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How to measure carrier concentration

How to measure carrier concentration, Total:46 items.

In the international standard classification, How to measure carrier concentration involves: Testing of metals, Inorganic chemicals, Insulating fluids, Semiconducting materials, Air quality, Electromechanical components for electronic and telecommunications equipment, Analytical chemistry.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, How to measure carrier concentration

• GB/T 8757-1988 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
• GB/T 8757-2006 Determination of carrier concentration in gallium arsenide by the plasma resonance minimum
• GB/T 11068-1989 Gallium arsenide epitaxial layer--Determination of carrier concentration--Voltage-capacitance method
• GB/T 11068-2006 Gallium arsenide epitaxial layer.Determination of carrier concentration voltage-capacitance method
• GB 11068-1989 GaAs Epitaxial Layer Carrier Concentration Capacitance-Voltage Measurement Method
• GB/T 36705-2018 Test method for carrier concentration of gallium nitride substrates—Raman spectrum method
• GB/T 14146-1993 Silicon epitaxial layers--Determination of carrier concentration--Mercury probe Valtage-capacitance method
• GB/T 14146-2009 Silicon epitaxial layers-determination of carrier concentration-mercury probe voltages-capacitance method
• GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes
• GB/T 14863-1993 Standard test method for net carrier density in silicon eqitaxial layers by voltage-capacitance of gated and ungated diodes

国家市场监督管理总局、中国国家标准化管理委员会, How to measure carrier concentration

• GB/T 14146-2021 Test method for carrier concentration of silicon epitaxial layers—Capacitance-voltage method

Professional Standard - Electron, How to measure carrier concentration

• SJ 2757-1987 Method of measurement by infra-red reflection for charge carrier concentraiton of heavily doped semiconductors
• SJ 3244.1-1989 Methods of measurement for hall mobility and carrier concentration of Gallium arsenide and Indium phosphide
• SJ 3248-1989 Methods for measuring carrier concentration of readded Gallium arsenide and Indium phosphide by infra-red reflection
• SJ 3244.4-1989 Methods of measurement for profile distribution of carrier concentration of Gallium arsenide and Indium phosphide materials--Electrochemical voltage capacitance method

British Standards Institution (BSI), How to measure carrier concentration

• PD IEC TS 62607-5-3:2020 Nanomanufacturing. Key control characteristics. Thin-film organic/nano electronic devices. Measurements of charge carrier concentration
• BS EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Current-carrying capacity tests - Test 5b - Current-temperature derating
• BS EN 13205-4:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Laboratory performance test based on comparison of concentrations
• BS EN 13205-1:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. General requirements
• BS EN 13205-6:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Transport and handling tests
• BS PD CEN/TR 13205-3:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Analysis of sampling efficiency data
• BS EN 13205-2:2014 Workplace exposure. Assessment of sampler performance for measurement of airborne particle concentrations. Laboratory performance test based on determination of sampling efficiency

Group Standards of the People's Republic of China, How to measure carrier concentration

• T/IAWBS 003-2017 Determination of Carrier Concentration in SiC Epitaxial Layer_Mercury Probe Capacitance-Voltage Method

AT-ON, How to measure carrier concentration

• ONORM M 5861-1-1993 Manual determination of particle concentrations in fluid gases - Gravimetrie method - General requirements
• ONORM M 5861-2-1994 Manual determination of particle concentrations in fluid gases - Gravimetrie method - Special requirements regarding measurement techniques

American Society for Testing and Materials (ASTM), How to measure carrier concentration

• ASTM F398-92(1997) Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum
• ASTM F1392-00 Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
• ASTM F1393-92(1997) Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe

International Electrotechnical Commission (IEC), How to measure carrier concentration

• IEC TS 62607-5-3:2020 Nanomanufacturing - Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration
• IEC 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating

International Organization for Standardization (ISO), How to measure carrier concentration

• ISO 9096:1992 Stationary source emissions; determination of concentration and mass flow rate of particulate material in gas-carrying ducts; manual gravimetric method
• ISO/WD TR 23683:2023 Surface chemical analysis — scanning probe microscopy — Guideline for experimental quantification of carrier concentration in semiconductor devices by using electric scanning probe microscopy

AENOR, How to measure carrier concentration

• UNE-EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements -- Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating.

Association Francaise de Normalisation, How to measure carrier concentration

• NF X43-283-4*NF EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4 : laboratory performance test based on comparison of concentrations
• NF C93-400-5-2*NF EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2 : current-carrying capacity tests - Test 5b : current-temperature derating.
• NF X43-283-1*NF EN 13205-1:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 1 : general requirements
• NF X43-283-6*NF EN 13205-6:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 6 : transport and handling tests

Korean Agency for Technology and Standards (KATS), How to measure carrier concentration

• KS C IEC 60512-5-2:2003 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
• KS C IEC 60512-5-2:2014 Connectors for electronic equipment-Tests and measurements-Part 5-2:Current-carrying capacity tests-Test 5b:Current-temperature derating
• KS C IEC 60512-5-2-2003(2008) Connectors for electronic equipment－Tests and measurements－Part 5－2：Current－carrying capacity tests－Test 5b：Current－temperature derating

Japanese Industrial Standards Committee (JISC), How to measure carrier concentration

• JIS C 5402-5-2:2005 Connectors for electronic equipment -- Tests and measurements -- Part 5-2: Current-carrying capacity tests -- Test 5b: Current-temperature derating

Lithuanian Standards Office , How to measure carrier concentration

• LST EN 60512-5-2-2003 Connectors for electronic equipment. Tests and measurements. Part 5-2: Current-carrying capacity tests. Test 5b: Current-temperature derating (IEC 60512-5-2:2002)

German Institute for Standardization, How to measure carrier concentration

• DIN EN 60512-5-2:2003-01 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests; Test 5b: Current-temperature derating (IEC 60512-5-2:2002); German version EN 60512-5-2:2002 / Note: DIN IEC 60512-3 (1994-05) remains valid along...
• DIN EN 13205-4:2014 Workplace exposure - Assessment of sampler performance for measurement of airborne particle concentrations - Part 4: Laboratory performance test based on comparison of concentrations; German version EN 13205-4:2014

Danish Standards Foundation, How to measure carrier concentration

• DS/EN 60512-5-2:2002 Connectors for electronic equipment - Tests and measurements - Part 5-2: Current-carrying capacity tests - Test 5b: Current-temperature derating

European Committee for Electrotechnical Standardization（CENELEC）, How to measure carrier concentration

• EN 60512-5-2:2002 Connectors for Electronic Equipment - Tests and Measurements Part 5-2: Current-Carrying Capacity Tests - Test 5b: Current-Temperature Derating

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