EN 60679-6:2011
质量评估的石英晶体控制振荡器 第6部分:石英晶体振荡器和 SAW 振荡器的相位抖动测量方法 应用指南

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines


 

 

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标准号
EN 60679-6:2011
发布
2011年
发布单位
CENELEC - European Committee for Electrotechnical Standardization
当前最新
EN 60679-6:2011
 
 
适用范围
"This part of the IEC 60679 series applies to the phase jitter measurement of quartz crystal oscillators and SAW oscillators used for electronic devices and gives guidance for phase jitter that allows the accurate measurement of r.m.s. jitter. In the measurement method@ phase noise measurement equipment or a phase noise measurement system is used. The measuring frequency range is from 10 MHz to1 000 MHz. This standard applies to quartz crystal oscillators and SAW oscillators used in electronic devices and modules that have the multiplication or division functions based on these oscillators. The type of phase jitter applied to these oscillators is the r.m.s. jitter. In the following text@ these oscillators and modules will be referred to as ""oscillator(s)"" for simplicity."

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