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half wave optical disc

half wave optical disc, Total:106 items.

In the international standard classification, half wave optical disc involves: Solar energy engineering, Optoelectronics. Laser equipment, Photography, Applications of information technology, Electric filters, Fibre optic communications, Medical equipment, Optics and optical measurements, Integrated circuits. Microelectronics, Document imaging applications, Ferroalloys, Semiconducting materials, Semiconductor devices, Testing of metals, Optical equipment, Products of the chemical industry, Aerospace electric equipment and systems.

Group Standards of the People's Republic of China, half wave optical disc

T/QGCML 2020-2023
T/ZZB 1335-2019 Optical low pass filter for high-definition imaging
T/QGCML 2041-2023

HU-MSZT, half wave optical disc

MSZ 5628-1957

Fujian Provincial Standard of the People's Republic of China, half wave optical disc

DB35/T 1193-2011 Semiconductor LED chip

Standard Association of Australia （SAA）, half wave optical disc

AS/NZS ISO 10322.1:2011
AS/NZS ISO 10322.2:2011
AS ISO 10322.1:2017 Ophthalmic optics — Semi-finished spectacle lens blanks, Part 1: Specifications for single-vision and multifocal lens blanks
AS ISO 10322.2:2017 Ophthalmic optics — Semi-finished spectacle lens blanks, Part 2: Specifications for progressive-power and degressive-power lens blanks

Association Francaise de Normalisation, half wave optical disc

NF EN ISO 10322-1:2016 Optique ophtalmique - Verres de lunettes semi-finis - Partie 1 : spécifications pour les verres unifocaux et multifocaux
NF EN ISO 10322-2:2016 Optique ophtalmique - Verres de lunettes semi-finis - Partie 2 : spécifications pour les verres progressifs
FD S11-490*FD ISO/TR 20772:2019 Ophthalmic optics - Spectacle lenses - Short wavelength visible solar radiation and the eye
FD ISO/TR 20772:2019 Optique ophtalmique - Verres de lunettes - L'oeil et les radiations solaires visibles de courtes longueurs d'onde
NF C96-016-10*NF EN 60747-16-10:2005 Semiconductor devices - Part 16-10 : Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
NF EN 60747-16-10:2005 Dispositifs à semiconducteurs - Partie 16-10 : format-cadre pour agrément de technologie (TAS) pour circuits intégrés monolithiques hyperfréquences
NF S11-421-2*NF EN ISO 10322-2:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2 : specifications for progressive-power and degressive-power lens blanks

Professional Standard - Electron, half wave optical disc

SJ/T 11856.3-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 3: Electric Absorption Modulated Semiconductor Laser Chips for Light Sources
SJ/T 11856.2-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 2: Vertical Cavity Surface Emitting Semiconductor Laser Chips for Light Sources
SJ/T 11399-2009 Measurement methods for chips of light emitting diodes
SJ/T 11402-2009 Technical specification of semiconductor laser chip used in optical fiber communication
SJ/T 11856.1-2022 Technical Specifications for Semiconductor Laser Chips for Optical Fiber Communications Part 1: Fabry-Perot Type and Distributed Feedback Type Semiconductor Laser Chips for Light Sources
SJ/T 11398-2009 Technical specification for power light-emitting diode chips

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, half wave optical disc

GB/T 32988-2016 Synthetic quartz crystal wafer for optical low pass filter (OLPF)
GB 27995.1-2011 Semi-finished spectacle lens blanks.Part 1:Specifications for single-vision and multifocal lens blanks
GB/T 36356-2018 Technical specification for power light-emitting diode chips
GB/T 36357-2018 Technical specification for middle power light-emitting diode chips
GB/T 20870.10-2023 Semiconductor Devices Part 16-10: Monolithic Microwave Integrated Circuit Technology Acceptable Procedures
GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method
GB/T 26068-2010 Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance
GB/T 26068-2018 Measurement of Carrier Recombination Lifetime of Silicon Wafer and Ingot Non-contact Microwave Reflection Photoconductivity Decay Method

