荧光寿命一般多少 标准查询与下载
共找到 150 条与 荧光寿命一般多少 相关的标准，共 10 页
LIFE TESTING OF FLUORESCENT LAMPS
LIFE TESTING OF SINGLE-BASED FLUORESCENT LAMPS
Approved Method for the Life Testing of Fluorescent Lamps
Approved Method for Life Testing of Fluorescent Lamps
Measurement method for minority carrier lifetime of solar grade polysilicon block
Approved Method Life Testing of Single-Based Fluorescent Lamps
Measurement of minority carrier life time in germanium by photoconductive decay method
IESNA Approved Method for Life Testing of Compact Fluorescent Lamps
Measurement of minority carrier life time in germanium by photoconductive decay method
Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
本标准规定了硅和锗单晶体内少数载流子寿命的测定方法。本标准适用于非本征硅和锗单晶体内载流子复合过程中非平衡少数载流子寿命的测量。 本标准为脉冲光方法。这种方法不破坏试样的内在特性，试样可以重复测试，但要求试样具有特殊的条形尺寸和淹没的表面，见表1。 本标准可测的最低寿命值为10μs，取决于光源的
Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay
本标准规定了硅和锗单晶体内少数载流子寿命的测量方法。 本标准适用于非本征硅和锗单晶体内载流子复合过程中非平衡少数载流子寿命的测量
Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay
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Buildings. Service life planning. General principles
Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
Measuring of minority - carrier lifetime in silicon single crystal by photoconductive decay method
