L21 石英晶体、压电元件 标准查询与下载



共找到 479 条与 石英晶体、压电元件 相关的标准,共 32

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

ICS
01.040.31;31.140
CCS
L21
发布
2009-07
实施

Synthetic quartz crystal - Specifications and guidelines for use (IEC 60758:2008); German version EN 60758:2009

ICS
31.140
CCS
L21
发布
2009-05
实施
2009-05-01

This International Standard applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection.

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

ICS
31.140
CCS
L21
发布
2009-04-30
实施
2009-04-30

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

ICS
01.040.31;31.140
CCS
L21
发布
2009-03
实施

This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection.

Synthetic quartz crystal — Specifications and guidelines for use

ICS
31.140
CCS
L21
发布
2009-02-28
实施
2009-02-28

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters

ICS
CCS
L21
发布
2009-02
实施

This International Standard applies to measurements and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values for frequency control and selection.

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

ICS
31.140
CCS
L21
发布
2008-11
实施
2009-01-16

This International Standard applies to synthetic quartz single crystals intended for manufacturing piezoelectric elements for frequency control and selection.

Synthetic quartz crystal - Specifications and guidelines for use

ICS
31.140
CCS
L21
发布
2008-11
实施

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Piezoelectric materials - Synthetic quartz crystal

ICS
01.040.31;31.140
CCS
L21
发布
2008-05-30
实施
2008-05-30

This part of IEC 61994 specifies the terms and definitions for materials applied for devices using waveguide type dielectric resonators representing the state-of-the-art, which are intended for use in the standards and documents of IEC TC 49.

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Materials - Materials for dielectric devices

ICS
01.040.31;31.140
CCS
L21
发布
2008-05-30
实施
2008-05-30

This PAS applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method, phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to 700 MHz. This PAS applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text, these oscillators and modules will be referred to as “oscillator(s)” for simplicity.

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

ICS
31.140
CCS
L21
发布
2008-02
实施

This part of IEC 61994 specifies the terms and definitions for materials applied for devices using waveguide type dielectric resonators representing the state-of-the-art, which are intended for use in the standards and documents of IEC TC 49.

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

ICS
01.040.31
CCS
L21
发布
2008-02
实施

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 60679-1:2007); German version EN 60679-1:2007

ICS
31.140
CCS
L21
发布
2008-02
实施
2008-02-01

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 60444-9:2007); German version EN 60444-9:2007

ICS
31.140
CCS
L21
发布
2007-12
实施
2007-12-01

표면 탄성파 공진기는 오늘날 다양한 응용분야에 폭넓게 사용되고 있다. VCR RF 컨버터,

Surface acoustic wave(SAW) resonators-Part 2:Guide to the use

ICS
31.140
CCS
L21
发布
2007-11-30
实施
2007-11-30

이 규격은 표면 탄성파(SAW) 필터와 공진기를 제조하기 위한 기판으로 사용하고자 하는 인

Single crystal wafers for surface acoustic wave(SAW) device applications-Specifications and measuring methods

ICS
31.140
CCS
L21
发布
2007-11-30
实施
2007-11-30

이 규격은 성능 인증 또는 품질 인증 절차를 이용하여 품질이 검증된 표면 탄성파 공진기에

Surface acoustic wave(SAW) resonators-Part 1:Generic specification

ICS
31.140
CCS
L21
发布
2007-11-30
实施
2007-11-30

Detailed specification of JA557 quartz crystal resonator

ICS
CCS
L21
发布
2007-11-01
实施
2007-11-01

Detailed specification of JA533 quartz crystal resonator

ICS
CCS
L21
发布
2007-11-01
实施
2007-11-01

Detailed specification of JA547 quartz crystal resonator

ICS
CCS
L21
发布
2007-11-01
实施
2007-11-01



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