电子背散射衍射系统EBSD系统 标准查询与下载
共找到 150 条与 电子背散射衍射系统EBSD系统 相关的标准，共 10 页
Determination of Texture in Steel Electron Backscattered Diffraction (EBSD) Method
本标准规定了采用电子背散射衍射(EBSD)测定晶粒度方法的原理、设备、取样、试样制备、校准与核查、测量步骤。 本标准适用于测量完全再结晶的多晶金属材料的平均晶粒度。其他能产生高质量高标定率电子背散射衍射花样的晶体材料可参照此方法执行
Determination of average grain size of metal.Electron backscatter diffraction (EBSD)method
本标准规定了电子背散射衍射分析方法。 本标准适用于安装了电子背散射衍射附件的电子束显微分析仪进行物相的鉴定、晶体取向、显微织构以及晶界特性等方面的分析
General guide for electron backscatter diffraction analysis
Microbeam Analysis — Electron Backscattered Electron Diffraction — Vocabulary
This document describes the guidelines for misorientation analysis to assess mechanical damage such as fatigue and creep induced by plastic
Microbeam analysis — Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
本标准规定了电子背散射衍射分析方法”本标准适用于安装了电子背散射衍射附件的扫描电镜和电子探针进行物相识别、晶体取向、显微织构以及晶界特性等方面的分析
Microbeam analysis.General guide for electron backscatter diffraction analysis
E2627-Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
Electron backscatter diffraction method for technical identification of electrical fire melt marks
5.1 This practice provides a way to estimate the average grain size of polycrystalline
Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
1.1 This practice is used to determine grain size from measurements of grain areas from automated electron backscatter diffraction (EBSD) scans
Standard Practice for Determining Average Grain Size Using Electron Backscatter Diffraction (EBSD) in Fully Recrystallized Polycrystalline Materials
What is ISO 23703 - Guidelines for misorientation analysis about? ISO 23703 discusses microbeam analysis. A microbeam
Microbeam analysis. Guidelines for misorientation analysis to assess mechanical damage of austenitic stainless steel by electron backscatter diffraction (EBSD)
本标准给出了使用电子背散射衍射(EBSD)技术进行晶体取向测量的指南,使测量数据具有较高的可靠性和重复性,本标准确立了试样制备、仪器配置、校正以及数据采集的一般原则。本标准适用于EBSD对块状晶体样品的晶粒取向分析
Microbeam analysis.Guidelines for orientation measurement using electron backscatter diffraction
State system for insuring the uniformity of measurements. Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
Microbeam Analysis - Guidelines for Orientation Measurement by Backscattered Electron Diffraction
本标准规定了用电子背散射衍射法(EBSD)对抛光截面进行平均晶粒尺寸的测定方法,包含与晶体试样中的位置相关的取向、取向差和花样质量因子的测量要求[1]。 注1:使用光学显微镜测定晶粒尺寸已为大家普遍接受,与其相比,EBSD具有很多技术优势,如高的空间分辨率和晶粒取向的定量描述等。 注2:该方法还可用
Microbeam analysis—Electron backscatter diffraction—Measurement of average grain size
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