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silicon carbide

silicon carbide, Total:17 items.

In the international standard classification, silicon carbide involves: Semiconducting materials, Cutting tools, Integrated circuits. Microelectronics, Testing of metals.

RU-GOST R, silicon carbide

• GOST 26239.7-1984 Semiconductor silicon. Method of oxygen, carbon and nitrogen determination

Professional Standard - Machinery, silicon carbide

• JB/T 10376-2002 Special products of silicon carbide Slab of silicon dioxide bonded silicon carbide
• JB/T 10376-2013 Special products of silicon carbide.Slab of silicon dioxide bonded silicon carbide
• JB/T 5204-2007 Chemical analysis methods for silicon carbide deoxyden
• JB/T 5204-1991 Chemical analysis method of silicon carbide deoxidizer

RO-ASRO, silicon carbide

• SR 5063/6-1993 SiWcon carbide. Df?ermin?lion of free silicon dioxide content
• STAS 5063/11-1993 Silicon carbide. Determination of calcium oxide content
• SR 5063/9-1993 Silicon carbide. Determination of iron trioxide content
• STAS 9281/11-1992 Silicon carbide refractories. Determination of dioxide content

机械电子工业部, silicon carbide

• JB 5204-1991 Chemical analysis method of silicon carbide deoxidizer

工业和信息化部, silicon carbide

• JB/T 5204-2018 Chemical analysis method of silicon carbide deoxidizer

Professional Standard - Electron, silicon carbide

• SJ 20636-1997 Test method for oxygen and carbon contents of large diameter thin silicon wafer in microzone for use in IC

Indonesia Standards, silicon carbide

• SNI 15-0928-1989 Emery cloth sheet aluminium oxide and silicon carbide type

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, silicon carbide

• GB/T 35306-2023 Determination of Carbon and Oxygen Content in Silicon Single Crystal Low Temperature Fourier Transform Infrared Spectroscopy
• GB/T 32281-2015 Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock.Secondary ion mass spectrometry

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, silicon carbide

• GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon—Low temperature fourier transform infrared spectrometry

Professional Standard - Commodity Inspection, silicon carbide

• SN/T 1043-2002 Determination of aluminium oxide in silicon carbide for import and export.Spectrophotometric method

Others:   Silicon Oxygen vs. Silicon Carbon, Silicon Oxycarbon, Silicon Oxygen Silicon Carbon, Silicon Oxygen and Silicon Carbon, Silicon Oxycarbon, Oxycarbon in silicon, Oxygen and carbon content in silicon, Silicon Carbon and Silicon Oxygen, SiCSiO, SiC and SiO, Silicon carbon oxygen content, Silicon Oxygen Carbon Content, Carbon Oxygen in Silicon, Oxygen and carbon measurement in silicon, silicon carbide, Silicon Oxygen Carbon Content, Silicon carbon oxygen content, silicon carbide, Silicon Oxygen Carbon Content, Oxysilica.