 Optics and optical instruments-Microscopes:Imaging distances related to mechanical reference planes-Part 2:Infinity-corrected optical systems
KS B ISO 9345-2:2016 Optics and optical instruments－Microscopes：Imaging distances related to mechanical reference planes－Part 2：Infinity-corrected optical systems
KS D ISO 21270-2005(2020) Surface chemical analysis－X-ray photoelectron and Auger electron spectrometers－Linearity of intensity scale

KR-KS, behind the polarimeter

KS P ISO 16971-2020 Ophthalmic instruments — Optical coherence tomograph for the posterior segment of the human eye
KS P ISO 7711-2-2020 Dentistry — Rotary diamond instruments — Part 2: Discs
KS D ISO 14707-2003(2023)
KS B ISO 10110-8-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 8：Surface texture
KS B ISO 10110-7-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 7：Surface imperfection tolerances
KS B ISO 10110-9-2017 Optics and optical instruments－Preparation of drawings for optical elements and systems－Part 9：Surface treatment and coating
KS D ISO 14706-2003(2023)

International Electrotechnical Commission (IEC), behind the polarimeter

IEC 60580:1977 Area exposure product meter

German Institute for Standardization, behind the polarimeter

DIN 43801-1:1976-08 Electrical measuring instruments; spiral springs; dimensions
DIN ISO 10110-9:2000 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 9: Surface treatment and coating (ISO 10110-9:1996)
DIN 58727-1:2015 Production in optical engineering - Surfacing pins for optics processing machines - Part 1: Without ball point cemented metal carbide
DIN ISO 10110-5 Bb.1:2003 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 5: Surface form tolerances; Surface form tolerance inspection using testing glasses
DIN EN 15483:2009-02 Ambient air quality - Atmospheric measurements near ground with FTIR spectroscopy; German version EN 15483:2008
DIN ISO 9345-2:2005 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems (ISO 9345-2:2003)

Defense Logistics Agency, behind the polarimeter

DLA MIL-DTL-15291/14-2013 SWITCHES, ROTARY, SNAP ACTION CLASS 80SR FRONT& REAR MOUNTED, SIDE CONNECTED
DLA A-A-50767 VALID NOTICE 3-2006 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 2-2001 ANALYZER, SURFACE FINISH
DLA A-A-50767 VALID NOTICE 1-1995 ANALYZER, SURFACE FINISH
DLA A-A-50767-1983 ANALYZER, SURFACE FINISH

(U.S.) Ford Automotive Standards, behind the polarimeter

FORD FLTM BI 010-2-2001 MEASUREMENT OF GLOSS CHANGE OF FLAT ENAMELS AFTER POLISHING

International Organization for Standardization (ISO), behind the polarimeter

ISO/CD 16971-1 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
ISO/DIS 16971-1:2011 Ophthalmic instruments — Optical coherence tomographs — Part 1: Optical coherence tomographs for the posterior segment of the human eye
ISO 17123-6:2003 Optics and optical instruments - Field procedures for testing geodetic and surveying instruments - Part 6: Rotating lasers
ISO 17123-6:2022 Optics and optical instruments — Field procedures for testing geodetic and surveying instruments — Part 6: Rotating lasers
ISO 17123-6:2012 Optics and optical instruments - Field procedures for testing geodetic and surveying instruments - Part 6: Rotating lasers
ISO 17123-9:2018 Optics and optical instruments — Field procedures for testing geodetic and surveying instruments — Part 9: Terrestrial laser scanners
ISO 16971:2015 Ophthalmic instruments - Optical coherence tomograph for the posterior segment of the human eye
ISO 17973:2016 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 17973:2002 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
ISO 14997:2017 Optics and optical instruments — Test methods for surface imperfections of optical elements
ISO 15368:2001 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
ISO 14997:2011 Optics and photonics - Test methods for surface imperfections of optical elements
ISO 14997:2003 Optics and optical instruments - Test methods for surface imperfections of optical elements
ISO 15368:2021 Optics and optical instruments — Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
ISO 10110-7:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 7: Surface imperfection tolerances
ISO 10110-5:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 5: Surface form tolerances
ISO 10110-9:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 9: Surface treatment and coating
ISO 10110-7:2017 Optics and optical instruments — Preparation of drawings for optical elements and systems — Part 7: Surface imperfection tolerances
ISO 15470:2004 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
ISO 15472:2010 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 15472:2001 Surface chemical analysis - X-ray photoelectron spectrometers - Calibration of energy scales
ISO 21270:2004 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
ISO 9345-1:1996 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Part 1: Tube length 160 mm
ISO 7759:1983 Anodizing of aluminium and its alloys; Measurement of reflectivity characteristics of aluminium surfaces using abridged goniophotometer or goniophotometer
ISO 7759:2010 Anodizing of aluminium and its alloys - Measurement of reflectance characteristics of aluminium surfaces using a goniophotometer or an abridged goniophotometer
ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles - Part 6: Verification of the performance of laser profilometers used for pavement texture measurements
ISO 24236:2005 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale
ISO 16129:2012 Surface chemical analysis - X-ray photoelectron spectroscopy - Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer
ISO 9345-2:2003 Optics and optical instruments - Microscopes: Imaging distances related to mechanical reference planes - Part 2: Infinity-corrected optical systems