Professional Standard - Military and Civilian Products, half wave optical disc

WJ 2278-1995 Regulations for verification of interference filters for wavelength verification of spectrophotometers

CEN - European Committee for Standardization, half wave optical disc

EN ISO 10322-1:1997 Ophthalmic Optics - Semi-Finished Spectacle Lens Blanks - Part 1: Specifications for Single-Vision and Multifocal Lens Blanks

European Committee for Standardization (CEN), half wave optical disc

EN ISO 10322-2:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive-power and degressive-power lens blanks
EN ISO 10322-2:1997 Opthalmic Optics - Semi-Finished Spectacle Lens Blanks - Part 2: Specifications for Progressive Power Lens Blanks ISO 10322-2: 1996
EN ISO 10322-1:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks
EN ISO 8980-4:2000 Ophthalmic Optics - Uncut Finished Spectacle Lenses - Part 4: Specifications and Test Methods for Anti-Reflection Coatings ISO 8980-4:2000
EN ISO 8980-4:2006 Ophthalmic optics - Uncut finished spectacle lenses - Part 4: Specifications and test methods for anti-reflective coatings (ISO 8980-4:2006)

International Organization for Standardization (ISO), half wave optical disc

ISO 10322-2:1996 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive power lens blanks
ISO 10322-1:1996 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks
ISO/TR 20772:2018 Ophthalmic optics - Spectacle lenses - Short wavelength visible solar radiation and the eye
ISO 8980-4:2006 Ophthalmic optics - Uncut finished spectacle lenses - Part 4: Specifications and test methods for anti-reflective coatings
ISO 12926:2012 Aluminium fluoride for industrial use - Determination of trace elements - Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets
ISO 4443:2022 Cryolite primarily used for the production of aluminium — Determination of elements — Wavelength-dispersive X-ray fluorescence spectrometric method using pressed powder tablets
ISO 10322-2:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive-power and degressive-power lens blanks

Taiwan Provincial Standard of the People's Republic of China, half wave optical disc

CNS 13806-1997 Method of Measurement for Emission Wavelength and Luminous Intensity of Epitaxial Wafers of Light Emitting Diodes

Danish Standards Foundation, half wave optical disc

DS/EN ISO 10322-1:2006 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks
DS/EN ISO 10322-2:2006 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive power lens blanks
DS/EN 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

ES-UNE, half wave optical disc

UNE-EN ISO 10322-1:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks (ISO 10322-1:2016)
UNE-EN ISO 10322-2:2016 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive-power and degressive-power lens blanks (ISO 10322-2:2016)
UNE-EN 60747-16-10:2004 Semiconductor devices -- Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (Endorsed by AENOR in November of 2004.)

German Institute for Standardization, half wave optical disc

DIN EN ISO 10322-1:2016-10 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks (ISO 10322-1:2016); German version EN ISO 10322-1:2016
DIN EN ISO 10322-2:2016-08 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive-power and degressive-power lens blanks (ISO 10322-2:2016); German version EN ISO 10322-2:2016
DIN EN 60747-16-10:2005 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN EN 60747-16-10:2005-03 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004); German version EN 60747-16-10:2004
DIN 50441-3:1985 Testing of materials for semiconductor technology; measurement of the geometric dimensions of semiconductor slices; determination of flatness deviation of polished slices by means of the multiple beam interference
DIN IEC 60368-2-1:1993-07 Piezoelectric filters; part 2: guide to the use of piezoelectric filters; section 1: quartz crystal filters; identical with IEC 60368-2-1:1988
DIN EN 2591-428:2003 Aerospace series - Elements of electrical and optical connection; Test methods - Part 428: Sinusoidal vibrations with passage of current for crimped terminal lugs; German and English version EN 2591-428:2002

American Society for Testing and Materials (ASTM), half wave optical disc

ASTM F907-85(1992)e1 Test Method for Measurement of Rotational Acceleration of a Wafer for Photoresist Spin Coating
ASTM F907-85E01R92 Test Method for Measurement of Rotational Acceleration of a Wafer for Photoresist Spin Coating
ASTM F358-83(1996)e1 Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers
ASTM F358-83(2002) Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers

