样本数：1
视野范围：40um*40um
扫描速度：最大300fps
扫描分辨率：横向20nm，轴向50nm
能量分辨率：不适用
应用领域：小动物
Vutara 352 Specifications
| 横向分辨率 | 20 nm* |
| 轴向分辨率 | 50 nm* |
| 采集速度 | Localization microscopy: up to 3,000 fps, Widefield: Up 30 fps |
| 相机（包括2个） | Localization microscopy: sCMOS (4.2 MP, 6.5 um x 6.5 um pixels 80% QE; Widefield sCMOS, 2.3 MP. 5.85 um x 5.86 um pixels, 80% QE |
| 光学平台 | X,Y scanning stage with linear encoders, 120 mm x 72 mm range, 50 nm resolution |
| Piezo 聚焦 | Objective mount piezo, 400 um range, 0.7 nm resolution |
| 视场 | Localization microscopy: 20 um x 20 um standard, 40 x 40 um optional; widefield 187 um x 187 um; confocal 87 um x 87 um |
| 物镜 | Standard: Water, 60x 1.2 NA; optional: Silicone 60x, 13 NA; Oil 60 x 1.49 NA |
| 标准层 | 100 mW 405 nm; 1 W 488 nm , 561 nm and 640 nm |
* Performance is sample and room dependent, typical resolutions can vary based upon preparation. Lateral resolution test specification with Tetraspek beads is , X,Y resolution should be less or equal to 20 nm and Z resolution less or equal to 50 nm. Colocalization tests with Tetraspek bead using three color is , X,Y colocalization between colors colors should be less or equal to 30 nm and Z colocalization between colors should be less or equal to 50
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