17.180.30 (Optical measuring instruments) 标准查询与下载



共找到 62 条与 相关的标准,共 5

The angular distribution of scatter is a property of surfaces that may have direct consequences on an intermediate or final application of that surface. Scatter defines many visual appearance attributes of materials, and specification of the distribution and wavelength dependence is critical to the marketability of consumer products, such as automobiles, cosmetics, and electronics. Optically diffusive materials are used in information display applications to spread light from display elements to the viewer, and the performance of such displays relies on specification of the distribution of scatter. Stray-light reduction elements, such as baffles and walls, rely on absorbing coatings that have low diffuse reflectances. Scatter from mirrors, lenses, filters, windows, and other components can limit resolution and contrast in optical systems, such as telescopes, ring laser gyros, and microscopes. The microstructure associated with a material affects the angular distribution of scatter, and specific properties can often be inferred from measurements of that scatter. For example, roughness, material inhomogeneity, and particles on smooth surfaces contribute to optical scatter, and optical scatter can be used to detect the presence of such defects. The angular distribution of scattered light can be used to simulate or render the appearance of materials. Quality of rendering relies heavily upon accurate measurement of the light scattering properties of the materials being rendered.p>1.1 This practice describes procedures for determining the amount and angular distribution of optical scatter from a surface. In particular it focuses on measurement of the bidirectional scattering distribution function (BSDF). BSDF is a convenient and well accepted means of expressing optical scatter levels for many purposes. It is often referred to as the bidirectional reflectance distribution function (BRDF) when considering reflective scatter or the bidirectional transmittance distribution function (BTDF) when considering transmissive scatter.1.2 The BSDF is a fundamental description of the appearance of a sample, and many other appearance attributes (such as gloss, haze, and color) can be represented in terms of integrals of the BSDF over specific geometric and spectral conditions.1.3 This practice also presents alternative ways of presenting angle-resolved optical scatter results, including directional reflectance factor, directional transmittance factor, and differential scattering function.1.4 This practice applies to BSDF measurements on opaque, translucent, or transparent samples.1.5 The wavelengths for which this practice applies include the ultraviolet, visible, and infrared regions. Difficulty in obtaining appropriate sources, detectors, and low scatter optics complicates its practical application at wavelengths less than about 0.2 m (200 nm). Diffraction effects start to become important for wavelengths greater than 15 m (15 000 nm), which complicate its practical application at longer wavelengths. Measurements pertaining to visual appearance are restricted to the visible wavelength region.1.6 This practice does not apply to materials exhibiting significant fluorescence.1.7 This practice applies to flat or curved samples of arbitrary shape. However, only a flat sample is addressed in the discussion and examples. It is the users responsibility to define an appropriate sample coordinate system to specify the measurement location on the sample surface and appropriate beam properties for samples that are not flat.1.8 This practice does not provide a method for ascribing the measured BSDF to any scattering mechanism or source.1.9 This practice does not provide a method to extrapolate data from one wavelength, scattering geometry, sample location, or polarization to any other wavelength, scattering geometry, sample location, or......

Standard Practice for Goniometric Optical Scatter Measurements

ICS
17.180.30 (Optical measuring instruments)
CCS
A60
发布
2005
实施

Background subtraction techniques in AES were originally employed as a method of enhancement of the relatively weak Auger signals to distinguish them from the slowly varying background of secondary and backscattered electrons. Interest in obtaining useful information from the Auger peak line shape, concern for greater quantitative accuracy from Auger spectra, and improvements in data gathering techniques, have led to the development of various background subtraction techniques. Similarly, the use of background subtraction techniques in XPS has evolved mainly from the interest in the determination of chemical states (binding energy values), greater quantitative accuracy from the XPS spectra, and improvements in data acquisition. Post-acquisition background subtraction is normally applied to XPS data. The procedures outlined are popular in XPS and AES. General reviews of background subtraction techniques have been published (1 and 2 ).3 1.1 The purpose of this guide is to familiarize the analyst with the principal background subtraction techniques presently in use together with the nature of their application to data acquisition and manipulation.1.2 This guide is intended to apply to background subtraction in electron, X-ray, and ion-excited Auger electron spectroscopy (AES), and X-ray photoelectron spectroscopy (XPS).1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Guide for Background Subtraction Techniques in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
2004-01-01
实施

1.1 This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers that use a monochromator for emission wavelength selection and photomultiplier tube detection. This test method can be applied to instruments that use multi-element detectors, such as diode arrays, but results must be interpreted carefully. This test method uses atomic lines between 250 nm and 1000 nm. 1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Wavelength Accuracy and Spectral Bandwidth of Fluorescence Spectrometers ,