British Standards Institution (BSI), half wave optical disc

BS EN 60747-16-10:2004 Semiconductor devices - Technology Approval Schedule (TAS) for monolithic microwave integrated circuits
PD ISO/TR 20772:2018 Ophthalmic optics. Spectacle lenses. Short wavelength visible solar radiation and the eye
BS 7011-2.1:1989 Consumable accessories for light microscopes - Slides - Specification for dimensions and optical properties
BS ISO 12926:2012 Aluminium fluoride for industrial use. Determination of trace elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets
BS ISO 4443:2022 Cryolite primarily used for the production of aluminium. Determination of elements. Wavelength-dispersive X-ray fluorescence spectrometric method using pressed powder tablets
BS ISO 12926:2013 Aluminium fluoride for industrial use. Determination of trace elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets
BS EN ISO 10322-2:2016 Ophthalmic optics. Semi-finished spectacle lens blanks. Specifications for progressive-power and degressive-power lens blanks
BS IEC 63068-3:2020 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Test method for defects using photoluminescence
20/30420126 DC BS ISO 4443. Cryolite primarily used for the production of aluminium. Determination of elements. Wavelength dispersive X-ray fluorescence spectrometric method using pressed powder tablets

Lithuanian Standards Office , half wave optical disc

LST EN ISO 10322-2:2006 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 2: Specifications for progressive power lens blanks (ISO 10322-2:2006)
LST EN ISO 10322-1:2006 Ophthalmic optics - Semi-finished spectacle lens blanks - Part 1: Specifications for single-vision and multifocal lens blanks (ISO 10322-1:2006)
LST EN 60747-16-10-2004 Semiconductor devices. Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits (IEC 60747-16-10:2004)

Korean Agency for Technology and Standards (KATS), half wave optical disc

KS B ISO 10322-2-2004(2019) Ophthalmic optics－Semi-finished spectacle lens blanks－Part 2：Specifications for progressive power lens blanks
KS X ISO 10198-2007(2012) Micrographics－Rotary camera for 16 mm microfilm－Mechanical and optical characteristics
KS X ISO 10198:2007 Micrographics-Rotary camera for 16 mm microfilm-Mechanical and optical characteristics
KS X ISO 10198:2013 Micrographics－Rotary camera for 16 mm microfilm－Mechanical and optical characteristics

API - American Petroleum Institute, half wave optical disc

API STD 601-1974 Metallic Gaskets for Piping Double-Jacketed Corrugated and Spiral-Wound (FOURTH EDITION)
API STD 601-1958 METALLIC GASKETS FOR REFINERY PIPING CORRUGATED OR SPIRAL WOUND (SIXTH EDITION)
API STD 601-1962 METALLIC GASKETS FOR REFINERY PIPING DOUBLE-JACKETED CORRUGATED AND SPIRAL WOUND (THIRD EDITION)
API STD 601-1988 Metallic Gaskets for Raised-Face Pipe Flanges and Flanged Connections (Double-Jacketed Corrugated and Spiral-Wound) (Seventh Edition)
API STD 601-1982 Metallic Gaskets for Raised-Face Pipe Flanges and Flanged Connections (Double-Jacketed Corrugated and Spiral-Wound) (FIFTH EDITION)
API STD 601-1985 Metallic Gaskets for Raised-Face Pipe Flanges and Flanged Connections (Double-Jacketed Corrugated and Spiral-Wound) (SIXTH EDITION)
API STD 601 ERTA-1983 Metallic Gaskets for Raised-Face Pipe Flanges and Flanged Connections (Double-Jacketed Corrugated and Spiral-Wound) (FIFTH EDITION)

Hebei Provincial Standard of the People's Republic of China, half wave optical disc

DB13/T 5120-2019 Specifications for DC performance test of FP and DFB semiconductor laser chips for optical communication
DB13/T 5091-2019 Determination of ferromanganese, manganese silicon, ferromanganese nitride and metal manganese silicon, manganese and phosphorus content Wavelength dispersive X-ray fluorescence spectrometry (cast glass method)