Professional Standard - Military and Civilian Products, behind the polarimeter

WJ 982-1977 Optical Instruments Investment Casting Mold Components Optical Instruments Investment Casting Mold Rotary Axis
WJ 2300-1995 Verification Regulations for Plane Grating Spectrograph

British Standards Institution (BSI), behind the polarimeter

BS ISO 17123-6:2022 Optics and optical instruments. Field procedures for testing geodetic and surveying instruments - Rotating lasers
BS ISO 17123-9:2018 Optics and optical instruments. Field procedures for testing geodetic and surveying instruments - Terrestrial laser scanners
BS ISO 17973:2003 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
21/30393812 DC BS ISO 17123-6. Optics and optical instruments. Field procedures for testing geodetic and surveying instruments. Part 6. Rotating lasers
BS ISO 15368:2001 Optics and optical instruments - Measurement of reflectance of plane surfaces and transmittance of plane parallel elements
BS ISO 10110-8:1998 Optics and optical instruments - Preparation of drawings for optical elements and systems - Surface texture
BS ISO 10110-8:2010 Optics and photonics. Preparation of drawings for optical elements and systems. Surface texture; roughness and waviness
BS ISO 17974:2002 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
BS EN 1786:1997 Foodstuffs - Detection of irradiated food containing bone - Method by ESR spectroscopy
BS ISO 9337-1:1999 Contact lenses. Determination of back vertex power. Method using focimeter with manual focusing
BS ISO 9345-2:2003 Optics and optical instruments - Microscopes - Imaging distances related to mechanical reference planes - Infinity-corrected optical systems
BS 4361-7:1988 Woodworking machines - Specification for thickness planing machines with rotary cutterblock for one-side dressing
BS ISO 10110-9:1996 Optics and optical instruments - Preparation of drawings for optical elements and systems - Surface treatment and coating
BS ISO 15470:2005 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters
BS ISO 15470:2017 Surface chemical analysis. X-ray photoelectron spectroscopy. Description of selected instrumental performance parameters
PD ISO/PAS 13473-6:2021 Characterization of pavement texture by use of surface profiles. Verification of the performance of laser profilometers used for pavement texture measurements
BS 9133 N001 to 003:1975 Detail specification for single turn low power non-wirewound rotary potentiometers - Spindle insulated from resistance element, spindle and panel sealed or container, spindle and panel sealed - Full assessment level
BS ISO 21270:2005 Surface chemical analysis - X-ray photoelectron and Auger electron spectrometers - Linearity of intensity scale
BS ISO 21270:2004 Surface chemical analysis. X-ray photoelectron and Auger electron spectrometers. Linearity of intensity scale
BS ISO 16129:2012 Surface chemical analysis. X-ray photoelectron spectroscopy. Procedures for assessing the day-to-day performance of an X-ray photoelectron spectrometer

VN-TCVN, behind the polarimeter

TCVN 7693-2007 Gears.Surface temper etch inspection after grinding

Japanese Industrial Standards Committee (JISC), behind the polarimeter

JIS K 0165:2011 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
JIS K 0166:2011 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
JIS B 7912-6:2007 Field procedures for testing geodetic and surveying instruments -- Part 6: Rotating lasers
JIS K 0162:2010 Surface chemical analysis -- X-ray photoelectron spectroscopy -- Description of selected instrumental performance parameters

SE-SIS, behind the polarimeter

SIS SS IEC 580:1986 X-ray equipment - Area exposure product meter
SIS SS 64 12 50-1981 Measurement in building - Laser direction and laser surface indicating device - Function and testing

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, behind the polarimeter

GB/T 29788-2013 Radiation protection instrumentation.Portable photon contamination meters and monitors
GB/T 21006-2007 Surface chemical analysis.X-ray photoelectron and Auger electron spectrometers.Linearity of intensity scale

Taiwan Provincial Standard of the People's Republic of China, behind the polarimeter

CNS 8179-1981 Metal Laboratory Ware Bossheads Rotary Double Clamp

Military Standard of the People's Republic of China-Commission of Science,Technology and Industry for National Defence, behind the polarimeter

GJB/J 6221-2008 Calibration specification for digital laster plane interferometer

Jilin Provincial Standard of the People's Republic of China, behind the polarimeter

DB22/T 2651-2017 Calibration specification for digital laser spherical interferometer

未注明发布机构, behind the polarimeter

GJB 8704-2015 Calibration Specification for Digital Laser Plane Interferometer
BS ISO 21270:2004(2010) Surface chemical analysis — X - ray photoelectron and Auger electron spectrometers — Linearity of intensity scale
BS EN ISO 9341:1998 Optics and optical instruments — Contact lenses — Determination ofinclusions and surface imperfections for rigid contact lenses

AENOR, behind the polarimeter

UNE 28027:1961 DIMENSIONS OF BOXES FOR INSTRUMENTS ABOARD AIRCRAFTS (MOUNTING BY POSTERIOR FACE OF THE BOARD) AND DIMENSIONS OF MOUNTING.