ICS
17.180.30 (Optical measuring instruments)
CCS
N34
发布
2004
实施

1.1 This test method covers the testing of the spectral bandwidth and wavelength accuracy of fluorescence spectrometers that use a monochromator for emission wavelength selection and photomultiplier tube detection. This test method can be applied to instruments that use multi-element detectors, such as diode arrays, but results must be interpreted carefully. This test method uses atomic lines between 250 nm and 1000 nm.1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Wavelength Accuracy of Spectral Bandwidth Fluorescence Spectrometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N34
发布
2004
实施

5.1 Stray radiant power can be a significant source of error in spectrophotometric measurements. SRP usually increases with the passage of time; therefore, testing should be performed periodically. Moreover, the SRPR test is an excellent indicator of the overall condition of a spectrophotometer. A control-chart record of the results of routinely performed SRPR tests can be a useful indicator of need for corrective action or, at least, of the changing reliability of critical measurements. 5.2 This test method provides a means of determining the stray radiant power ratio of a spectrophotometer at selected wavelengths in a spectral range, as determined by the SRP filter used, thereby revealing those wavelength regions where significant photometric errors might occur. It does not provide a means of calculating corrections to indicated absorbance (or transmittance) values. The test method must be used with care and understanding, as erroneous results can occur, especially with respect to some modern grating instruments that incorporate moderately narrow bandpass SRP-blocking filters. This test method does not provide a basis for comparing the performance of different spectrophotometers. Note 8: Kaye (3) discusses correction methods of measured transmittances (absorbances) that sometimes can be used if sufficient information on the properties and performance of the instrument can be acquired. See also A1.2.5. 5.3 This test method describes the performance of a spectrophotometer in terms of the specific test parameters used. When an analytical sample is measured, absorption by the sample of radiation outside of the nominal bandpass at the analytical wavelength can cause a photometric error, underestimating the transmittance or overestimating the absorbance, and correspondingly underestimating the SRPR. 5.4 The SRPR indicated by this test method using SRP filters is almost always an underestimation of the true value (see 1.3). A value cited in a manufacturer’s literature represents the performance of a new instrument, tested exactly in accordance with the manufacturer’s specification. The implication is that the manufacturer’s stated SRPR can serve as a benchmark for future performance, provided that the user performs the manufacturer’s specified test. It is recommended that users test new instruments promptly, thereby establishing a comparative benchmark in terms of their own testing facilities. The solution filter ratio method (4.3) is a convenient method for control-charting SRPR. Mielenz, et al., (4) show that its results tend to correlate well with those of the specified wavelength method, but for critical comparison with the manufacturer’s specification, the method used by the manufacturer must be used. Because some instruments reduce SRP by incorporating moderately narrow bandpass SRP-blocking filters that are changed as the wavelength range is scanned, it is possible for SRPR determinations to be highly inaccurate if the cutoff wavelength of the SRP filter falls too close to the absorption edge of an instrument’......

Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method

ICS
17.180.30 (Optical measuring instruments)
CCS
发布
2004
实施

Stray radiant power can be a significant source of error in spectrophotometric measurements. SRP usually increases with the passage of time; therefore, testing should be performed periodically. Moreover, the SRPR test is an excellent indicator of the overall condition of a spectrophotometer. A control-chart record of the results of routinely performed SRPR tests can be a useful indicator of need for corrective action or, at least, of the changing reliability of critical measurements. This test method provides a means of determining the stray radiant power ratio of a spectrophotometer at selected wavelengths in a spectral range, as determined by the SRP filter used, thereby revealing those wavelength regions where significant photometric errors might occur. It does not provide a means of calculating corrections to indicated absorbance (or transmittance) values. The test method must be used with care and understanding, as erroneous results can occur, especially with respect to some modern grating instruments that incorporate moderately narrow bandpass SRP-blocking filters. This test method does not provide a basis for comparing the performance of different spectrophotometers. Note 88212;Kaye (3) discusses correction methods of measured transmittances (absorbances) that sometimes can be used if sufficient information on the properties and performance of the instrument can be acquired. See also A1.2.5. This test method describes the performance of a spectrophotometer in terms of the specific test parameters used. When an analytical sample is measured, absorption by the sample of radiation outside of the nominal bandpass at the analytical wavelength can cause a photometric error, underestimating the transmittance or overestimating the absorbance, and correspondingly underestimating the SRPR. The SRPR indicated by this test method using SRP filters is almost always an underestimation of the true value (see 1.3). A value cited in a manufacturer’s literature represents the performance of a new instrument, tested exactly in accordance with the manufacturer’s specification. The implication is that the manufacturer’s stated SRPR can serve as a benchmark for future performance, provided that the user performs the manufacturer’s specified test. It is recommended that users test new instruments promptly, thereby establishing a comparative benchmark in terms of their own testing facilities. The solution filter ratio method (4.3) is a convenient method for control-charting SRPR. Mielenz, et al., (4) show that its results tend to correlate well with those of the specified wavelength method, but for critical comparison with the manufacturer’s specification, the method used by the manufacturer must be used. Because some instruments reduce SRP by incorporating moderately narrow bandpass SRP-blocking filters that are changed as the wavelength range is scanned, it is possible for SRPR determinations to be highly inaccurate if the cutoff wavelength of the SRP filter falls too close to the absorption edge of an instrument’s SRP-reducing filter (3).1.1 Stray radiant power (SRP) can be a significant source of error in spectrophotometric measurements, and the danger that such error exists is enhanced because its presence often is not suspected (1-4). This test method affords an estimate of the relative radiant power, that is, the Stray Radiant Power Ratio (SRPR), at wavelengths remote from those of the nominal bandpass transmitted through the monochromator of an absorption spectrophotometer. Test-fil......

Standard Test Method for Estimating Stray Radiant Power Ratio of Dispersive Spectrophotometers by the Opaque Filter Method

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
2004
实施

This practice is for the use of manufacturers and users of equipment for visual appraisal or measurement of appearance, those writing standards related to such equipment, and others who wish to specify precisely conditions of viewing or measuring attributes of appearance. The use of this practice makes such specifications concise and unambiguous. The functional notation facilitates direct comparisons of the geometric specifications of viewing situations and measuring instruments.1.1 This practice describes the geometry of illuminating and viewing specimens and the corresponding geometry of optical measurements to characterize the appearance of materials. It establishes terms, symbols, a coordinate system, and functional notation to describe the geometric orientation of a specimen, the geometry of the illumination (or optical irradiation) of a specimen, and the geometry of collection of flux reflected or transmitted by the specimen, by a measurement standard, or by the open sampling aperture.1.2 Optical measurements to characterize the appearance of retroreflective materials are of such a special nature that they are treated in other ASTM standards and are excluded from the scope of this practice.1.3 The measurement of transmitted or reflected light from areas less than 0.5 mm in diameter may be affected by optical coherence, so measurements on such small areas are excluded from consideration in this practice, although the basic concepts described in this practice have been adopted in that field of measurement.1.4 The specification of a method of measuring the reflecting or transmitting properties of specimens, for the purpose of characterizing appearance, is incomplete without a full description of the spectral nature of the system, but spectral conditions are not within the scope of this practice. The use of functional notation to specify spectral conditions is described in ISO 5/1.

Standard Practice for Specifying the Geometries of Observation and Measurement to Characterize the Appearance of Materials

ICS
17.180.30 (Optical measuring instruments)
CCS
N04
发布
2004
实施

1.1 This practice covers the procedure for certifying continuous opacity monitors. It includes design and performance specifications, test procedures, and quality assurance requirements to ensure that continuous opacity monitors meet minimum design and calibration requirements, necessary in part, for accurate opacity monitoring measurements in regulatory environmental opacity monitoring applications subject to 10 % or higher opacity standards. 1.2 This practice applies specifically to the original manufacturer, or to those involved in the repair, remanufacture, or resale of opacity monitors.1.3 Test procedures that specifically apply to the various equipment configurations of component equipment that comprise either a transmissometer, an opacity monitor, or complete opacity monitoring system are detailed in this practice.1.4 The specifications and test procedures contained in this practice have been adopted by reference by the United States Environmental Protection Agency (USEPA). For each opacity monitor or monitoring system that the manufacturer demonstrates conformance to this practice, the manufacturer may issue a certificate that states that opacity monitor or monitoring system conforms with all of the applicable design and performance requirements of 40 CFR 60, Appendix B, Performance Specification 1 except those for which tests are required after installation.

