A methodology for accessing instrumentation embedded within a semiconductor device, without defining the instruments or their features themselves, via the IEEE 1149.1(TM) test access port (TAP) and/or other signals, is described in this standard. The elements of the methodology include a hardware architecture for the on-chip network connecting the instruments to the chip pins, a hardware descripti...
IEEE Std 1687-2014由美国电气电子工程师学会 US-IEEE 发布于 2014-12-05,并于 2014-12-05 实施。
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