IEC 61010-031:2002
Regles De Securite Pour Appareils Electriques De Mesurage@ De Regulation Et De Laboratoire - Partie 031: Prescriptions De Securite Pour Sondes Equipees Tenues A La Main Pour Mesurage Et Essais Electriques (Edition 1.0)

Safety Requirements for Electrical Equipment for Measurement@ Control@ and Laboratory Use - Part 031: Safety Requirements for Hand-Held Probe Assemblies for Electrical Measurement and Test (Edition 1.0)

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标准号

IEC 61010-031:2002

发布

2002年

发布单位

IEC - International Electrotechnical Commission

替代标准

IEC 61010-031:2008

当前最新

IEC 61010-031:2022 CMV

 

 

被代替标准

IEC 66/262/FDIS:2001 IEC 61010-2-031:1993

适用范围

This part of IEC 61010 applies to hand-held and hand-manipulated PROBE ASSEMBLIES of the types described below@ and related accessories which are intended for professional@ industrial process@ and educational use. These PROBE ASSEMBLIES are for use in the interface between an electrical phenomenon and test or measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment.a) Low-voltage and high-voltage@ non-attenuating PROBE ASSEMBLIES (type A). Non-attenuating PROBE ASSEMBLIES that are RATED for direct connection to voltages exceeding 33 V r.m.s. or 46@7 V peak or 70 V d.c.@ but not exceeding 63 kV. They do not incorporate active components@ nor are they intended to provide a voltage divider function or a signal conditioning function@ but they may contain passive non-attenuating components such as fuses.b) High-voltage attenuating or divider PROBE ASSEMBLIES (type B). Attenuating or divider PROBE ASSEMBLIES that are RATED for direct connection to secondary voltages exceeding 1 kV but not exceeding 63 kV. The divider function may be carried out wholly within the PROBE ASSEMBLY@ or partly within the test or measurement equipment to be used with the PROBE ASSEMBLY.c) Low-voltage attenuating or divider PROBE ASSEMBLIES (type C). Attenuating@ divider or other signal conditioning PROBE ASSEMBLIES for direct connection to voltages exceeding 33 V r.m.s or 46@7 V peak or 70 V d.c.@ but not exceeding 1 kV r.m.s. or 1@5 kV d.c. The signal conditioning function may be carried out wholly within the PROBE ASSEMBLY@ or partly within the test or measurement equipment intended to be used with the PROBE ASSEMBLY.NOTE PROBE ASSEMBLIES which?C are not within the definitions of types A@ B or C@ or@?C which are designed to be powered from a low-voltage mains supply@ or?C include other features not specifically addressed in this standard may also need to meet the relevant requirements of other parts of IEC 61010 [6]1).1) Figures in square brackets refer to the bibliography.

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