American National Standards Institute （ANSI), half wave optical disc

ANSI/AIIM/ISO 10198:1999 Rotary Cameras for 16mm Microfilm – Mechanical and Optical Characteristics

RU-GOST R, half wave optical disc

GOST R 53939-2010 Ophthalmic optics. Semi-finished spectacle lens blanks. General specifications. Test methods

ASHRAE - American Society of Heating@ Refrigerating and Air-Conditioning Engineers@ Inc., half wave optical disc

ASHRAE MN-00-14-3-2000 Computational Study of Heat Transfer and Friction Characteristics of a Smooth Wavy Fin Heat Exchanger

Defense Logistics Agency, half wave optical disc

DLA SMD-5962-90504 REV C-1997 MICROCIRCUIT, DIGITAL, CMOS, BINARY FILTER AND TEMPLATE MATCHER, MONOLITHIC SILICON
DLA SMD-5962-89483 REV D-1996 MICROCIRCUIT, LINEAR, CMOS, QUAD, UNIVERSAL FILTER BUILDING BLOCK, MONOLITHIC SILICON
DLA SMD-5962-88743 REV B-1991 MICROCIRCUITS, LINEAR, 8-BIT CMOS FLASH A/D CONVERTER, MONOLITHIC SILICON
DLA SMD-5962-96616 REV A-1998 MICROCIRCUIT, DIGITAL, RADIATION HARDENED CMOS, STROBED HEX INVERTER/BUFFER, MONOLITHIC SILICON
DLA SMD-5962-89947 REV A-2005 MICROCIRCUIT, DIGITAL, HIGH SPEED CMOS, 12-STAGE RIPPLE-CARRY BINARY COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON
DLA SMD-5962-96895-1997 MICROCIRCUIT, DIGITAL, BICMOS, HIGH-SPEED OPTICAL/COPPER TRANSMITTER INTERFACE, MONOLITHIC SILICON
DLA SMD-5962-96896-1997 MICROCIRCUIT, DIGITAL, BICMOS, HIGH-SPEED OPTICAL/COPPER RECEIVER INTERFACE, MONOLITHIC SILICON
DLA SMD-5962-95749 REV B-2000 MICROCIRCUIT, DIGITAL, RADIATION HARDENED HIGH SPEED CMOS, DUAL DECADE RIPPLE COUNTER, TTL COMPATIBLE INPUTS, MONOLITHIC SILICON

国家市场监督管理总局、中国国家标准化管理委员会, half wave optical disc

GB/T 40311-2021 Vanadium slag—Determination of multi-element contents—Wavelength dispersive X-ray fluorescence spectrometry(fused cast bead method)
GB/T 40312-2021 Ferrophosphorus—Determination of phosphorus, silicon, manganese and titanium content—Wavelength dispersive X-ray fluorescence spectrometry method (fused cast bead method)
GB/T 5687.13-2021 Ferrochromium—Determination of chromium, silicon, manganese, titanium, vanadium, iron contents—Wavelength dispersive X-ray fluorescence spectrometry (fused cast bead method)

International Electrotechnical Commission (IEC), half wave optical disc

IEC 60747-16-10:2004 Semiconductor devices - Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

European Committee for Electrotechnical Standardization（CENELEC）, half wave optical disc

EN 60747-16-10:2004 Semiconductor devices Part 16-10: Technology Approval Schedule (TAS) for monolithic microwave integrated circuits

工业和信息化部, half wave optical disc

YB/T 4780-2019 Determination of silicon, calcium and aluminum content in calcium silicon alloys by wavelength dispersive X-ray fluorescence spectrometry (cast glass plate method)

中华人民共和国国家质量监督检验检疫总局、中国国家标准化管理委员会, half wave optical disc

GB/T 4333.5-2016 Ferrosillicon—Determination of silicon, manganese, aluminium, calcium, chromium and iron contents—Wavelength dispersive X-ray fluorescence spectrometry (Fused cast bead method)

GOSTR, half wave optical disc

GOST 34285-2017 Food products, food raw materials. Method for the detection of chemotherapeutic drugs by the hemiluminescence immunoenzymatic assay with the use of biochip technology