RU-GOST R, behind the polarimeter

GOST 14618.9-1978 Essential oils, aromatics and their intermediates. Method for determination of angle of optical rotation and specific rotation value of polarization flat
GOST 19300-1986 Instruments for measurement of surface roughness by the profile method. Contact profilographs and profilometers. Types and main parameters
GOST R ISO 17123-6-2011 State system for ensuring the uniformity of meansurements. Optics and optical instruments. Field procedures for testing geodetic and surveying instruments. Part 6. Rotating lasers
GOST 9847-1979 Optical instruments for surface roughness parameters measuring. Basis parameters and types

SG-SPRING SG, behind the polarimeter

SS 373 Pt.3-1994 Specification for Optics and optical instruments - contact lenses Part 3: Determination of Back vertex power of contact lenses

YU-JUS, behind the polarimeter

JUS M.A1.041-1980 Roughness comparisan specimens..Turned, ground, bored, milled, shapedandplaned

American Society for Testing and Materials (ASTM), behind the polarimeter

ASTM E1127-03 Standard Guide for Depth Profiling in Auger Electron Spectroscopy
ASTM F3080-14 Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
ASTM F3080-17a Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
ASTM E1217-11 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-00 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM E1217-05 Standard Practice for Determination of the Specimen Area Contributing to the Detected Signal in Auger Electron Spectrometers and Some X-Ray Photoelectron Spectrometers
ASTM F3080-21 Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector, Infrared Measurement, and CCTV Camera System
ASTM D5767-95(1999) Standard Test Methods for Instrumental Measurement of Distinctness-of-Image Gloss of Coating Surfaces
ASTM D5767-95(2012) Standard Test Methods for Instrumental Measurement of Distinctness-of-Image Gloss of Coating Surfaces
ASTM E1696-15(2022) Standard Test Method for Field Measurement of Raised Retroreflective Pavement Markers Using a Portable Retroreflectometer

Shanxi Provincial Standard of the People's Republic of China, behind the polarimeter

DB14/T 1435-2017 Data preprocessing of ground laser raindrop spectrometer detection

ESDU - Engineering Sciences Data Unit, behind the polarimeter

AERO W.02.04.03 A-1978 Profile drag of smooth aerofoils with straight trailing- edges at low speeds.

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, behind the polarimeter

GB/T 33806-2017 Technical requirement of area fluorescent imaging microarray scanner

Hubei Provincial Standard of the People's Republic of China, behind the polarimeter

DB42/T 1337-2018 Laser-type high-speed deflection meter measuring pavement deflection test procedures

BE-NBN, behind the polarimeter

NBN-EN 434-1994 Resilient floor coverings - Determination of dimensional stability and curling after exposure to heat

MSS - Manufacturers Standardization Society of the Valve and Fittings Industry., behind the polarimeter

SP 112 COMPARATOR-2016 Quality Standard For Evaluation Of Cast Surface Finishes – Visual and Tactile Method – Three Dimensional Cast Surface Comparator

Standard Association of Australia （SAA）, behind the polarimeter

AS ISO 15470:2006 Surface chemical analysis - X-ray photoelectron spectroscopy - Description of selected instrumental performance parameters

CZ-CSN, behind the polarimeter

CSN 25 2300-1972 Classification of instruments and devices or measurement of the geometrical arameters of surface finish

European Committee for Standardization (CEN), behind the polarimeter

EN ISO 4518:2021 Metallic coatings - Measurement of coating thickness - Profilometric method (ISO 4518:2021)
EN 12373-13:2000 Aluminium and Aluminium Alloys - Anodizing - Part 13: Measurement of Reflectance Characteristics of Aluminium Surfaces Using a Goniophotometer or an Abridged Goniophotometer
EN ISO 7759:2010 Anodizing of aluminium and its alloys - Measurement of reflectance characteristics of aluminium surfaces using a goniophotometer or an abridged goniophotometer (ISO 7759:2010)

ZA-SANS, behind the polarimeter

SANS 4518:1980 Metallic coatings - Measurement of coating thickness - Profilometric method

Danish Standards Foundation, behind the polarimeter

DS/EN ISO 4518:1995 Metallic coatings - Measurement of coating thickness - Profiliometric method