Standard Practice for Opacity Monitor Manufacturers to Certify Conformance with Design and Performance Specifications

ICS
17.180.30 (Optical measuring instruments)
CCS
N30
发布
2003
实施

1.1 The purpose of this document is to assist potential users in understanding the issues related to the accuracy of non-contacting strain measurement systems and to provide a common framework for quantitative comparison of optical systems. The output from a non-contacting optical strain and deformation measurement system is generally divided into optical data and image analysis data. Optical data contains information related to specimen strains and the image analysis process converts the encoded optical information into strain data. The enclosed document describes potential sources of error in the strain data and describes general methods for quantifying the error and estimating the accuracy of the measurements when applying non-contacting methods to the study of events for which the optical integration time is much smaller than the inverse of the maximum temporal frequency in the encoded data (that is, events that can be regarded as static during the integration time). A brief application of the approach, along with specific examples defining the various terms, is given in the Appendix.

Standard Guide for Evaluating Non-Contacting Optical Strain Measurement Systems

ICS
17.180.30 (Optical measuring instruments)
CCS
D30
发布
2002
实施

1.1 The purpose of this document is to assist potential users in understanding the issues related to the accuracy of non-contacting strain measurement systems and to provide a common framework for quantitative comparison of optical systems. The output from a non-contacting optical strain and deformation measurement system is generally divided into optical data and image analysis data. Optical data contains information related to specimen strains and the image analysis process converts the encoded optical information into strain data. The enclosed document describes potential sources of error in the strain data and describes general methods for quantifying the error and estimating the accuracy of the measurements when applying non-contacting methods to the study of events for which the optical integration time is much smaller than the inverse of the maximum temporal frequency in the encoded data (that is, events that can be regarded as static during the integration time). A brief application of the approach, along with specific examples defining the various terms, is given in the Appendix.

Standard Guide for Evaluating Non-Contacting Optical Strain Measurement Systems

ICS
17.180.30 (Optical measuring instruments)
CCS
N30
发布
2002
实施

This practice is for the use of manufacturers and users of instruments to measure the appearance of gonioapparent materials, those writing standard specifications for such instruments, and others who wish to specify precisely the geometric conditions of multiangle spectrophotometry. A prominent example of industrial usage is the routine application of such measurements by material suppliers and automobile manufacturers to measure the colors of metallic paints and plastics.1.1 This practice provides a way of specifying the angular and spatial conditions of measurement and angular selectivity of a method of measuring the spectral reflectance factors of opaque gonioapparent materials, for a small number of sets of geometric conditions. 1.2 Measurements to characterize the appearance of retroreflective materials are of such a special nature that they are treated in other ASTM documents and are not included in the scope of this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Specifying the Geometry of Multiangle Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N50
发布
2001
实施

This practice permits an analyst to compare the general performance of his instrument, as he is using it in a specific spectrophotometric method, with the performance of instruments used in developing the method. 1.1 This practice covers the description of requirements of spectrophotometric performance especially for ASTM methods, and the testing of the adequacy of available equipment for a specific method. The tests give a measurement of some of the important parameters controlling results obtained in spectrophotometric methods, but it is specifically not to be concluded that all the factors in instrument performance are measured.1.1.1 This practice is not to be used (1) as a rigorous test of performance of instrumentation, or (2) to intercompare the quantitative performance of instruments of different design.1.1.2 This practice is primarily directed to dispersive spectrophotometers used for transmittance measurements rather than instruments designed for diffuse transmission and diffuse reflection.

Standard Practice for Describing and Measuring Performance of Ultraviolet, Visible, and Near-Infrared Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
2001
实施

1.1 This test method covers a procedure for evaluating the limits of the linearity of response with fluorescence intensity of fluorescence-measuring systems under operating conditions. Particular attention is given to slit widths, filters, and sample containers. This test method can be used to test the overall linearity under a wide variety of instrumental and sampling conditions. The results obtained apply only to the tested combination of slit width and filters, and the size, type and illumination of the sample cuvette, all of which must be stated in the report. The sources of nonlinearity may be the measuring electronics, excessive absorption of either the exciting or emitted radiation, or both, and the sample handling technique, particularly at low concentrations.1.2 This test method has been applied to fluorescence-measuring systems utilizing continuous and low-energy excitation sources (for example, an excitation source of 450-W electrical input or less). There is no assurance that extremely intense illumination will not cause photodecomposition of the compounds suggested in this test method. For this reason it is recommended that this test method not be indiscriminately employed with high-intensity light sources. It is not a test method to determine the linearity of response of other materials. If this test method is extended to employ other chemical substances, the principles within can be applied, but new material parameters, such as the concentration range of linearity, must be established. The user should be aware of the possibility that these other substances may undergo decomposition, or adsorption onto containers.1.3 This test method is applicable to 10-mm pathlength cuvette formats and instruments covering a wavelength range within 190 to 900 nm. The use of other sample formats has not been established with this test method.1.4 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Test Method for Linearity of Fluorescence Measuring Systems

