IEEE Std 1687-2014
半导体设备中嵌入仪器的访问和控制 IEEE 标准

IEEE Standard for Access and Control of Instrumentation Embedded within a Semiconductor Device

标准号

IEEE Std 1687-2014

发布

2014年

发布单位

美国电气电子工程师学会

当前最新

IEEE Std 1687-2014

 

 

适用范围

A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware descripti...

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