ICS
17.180.30 (Optical measuring instruments)
CCS
N30
发布
2001
实施

4.1 This practice is for the use of manufacturers and users of instruments to measure the appearance of gonioapparent materials, those writing standard specifications for such instruments, and others who wish to specify precisely the geometric conditions of multiangle spectrophotometry. A prominent example of industrial usage is the routine application of such measurements by material suppliers and automobile manufacturers to measure the colors of metallic paints and plastics. 1.1 This practice provides a way of specifying the angular and spatial conditions of measurement and angular selectivity of a method of measuring the spectral reflectance factors of opaque gonioapparent materials, for a small number of sets of geometric conditions. 1.2 Measurements to characterize the appearance of retroreflective materials are of such a special nature that they are treated in other ASTM documents and are not included in the scope of this standard. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Specifying the Geometry of Multiangle Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
发布
2001
实施

1.1 This practice covers requirements for the validation of measurements made by on-line, process near- or mid-infrared analyzers, or both, used in the calculation of physical, chemical, or quality parameters of liquid petroleum products. The parameters are calculated from spectroscopic data using multivariate modeling methods. The requirements include verification of adequate instrument performance, verification of the applicability of the calibration model to the spectrum of the sample under test, and verification of equivalence between the result calculated from the infrared measurements and the result produced by the primary method used for the development of the calibration model.1.2 This practice does not cover procedures for establishing the calibration model used by the analyzer. Calibration procedures are covered in Practices E 1655 and references therein.1.3 This practice is intended as a review for experienced persons. For novices, this practice will serve as an overview of techniques used to verify instrument performance, to verify model applicability to the spectrum of the sample under test, and to verify equivalence between the parameters calculated from the infrared measurement and the results of the primary method measurement.1.4 This practice teaches and recommends appropriate statistical tools, outlier detection methods, for determining whether the spectrum of the sample under test is a member of the population of spectra used for the analyzer calibration. The statistical tools are used to determine if the infrared measurement results in a valid property or parameter estimate. 1.5 The outlier detection methods do not define criteria to determine whether the sample, or the instrument is the cause of an outlier measurement. Thus, the operator who is measuring samples on a routine basis will find criteria to determine that a spectral measurement lies outside the calibration, but will not have specific information on the cause of the outlier. This practice does suggest methods by which instrument performance tests can be used to indicate if the outlier methods are responding to changes in the instrument response.1.6 This practice is not intended as a quantitative performance standard for the comparison of analyzers of different design. 1.7 Although this practice deals primarily with validation of on-line, process infrared analyzers, the procedures and statistical tests described herein are also applicable to at-line and laboratory infrared analyzers which employ multivariate models.1.8 This standard does not purport to address all of the safety concerns, if any associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Validation of Multivariate Process Infrared Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
G04
发布
2001
实施

1.1 This practice covers the calibration of transmission densitometers used to perform radiographic film density measurements (see Note 1.) 1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Note--For further information on the design and use of densitometers, the following literature is suggested as additional background information: Guide E94 and ANSI documents PH2.19 and PH2.36.

Standard Practice for Calibration of Transmission Densitometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N30
发布
2000
实施

1.1 This practice covers requirements for the validation of measurements made by on-line, process near- or mid-infrared analyzers, or both, used in the calculation of physical, chemical, or quality parameters of liquid petroleum products. The parameters are calculated from spectroscopic data using multivariate modeling methods. The requirements include verification of adequate instrument performance, verification of the applicability of the calibration model to the spectrum of the sample under test, and verification of equivalence between the result calculated from the infrared measurements and the result produced by the primary method used for the development of the calibration model.1.2 This practice does not cover procedures for establishing the calibration model used by the analyzer. Calibration procedures are covered in Practices E 1655 and references therein.1.3 This practice is intended as a review for experienced persons. For novices, this practice will serve as an overview of techniques used to verify instrument performance, to verify model applicability to the spectrum of the sample under test, and to verify equivalence between the parameters calculated from the infrared measurement and the results of the primary method measurement.1.4 This practice teaches and recommends appropriate statistical tools, outlier detection methods, for determining whether the spectrum of the sample under test is a member of the population of spectra used for the analyzer calibration. The statistical tools are used to determine if the infrared measurement results in a valid property or parameter estimate. 1.5 The outlier detection methods do not define criteria to determine whether the sample, or the instrument is the cause of an outlier measurement. Thus, the operator who is measuring samples on a routine basis will find criteria to determine that a spectral measurement lies outside the calibration, but will not have specific information on the cause of the outlier. This practice does suggest methods by which instrument performance tests can be used to indicate if the outlier methods are responding to changes in the instrument response.1.6 This practice is not intended as a quantitative performance standard for the comparison of analyzers of different design. 1.7 Although this practice deals primarily with validation of on-line, process infrared analyzers, the procedures and statistical tests described herein are also applicable to at-line and laboratory infrared analyzers which employ multivariate models.1.8 This standard does not purport to address all of the safety concerns, if any associated with its use. It is the responsibility of the user of this standard to consult and establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Standard Practice for Validation of Multivariate Process Infrared Spectrophotometers

ICS
17.180.30 (Optical measuring instruments)
CCS
G04
发布
1999
实施

1.1 This practice describes two levels of tests to measure the performance of Fourier transform infrared (FT-IR) spectrometers.

Standard Practice for Describing and Measuring Performance of Fourier Transform Mid-Infrared (FT-MIR) Spectrometers Level Zero and Level One Tests

ICS
17.180.30 (Optical measuring instruments)
CCS
N52
发布
1999
实施

This practice describes the essential components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES). The components include excitation/radio-frequency generators, sample introduction systems, spectrometers, detectors, and signal processing and displays. This description allows the user or potential user to gain a cursory understanding of an ICP-AES system. This practice also provides a means for comparing and evaluating various systems, as well as understanding the capabilities and limitations of each instrument. Training8212;The vendor should provide training in safety, basic theory of ICP spectrochemical analysis, operations of hardware and software, and routine maintenance for at least one operator. Training ideally should consist of the basic operation of the instrument at the time of installation, followed by an in-depth course one or two months later. Advanced courses are also offered at several of the important spectroscopy meetings that occur throughout the year as well as by independent training institutes. Furthermore, several independent consultants are available who can provide training, in most cases at the userrsquo;site.1.1 This practice describes the components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES) that are basic to its operation and to the quality of its performance. This practice identifies critical factors affecting accuracy, precision, and sensitivity. It is not the intent of this practice to specify component tolerances or performance criteria, since these are unique for each instrument. A prospective user should consult with the vendor before placing an order, to design a testing protocol to demonstrate that the instrument meets all anticipated needs.1.2 The values stated in SI units are to be regarded as the standard. The values given in parentheses are for information only.1.3This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 13.

Standard Practice for Describing and Specifying Inductively-Coupled Plasma Atomic Emission Spectrometers

ICS
17.180.30 (Optical measuring instruments)
CCS
N33
发布
1999
实施

This practice describes the essential components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES). The components include excitation/radio-frequency generators, sample introduction systems, spectrometers, detectors, and signal processing and displays. This description allows the user or potential user to gain a cursory understanding of an ICP-AES system. This practice also provides a means for comparing and evaluating various systems, as well as understanding the capabilities and limitations of each instrument. Training8212;The vendor should provide training in safety, basic theory of ICP spectrochemical analysis, operations of hardware and software, and routine maintenance for at least one operator. Training ideally should consist of the basic operation of the instrument at the time of installation, followed by an in-depth course one or two months later. Advanced courses are also offered at several of the important spectroscopy meetings that occur throughout the year as well as by independent training institutes. Furthermore, several independent consultants are available who can provide training, in most cases at the user's site.1.1 This practice describes the components of an inductively-coupled plasma atomic emission spectrometer (ICP-AES) that are basic to its operation and to the quality of its performance. This practice identifies critical factors affecting accuracy, precision, and sensitivity. It is not the intent of this practice to specify component tolerances or performance criteria, since these are unique for each instrument. A prospective user should consult with the vendor before placing an order, to design a testing protocol to demonstrate that the instrument meets all anticipated needs. 1.2 The values stated in SI units are to be regarded as standard. The values given in parentheses are for information only. 1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use. Specific safety hazard statements are given in Section 13.

Standard Practice for Describing and Specifying Inductively-Coupled Plasma Atomic Emission Spectrometers

ICS
17.180.30 (Optical measuring instruments)
CCS
发布
1999
实施



Copyright ©2007-2022 ANTPEDIA, All Rights Reserved
京ICP备07018254号 京公网安备1101085018 电信与信息服务业务经营许可证:京ICP证110310号